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Device Modeling Report




COMPONENTS: SILICON CARBIDE SCHOTTKY DIODE
PART NUMBER: C4D10120E
MANUFACTURER: CREE
REMARK: PROFESSIONAL MODEL




                   Bee Technologies Inc.




      All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                     1
Circuit Configuration




                   U2
                   C4D10120E




DIODE MODEL PARAMETERS
   PSpice
    model                                Model description
  parameter
      IS         Saturation Current
      N          Emission Coefficient
      RS         Series Resistance
     IKF         High-injection Knee Current
     CJO         Zero-bias Junction Capacitance
      M          Junction Grading Coefficient
      VJ         Junction Potential
     ISR         Recombination Current Saturation Value
      BV         Reverse Breakdown Voltage(a positive value)
     IBV         Reverse Breakdown Current(a positive value)
      TT         Transit Time
     EG          Energy-band Gap




              All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                             2
Forward Current Characteristics

Circuit Simulation result


            20A


            18A


            16A


            14A


            12A


            10A


             8A


             6A


             4A


             2A


             0A
                  0V           0.5V   1.0V    1.5V    2.0V     2.5V      3.0V     3.5V   4.0V
                       I(R1)
                                                      V_V1




Evaluation circuit


                                             R1

                                             0.01m


                                       V1                             U1
                                                                      C4D10120E




                                      0




                         All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                                3
Comparison Graph

Circuit Simulation result




Comparison table


                                             VF (V)
               IF (A)                                                      %Error
                                Measurement           Simulation
                        0.2              0.853                 0.864              1.29
                        0.5              0.906                 0.905              -0.11
                            1            0.959                 0.952              -0.73
                            2            1.044                 1.029              -1.44
                            5            1.226                 1.229              0.24
                        10               1.538                 1.539              0.07
                        20               2.148                 2.143              -0.23




                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                          4
Reverse Current Characteristic

Circuit Simulation result


            5.0mA




            4.0mA




            3.0mA




            2.0mA




            1.0mA




               0A
                    0V                0.5KV             1.0KV           1.5KV           2.0KV
                         I(R1)
                                                        V_V1




Evaluation circuit


                                                R1

                                                0.01m

                                      V1                    U1
                                                     C4D10120E




                                      0




                         All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                                5
Comparison Graph

Circuit Simulation result




Comparison table


                                             IR (A)
              VR (V)                                                       %Error
                             Measurement               Simulation
                    1500               55.900                55.388               -0.92
                    1550               86.350                89.926               4.14
                    1600              142.000               146.042               2.85
                    1650              243.600               237.219               -2.62
                    1700              377.600               385.148               2.00
                    1728              516.000               505.293               -2.08
                    1730            5000.000               5000.000               0.00




                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                          6
Junction Capacitance Characteristic

Circuit Simulation result


             800p



             700p



             600p



             500p



             400p



             300p



             200p



             100p



                0
               100mV               1.0V               10V           100V            1.0KV
                   I(V2)/(1000V/10u)
                                                      V(R)




Evaluation circuit



                                                 V2
                                         R

                                                 0
                                                             U1
                            V1 = 0       V1           C4D10120E
                            V2 = 1000
                            TD = 0
                            TR = 10us
                            TF = 100ns
                            PW = 100us
                            PER = 10m


                                             0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                            7
Comparison Graph

Circuit Simulation result




Comparison table

                                             C (pF)
              VR (V)                                                       %Error
                                Measurement           Simulation
                       0.1            751.800               753.017               0.16
                       0.2            721.800               725.047               0.45
                       0.5            656.250               657.779               0.23
                            1         577.500               575.619               -0.33
                            2         484.050               480.455               -0.74
                            5         353.850               353.966               0.03
                       10             267.750               267.501               -0.09
                       20             200.000               198.477               -0.76
                       50             136.500               132.830               -2.69
                       100             94.300                96.850               2.70
                       200             68.150                70.590               3.58
                       500             47.250                46.390               -1.82
                    1000               34.750                33.660               -3.14


                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                          8

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  • 1. Device Modeling Report COMPONENTS: SILICON CARBIDE SCHOTTKY DIODE PART NUMBER: C4D10120E MANUFACTURER: CREE REMARK: PROFESSIONAL MODEL Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 1
  • 2. Circuit Configuration U2 C4D10120E DIODE MODEL PARAMETERS PSpice model Model description parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 2
  • 3. Forward Current Characteristics Circuit Simulation result 20A 18A 16A 14A 12A 10A 8A 6A 4A 2A 0A 0V 0.5V 1.0V 1.5V 2.0V 2.5V 3.0V 3.5V 4.0V I(R1) V_V1 Evaluation circuit R1 0.01m V1 U1 C4D10120E 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 3
  • 4. Comparison Graph Circuit Simulation result Comparison table VF (V) IF (A) %Error Measurement Simulation 0.2 0.853 0.864 1.29 0.5 0.906 0.905 -0.11 1 0.959 0.952 -0.73 2 1.044 1.029 -1.44 5 1.226 1.229 0.24 10 1.538 1.539 0.07 20 2.148 2.143 -0.23 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 4
  • 5. Reverse Current Characteristic Circuit Simulation result 5.0mA 4.0mA 3.0mA 2.0mA 1.0mA 0A 0V 0.5KV 1.0KV 1.5KV 2.0KV I(R1) V_V1 Evaluation circuit R1 0.01m V1 U1 C4D10120E 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 5
  • 6. Comparison Graph Circuit Simulation result Comparison table IR (A) VR (V) %Error Measurement Simulation 1500 55.900 55.388 -0.92 1550 86.350 89.926 4.14 1600 142.000 146.042 2.85 1650 243.600 237.219 -2.62 1700 377.600 385.148 2.00 1728 516.000 505.293 -2.08 1730 5000.000 5000.000 0.00 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 6
  • 7. Junction Capacitance Characteristic Circuit Simulation result 800p 700p 600p 500p 400p 300p 200p 100p 0 100mV 1.0V 10V 100V 1.0KV I(V2)/(1000V/10u) V(R) Evaluation circuit V2 R 0 U1 V1 = 0 V1 C4D10120E V2 = 1000 TD = 0 TR = 10us TF = 100ns PW = 100us PER = 10m 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 7
  • 8. Comparison Graph Circuit Simulation result Comparison table C (pF) VR (V) %Error Measurement Simulation 0.1 751.800 753.017 0.16 0.2 721.800 725.047 0.45 0.5 656.250 657.779 0.23 1 577.500 575.619 -0.33 2 484.050 480.455 -0.74 5 353.850 353.966 0.03 10 267.750 267.501 -0.09 20 200.000 198.477 -0.76 50 136.500 132.830 -2.69 100 94.300 96.850 2.70 200 68.150 70.590 3.58 500 47.250 46.390 -1.82 1000 34.750 33.660 -3.14 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 8