Pete Sarson, PH.D , profile picture

Pete Sarson, PH.D

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Politecnico di Torino Test Engineering Lecture
Arizona State University Test Lecture
Use Models for Extending IEEE 1687 to Analog Test
A Technique for Dynamic Range Improvement of Intermodulation Distortion Products for an Interpolating DAC-based Arbitrary Waveform Generator Using a Phase Switching Algorithm
Test time efficient group delay filter characterization technique using a discrete chirped excitation signal
Low supply voltage test to screen resistive bridges in OTPs with dppm data
Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs
Yield improvement of an eeprom for automotive applications
Getting to 0ppm - Automotive Session
ACR BER Correlation to ATE for a COFDM VHF RX
An example transition to 1687-based mixed-signal DFT
The future of Analogue Test - NMI DFT event
IDT2014 Chirp Presentation
Asian Test Symposium 2013 eeprom qualification
Idt2014 panel