The document provides information about scanning tunneling microscopy (STM). It begins by explaining the quantum mechanical principles behind STM, specifically electron tunneling. It then describes the key components of an STM, including the scanning tip, piezoelectric scanner, distance control system, data processing unit, and vibration isolation system. The document discusses the two main imaging modes of STM - constant height mode and constant current mode. It also outlines how STM works by applying a voltage bias between the tip and sample and measuring the tunneling current. The document concludes by discussing advantages and disadvantages of STM as well as sources of artifacts in STM images.