This document summarizes the modeling and simulation of a TPC8029 power MOSFET. It includes:
1) Details of the MOSFET model parameters and equations used in the Pspice simulation.
2) Simulation results and comparisons to measurement data for key MOSFET characteristics like transconductance, Vgs-Id, output characteristics, and switching times.
3) The model for the internal body diode and simulation results for forward and reverse recovery characteristics compared to measurements.
4) A diagram showing the relationship between reverse recovery times trj and trb.
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SPICE MODEL of TPC8029 (Standard+BDS Model) in SPICE PARK
1. Device Modeling Report
COMPONENTS: Power MOSFET (Model Parameter)
PART NUMBER: TPC8029
MANUFACTURER: TOSHIBA
Body Diode (Model Parameter)
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
2. Circuit Configuration
MOSFET MODEL
Pspice model
Model description
parameter
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Modility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
3. Transconductance Characteristic
Circuit Simulation Result
30
Measurement
Simulation
25
20
gfs
15
10
5
0
0 1 2 3 4 5
ID : Drain Current A
Comparison table
gfs
Id(A) Error(%)
Measurement Simulation
0.200 5.445 5.714 4.940
0.500 8.330 8.091 -2.869
1.000 12.680 12.821 1.112
2.000 18.736 18.018 -3.832
5.000 29.500 28.249 -4.241
All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
13. Reverse Recovery Characteristic
Circuit Simulation Result
400mA
200mA
0A
-200mA
-400mA
19.92us 20.00us 20.08us 20.16us 20.24us 20.32us
I(R1)
Time
Evaluation Circuit
R1
50
V1 = -9.5V V1
V2 = 10.6V
TD = 10n
TR = 10ns TPC8029
TF = 19ns U1
PW = 20us
PER = 100us
0
Compare Measurement vs. Simulation
Measurement Simulation Error (%)
Trj(ns) 22.400 22.248 -0.679
All Rights Reserved Copyright (c) Bee Technologies Inc. 2007
14. Reverse Recovery Characteristic Reference
Trj=22.4(ns)
Trb=86.4(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50
Example
Relation between trj and trb
All Rights Reserved Copyright (c) Bee Technologies Inc. 2007