DFR Conference, March 2019 Securing your supply chain from counterfeit parts through real time electronic chip traceability - published v2 ITC 2015 - Marvell Present : "Improving Quality and Yield Through Optimal+ Big Data Analytics". Breakthrough in Quality Management Scs14 optimal presentation leveraging test data - apr 2014 Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA Improvements 
