This document discusses biasing techniques for MOSFET amplifiers and MOSFET circuit design. It describes four common methods for biasing MOSFET amplifiers: 1) biasing by fixing the gate-source voltage, 2) biasing by fixing the gate voltage and connecting a source resistance, 3) biasing using a drain-to-gate feedback resistor, and 4) biasing using a constant current source. It also discusses implementing resistors, capacitors, and current mirrors using MOSFETs in integrated circuits. Common MOSFET amplifier configurations like the common source amplifier, common gate amplifier, and their analysis considering effects like body effect and channel-length modulation are presented.
Assignment 1 Description Marks out of Wtg() Due date .docxfredharris32
Assignment 1
Description Marks out of Wtg(%) Due date
Assignment 1 200 20 28 August 2015
Part A: Comparators and Switching (5%)
(1) Signal limit detector
Use a 339 comparator, a single 74LS02 quad NOR gate and a +5V power supply only to
design a circuit which will detect when a voltage goes outside the range +2.5V to +3.5V
and such that an LED lights and stays lit. Provide a manual reset to extinguish the LED.
Design hints
1. The circuit has an analog input and a digital output so some form of comparator circuit
is required. There are two thresholds so two comparators are required, with the analog
input applied to both. This arrangement is sometimes known as a window detector.
2. Arrange the output of the comparators to be +5V logic levels, and combine the two
outputs logically to produce one signal which is for example, high for out-of-range, and
low for within-range.
3. Latch the change from in-range to out-of-range.
Design procedure
1. Start at the output and work backwards.
2. Select a latch circuit (flip-flop) and determine what combinations of inputs are needed to
latch and then reset it, ensuring that the LED is connected correctly with regard to both
logic and current flow.
3. Determine the logic needed to combine two comparator outputs in such a way as to
correctly operate the latch.
4. Choose comparator outputs which will correctly drive the logic. Remember that the
reference voltage at the input of the comparator may be at either the + or – input.
5. Choose resistors to provide the correct reference voltages.
Note: You will need to consult data for both the 74LS02 and the 339 (see data sheets).
Test
It is strongly recommended that you assemble and test your circuit.
(2) MOSFET Switching
Find out information on the operation of, and configuring of, MOSFETs to be used in
switching circuits. In particular note the differences between BJTs and MOSFETs in this
role. Draw up a table to highlight the differences and hence the pros and cons on each
device for particular situations (eg. Switching high-to-low or low-to-high (ie. P or N type),
high or low current switching, low or high voltage switching).
Consider the following BJT switching circuit. Analyse the operation of the circuit to
understand the parameters involved. Choose suitable replacement MOSFETs to be used
ELE2504 – Electronic design and analysis 2
instead of the output switching BJTs in the given circuit. Include any necessary circuit
changes for the new devices to operate so as to maintain the circuit’s required parameters.
Where Vcc = 12V and Relay resistance = 15Ω .
ELE2504 – Electronic design and analysis 3
Part B: Transistor amplifier design (6%)
Design and test a common emitter amplifier using the circuit shown and the selected
specifications.
Specifications
Get your own spec ...
Part of Lecture series on EE321N, Power Electronics-I delivered by me during Fifth Semester of B.Tech. Electrical Engg., 2012
Z H College of Engg. & Technology, Aligarh Muslim University, Aligarh
Please comment and feel free to ask anything related. Thanks!
The manual is useful for PG students belongs to ME power Electronics and Drives
By
M.MURUGANANDAM. M.E.,(Ph.D).,MIEEE.,MISTE,
Assistant Professor & Head / EIE,
Muthayammal Engineering College,
Rasipuram,
Namakkal-637 408.
Cell No: 9965768327
Assignment 1 Description Marks out of Wtg() Due date .docxfredharris32
Assignment 1
Description Marks out of Wtg(%) Due date
Assignment 1 200 20 28 August 2015
Part A: Comparators and Switching (5%)
(1) Signal limit detector
Use a 339 comparator, a single 74LS02 quad NOR gate and a +5V power supply only to
design a circuit which will detect when a voltage goes outside the range +2.5V to +3.5V
and such that an LED lights and stays lit. Provide a manual reset to extinguish the LED.
Design hints
1. The circuit has an analog input and a digital output so some form of comparator circuit
is required. There are two thresholds so two comparators are required, with the analog
input applied to both. This arrangement is sometimes known as a window detector.
2. Arrange the output of the comparators to be +5V logic levels, and combine the two
outputs logically to produce one signal which is for example, high for out-of-range, and
low for within-range.
3. Latch the change from in-range to out-of-range.
Design procedure
1. Start at the output and work backwards.
2. Select a latch circuit (flip-flop) and determine what combinations of inputs are needed to
latch and then reset it, ensuring that the LED is connected correctly with regard to both
logic and current flow.
3. Determine the logic needed to combine two comparator outputs in such a way as to
correctly operate the latch.
4. Choose comparator outputs which will correctly drive the logic. Remember that the
reference voltage at the input of the comparator may be at either the + or – input.
5. Choose resistors to provide the correct reference voltages.
Note: You will need to consult data for both the 74LS02 and the 339 (see data sheets).
Test
It is strongly recommended that you assemble and test your circuit.
(2) MOSFET Switching
Find out information on the operation of, and configuring of, MOSFETs to be used in
switching circuits. In particular note the differences between BJTs and MOSFETs in this
role. Draw up a table to highlight the differences and hence the pros and cons on each
device for particular situations (eg. Switching high-to-low or low-to-high (ie. P or N type),
high or low current switching, low or high voltage switching).
Consider the following BJT switching circuit. Analyse the operation of the circuit to
understand the parameters involved. Choose suitable replacement MOSFETs to be used
ELE2504 – Electronic design and analysis 2
instead of the output switching BJTs in the given circuit. Include any necessary circuit
changes for the new devices to operate so as to maintain the circuit’s required parameters.
Where Vcc = 12V and Relay resistance = 15Ω .
ELE2504 – Electronic design and analysis 3
Part B: Transistor amplifier design (6%)
Design and test a common emitter amplifier using the circuit shown and the selected
specifications.
Specifications
Get your own spec ...
Part of Lecture series on EE321N, Power Electronics-I delivered by me during Fifth Semester of B.Tech. Electrical Engg., 2012
Z H College of Engg. & Technology, Aligarh Muslim University, Aligarh
Please comment and feel free to ask anything related. Thanks!
The manual is useful for PG students belongs to ME power Electronics and Drives
By
M.MURUGANANDAM. M.E.,(Ph.D).,MIEEE.,MISTE,
Assistant Professor & Head / EIE,
Muthayammal Engineering College,
Rasipuram,
Namakkal-637 408.
Cell No: 9965768327
Transistor DC voltmeter circuits, Emitter follower DC voltmeter, Op-Amp voltage follower DC Voltmeter, Amplifier based DC voltmeter for low voltage measurement, Op-Amp amplifier DC Voltmeter
CMOS Analog IC design by Dr GS Javed - Refresher Course - Batch 1Javed G S, PhD
Topics covered in the course
1. DC Biasing of the circuits
2. Circuits for reference voltage and current generation
-Voltage Regulator
-BGR
-LDO
-V-to-I
3. Precision Current References
4. Opamp design for Analog to digital converters
- OTA
- Buffer
- Unity Feedback OTA
- Layout design strategies – 2stage opamp + CMFB
5. Sense and Return mechanisms in Feedback circuits
- Current and Voltage circuits
6. Sub-Threshold Conduction
- Low voltage Operation
7. ADC Design and Simulation
-Near Nyquist performance of Opamp for ADC Circuits
-Spectral Analysis and No. of FFT Points for simulation
-Simulation time for performance
-Resistors – their variation and Calibration
-Switch design for S/H
-CDAC
8. On-Chip Inductors
Transistor DC voltmeter circuits, Emitter follower DC voltmeter, Op-Amp voltage follower DC Voltmeter, Amplifier based DC voltmeter for low voltage measurement, Op-Amp amplifier DC Voltmeter
CMOS Analog IC design by Dr GS Javed - Refresher Course - Batch 1Javed G S, PhD
Topics covered in the course
1. DC Biasing of the circuits
2. Circuits for reference voltage and current generation
-Voltage Regulator
-BGR
-LDO
-V-to-I
3. Precision Current References
4. Opamp design for Analog to digital converters
- OTA
- Buffer
- Unity Feedback OTA
- Layout design strategies – 2stage opamp + CMFB
5. Sense and Return mechanisms in Feedback circuits
- Current and Voltage circuits
6. Sub-Threshold Conduction
- Low voltage Operation
7. ADC Design and Simulation
-Near Nyquist performance of Opamp for ADC Circuits
-Spectral Analysis and No. of FFT Points for simulation
-Simulation time for performance
-Resistors – their variation and Calibration
-Switch design for S/H
-CDAC
8. On-Chip Inductors
Hierarchical Digital Twin of a Naval Power SystemKerry Sado
A hierarchical digital twin of a Naval DC power system has been developed and experimentally verified. Similar to other state-of-the-art digital twins, this technology creates a digital replica of the physical system executed in real-time or faster, which can modify hardware controls. However, its advantage stems from distributing computational efforts by utilizing a hierarchical structure composed of lower-level digital twin blocks and a higher-level system digital twin. Each digital twin block is associated with a physical subsystem of the hardware and communicates with a singular system digital twin, which creates a system-level response. By extracting information from each level of the hierarchy, power system controls of the hardware were reconfigured autonomously. This hierarchical digital twin development offers several advantages over other digital twins, particularly in the field of naval power systems. The hierarchical structure allows for greater computational efficiency and scalability while the ability to autonomously reconfigure hardware controls offers increased flexibility and responsiveness. The hierarchical decomposition and models utilized were well aligned with the physical twin, as indicated by the maximum deviations between the developed digital twin hierarchy and the hardware.
Literature Review Basics and Understanding Reference Management.pptxDr Ramhari Poudyal
Three-day training on academic research focuses on analytical tools at United Technical College, supported by the University Grant Commission, Nepal. 24-26 May 2024
KuberTENes Birthday Bash Guadalajara - K8sGPT first impressionsVictor Morales
K8sGPT is a tool that analyzes and diagnoses Kubernetes clusters. This presentation was used to share the requirements and dependencies to deploy K8sGPT in a local environment.
1. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 1
Biasing in MOSFET Amplifiers
• Biasing: Creating the circuit to establish the desired
DC voltages and currents for the operation of the
amplifier
• Four common ways:
1. Biasing by fixing VGS
2. Biasing by fixing VG and connecting a resistance in the
Source
3. Biasing using a Drain-to-Gate Feedback Resistor
4. Biasing Using a Constant-Current Source
2. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 2
Biasing in MOSFET Amplifiers
• Biasing by fixing VGS
When the MOSFET device is
changed (even using the same
supplier), this method can result in
a large variability in the value of
ID. Devices 1 and 2 represent
extremes among units of the same
type.
( )2
2
1
t
GS
n
D V
V
L
W
k
I −
′
=
ox
n
ox
ox
n
n C
t
k μ
ε
μ =
=
′
VDD
-VEE
VGG
RG
RD
RS
M1
VG
VD
VS
3. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 3
Biasing in MOSFET Amplifiers
• Biasing by fixing VG and connecting a resistance in the Source
Degeneration Resistance
4. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 4
Biasing in MOSFET Amplifiers
• Biasing using a Drain-to-Gate Feedback Resistor
Large Resistor
5. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 5
Biasing in MOSFET Amplifiers
• Biasing Using a Constant-Current Source
Figure 4.33 (a) Biasing the MOSFET using a constant-current source I. (b) Implementation of the constant-current source I
using a current mirror.
Current Mirror
Used in Integrated Circuits
6. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 6
Current Mirror DC Analysis
• The width and length (the W/L aspect
ratio) and the parameters of the two
transistors can be different
• We can choose W/L freely
• In this circuit, consider W/L of both
MOSFETs are the same and transistors
are identical. The Gate-Source voltages
are also the same, then
( )2
1
1
2
1
t
GS
n
REF V
V
L
W
k
I −
′
=
( )2
1
1
2
1
t
GS
n V
V
L
W
k
I −
′
=
REF
REF
I
I
W
L
L
W
I
I
=
=
⋅
= 1
1
1
1
1
W1
L1
VGS VGS
+
-
-
+
W1
L1
I
7. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 7
Current Mirror DC Analysis
• Designing IREF
R
V
V
V
I SS
GS
DD
REF
+
−
=
( )2
1
1
2
1
t
GS
n
REF V
V
L
W
k
I −
′
=
• It is often needed to find the value of R in order to
achieve a desired IREF
8. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 8
Biasing of MOSFET Amplifier
• 1- Intro to MOS Field Effect Transistor (MOSFET)
• 2- NMOS FET
• 3- PMOS FET
• 4- DC Analysis of MOSFET Circuits
• 5- MOSFET Amplifier
• 6- MOSFET Small Signal Model
• 7- MOSFET Integrated Circuits
• 8- CSA, CGA, CDA
• 9- CMOS Inverter & MOS Digital Logic
9. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 9
MOSFET Design Space
• Modern integrated circuits use MOSFETs
extensively
– Very high densities of transistors – up to 109
transistors/cm2 in some ULSI memory arrays.
– Off-chip discrete resistors and capacitors are NOT
commonly used
– On-chip resistors and capacitors generally small
– Multistage amplifiers are usually DC-coupled
• Transistors used wherever possible to implement
current sources, resistors, capacitors,
10. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 10
Using MOSFETs to implement R’s and C’s
• Resistors:
Active Loads (large R’s)
Diode-connected loads (small R’s)
MOSFET Triode-Region (moderate R’s)
• Capacitors
Most obvious is the gate-body capacitor
Can be used to have variable-capacitors as well
• Current Mirrors
11. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 11
MOSFET Active Loads
• MOSFETs used as an active load for high resistances:
– MOSFET is held in saturation with the source and gate
held at a constant DC voltage
– Drain connected to circuit
vgs = 0
gmvgs = 0
D
o
I
r
⋅
=
λ
1
– ro is inversely proportional to ID
Rin= ?
Rin=ro
12. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 12
Diode-Connected MOSFETs
• A Diode connected MOSFET can be used to achieve
small resistances:
– The Drain is directly connected to Gate, and therefore it
can only be operated in saturation (or cutoff)
Source Absorption Theorem
13. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 13
MOSFET Current Mirrors
• Used extensively in
MOSFET IC applications
• Often ro,is neglected. Since
there is no gate current, the
drain currents of M1 and M2
are identical
• In practice, IREF ≠ I due to
finite ro. (Not included in EC1)
VGS VGS
+
-
-
+
0 0
( ) )
1
(
2
1 2
1
1
X
t
X
n
REF V
V
V
L
W
k
I λ
+
−
′
=
1
1 DS
GS
X V
V
V =
=
VX
The current I will also depend on VDS2
I
14. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 14
Current Mirror DC Analysis
• The width and length (the W/L
aspect ratio) of MOSFETs can
be designed almost freely
• Since the W/L of M1 and M2
need not be the same, the size
ratios can affect current ratios
( )2
1
1
2
1
t
GS
n
REF V
V
L
W
k
I −
′
=
( )2
2
2
2
1
t
GS
n V
V
L
W
k
I −
′
=
1
1
2
2
W
L
L
W
I
I
REF
⋅
=
W1
L1
W2
L2
VGS VGS
+
-
-
+
I
15. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 15
Current Scaling (Steering)
• Ratio of
aspect ratios
can be
selected to
achieve
nearly any
scale factor
I/IREF
W
L
W
L
W
L
W
L
Note: All gates are connected
16. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 16
Current Mirroring – Pushing and Pulling
17. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 17
Small Signal
• Transistor M1 is diode
connected and acts like a
resistor to s.-s. ground.
ro2
18. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 18
Outline of Chapter 5
• 1- Intro to MOS Field Effect Transistor (MOSFET)
• 2- NMOS FET
• 3- PMOS FET
• 4- DC Analysis of MOSFET Circuits
• 5- MOSFET Amplifier
• 6- MOSFET Small Signal Model
• 7- MOSFET Integrated Circuits
• 8- CSA, CGA, CDA
• 9- CMOS Inverter & MOS Digital Logic
19. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 19
DC and AC - Body-Effect / CLM
Three types of analysis:
Neglect AC Body-Effect & AC CLM
/ Neglect AC CLM
Use AC Body-Effect
Use AC Body-Effect / Use CLM
Three types of analysis:
Neglect DC Body-Effect & DC CLM
/ Neglect DC CLM
Use DC Body-Effect
Use DC Body-Effect / Use DC CLM
DC Analysis
AC Analysis
(small-signal)
Use whatever
DC values for
V and I in the
small-signal
analysis
20. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 20
Common Source Amplifier (CSA)
• Current source I implemented
with current mirror.
• Current mirror provides
active load at drain
• Source terminal grounded –
no DC or AC Body effect
21. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 21
CSA with Current Mirror
CSA
ro2
22. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 22
CSA Small Signal Analysis
• From MOSFET
Current-Mirror:
only ro2 appears in
analysis
i
gs v
v =
1
( ) 1
2
1
1 gs
o
o
m
out v
r
r
g
v −
=
( )
2
1
1 o
o
m
i
out
V r
r
g
v
v
A −
=
=
23. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 23
CSA Input/Output Resistance
• Input Resistance
• Output resistance
2
1 o
o
OUT r
r
R =
vgs1 = 0
gm1vgs1 = 0
∞
⇒
IN
R
24. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 24
CSA Calculations
• In practice, difficult to keep all
transistors operating in saturation
VOUT is hard to control, and
sensitive to: W/L, VG, and
CLM
Ω
=
−
=
=
=
=
=
′
=
′
=
=
=
= −
k
R
V
V
V
V
L
W
L
W
k
k
V
V
V
V
REF
SS
DD
V
A
n
V
A
p
t
t
1
2
,
5
40
,
50
125
50
1
01
.
0
1
1
2
2
2
1
1
2
1
μ
μ
λ
λ
V
V
V
o
V
A
m
OUT
G
A
k
r
m
g
V
V
mA
I
V
V
100
52
.
38
192
.
5
855
.
3
596
.
2
567
.
2
1
−
=
Ω
=
=
=
=
=
Hand: SPICE:
V
V
V
OUT
G
A
V
V
mA
I
V
V
4
.
102
895
.
2
57
.
2
58
.
2
−
=
=
=
=
25. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 25
Common Gate Amplifier (CGA)
• A pMOS current mirror is used
as IREF including the output
resistance.
• Since source terminal not at
signal ground, the body effect is
present.
• The gate terminal held at a DC
voltage. (AC Ground)
Typically used as second stage of a
multi-stage amplifier circuit
26. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 26
CGA – DC Analysis
• Current mirror is assumed to be ideal
during the DC analysis, thus IREF=I
• DC voltage at the source terminal (VS)
must be obtained from driving the
current IREF through the transistor.
• This assumes that the input voltage
source VI is set to zero
• RI is part of the source voltage
• Solve for VO, with VS and VG known,
and including CLM
( ) ( )
[ ]
S
O
t
S
G
n V
V
V
V
V
L
W
k
I −
⋅
+
−
−
′
= λ
1
2
2
1
27. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 27
CGA
• Replace with a current source
including output resistance ro2
Choice of analysis:
Neglect AC Body-Effect & CLM
/ Neglect CLM
Use AC Body-Effect
Use AC Body-Effect / Use CLM
ro2
28. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 28
CGA – No Body Effect or CLM
2
o
gs
m
o r
v
g
v ⋅
−
=
I
I
m
m
gs v
R
g
g
v
+
−
=
1
1
1
1
I
m
o
I
o
V
R
g
r
v
v
A
+
=
=
1
2
i=0
Non Inverting
29. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 29
CGA – RIN & ROUT, No Body Effect or CLM
1
1
m
IN
g
R =
RIN
ROUT
2
o
OUT r
R =
vI = 0
30. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 30
CGA – With Body Effect & no CLM
( ) 2
1
1 o
x
mb
x
m
o r
v
g
v
g
v +
−
=
( ) 2
1
1 o
mb
m
x
o
V r
g
g
v
v
A +
=
=
x
gs
bs v
v
v −
=
= 1
1
( ) 2
1
1
1
1 o
bs
mb
gs
m
o r
v
g
v
g
v +
−
=
( )
I
IN
IN
o
mb
m
i
x
x
o
i
o
total
V
R
R
R
r
g
g
v
v
v
v
v
v
A
+
⋅
+
=
⋅
=
=
− 2
Include RI and
solve for total
voltage gain in
term of RIN
RIN
Solve at vx first:
vX
31. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 31
CGA – RIN With Body Effect & no CLM
x
mb
m
x v
g
g
i )
( 1
1 +
=
x
gs
bs v
v
v −
=
= 1
1
1
1
1
mb
m
IN
g
g
R
+
=
RIN
iIN
vX
Neglect Input
Voltage Source
x
mb
m
in v
g
g
i )
( 1
1 +
=
iX
32. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 32
CGA - With Body Effect & CLM
Neglect Input
Voltage Source
gs
x v
v −
=
2
o
x
o r
i
v ⋅
=
( )
1
1
1
o
o
x
x
mb
m
x
r
v
v
v
g
g
i
−
+
+
=
vX
iX
iX
( ) ⎟
⎟
⎠
⎞
⎜
⎜
⎝
⎛
+
+
⋅
=
= 1
1
1
2
1
1
mb
m
o
o
o
x
o
V g
g
r
r
r
v
v
A
33. Department of Electrical and
Computer Engineering
ECSE-330B Electronic Circuits I
MOSFETs 33
CGA – RIN With Body Effect & CLM
Neglect Input
Voltage Source
2
o
x
o r
i
v ⋅
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1
1
1
o
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x
x
mb
m
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r
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v
v
g
g
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−
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1
1
1
1
2
1
1
mb
m
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g
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r
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