SPICE MODEL of TLP620 in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS : PHOTOCOUPLER
PART NUMBER : TLP620
MANUFACTURER : TOSHIBA
Bee Technologies Inc.
All Rights Reserved Copyright (C) Bee Technologies Corporation 2008

2. DIODE MODEL
Pspice model
Model description
Parameter
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
BIPOLAR JUNCTION TRANSISTOR MODEL
Pspice
model Model description
parameter
NR Reverse Emission Coefficient
RB Base Resistance
RC Series Collector Resistance
CJE Zero-bias Emitter-Base Junction Capacitance
CJC Zero-bias Collector-Base Junction Capacitance
TF Forward Transit Time
TR Reverse Transit Time
VOLTAGE CONTROLLED VOLTAGE SOURCE MODEL(VCVS)
E<Name><(+)Node><(－)Node>VALUE={Expression}
E<Name><(+)Node><(－)Node>TABLE={Expression}
VOLTAGE CONTROLLED CURRENT SOURCE MODEL(VCCS)
E<Name><(+)Node><(－)Node>VALUE={Expression}
All Rights Reserved Copyright (C) Bee Technologies Corporation 2008

3. CURRENT CONTROLLED MODEL(W)
Pspice Model description
model
parameter
IOFF Controlling current to Off state
ION Controlling current to On state
ROFF Off Resistance
RON On Resistance
All Rights Reserved Copyright (C) Bee Technologies Corporation 2008

4. LED IV Curve Characteristics
Simulation result
100mA
50mA
-0mA
-50mA
-100mA
-2.0V -1.0V 0V 1.0V 2.0V
I(I1)
V(U1:A)
Evaluation Circuit
U1
V1
I1 1.1 5Vd c
10 mAd c
TL P62 0
0 0
All Rights Reserved Copyright (C) Bee Technologies Corporation 2008

5. Comparison Graph
100
Measurement
90 Simulation
80
70
60
Ifwd (mA)
50
40
30
20
10
0
0.4 0.6 0.8 1 1.2 1.4 1.6
VF (V)
Comparison Table
Vfwd(V)
Ifwd (mA) % Error
Measurement Simulation
0.100 0.910 0.919 0.989
0.200 0.948 0.952 0.422
0.500 1.002 0.996 -0.569
1.000 1.035 1.030 -0.502
2.000 1.068 1.065 -0.309
5.000 1.110 1.113 0.306
10.000 1.150 1.155 0.461
20.000 1.200 1.206 0.500
50.000 1.310 1.304 -0.435
100.000 1.430 1.430 -0.014
All Rights Reserved Copyright (C) Bee Technologies Corporation 2008

6. Comparison Graph
0
10
20
30
40
- Ifwd (mA)
50
60
70
80
90 Measurement
Simulation
100
1.6 1.4 1.2 1 0.8 0.6 0.4
- VF (V)
Comparison Table
Vfwd(V)
Ifwd (mA) % Error
Measurement Simulation
-100.000 -1.430 -1.430 -0.014
-50.000 -1.310 -1.304 -0.435
-20.000 -1.200 -1.206 0.500
-10.000 -1.150 -1.155 0.461
-5.000 -1.110 -1.113 0.306
-2.000 -1.068 -1.065 -0.309
-1.000 -1.035 -1.030 -0.502
-0.500 -1.002 -0.996 -0.569
-0.200 -0.948 -0.952 0.422
-0.100 -0.910 -0.919 0.989
All Rights Reserved Copyright (C) Bee Technologies Corporation 2008

7. Transistor Saturation Characteristics
Simulation result
400mV
200mV
0V
0s 5ms 10ms 15ms 20ms
V(U1:C)
Time
Evaluation Circuit
V2 V1
0V dc 0V dc
U1
I1 I2
1m 0.2 mAdc
TL P62 0
0 0
Comparison Table
Measurement Simulation % Error
VCE(sat) (V) 0.4 (Max) 0.141 -
All Rights Reserved Copyright (C) Bee Technologies Corporation 2008

8. CTR(Current Transfer Ratio) Characteristics
Simulation result
500
400
300
200
100
1
100uA 1.0mA 10mA 100mA
(I(V1)/I(V2))*100
I_I1
Evaluation Circuit
V2 V1
0V dc 0V dc
U1
V3
I1 5
5m
TL P62 0
0 0
All Rights Reserved Copyright (C) Bee Technologies Corporation 2008

9. Rise Curve Table
IO/IF
If (mA) % Error
Measurement Simulation
0.300 59.000 56.973 -3.436
0.500 93.000 97.376 4.705
1.000 150.000 151.527 1.018
2.000 210.000 205.335 -2.221
5.000 290.000 276.193 -4.761
10.000 332.000 329.861 -0.644
15.000 333.500 350.133 4.987
Fall Curve Table
IO/IF
If(mA) % Error
Measurement Simulation
15.000 333.500 350.133 4.987
20.000 290.000 280.538 -3.263
50.000 140.000 143.361 2.401
60.000 120.000 116.540 -2.883
All Rights Reserved Copyright (C) Bee Technologies Corporation 2008

10. Switching Time Characteristics
Simulation result
6.0V
1 2
16mA
5.0V
>>
0V 0A
5us 20us 40us 60us 80us 100us 120us 140us
1 V(U1:C) 2 I(V2)
Time
Evaluation Circuit
V2 R1
1.9 k
0V dc
U1
I1 = 0
I2 = 16 m I1 V1
TD = 1 0u 5
TF = 10n
TR = 1 0n
TL P62 0
PW = 5 0u
PE R = 20 0u
0 0
Comparison Table
IF=16mA, RL=1.9k Measurement Simulation % Error
tS (us) 15.000 15.024 0.160
tOFF (us) 25.000 25.022 0.088
All Rights Reserved Copyright (C) Bee Technologies Corporation 2008