1. Difference between Sem and Tem:
Scanning electron microscope (Sem)
• Sem stands for Scanning electron microscope
• SEM creates an image by detecting reflected or knocked-
off electrons.
• Surface of the sample
• Image is 3 dimensional.
• The magnification is maximum 2 million .
• The resolution is 0.4nanometers
• The medium of SEM is vaccum .
• Field of view is large
• Voltage require is high .(50 to 30000).
• Required less time compared with TEM.
• Sample can be thick or thin
• Less preparation sample required
Transmission electron microscope
(tem)
• Tem stands for transmission electron microscope.
• TEM uses transmitted electrons (electrons that are
passing through the sample) to create an image.
• Internal surface of the sample
• Image is 2 Dimensional
• The magnification is maximum of 50 million.
• The resolution is 0.5angstroms
• The medium of TEM is vaccum
• Field of view is small
• Voltage require is low
• Long process Required more times when
compared to SEM
• Sample can be ultrathin
• More sample preparation required
3. • Similarities of Scanning electron microscope and Transmission
electron microscope :
• some similarities between the scanning electron microscope
(SEM) and Transmission electron microscope (TEM) are as follows:
• Object types
• Source of radiation
• Medium
• Nature of lenses
• Magnification adjustment.
• Focusing
Similarities between SEM and TEM:
4. SEM vs TEM summary of advantages :
Both SEMs and TEMs have unique advantages when compared to one another.
• Compared to TEMs, SEMs cost less to procure, take less time to
generate an image, require less time for specimen preparation,
accept thicker samples that are much larger.
• Compared to SEMs, TEMs generate higher-resolution images, provide
atomic and crystallographic data, produce 2D images that are easier to
interpret than 3D SEM images, and allow users to examine additional
characteristics of a given sample.
5. Difference between XRD and SEM
XRD
• XRD stands for X-ray diffraction
• XRD is limited to small samples, and works best
with flat things.
SEM
• SEM stands for Scanning electron microscope
• SEM-EDS can produce structural information or
material composition information. It additionally
provides images of the surface of an object at
extremely high magnifications.
• XRD shows particle size of 40 nm • SEM reveals particle size of 20 nm
• SEM is used for particle size. Both are
different.
• XRD is used for crystalline size
6. Difference between XRD and TEM
XRD
• XRD can gives a crystal size distribution related to
the millions of diffracted crystals illuminated by X
ray during the experiment.
TEM
• TEM is good for morphology scan but it required a
quite huge number of images for statistical
reliability which is not an easy and cheap thing.
• From the XRD patterns, you can calculate the
average crystallite size b
• From TEM, you can calculate the
particle size.
