This document discusses how intermittent faults are a major cause of No Fault Found (NFF) issues for the Department of Defense, costing $2-10 billion annually. Conventional testing methods are unable to detect intermittent faults. Universal Synaptics has developed intermittent fault detection technologies, the Intermittent Fault Detection and Isolation System (IFDIS) and Voyager Intermittent Fault Detector, which can test all circuit lines simultaneously and continuously with high sensitivity, significantly reducing NFF rates and costs for the DoD.
Bosch ConnectedWorld 2017: Striving for Zero DPPMDavid Park
Optimal+ CTO, Michael Schuldenfrei, explains how big data product analytics can significantly lower PPM rates for both semiconductors and electronic systems, raising the overall quality and reliability of mission-critical automotive systems.
Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA I...OptimalPlus
ITC 2013, Craig Nishizaki, Senior Director of ATE Development, NVIDIA
"Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA Improvements"
Bosch ConnectedWorld 2017: Striving for Zero DPPMDavid Park
Optimal+ CTO, Michael Schuldenfrei, explains how big data product analytics can significantly lower PPM rates for both semiconductors and electronic systems, raising the overall quality and reliability of mission-critical automotive systems.
Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA I...OptimalPlus
ITC 2013, Craig Nishizaki, Senior Director of ATE Development, NVIDIA
"Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA Improvements"
Through four use cases with examples, we describe how IEEE 1687 can be extended to include analog and mixed-signal chips, including linkage to circuit simulators on one end of the ecosystem and ATE on the other. The role of instrumentation, whether on the tester or on the device itself, is central to analog testing, and conveniently also the focal point of IEEE 1687. We identify enhancements to the modular netlist and test languages (ICL and PDL) to facilitate the description of the components involved in analog tests as well as the content of the tests themselves.
Seaward has over 70 years experience in the design manufacture of market-leading electrical test equipment. Seaward’s unrivalled range of electrical test equipment serves a wide variety of safety testing and precision measurement applications. For 25 years Seaward has been developing market-defining portable appliance testers, software and accessories for the PAT testing market.
The Cropico and Clare ranges of precision instruments and industrial electrical test equipment bolster Seaward’s product offering and demonstrate the result of 70 years of technical expertise across a number of industries including manufacturing, utilities and aerospace.
The all-inclusive Seaward electrical test equipment range now encompasses:
PAT Testing
Installation Testing
Electrical Test Tools
High Voltage Testing
Industrial Testing and Measurement
Micro Ohmmeters
Hipot Testers
Resistance Standards
Decade Boxes
When Agile is a Quality Game Changer Webinar - Michael Mah, Philip LewXBOSoft
Accelerate your Agile success with in-depth research and smarter decisions. Michael Mah of QSM Associates shows you what it takes to find and utilize patterns of successful Agile development in this quarterly XBOSoft webinar.
Infrastructure Testing: The Ultimate “Shift Left”TechWell
Organizations worldwide are continually required to make significant investments in upgrading, re-engineering, and protecting their IT infrastructure. However, unlike application software development, many companies lack a structured quality assurance approach for infrastructure testing. Creating an infrastructure quality practice is an answer, but it's not without its challenges. However, if your company is interested in avoiding headline-grabbing outages, rooted in deployment problems with infrastructure—server, network, storage, middleware, telephony, hardware, IT security, cloud, virtual, and Data Center Ops—then come to this session. Carl Delmolino and Hitesh Patel explain how to identify and address infrastructure testing opportunities, how to build a diversely skilled infrastructure test team, and how to apply familiar SDLC testing process rigor to enterprise-level infrastructure change. When addressed effectively, infrastructure testing is risk mitigation at the far end of “left,” reduces organizational technical risk, and helps ensure higher system availability for employees and customers, alike.
Advanced Continuous Test Automation presentation given by Marc Hornbeek, Sr. Solutions Architect for Spirent at the IEEE meeting Buenaventura chapter March 9, 2016.
Through four use cases with examples, we describe how IEEE 1687 can be extended to include analog and mixed-signal chips, including linkage to circuit simulators on one end of the ecosystem and ATE on the other. The role of instrumentation, whether on the tester or on the device itself, is central to analog testing, and conveniently also the focal point of IEEE 1687. We identify enhancements to the modular netlist and test languages (ICL and PDL) to facilitate the description of the components involved in analog tests as well as the content of the tests themselves.
Seaward has over 70 years experience in the design manufacture of market-leading electrical test equipment. Seaward’s unrivalled range of electrical test equipment serves a wide variety of safety testing and precision measurement applications. For 25 years Seaward has been developing market-defining portable appliance testers, software and accessories for the PAT testing market.
The Cropico and Clare ranges of precision instruments and industrial electrical test equipment bolster Seaward’s product offering and demonstrate the result of 70 years of technical expertise across a number of industries including manufacturing, utilities and aerospace.
The all-inclusive Seaward electrical test equipment range now encompasses:
PAT Testing
Installation Testing
Electrical Test Tools
High Voltage Testing
Industrial Testing and Measurement
Micro Ohmmeters
Hipot Testers
Resistance Standards
Decade Boxes
When Agile is a Quality Game Changer Webinar - Michael Mah, Philip LewXBOSoft
Accelerate your Agile success with in-depth research and smarter decisions. Michael Mah of QSM Associates shows you what it takes to find and utilize patterns of successful Agile development in this quarterly XBOSoft webinar.
Infrastructure Testing: The Ultimate “Shift Left”TechWell
Organizations worldwide are continually required to make significant investments in upgrading, re-engineering, and protecting their IT infrastructure. However, unlike application software development, many companies lack a structured quality assurance approach for infrastructure testing. Creating an infrastructure quality practice is an answer, but it's not without its challenges. However, if your company is interested in avoiding headline-grabbing outages, rooted in deployment problems with infrastructure—server, network, storage, middleware, telephony, hardware, IT security, cloud, virtual, and Data Center Ops—then come to this session. Carl Delmolino and Hitesh Patel explain how to identify and address infrastructure testing opportunities, how to build a diversely skilled infrastructure test team, and how to apply familiar SDLC testing process rigor to enterprise-level infrastructure change. When addressed effectively, infrastructure testing is risk mitigation at the far end of “left,” reduces organizational technical risk, and helps ensure higher system availability for employees and customers, alike.
Advanced Continuous Test Automation presentation given by Marc Hornbeek, Sr. Solutions Architect for Spirent at the IEEE meeting Buenaventura chapter March 9, 2016.
Best EXFO OTDR in India at affordable PricesSPI Engineers
The best EXFO OTDR in India on Industry-First, Integrated, Automated, Smart, Ease of Use, Compact, low price. We are an authorized distributor in India at affordable prices, if you are interested, please contact us- https://www.spiengineers.com/exfo/field-network-testing/
Are you looking for Maxtester 715 B Single-mode Handheld OTDR in India at affordable prices? Maxtester 715B is the best Single-mode handheld OTDR in India, The MAX-715B OTDR/iOLM is optimized for the point-to-point testing and troubleshooting of FTTx architectures, and is ideal for testing short fibers (e.g., inside a CO environment or at FTTA/DAS network installations). SPI is the best authorized distributor of EXFO maxtester 715b in India. If you want to buy now, so please contact more details- https://www.spiengineers.com/portfolio/maxtester-715b-last-mile-otdr/
Boundary scan has become an indispensable technology as engineers like you face increasing test challenges. Agilent is proud to introduce the new x1149 Boundary Scan Analyzer - bringing the best of our technology and vast test experience - to your workbench!
The MaxTester 730C (MAX-730C) is designed for testing through FTTH/PON splitters for end-to-end characterization. This handheld OTDR is ideal for FTTH/PON testing, live fiber troubleshooting and metro range testing. SPI Engineers is the Authorized Distributor of EXFO in India and offers EXFO make Network tools and services at competitive prices across the country. If you want to buy MaxTester 730C - PON/metro OTDR, so kindly contact for more details- https://www.spiengineers.com/portfolio/maxtester-730c-pon-metro-otdr/
Smart Traffic Lights that Learn ! Multi-Agent Reinforcement Learning Integ...Jonathan Laba
The University of Toronto’s Dr. Samah el-Tantawy has developed MARLIN-ATSC (Multi-agent Reinforcement Learning for Integrated Network of Adaptive Traffic Signal Controllers), an artificial intelligence traffic system that uses cameras and inter-system collaboration to determine how best to manage traffic flow throughout a region. MARLIN’s success is largely due to its adaptive nature, which allows it to learn and adjust as it gathers traffic pattern information.
Read more: http://www.utne.com/science-and-technology/marlin-transforms-traffic.aspx#ixzz2yxjuDpCP
visit http://techronto.com for more information like this.
Like its predecessor PROFIBUS, PROFINET is a diagnostic-rich protocol allowing your support team to quickly identify the source of device-related problems. This however is of limited use if the underlying performance of your network is poor. PROFINET networks are often seen as the plug and play solution for industrial networks, giving you the impression that successful completion of your application-specific testing is a guarantee that your network is working efficiently and without errors. This is fundamentally wrong and needs to be considered at the design stage as well as the acceptance stage of a project. This presentation will discuss the issues, how to address them and give typical examples of the equipment required.
Enabling Carrier-Grade Availability Within a Cloud InfrastructureOPNFV
Aaron Smith, Red hat, Pasi Vaananen, Red Hat
Carrier-Grade Cloud Infrastructure (Aaron Smith, Pasi Vaananen, Red Hat): The move from vertically integrated hardware and software to distributed execution in a cloud complicates the delivery of highly available services. Vertically integrated systems enabled all system layers required to communicate and participate in the support of availability of the service to be under control of single system vendor. With NFV, the cloud philosophy of infrastructure and application decoupling requires new open interfaces to support the necessary flow of information between layers and clear separation of the fault and availability management responsibilities between the infrastructure and application SW subsystems. Even in the cloud environment, traditional availability concepts such as fast detection, correlation, and fault notification still apply. A fast, low-latency fault management platform will be presented that allows cloud-based services to achieve 5NINES of availability and service continuity. Performance measurements from a prototype of the system will be presented along with a demo of the operation of a service requiring 50 ms fault remediation.
Design for Testability in Timely Testing of Vlsi CircuitsIJERA Editor
Even though a circuit is designed error-free, manufactured circuits may not function correctly. Since the manufacturing process is not perfect, some defects such as short-circuits, open-circuits, open interconnections, pin shorts, etc., may be introduced. Points out that the cost of detecting a faulty component increases ten times at each step between prepackage component test and system warranty repair. It is important to identify a faulty component as early in the manufacturing process as possible. Therefore, testing has become a very important aspect of any VLSI manufacturing system.Two main issues related to test and security domain are scan-based attacks and misuse of JTAG interface. Design for testability presents effective and timely testing of VLSI circuits. The project is to test the circuits after design and then reduce the area, power, delay and security of misuse. BIST architecture is used to test the circuits effectively compared to scan based testing. In built-in self-test (BIST), on-chip circuitry is added to generate test vectors or analyze output responses or both. BIST is usually performed using pseudorandom pattern generators (PRPGs). Among the advantages of pseudorandom BIST are: (1) the low cost compared to testing from automatic test equipment (ATE). (2) The speed of the test, which is much faster than when it is applied from ATE. (3) The applicability of the test while the circuit is in the field, and (4) the potential for high quality of test.
PROFINET is a member of a family providing industrial communications over Ethernet.
PROFINET is:
completely standard Ethernet (IEEE802.3).
High speed, operating at 100Mbit/s or faster over copper or fibre-optic cables,
makes use of existing IT standards. But, is “real-time” and deterministic,
PROFINET is very well thought out to incorporate all the requirements of automation and control systems.
PROFINET is totally compatible with PROFIBUS but is NOT PROFIBUS over Ethernet.
PROFINET wiring is quite different to PROFIBUS
PROFIBUS:
Uses multi-drop segments with many devices on one cable. Segments are separated by repeaters.
Two-core screened twisted pair cable.
Termination is in the hands of the user – many problems arise because of this.
PROFINET :
Multi-drop connection is not used; all cables connect just two devices together. Switches are used for branching to devices.
Four-core screened twisted pair cable.
Termination is provided within every Ethernet device; no longer in the hands of the user – should eliminate termination problems.
PROFINET – Commissioning Guideline
This is one of several free-to-download guidelines documents from PNO (PROFIBUS and PROFINET User Organisation).
It provides guidance on how to verify the installation aspects of the network as well as how to commission the live system.
These tests are additional to the application-specific, System Acceptance Testing that would usually be performed.
Failure to follow these guidelines puts you at risk of having your application tests pass without a detailed knowledge of the underlying performance of your network
Sterling Medical Devices is your Partner in Medical Device Development
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Adjusting primitives for graph : SHORT REPORT / NOTESSubhajit Sahu
Graph algorithms, like PageRank Compressed Sparse Row (CSR) is an adjacency-list based graph representation that is
Multiply with different modes (map)
1. Performance of sequential execution based vs OpenMP based vector multiply.
2. Comparing various launch configs for CUDA based vector multiply.
Sum with different storage types (reduce)
1. Performance of vector element sum using float vs bfloat16 as the storage type.
Sum with different modes (reduce)
1. Performance of sequential execution based vs OpenMP based vector element sum.
2. Performance of memcpy vs in-place based CUDA based vector element sum.
3. Comparing various launch configs for CUDA based vector element sum (memcpy).
4. Comparing various launch configs for CUDA based vector element sum (in-place).
Sum with in-place strategies of CUDA mode (reduce)
1. Comparing various launch configs for CUDA based vector element sum (in-place).
Levelwise PageRank with Loop-Based Dead End Handling Strategy : SHORT REPORT ...Subhajit Sahu
Abstract — Levelwise PageRank is an alternative method of PageRank computation which decomposes the input graph into a directed acyclic block-graph of strongly connected components, and processes them in topological order, one level at a time. This enables calculation for ranks in a distributed fashion without per-iteration communication, unlike the standard method where all vertices are processed in each iteration. It however comes with a precondition of the absence of dead ends in the input graph. Here, the native non-distributed performance of Levelwise PageRank was compared against Monolithic PageRank on a CPU as well as a GPU. To ensure a fair comparison, Monolithic PageRank was also performed on a graph where vertices were split by components. Results indicate that Levelwise PageRank is about as fast as Monolithic PageRank on the CPU, but quite a bit slower on the GPU. Slowdown on the GPU is likely caused by a large submission of small workloads, and expected to be non-issue when the computation is performed on massive graphs.
Opendatabay - Open Data Marketplace.pptxOpendatabay
Opendatabay.com unlocks the power of data for everyone. Open Data Marketplace fosters a collaborative hub for data enthusiasts to explore, share, and contribute to a vast collection of datasets.
First ever open hub for data enthusiasts to collaborate and innovate. A platform to explore, share, and contribute to a vast collection of datasets. Through robust quality control and innovative technologies like blockchain verification, opendatabay ensures the authenticity and reliability of datasets, empowering users to make data-driven decisions with confidence. Leverage cutting-edge AI technologies to enhance the data exploration, analysis, and discovery experience.
From intelligent search and recommendations to automated data productisation and quotation, Opendatabay AI-driven features streamline the data workflow. Finding the data you need shouldn't be a complex. Opendatabay simplifies the data acquisition process with an intuitive interface and robust search tools. Effortlessly explore, discover, and access the data you need, allowing you to focus on extracting valuable insights. Opendatabay breaks new ground with a dedicated, AI-generated, synthetic datasets.
Leverage these privacy-preserving datasets for training and testing AI models without compromising sensitive information. Opendatabay prioritizes transparency by providing detailed metadata, provenance information, and usage guidelines for each dataset, ensuring users have a comprehensive understanding of the data they're working with. By leveraging a powerful combination of distributed ledger technology and rigorous third-party audits Opendatabay ensures the authenticity and reliability of every dataset. Security is at the core of Opendatabay. Marketplace implements stringent security measures, including encryption, access controls, and regular vulnerability assessments, to safeguard your data and protect your privacy.
As Europe's leading economic powerhouse and the fourth-largest hashtag#economy globally, Germany stands at the forefront of innovation and industrial might. Renowned for its precision engineering and high-tech sectors, Germany's economic structure is heavily supported by a robust service industry, accounting for approximately 68% of its GDP. This economic clout and strategic geopolitical stance position Germany as a focal point in the global cyber threat landscape.
In the face of escalating global tensions, particularly those emanating from geopolitical disputes with nations like hashtag#Russia and hashtag#China, hashtag#Germany has witnessed a significant uptick in targeted cyber operations. Our analysis indicates a marked increase in hashtag#cyberattack sophistication aimed at critical infrastructure and key industrial sectors. These attacks range from ransomware campaigns to hashtag#AdvancedPersistentThreats (hashtag#APTs), threatening national security and business integrity.
🔑 Key findings include:
🔍 Increased frequency and complexity of cyber threats.
🔍 Escalation of state-sponsored and criminally motivated cyber operations.
🔍 Active dark web exchanges of malicious tools and tactics.
Our comprehensive report delves into these challenges, using a blend of open-source and proprietary data collection techniques. By monitoring activity on critical networks and analyzing attack patterns, our team provides a detailed overview of the threats facing German entities.
This report aims to equip stakeholders across public and private sectors with the knowledge to enhance their defensive strategies, reduce exposure to cyber risks, and reinforce Germany's resilience against cyber threats.
2. No Fault Found
• No Fault Found (NFF) is an annual multi-billion dollar non-value
added expense to the DoD
– Intermittent discontinuity resulting in NFF is now recognized by the
Department of Defense (DoD) as an operational readiness degrader and life-
cycle cost driver
– DoD estimates that 3 out of 4 (75%) of DoD weapons systems have
undetected intermittent faults that manifest as operational failures
– NFF costs the Department of Defense (DoD) between $2B - $10B annually
(Source: Office of the Secretary of Defense (OSD) Maintenance, CTMA Partners Meeting)
• Universal Synaptics
– Over 20 years experience in NFF remediation and solutions
– Focus on improved diagnostics capability to address intermittent faults in Line
Replaceable Units (LRUs) and Electrical Wiring Interconnect Systems (EWIS)
which has been conclusively linked as a significant contributor to NFF
– Deployed intermittent fault detection capability has demonstrated significant
reductions in NFF, improved availability and cost savings
Intermittent Fault Detection & Isolation = Cost Effective Readiness
3. The Problem
• Aircraft electronic LRUs test “No Fault Found” (NFF)
approximately 50% of the time
– Box malfunctions intermittently during flight, but tests good during
subsequent ground testing
– Intermittent activity also categorized as RTOK, CND, NTF, NEOF or
even “gremlins”
– Intermittent discontinuity is also a significant problem in electronic wiring
interconnect systems
• Intermittent faults are mechanical in nature
– Failures are in wiring, solder joints, wire wraps, connectors, via’s etc.
– Modern components are more reliable and capable – intermittent
discontinuity between components is a major concern and cost driver
No Fault Found costs the DoD between $2 and $10 Billion annually
4. Conventional Approach
• Functional ATE and Continuity testers cannot detect and
isolate intermittent faults that cause NFF
– Test only one function at a time
– Test only one circuit at a time, even when connected to multiple circuits
– Digital averaging, scanning and sampling masks / misses the
intermittent faults – a testing “blind spot” / “testing void” exists
– LRUs are not tested in an operational environment which is where the
failures occur, EWIS is also tested in static environment
– Only designed to find functional failures, failed components and “hard”
failures (opens circuits / short circuits)
– Intermittent faults that cause NFF do not follow specific failure patterns
Conventional Approach = Conventional Results
5. Conventional Approach
• Digital Multi-Meters (DMMs) take sample readings and, over a specific
period, average them out before presenting them to the user’s display.
Most DMMs will be sampling at a high rate of 1/millisecond; so even if a
high ohmic reading was detected on one of the reads, it would appear
insignificant over a thousand readings – this digital averaging renders them
incapable of detecting ohmic intermittent faults of Category 3 or shorter
(Category 3 as per the DoD MIL-PRF 32516 definition: 501 microseconds to
5 milliseconds). Most conventional wiring continuity testers have a DMM as
their underlying testing technology and while they may be connected to
many lines at once, are still only testing one line-at-a-time. Any
intermittence occurring on a line not actively tested is missed.
6. MX and Supply Impact
• Tools provided to maintainers are not sufficient:
– Just because an LRU passes BIT or ATE tests multiple times in a row,
does NOT mean there isn’t a lurking problem in the LRU
– BIT / ATE testing does not check all circuits simultaneously or functional
paths in an LRU or connection paths to SRUs
– Conventional ATE does not test in an operationally relevant environment
– Conventional ATE is incapable of detecting short duration intermittent
faults that cause NFF
• Flight Line “Blacklisting” of LRUs makes an expensive supply
problem worse
– Creates availability issues / drives unnecessary acquisition
– Masks the real problem / drives “swaptronics”
– Recirculates “bad actors” to other military units, thus perpetuating the
problem
An Innovative Solution is Needed to Solve This Problem
7. Operational Impact
• High MICAP rates
– Missions canceled and postponed
– Readiness is negatively impacted
• High NFF / RTOK / CND rates
– Wasted O / I / D-level maintenance resources and supply man-hours
– Wasted time on supply documentation, transportation and
troubleshooting
• Supply chain becomes more expensive and less responsive
– Each LRU sent to the depot for a non-fix, unnecessarily wastes Combat
and Support Commands millions of dollars each year
– High availability (even a 100% production fill rate) does not equal high
reliability or weapon system readiness
The DoD Mx Enterprise is large, global, complex and costly
change is required to reduce NFF & improve operational
availability
8. F-16 LRU Field & Depot NFF
0.0%
10.0%
20.0%
30.0%
40.0%
50.0%
60.0%
70.0%
80.0%
90.0%
DFLCC ECA APSP AMRIU PSP FLCC CADC MLPRF FLCP/N
VFLCP
CDEEU Ant DTU/N
VDTU
ACRIU Signal
Proc
EEFCC WAC
HUD
EU
UCADC MMC
Chassi
s
Field NFF 83.8% 67.8% 64.4% 63.4% 60.7% 58.5% 58.3% 56.7% 54.9% 49.2% 47.2% 46.8% 38.7% 36.6% 35.2% 34.0%
Depot Level NFF 7.1% 3.8% 26.0% 8.4% 4.1% 20.0% 7.8% 5.8% 5.0% 14.5% 2.3% 9.1% 2.4% 9.1% 56.7% 25.8% 13.8% 76.1%
Depot Work, But Problem Not Definitively Identified & Repaired 42.0% 49.0% 8.0% 43.0% 53.0% 64.0% 21.4% 32.0%
NFFPercentage
LRUs
Field NFF Depot Level NFF Depot Work, But Problem Not Definitively Identified & Repaired
Source: USAF, Defense Repair Information Logistics System (DRILS)
9. USN / USMC WRA NFF
Source: NAVAIR Aircraft Wiring Support Equipment Commodity (AWSEC) IPT – JSWAG 2015
$9.184
$194.657
O&S Costs for Status Quo (TY$M)
Maintenance Labor
AVDLR
10. Intermittent Faults / NFF
• The Testing Problem: Intermittence occurs randomly in time, place,
amplitude and duration. The very nature of the failure mode suggests that
the ability to detect and further isolate the intermittence root cause is based
on test detection SENSITIVITY and PROBABILITY rather than conventional
parametric methods concentrating on ohmic measurement accuracy.
• Simply put, you can’t detect an intermittent event until it occurs, and then
you may have limited opportunities to capture it on the specific circuit when
it does occur - by any reasonable scientific explanation of the problem, to
catch intermittents on the ground, you need to have phenomenal testing
speed (sensitivity) and a 100% bandwidth (probability).
• In other words, the proper technology for the task must be able to test all of
the failing system’s lines, all of the time, in a simultaneous and continuous
fashion. Conventional test equipment does just the opposite.
“DoD maintained 400 types of test systems and spent $50B to
buy and support these systems over a 12 year period” – GAO.
None of these test systems are solving the NFF problem
11. Intermittent Faults
• Three Stages to an intermittent fault:
IFDIS & Voyager detects & isolates all three stages
12. Intermittent Faults
• The Testing Solution: To address all the testing limitations mentioned,
the Intermittent Fault Detector (IFD) was developed specifically with
intermittence requirements in mind.
• It uses patented super sensitive analog neural network detection technology
on the front end and digital reporting and data processing technology on the
backend, and it does it all in an efficient, parallel circuitry manner.
• The IFD consistently detects any intermittent event on any circuit,
simultaneously, at ohmic glitch durations as short as 50 nanoseconds. The
numbers of simultaneous test points are scalable from 128 to over 20,000
test points.
• Two major product lines were developed to deploy the IFD technology.
13. Intermittent Fault Detection
Conventional ATE
• Measures only one circuit
at a time, even when
connected to multiple
circuits
• Filters and averages out
intermittent events that
cause NFF
Circuit under test
Intermittent Event
IFD
No missed defects!
• Hardware Neural-Network monitors ALL
circuits, simultaneously and continuously
with high sensitivity
14. Conventional Tester – higher frequency of switching vs testing between test points
TP1
TP2
TP3
TP4
Ncompass™ IFD Technology - No switching therefore simultaneous & continuous
TP1
TP2
TP3
TP4
IFDIS & Voyager IFD testers have an analog neural-network, so they can
test thousands of test points simultaneously and continuously. This
provides a dramatic increase in detection probability.
When testing multiple test points, eg wires in a loom, conventional
testers scan through each line one at a time – so there is a
negligible chance of detecting intermittency
Intermittent Fault Detection
15. Universal Synaptics NFF Solutions
Intermittent Fault Detection & Isolation System (IFDIS)
• Advanced all lines all the time
circuit monitoring
• Proven technology that reduces
NFF and improves system
availability while reducing cost
• TRL 9 solutions
“Our equipment shows signs of wear and
tear, we can’t be complacent about our
competitive advantage.”
– General Joseph Dunford, USMC,
Chairman of the Joint Chiefs of Staff
Voyager Intermittent Fault
Detector (VIFD) and the
Intermittent Fault Detection &
Isolation System (IFDIS)
16. Universal Synaptics NFF Solutions
Voyager Intermittent Fault Detector (VIFD)
• MIL-PRF 32516 Compliant
• MIL-STD 202G Compliant
• Detects: intermittent faults, open
circuit, shorted circuits, mis-
wiring and distance to fault
• Includes: all lines all the time
circuit monitoring (IFD), SSTDR,
Huntron Tracker 30, DMM and
• AutoMap™ (No TPS
development)
• Windows 7 OS
• 128, 256 & 512 test point variants
• TRL 9
DoD Mx Symposium “Great Ideas” Competition Finalist 2014
17. Universal Synaptics NFF Solutions
DoD Mx Symposium “Great Ideas”
Competition Winner 2010 & 2012
Intermittent Fault Detection & Isolation System (IFDIS)
• MIL-PRF 32516 Compliant
• Detects: intermittent faults,
open circuit, shorted circuits
and mis-wiring
• Includes: all lines all the time
circuit monitoring (IFD),
Picoscope, DMM and
• AutoMap™
• Windows 7 OS
• Expandable to over 20,000
test points
• TRL 9
IFDIS
"If we’re going to keep the advantage
that we’ve historically had then we need
to keep up [technologically].”
– Secretary of Defense Ash Carter
19. Department of Defense Solution
• Office of the Secretary of Defense established the Joint Intermittence
Testing (JIT) Working Integrated Product Team (WIPT) in 2012 – Joint
Service effort to address the intermittent testing void
• DoD released Military Performance Specification (MIL-PRF) in March 2015,
MIL-PRF 32516 “Electronic Test Equipment, Intermittent Fault Detection &
Isolation”
• JIT Industry Week (04 – 07 Jan 2016), Universal Synaptics IFD technology
passed all JIT Intermittent Fault Emulator (IFE) tests in compliance with
MIL-PRF 32516
• Universal Synaptics has proven solutions that detect and isolate intermittent
faults down to 50ns *TRL 9 technology solutions
“Ladies & Gentlemen, we are out of money, we have to think” –
Winston Churchill
20. Identifying Test Candidates
Collect Maintenance and Performance Data
Perform IFD
Diagnostics
Retest with IFD
Technology
Repair Chassis
or wiring
harness
Identify:
• NFF’s
• Poor performers
• Un-repairable
• System architecture
• Feasibility Study
Analyze
Maintenance
Data
Test
Candidate?
Test, Repair and
Return to
Service
No
Yes
Other
Remediation
Option
27. • NAVAIR F/A-18 Generator Converter Unit (GCU) is a Top Ten Fleet
Degrader & number 1 cannibalized WRA at O-Level
• GCU Inductions have outpaced production for the last three years
• GCU inventory continues to increase due to aircraft production yet time on
wing continues to decrease causing more GCU inductions each year
• BCM & I-Level AVDLR costs were $161.22M in FY14
• GCU G4 upgrade in process as well as multiple SRA modifications /
upgrades
• An innovative solution was needed to improve time on wing, reduce BCM &
AVDLR costs, reduce A-799 (NFF) and enable cost effective readiness – the
solution now exists
F/A-18 GCU: Overview
F/A-18 GCU IFDIS Delivered to FRC SW in January 2016
28. F/A-18 GCU: IFDIS Results
IFDIS testing identified chassis intermittent failures in 74% 21 of 27 GCUs
Additionally, IFDIS testing found failures in two new motherboards ordered and received from supply
to repair S/N: TNW00246
29. F/A-18 GCU: IFDIS Results
• F/A-18 GCU: IFDIS Results to date:
“Collaboration, innovation and forward thinking were key words used to
describe the amazing work taking place across the FRC landscape in
support of the Naval Aviation Enterprise Vision.
At FRC West, Sailors teamed with artisans to interdict repairs for Generator
Control Units—or GCU—using the Intermittent Fault Detection and Isolation
System. This resulted in the GCU time on wing to more than double,
providing what was a top ten degrader asset, to be readily available for
longer periods of time in support of flight operations.”
Rear Adm Zarkowski
Commander FRCs
USN
34. Conclusion
• Undetected intermittent faults are a systemic issue – a multi-billion
dollar NFF problem exists
• Advanced IFD diagnostic solutions are available to detect and
isolate intermittent faults that cause NFF in compliance with MIL-
PRF 32516
• Intermittent fault detection and isolation capability has proven to
reduce NFF, reduce life cycle costs, reduce MICAPs, improve Time
on Wing (TOW) and improve operational availability
• IFDIS™ & Voyager™ are proven solutions making a positive impact
today and can be utilized on any platform
It’s Time to Stop Admiring the Problem
36. JIT Team Definition of “Environmentally Induced Intermittent Fault”
• A discontinuity that occurs in LRU/WRA chassis and backplane conductive paths as a result
of various operational environmental stimuli, including, but not limited to, thermal stress,
vibrational stress, gravitational G-force loading, moisture and/or contaminant exposure; as
well as changes in the material due to age and use, such as tin whiskers, metal migration
and delamination of materials. These faults can occur individually and/or in rapid
succession on any chassis or backplane circuit.
Figure Source: B. Sorensen, “Digital-Averaging-The-Smoking-Gun-Behind-No-Fault-Found”, http://www.aviationtoday.com/asw/categories/commercial/Digital-Averaging-The-Smoking-
Gun-Behind-No-Fault-Found_2120.html, Air Safety Week, February 24, 2003.
DoD Intermittent Fault Definition
37. MIL-PRF 32516 “Electronic Test Equipment, Intermittent Fault Detection &
Isolation”
• Covers the “minimum performance requirements for equipment to detect and
isolate nanosecond, microsecond and millisecond conductive path intermittent
faults”
• “Intermittent faults can occur in any and all of the hundreds to thousands of LRU /
WRA chassis and backplane circuits and their wire harnesses”
• Establishes performance requirements framework for intermittent fault detection
test equipment to detect and isolate nanosecond, microsecond and millisecond
intermittent faults
• “Not intended to address hard opens, shorts or constant function failures found in
routine electronics repair”
DoD MIL-PRF 32516
38. Intermittent Faults
• Hi-Pot testers rely on the breakdown of the insulation to show if there is a
fault. It is well known that this technique stresses the cable under test and
in some cases can actually damage the insulation on sites that would
otherwise have not caused a problem. Some recognized military forces
have banned high voltage insulation testing following the NTSB report into
the cause of the loss of TWA Flight 800 in 1996. In addition, Hi-Pot testing
can actually mask intermittent faults and can result in a false negative
result.
• Low Energy High Voltage testers are a better solution for finding some
intermittent faults than Hi-Pot testers because they use a low energy pulse.
However, depending on the type of intermittent they then need to use higher
voltages to expose the fault, which can then lead to the same
disadvantages as Hi-Pot testers. On commencing testing it is not possible
to know the type of the intermittent being dealt with so it is difficult to
determine what voltage level to use. This method also assumes that
intermittent faults have an adjacent escape path for the pulse ie the
airframe, or another adjacent cable with exposed conducting material; this is
not always the case and so detection probabilities are low and scenario
driven.
39. Intermittent Faults
• Spread-Spectrum Time Domain Reflectometry (SSTDR)
technology is very advanced at detecting cable changes using complex
signals, reading reflections and carrying out post analysis. However, the
detection rate is limited to approximately 50 millisecond changes, which
means that not all intermittent faults below this threshold can be detected.
Furthermore, as a stand-alone tool, SSTDR can be applied to just one wire
per cable loom at any given time and this ‘switching’ approach between
wires in the loom introduces more opportunities to miss the intermittent fault
than it does to find it.
• Oscilloscopes can be set up to have a latching trigger and defined trigger
parameters to detect and latch a particular condition. Generally they do not
have a self-stimulus and so this needs to be provided as a 3rd party aspect
of the test when using an oscilloscope in this mode. Importantly, setting up
the triggers and releasing the latching trigger in time for capturing
subsequent fault(s) is an extremely complex technique and it would only be
applicable for a single line-at-a-time. These approaches could be used on I
or D-level applications but it would be extremely time consuming to apply to
each of the suspect lines during fault investigations.
40. EA-6B Prowler Intercommunication System (AIC-45) Weapon
Replaceable Assembly (WRA)
- High Mission Incapable (MICAP) rate
- High NFF / CND rates
- Conventional test equipment unable to identify intermittent issues or
improve reliability
- IFDIS identified and isolated one or more intermittent circuits in 83% of the
AIC-45s tested
EA-6B Prowler Results
41. CH-47 Chinook Wiring Harnesses
- High NFF rates, costly to support and sustain
- Conventional ONE circuit at a time wire testers unable to identify and isolate
intermittent wiring problems, reduce NFF or improve readiness
- Voyager IFD is detecting and isolating intermittent wiring issues that cause
NFF and drive high sustainment costs
- 75% reduction in test time achieved with Voyager
CH-47 Chinook Results
42. Tornado GR4 Results
• Intermittent / NFF Cross-Drive Clutch
wiring problems since 2006
• On just one aircraft:
– 35 maintenance repeats
– 30+ components replaced
– 500+ man-hours of investigation
– Conventional ATE ineffective
• Voyager IFD testing of wiring found:
– Intermittent faults that went
undetected by continuity testers
– Root cause of the faults located in
minutes