1. The document discusses the optimization of a characterization bench for micro and nano optical components such as waveguides. 2. A key part of the optimization is the automatic control of piezo controllers to precisely align the fiber and waveguide facets, which is important for evaluating propagation losses using the Fabry-Perot interferometric method. 3. The characterization bench uses a tunable laser, infrared camera, and power meter to visualize and measure the optical mode and propagation losses in lithium niobate waveguides.