ULTRA HIGH RESOLUTION FOURIER TRANSFORM X-RAY INTERFEROMETERHERBERT W. SCHNOPPERMAD CITY LABSMADISON, WISCONSINandSMITHSONIAN ASTROPHYSICAL OBSERVATORYCAMBRIDGE, MAandJAMES A. MACKAYMAD CITY LABSMADISON WISCONSIN
ATTENUATION ANDPHASE SHIFTdBRAGGS LAW: nλ = 2d sinθwhere: n = the reflection orderλ = the X-ray wavelengthd = either the crystal lattice spacing or the multilayer pair thickness, andθ = the incident angle
For a wave propagating in a medium with refractive index n = 1 – δ + iβ E(r,t) = E0e-i(t - r/c) e-i(2πδ/λ)r e-(2πβ/λ)r vacuum propagation Φ-shift absorption The phase shift, ΔΦ, relative to vacuum that is caused by propagation through a thickness Δr is: ΔΦ= (2πδ/λ)Δ r
MICHELSON’S TWO-BEAM INTERFEROMETERSCANNINGSTAGEPATH 2PATH 1DETECTORREFLECTORPARTIALLY REFLECTINGBEAM SPLITTER
SIN(X) PATH 1PATH 1PATH 1PATH 10 deg phase shift180 deg phase shiftA MIRROR STEP EQUAL TO F λ/2 PRODUCES A PHASE SHIFT OλAND A MAXIMUM SIGNALA MIRROR STEP EQUAL TO Fλ/4 PRODUCES A PHASE SHIFT O λ/2AND A MINIMUM SIGNAL
x (radians) -30-20-100102030 (sinx)/x 01
DETECTORFIXED REFLECTOR(MULTILAYERED) SCANNING REFLECTOR(MULTILAYERED) BEAM SPLITTER(MULTILAYERED) TELESCOPEdTELESCOPEFOCUSMICHELSON INTEFRFEROMETER FOR X-RAY SPECTROSCOPY
θcSCANNINGMIRRORCENTRALRAYINTERMEDIATESCANPOSITIONMAXIMUMSCANPOSITIONTELESCOPEFOCUSSCAN RANGEddmaxcmax TO/FROMBEAMSPLITTER MICHELSON INTERFEROMETER SCANNING ARM
The maximum path difference between these rays (including thereflection) is Δmax = 2(cmax - dmax). For a Michelson interferometer, the resolution element (in wave numbers), Δkmax = 1/ (2dmax) where dmax is the maximum on-axis displacement of the scanning reflector. We adopt the convention of limiting the maximum phase shiftarising from the path difference Δmaxto λ/10. This choice implies amaximum phase shift, Φmax= 2π(1/10) rad. For small values of θ, 1/(cosθmax) = cmax/dmax ~ 1 + θmax2/2, cmax/dmax = 1 + (cmax - dmax )/dmax = 1 + Δmax/(2dmax); therefore, θmax2 ~ Δmax/dmax = λ/(10 dmax).
Table 1. Spectral resolution (λ/dλ) vs focal length FL (m) 100 200 500 1000 θmax(rad) 5.0 x 10-32.5 x 10-31.0 x 10-35.0 x 10-4θmax(deg) 0.286 0.143 0.0573 0.0286 λ /dλ 4 x 103 1.6 x 104 1 x 105 4 x 105 Table 2. dmax vs focal length (H-like ions) FL (m) dmax ( μm) C VI 3.4 nm N VII 2.5 nm O VIII 1.9 nm 100.0 13.6 10.0 7.6 200.0 54.4 40.0 30.4 500.0 340.0 250.0 190.0 1000.0 1360.0 1000.0 760.0
FOUR BOUNCE FOURIER TRANSFORM X-RAY SPECTROMETERREFERENCEDETECTORINTERFEROMETERDETECTORMULTILAYERBEAMSPLITTERMULTILAYEREDREFLECTORNANOPOSITIONEDSLIDE
FRACTIONALPATHDIFFERENCEvsTOTALDISPLACEMENTFORAMACH-ZEHNDERINTERFEROMETER020406080100012(P/d) = 2[(1-cosΔθ/sinθ]max ΔP/dmax BRAGG ANGLE (θ)
Table 3. Species to be studied with the 4-bounce Mach-Zhender interferometer. Ion Mg(VII) Si (XIV) S (XVI) Ar (XVIII) Ca (XX) Ti (XXII) Fe (XXVI) Wavelength (nm) 0.840.620.470.37 0.300.25 0.18 Bragg angle (deg) 31.622.817.113.4 10.89.0 6.5
BRAGGANGLEvsWAVELENGTHFORCOSMICALLYABUNDANTH-LIKEIONS(multilayerd-spacing=0.8nm) 01234020406080100Fe (XXVI) Ti (XXII)Ca(XX) Ar (XVIII) S (XVI) Si (XIV) Mg (VII) O (VIII)N (VII)C (VI) WAVELENGTH (nm) BRAGG ANGLE (DEG) MICHELSON INTERFEROMETERMACH-ZHENDER INTERFEROMETER
MACH-ZEHNDER INTERFEROMETER
1138 schnopper[1]
1138 schnopper[1]
1138 schnopper[1]
1138 schnopper[1]
1138 schnopper[1]

1138 schnopper[1]

  • 1.
    ULTRA HIGH RESOLUTIONFOURIER TRANSFORM X-RAY INTERFEROMETERHERBERT W. SCHNOPPERMAD CITY LABSMADISON, WISCONSINandSMITHSONIAN ASTROPHYSICAL OBSERVATORYCAMBRIDGE, MAandJAMES A. MACKAYMAD CITY LABSMADISON WISCONSIN
  • 2.
    ATTENUATION ANDPHASE SHIFTdBRAGGSLAW: nλ = 2d sinθwhere: n = the reflection orderλ = the X-ray wavelengthd = either the crystal lattice spacing or the multilayer pair thickness, andθ = the incident angle
  • 3.
    For a wavepropagating in a medium with refractive index n = 1 – δ + iβ E(r,t) = E0e-i(t - r/c) e-i(2πδ/λ)r e-(2πβ/λ)r vacuum propagation Φ-shift absorption The phase shift, ΔΦ, relative to vacuum that is caused by propagation through a thickness Δr is: ΔΦ= (2πδ/λ)Δ r
  • 7.
    MICHELSON’S TWO-BEAM INTERFEROMETERSCANNINGSTAGEPATH2PATH 1DETECTORREFLECTORPARTIALLY REFLECTINGBEAM SPLITTER
  • 8.
    SIN(X) PATH 1PATH1PATH 1PATH 10 deg phase shift180 deg phase shiftA MIRROR STEP EQUAL TO F λ/2 PRODUCES A PHASE SHIFT OλAND A MAXIMUM SIGNALA MIRROR STEP EQUAL TO Fλ/4 PRODUCES A PHASE SHIFT O λ/2AND A MINIMUM SIGNAL
  • 9.
  • 10.
    DETECTORFIXED REFLECTOR(MULTILAYERED) SCANNINGREFLECTOR(MULTILAYERED) BEAM SPLITTER(MULTILAYERED) TELESCOPEdTELESCOPEFOCUSMICHELSON INTEFRFEROMETER FOR X-RAY SPECTROSCOPY
  • 11.
  • 12.
    The maximum pathdifference between these rays (including thereflection) is Δmax = 2(cmax - dmax). For a Michelson interferometer, the resolution element (in wave numbers), Δkmax = 1/ (2dmax) where dmax is the maximum on-axis displacement of the scanning reflector. We adopt the convention of limiting the maximum phase shiftarising from the path difference Δmaxto λ/10. This choice implies amaximum phase shift, Φmax= 2π(1/10) rad. For small values of θ, 1/(cosθmax) = cmax/dmax ~ 1 + θmax2/2, cmax/dmax = 1 + (cmax - dmax )/dmax = 1 + Δmax/(2dmax); therefore, θmax2 ~ Δmax/dmax = λ/(10 dmax).
  • 13.
    Table 1. Spectralresolution (λ/dλ) vs focal length FL (m) 100 200 500 1000 θmax(rad) 5.0 x 10-32.5 x 10-31.0 x 10-35.0 x 10-4θmax(deg) 0.286 0.143 0.0573 0.0286 λ /dλ 4 x 103 1.6 x 104 1 x 105 4 x 105 Table 2. dmax vs focal length (H-like ions) FL (m) dmax ( μm) C VI 3.4 nm N VII 2.5 nm O VIII 1.9 nm 100.0 13.6 10.0 7.6 200.0 54.4 40.0 30.4 500.0 340.0 250.0 190.0 1000.0 1360.0 1000.0 760.0
  • 14.
    FOUR BOUNCE FOURIERTRANSFORM X-RAY SPECTROMETERREFERENCEDETECTORINTERFEROMETERDETECTORMULTILAYERBEAMSPLITTERMULTILAYEREDREFLECTORNANOPOSITIONEDSLIDE
  • 15.
  • 16.
    Table 3. Speciesto be studied with the 4-bounce Mach-Zhender interferometer. Ion Mg(VII) Si (XIV) S (XVI) Ar (XVIII) Ca (XX) Ti (XXII) Fe (XXVI) Wavelength (nm) 0.840.620.470.37 0.300.25 0.18 Bragg angle (deg) 31.622.817.113.4 10.89.0 6.5
  • 17.
    BRAGGANGLEvsWAVELENGTHFORCOSMICALLYABUNDANTH-LIKEIONS(multilayerd-spacing=0.8nm) 01234020406080100Fe (XXVI)Ti (XXII)Ca(XX) Ar (XVIII) S (XVI) Si (XIV) Mg (VII) O (VIII)N (VII)C (VI) WAVELENGTH (nm) BRAGG ANGLE (DEG) MICHELSON INTERFEROMETERMACH-ZHENDER INTERFEROMETER
  • 18.