The document describes an ultra-high resolution Fourier transform x-ray interferometer using Michelson and Mach-Zehnder interferometers. It discusses how Bragg's law relates x-ray wavelength and angle of incidence to crystal lattice spacing. It also explains how the maximum path difference and scanning reflector displacement determine the instrument's spectral resolution. Tables show how resolution varies with focal length and species that can be studied with a 4-bounce Mach-Zehnder design.