This document provides instructions for identifying the leads of various transistor types and testing transistors with an ohmmeter to determine if they are good or defective. It describes several methods for identifying the emitter, base, and collector leads based on the transistor packaging and markings. It also outlines three tests to perform with an ohmmeter: forward bias tests of the base-emitter and base-collector junctions, and a leakage current test between the emitter and collector. The results of these tests can indicate whether a transistor is good or defective.