- Lou Chen is a test engineer with over 8 years of experience designing, developing, and implementing cost-effective test solutions at Texas Instruments, including developing the first 16-site strip solution for an ARM MCU and generating a less than 10% COB test solution for an audio codec with stereo class-D speaker amplifier. - Lou holds a Master's degree in Electric Engineering from National Cheng Kung University and a Bachelor's degree in Electronics Engineering from I-Shou University. - Lou's achievements at Texas Instruments include developing the first jitter measurement solution for a phase-locked loop device and saving 60% in test costs by converting a tester platform.

1. Lou Chen
3521 Haversham Dr +886-918-743-004
Plano Texas 75023 lou@ti.com
(currently have an international assignment in Taiwan.)
Strength
Around 8 years of extensive professional experience in designing,
developing, and implementing cost-effective test solutions. Design
test fixtures and equipment, completes specifications and procedures
for new products. Excellent hardware and software debugging skills.
Award
Make Member of Technical Staff (MMTS) at TI
• Was recognized for the direct contributions to revenue/profit,
developing top technical talent.
Professional Skill
• Professional in Teradyne Catalyst Programming, TI developed ATE
Programming, DataPower (data analysis), Spotfire (data analysis),
Mentor Graphics design capture (Schematic.)
• Certificated Training of Teradyne Catalyst, Teradyne I-FLEX, TI
developed ATE testing.
• Experienced in Pascal, C++.
Education
National Cheng Kung University, Taiwan 2001~2003
Master of Science in Electric Engineering
• Studied surface acoustic wave filter circuit design and
• Emphasized in RF circuit theory and application.
I-Shou University, Taiwan 1997~2001
Bachelor of Science in Electronics Engineering
• Developed the software for grounding schemes on rail potential
and stray current for a single train simulation in the Taipei rail
transit system.
• Emphasized in RF circuit theory.
Career
Texas Instruments, Dallas, Texas
Test Engineer 11/2007 – present
• Achievement

2. • Developed the 1st 16-site Strip solution for the
pressure/temperature sensor embedded ARM MCU for the
industrial group.
• Developing a solution for trimming and testing digital input
3.5W Class-D audio amplified with boost and speaker IV-sense.
• Proposed a creative idea about two different pitches on a WCSP
socket and implemented the test solution.
• Generated a <10% COB test solution for audio codec with
stereo class-D speaker amplifier (1.4W) for HTC and so on.
• Developed a <10% COB test solution for custom device which
has low power audio codec With Embedded miniDSP for
Blackberry Torch.
• Developed the first octal-site WSP test solution and achieved
cost-effective test solution by Implementing C-routine codes.
• Worked with application engineer on bench for SONY returns.
Implemented a current trip test to identify the issue.
• Supported Nintendo returns, implemented a test to screen the
units. Successfully identified the issue.
Texas Instruments, Taipei, Taiwan
Test Engineer 07/2005 – 10/2007
• Achievement
• Implemented the first jitter measurement at final and probe test
on VLCT for a phase-locked loop device. Additionally, proved
that VLCT is capable of 40ps jitter measurement, and has better
performance than Catalyst and lower cost.
• Saved 60% test cost from converting the test solution for PLL
devices from HP tester to VLCT.
• Improved the SNR by on board notch filter
• Developed several test platform conversion projects for
PCM1733/44, PCM1807, PCM1801, and released to TI
Malaysia.
• Mentored new hires in basic computer language and
troubleshooting skill on production line.
Product Engineer 07/2003 – 06//2005
• Achievement
• Was in charge of VLCT test solutions for baseband devices and
Catalyst/A580 test solutions for MSP430 series devices.
Debugged hardware problems, trouble shoot tester issues, and
improved yield, and especially worked on test time reduction
for TWL3016 and TLS2300.

3. • Worked with the test engineer to identify a test issue which was
caused by 60Hz noise induced from AC power source of the
handlers, and solved the issue with the Japanese handler vendor.