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Device Modeling Report



COMPONENTS:
DIODE/ GENERAL PURPOSE RECTIFIER/ STANDARD
PART NUMBER: 1SS412
MANUFACTURER: TOSHIBA




                   Bee Technologies Inc.

     All Rights Reserved Copyright (C) Bee Technologies Inc. 2008

                                -1-
DIODE MODEL PARAMETERS

PSpice model
                                    Model description
 parameter
     IS        Saturation Current
     N         Emission Coefficient
     RS        Series Resistance
    IKF        High-injection Knee Current
    CJO        Zero-bias Junction Capacitance
     M         Junction Grading Coefficient
     VJ        Junction Potential
    ISR        Recombination Current Saturation Value
     BV        Reverse Breakdown Voltage(a positive value)
    IBV        Reverse Breakdown Current(a positive value)
     TT        Transit Time
    EG         Energy-band Gap




           All Rights Reserved Copyright (C) Bee Technologies Inc. 2008

                                      -2-
Forward Current Characteristic

Circuit Simulation Result


           100mA




            10mA




           1.0mA




           100uA




            10uA
                   0V       0.2V    0.4V         0.6V          0.8V   1.0V       1.2V   1.4V
                        I(R1)
                                                        V_V1
Evaluation Circuit

                                    R1

                                     0.01m



                               V1                U1
                        0Vdc                 1SS412                     R2
                                                                        100MEG




                                             0




                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2008

                                                   -3-
Comparison Graph

Circuit Simulation Result




Simulation Result

                                     Vfwd (V)
             Ifwd (A)                                                   %Error
                            Measurement     Simulation
                0.00001            0.655           0.658                         0.40
                0.00002            0.682           0.680                        -0.22
                0.00005            0.710           0.710                         0.00
                 0.0001            0.735           0.733                        -0.29
                 0.0002            0.757           0.756                        -0.19
                 0.0005            0.785           0.786                         0.08
                   0.001           0.812           0.809                        -0.41
                   0.002           0.831           0.832                         0.09
                   0.005           0.861           0.863                         0.22
                    0.01           0.889           0.888                        -0.15
                    0.02           0.912           0.914                         0.27
                    0.05           0.957           0.957                         0.00
                     0.1           1.003           1.001                        -0.24
                     0.2           1.064           1.065                         0.08


                 All Rights Reserved Copyright (C) Bee Technologies Inc. 2008

                                            -4-
Capacitance Characteristic

Circuit Simulation Result

           3.5p



           3.0p




           2.0p




           1.0p




               0
              100mV                     1.0V                     10V              50V
                  I(V2)/(80V/1u)
                                                 V(N11503)

Evaluation Circuit

                                          V2



                                          0Vdc



                     V1 = 0       V1
                     V2 = 80                                    U1
                     TD = 0                                     1SS412   R1
                     TR = 1u
                     TF = 50ns                                           100MEG
                     PW = 5us
                     PER = 10us




                                               0




                  All Rights Reserved Copyright (C) Bee Technologies Inc. 2008

                                               -5-
Comparison Graph

Circuit Simulation Result




Simulation Result

                                      Ct (pF)
              Vrev (V)                                                 %Error
                            Measurement     Simulation
                      0.1          2.797           2.802                     0.16
                      0.2          2.664           2.670                     0.23
                      0.5          2.387           2.381                    -0.26
                        1          2.094           2.080                    -0.69
                        2          1.767           1.744                    -1.32
                        5          1.280           1.314                     2.66
                       10          1.008           1.039                     3.08
                       20          0.802           0.814                     1.50
                       50          0.603           0.583                    -3.32




                 All Rights Reserved Copyright (C) Bee Technologies Inc. 2008

                                            -6-
Reverse Recovery Characteristic

Circuit Simulation Result
            400mA


            300mA


            200mA


            100mA


             -0mA


           -100mA


           -200mA


           -300mA


           -400mA
               19.4us              19.8us        20.2us           20.6us    21.0us    21.4us
                    I(R1)
                                                           Time

Evaluation Circuit

                                            R1


                                                 50

                      V1 = -9V
                      V2 = 11.1V
                      TD = 100ns     V1
                      TR = 10ns                                                  R2
                      TF = 9ns                            U1
                      PER = 50us                                                 100MEG
                                                      1SS412
                      PW = 20us




                                                      0




Compare Measurement vs. Simulation

                                   Measurement                     Simulation             %Error
           trj        ns                          92.00                    91.379              -0.67




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2008

                                                          -7-
Reverse Recovery Characteristic                                        Reference

Measurement




Trj =92(ns)
Trb= 220(ns)
Conditions: Ifwd=0.2A,Irev=0.2A, Rl=50




                                                          Example




                               Relation between trj and trb

                All Rights Reserved Copyright (C) Bee Technologies Inc. 2008

                                           -8-

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SPICE MODEL of 1SS412 (Standard Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: DIODE/ GENERAL PURPOSE RECTIFIER/ STANDARD PART NUMBER: 1SS412 MANUFACTURER: TOSHIBA Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 -1-
  • 2. DIODE MODEL PARAMETERS PSpice model Model description parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 -2-
  • 3. Forward Current Characteristic Circuit Simulation Result 100mA 10mA 1.0mA 100uA 10uA 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V I(R1) V_V1 Evaluation Circuit R1 0.01m V1 U1 0Vdc 1SS412 R2 100MEG 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 -3-
  • 4. Comparison Graph Circuit Simulation Result Simulation Result Vfwd (V) Ifwd (A) %Error Measurement Simulation 0.00001 0.655 0.658 0.40 0.00002 0.682 0.680 -0.22 0.00005 0.710 0.710 0.00 0.0001 0.735 0.733 -0.29 0.0002 0.757 0.756 -0.19 0.0005 0.785 0.786 0.08 0.001 0.812 0.809 -0.41 0.002 0.831 0.832 0.09 0.005 0.861 0.863 0.22 0.01 0.889 0.888 -0.15 0.02 0.912 0.914 0.27 0.05 0.957 0.957 0.00 0.1 1.003 1.001 -0.24 0.2 1.064 1.065 0.08 All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 -4-
  • 5. Capacitance Characteristic Circuit Simulation Result 3.5p 3.0p 2.0p 1.0p 0 100mV 1.0V 10V 50V I(V2)/(80V/1u) V(N11503) Evaluation Circuit V2 0Vdc V1 = 0 V1 V2 = 80 U1 TD = 0 1SS412 R1 TR = 1u TF = 50ns 100MEG PW = 5us PER = 10us 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 -5-
  • 6. Comparison Graph Circuit Simulation Result Simulation Result Ct (pF) Vrev (V) %Error Measurement Simulation 0.1 2.797 2.802 0.16 0.2 2.664 2.670 0.23 0.5 2.387 2.381 -0.26 1 2.094 2.080 -0.69 2 1.767 1.744 -1.32 5 1.280 1.314 2.66 10 1.008 1.039 3.08 20 0.802 0.814 1.50 50 0.603 0.583 -3.32 All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 -6-
  • 7. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 19.4us 19.8us 20.2us 20.6us 21.0us 21.4us I(R1) Time Evaluation Circuit R1 50 V1 = -9V V2 = 11.1V TD = 100ns V1 TR = 10ns R2 TF = 9ns U1 PER = 50us 100MEG 1SS412 PW = 20us 0 Compare Measurement vs. Simulation Measurement Simulation %Error trj ns 92.00 91.379 -0.67 All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 -7-
  • 8. Reverse Recovery Characteristic Reference Measurement Trj =92(ns) Trb= 220(ns) Conditions: Ifwd=0.2A,Irev=0.2A, Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (C) Bee Technologies Inc. 2008 -8-