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Lecture 8.0Lecture 8.0
Silicon Crystal Growth
Silicon Mfg. - oldSilicon Mfg. - old
Produce Silicon metal bar
Zone Refining – n times
– To get purity
Cut off impure end
Use pieces to fill crystallization
apparatus
Grow Mono-Crystal of large size
Zone RefiningZone Refining
0=x-Ut, k=CS/CL
Co=solute concentration in melt
or of solid on first pass
Co=0∫x+L
Cs(x)dx - o∫x-L
kCL(x)dx
Si-Fe Phase DiagramSi-Fe Phase Diagram
Si-O Phase DiagramSi-O Phase Diagram
Crystal GrowthCrystal Growth
Silicon Mfg. - newSilicon Mfg. - new
Produce ultra pure Silicon cylinder
Use pieces to fill crystallization
apparatus
Grow Mono-Crystal of large size
Add Dopants toAdd Dopants to
Silicon GrownSilicon Grown
 Melt is maintained
with a given
impurity
concentration
 Melting Point is
decreased
 Solid produced
has a given
impurity
concentation
Ultra-pure Silicon ProductionUltra-pure Silicon Production
 Si + 3HClSiHCl3 +H2
– fluidized bed reactor at 500 to 700K
– Condense chlorosilane, SiHCl3
 Distillation of liquid SiHCl3
 SiHCl3+H2Si + 3HCl at 1400K
 Si vapor Deposits on Si mandrel in a
purged fed batch reactor heated to 700K
 Results Large diameter Si with impurities
at 10 ppt or 14-9’s pure
12” (30 cm) Boule12” (30 cm) Boule
Crystal GrowthCrystal Growth
Czochralski Crystal GrowthCzochralski Crystal Growth
ApparatusApparatus
 Figure 4. Today's Czochralski growth furnace,
or crystal puller, is a far more sophisticated
apparatus than that built by Gordon Teal
nearly 50 years ago. It is however
fundamentally identical. A crystal is pulled
from a feedstock of molten material by slowly
withdrawing it from the melt. Czochralski
pullers often possess provisions for adding to
the melt during a single pull so that crystals
larger than what can be obtained in a single
charge of the crucible may be produced.
Today crystals of a 12-inch diameter are
possible, and the industry will spend billions
to adopt this new size in the coming years.
This figure was taken directly from the
Mitsubishi Semiconductor
– website: http://www.egg.orjp/MSIL/
english/index-e.html!
Czochralski Growing SystemCzochralski Growing System
12” (30 cm) Boule12” (30 cm) Boule
Crystal Growth StepsCrystal Growth Steps
Induce Supersaturation
– Sub cooled melt
– S=exp[T∫∆Hf/(RT2
)dT]
Nucleation
Growth at different rates on each
Crystal Face
Results in crystal with a particular
Crystal Habit or shape
NucleationNucleation
 Free Energy
– GTOT=∆Gv V + γA
 Critical Size
– R*=2βAγVm/(3βvRgT lnS)
 Nucleation Rate
 J=(2D/d5
)exp[- ∆G(R*)/(RgT)]
 D=diffusion coefficient
 d= molecular diameter
Surface NucleationSurface Nucleation
 Surface energy, γ,
is replaced by γ cos
θ, where θ is the
contact angle
between phases
 Geometric factors
changed
 Units #/(cm2
sec)
 Surface Nucleation
– Limits growth of flat
crystal surfaces
Crystal GrowthCrystal Growth
 Boundary Layer
Diffusion
 Surface Diffusion
 Edge Diffusion
 Kink Site
Adsorption
 Loss of
Coordination
shell at each step
Crystal Growth RateCrystal Growth Rate
Limiting StepsLimiting Steps
 Boundary Layer
Diffusion
 Surface Diffusion
 Surface Nucleation
– Mono
– Poly
 Screw Disslocation
 Edge Diffusion
 Kink Site Adsorption
 Loss of Coordination
shell
Screw Surface GrowthScrew Surface Growth
FluxesFluxes
Boundary
Layer
Surface
Edge
Mass Transfer to Rotating CrystalMass Transfer to Rotating Crystal
 Local BL-MT Flux
 J[mole/(cm2
s)] = 0.62 D2/3
(Co-Ceq) ν-1/6
ω1/2
 J[mole/(cm2
s)] = 0.62 D2/3
Ceq(S-1) ν-1/6
ω1/2
– Franklin, T.C. Nodimele, R., Adenniyi, W.K. and Hunt,
D., J. Electrochemical Soc. 135,1944-47(1988).
– Uniform, not a function of radius!!
 Crystal Growth Rate due to BL-MT as
Rate Determining Step
Heat Transfer to Rotating CrystalHeat Transfer to Rotating Crystal
 Local BL-HT Flux
 J[mole/(cm2
s)] = h(Teq-T)/∆Hf
 J[mole/(cm2
s)]
• = 0.62 k α-1/3
ν-1/6
ω1/2
(Teq-T)/∆Hf
– Franklin, T.C. Nodimele, R., Adenniyi, W.K. and Hunt,
D., J. Electrochemical Soc. 135,1944-47(1988).
– Uniform, not a function of radius!!
 Crystal Growth Rate due to BL-HT as
Rate Determining Step
Crystal HabitCrystal Habit
Equilibrium Shape
– h1/γ1=h2/γ2=h3/γ3
Kinetic Shape
– h1=G1(S)*t
– h2=G2 (S)* t
– h3=G3 (S)* t
Crystal FacesCrystal Faces
 Flat Face
 Stepped Face
 Kinked Face
 Diffusion Distances
to Kink sites are
shorter on K &S
Faces
Crystal HabitCrystal Habit
Wafers Cut from Boule & PolishedWafers Cut from Boule & Polished

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Lecture8.0 silicon crystal growth

  • 2. Silicon Mfg. - oldSilicon Mfg. - old Produce Silicon metal bar Zone Refining – n times – To get purity Cut off impure end Use pieces to fill crystallization apparatus Grow Mono-Crystal of large size
  • 3. Zone RefiningZone Refining 0=x-Ut, k=CS/CL Co=solute concentration in melt or of solid on first pass Co=0∫x+L Cs(x)dx - o∫x-L kCL(x)dx
  • 4. Si-Fe Phase DiagramSi-Fe Phase Diagram
  • 5. Si-O Phase DiagramSi-O Phase Diagram
  • 7. Silicon Mfg. - newSilicon Mfg. - new Produce ultra pure Silicon cylinder Use pieces to fill crystallization apparatus Grow Mono-Crystal of large size
  • 8. Add Dopants toAdd Dopants to Silicon GrownSilicon Grown  Melt is maintained with a given impurity concentration  Melting Point is decreased  Solid produced has a given impurity concentation
  • 9. Ultra-pure Silicon ProductionUltra-pure Silicon Production  Si + 3HClSiHCl3 +H2 – fluidized bed reactor at 500 to 700K – Condense chlorosilane, SiHCl3  Distillation of liquid SiHCl3  SiHCl3+H2Si + 3HCl at 1400K  Si vapor Deposits on Si mandrel in a purged fed batch reactor heated to 700K  Results Large diameter Si with impurities at 10 ppt or 14-9’s pure
  • 10. 12” (30 cm) Boule12” (30 cm) Boule
  • 12. Czochralski Crystal GrowthCzochralski Crystal Growth ApparatusApparatus  Figure 4. Today's Czochralski growth furnace, or crystal puller, is a far more sophisticated apparatus than that built by Gordon Teal nearly 50 years ago. It is however fundamentally identical. A crystal is pulled from a feedstock of molten material by slowly withdrawing it from the melt. Czochralski pullers often possess provisions for adding to the melt during a single pull so that crystals larger than what can be obtained in a single charge of the crucible may be produced. Today crystals of a 12-inch diameter are possible, and the industry will spend billions to adopt this new size in the coming years. This figure was taken directly from the Mitsubishi Semiconductor – website: http://www.egg.orjp/MSIL/ english/index-e.html!
  • 14. 12” (30 cm) Boule12” (30 cm) Boule
  • 15. Crystal Growth StepsCrystal Growth Steps Induce Supersaturation – Sub cooled melt – S=exp[T∫∆Hf/(RT2 )dT] Nucleation Growth at different rates on each Crystal Face Results in crystal with a particular Crystal Habit or shape
  • 16. NucleationNucleation  Free Energy – GTOT=∆Gv V + γA  Critical Size – R*=2βAγVm/(3βvRgT lnS)  Nucleation Rate  J=(2D/d5 )exp[- ∆G(R*)/(RgT)]  D=diffusion coefficient  d= molecular diameter
  • 17. Surface NucleationSurface Nucleation  Surface energy, γ, is replaced by γ cos θ, where θ is the contact angle between phases  Geometric factors changed  Units #/(cm2 sec)  Surface Nucleation – Limits growth of flat crystal surfaces
  • 18. Crystal GrowthCrystal Growth  Boundary Layer Diffusion  Surface Diffusion  Edge Diffusion  Kink Site Adsorption  Loss of Coordination shell at each step
  • 19. Crystal Growth RateCrystal Growth Rate Limiting StepsLimiting Steps  Boundary Layer Diffusion  Surface Diffusion  Surface Nucleation – Mono – Poly  Screw Disslocation  Edge Diffusion  Kink Site Adsorption  Loss of Coordination shell
  • 20. Screw Surface GrowthScrew Surface Growth
  • 22.
  • 23. Mass Transfer to Rotating CrystalMass Transfer to Rotating Crystal  Local BL-MT Flux  J[mole/(cm2 s)] = 0.62 D2/3 (Co-Ceq) ν-1/6 ω1/2  J[mole/(cm2 s)] = 0.62 D2/3 Ceq(S-1) ν-1/6 ω1/2 – Franklin, T.C. Nodimele, R., Adenniyi, W.K. and Hunt, D., J. Electrochemical Soc. 135,1944-47(1988). – Uniform, not a function of radius!!  Crystal Growth Rate due to BL-MT as Rate Determining Step
  • 24. Heat Transfer to Rotating CrystalHeat Transfer to Rotating Crystal  Local BL-HT Flux  J[mole/(cm2 s)] = h(Teq-T)/∆Hf  J[mole/(cm2 s)] • = 0.62 k α-1/3 ν-1/6 ω1/2 (Teq-T)/∆Hf – Franklin, T.C. Nodimele, R., Adenniyi, W.K. and Hunt, D., J. Electrochemical Soc. 135,1944-47(1988). – Uniform, not a function of radius!!  Crystal Growth Rate due to BL-HT as Rate Determining Step
  • 25. Crystal HabitCrystal Habit Equilibrium Shape – h1/γ1=h2/γ2=h3/γ3 Kinetic Shape – h1=G1(S)*t – h2=G2 (S)* t – h3=G3 (S)* t
  • 26. Crystal FacesCrystal Faces  Flat Face  Stepped Face  Kinked Face  Diffusion Distances to Kink sites are shorter on K &S Faces
  • 28. Wafers Cut from Boule & PolishedWafers Cut from Boule & Polished