James Benoit has over 15 years of experience in testing integrated circuits and electronic devices. He is proficient in various programming languages including C, C++, Java, and Python. Most recently, he worked as a validation technician testing architecture components. Prior to that, he held positions as a senior test engineer developing test programs and debugging integrated circuits. He also has experience providing technical support and instructing computer application classes.

1. JAMES BENOIT
Home 512-581-0649
Austin, Texas r8204c@gmail.com Mobile 512-636-9208
http://www.linkedin.com/in/jimbenoit
TECHNICAL SKILLS
• Designed, developed, tested and supervised the deployment of systems for evaluating electronic
devices. Post-Si Validation, Silicon debug, CPU architecture, SoC Peripherals (USB, UART), C Shell,
UNIX, C, C++, PERL, JAVA, JavaScript, PHP, MS Office, Visual Studio, XHTML, HTML5, CSS3, Visual
Basic, GPIB, VXI, Oscilloscope, DMM, Cisco CCNA, Dreamweaver, Photoshop, WordPress, Python, C#,
MySQL, Webmaster Certificate Program
• ATE Test Systems: Teradyne: J750 J973 UltraFlex Tiger Catalyst, HP82000, Eagle ETS600
PROFESSIONAL EXPERIENCE
Aditi Staffing, Austin, Texas August 2015-September 2015
Validation Technician - Architecture Validation Components Department
• Knowledgeable in Integrated Circuits, Electronics, and schematics.
• Knowledgeable in use of tools such as ATE testers, Oscilloscope, Digital Multi-meter, microscope.
Adecco Technical, Austin, Texas January 2010-April 2015
Final Test Technician, DSM, Etch, MDP and CMP Departments
• Utilized routine work orders, schematics, wiring diagrams, parts and wire lists, written and/or verbal
instructions to build, repair and/or test electrical, electro-mechanical, vacuum, pneumatic assemblies,
subassemblies and components.
• Performed electro-mechanical assembly operations, troubleshooting and repair.
• Utilized test fixtures, electronic measurement equipment, leak detectors, and/or vacuum pumps to test
assemblies, subassemblies and components. Entered data on computer terminal, such as progress, work
expense and labor details.
• Received parts and performed audits to ensure all necessary parts were available to perform build, test
and repair. Inspected parts for defects. Troubleshot and improved processes.
• Worked from highly complex test procedures, electro/mechanical schematics, diagrams, written and/or
verbal descriptions, and layouts to perform testing, checkout, and troubleshooting functions.
Coastal Bend College, Beeville, Texas January 2012-September 2013
Computer Applications Instructor, Prison Programs
• Demonstrated a thorough and accurate knowledge of MS Office and proficient in the latest version
• Responsible for instructing classes, ordering supplies, registration of students and other related
instructional duties.
• Passed federal government background check.
• Planned and organized instruction in ways that maximized student learning and effectively employed
available instructional technology.
• Encouraged the development of communication skills and higher order thinking skills through appropriate
assignments.
• Developed evaluation methods which fairly measured student progress toward outcomes.
• Maintained accurate records of student progress.
Aerotek, Austin, Texas May 2010-October 2010
Test Engineer, Integrated Circuit Test Department
• Researched, developed, designed and tested electrical components, and systems.

2. • Programmed, tested and debugged integrated circuits using Eagle ETS600.
JAMES BENOIT Page 2
Unisys Technical Services, Austin, Texas January 2009-January 2010
Help Desk Agent, Federal Queues Department
• Responsibilities included providing the first-line of post-sales telephone technical support of hardware,
systems, sub-systems and/or applications for customers and/or employees.
• Answered basic questions about installation, operation, configuration, customization, and usage of
assigned products.
• Applied basic diagnostic techniques to identify problems, investigated causes and recommended solutions
to correct common failures.
• Escalated complex problems to the Remote Support Engineering staff or Field Engineering.
Freescale Semiconductor Inc., Austin, Texas May 2006-November 2008
Senior Test Engineer, Networking and Multimedia Group
• Programmed Teradyne testers for Digital Signal Processor (DSP) integrated circuits in a New Product
Introduction (NPI) environment.
• Tested devices using HVST (High Voltage Stress Test), DDR, SRIO (Serial RapidIO), Bitmaps, Data
Retention, and DFT (Design For Test) techniques of BIST (Built In Self-Test) and SCAN.
• Generated test software for wafer probe in Taiwan, Singapore, Japan, Malaysia, and China.
• Discovered and corrected a software bug that caused inaccurate memory repair binning and had delayed
release of the software.
• Coordinated with Design, Processing, Test, Failure Analysis, and Application engineers, to support current
production devices, and manage revisions.
• Created a PERL script for test program documentation.
• Supported NPI product engineering from product definition through validation and launch.
TAC Worldwide Companies (TWC), Austin, Texas October 2005-April 2006
Senior Test Engineer, Wafer Probe Department
• Analyzed correlation of Split Gate Flash multi-site probe hardware and software.
• Devised innovative techniques for testing and characterizing leading edge VLSI devices including mixed
signal cell phone integrated circuits.
• Correlated setup of equipment and documented processes for a new test facility in China.
Teradyne Incorporated, Austin, Texas April 1999-September 2005
Field Application Engineer, Wafer Probe Department
• Developed test programs on Teradyne ATE with emphasis on coverage and test time.
• Supported ATE test hardware development, ATE test platform review and selection.
• Implemented contact resistance software to detect probe needles that were not making optimum contact
resulting in inaccurate testing.
• Traveled onsite to the customer whenever necessary to support installation and problem resolution.
• Corrected a memory leak in a repair routine that had caused testing to randomly stop generating serious
manufacturing interruptions.
• Characterized and debugged new products on ATE and worked with R&D (HW and SW) to assist with
product bring-up in the lab.
• Worked with Product team to provide and support cost reduction and yield enhancement. Taught test
programming classes and labs for VLSI digital testers.
EDUCATION
B.S. in Electronic Technology

3. Arizona State University, Tempe, Arizona