The document summarizes a technique called FERNS that uses the power-up state of SRAM cells to provide both device identification and random number generation capabilities without requiring additional hardware. SRAM power-up state varies across chips due to manufacturing variations, providing a fingerprint for identification. It also varies across power cycles due to noise, providing a source of randomness. FERNS was tested on both passive RFID tags and microcontrollers, demonstrating its potential low-cost applications for device identification and random number generation using only existing SRAM circuits.