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Device Modeling Report




COMPONENTS: SILICON CARBIDE SCHOTTKY DIODE
PART NUMBER: C4D08120E
MANUFACTURER: CREE
REMARK: PROFESSIONAL MODEL




                   Bee Technologies Inc.




      All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                     1
Circuit Configuration




                   U2
                   C4D08120E



DIODE MODEL PARAMETERS
   PSpice
    model                                Model description
  parameter
      IS         Saturation Current
      N          Emission Coefficient
      RS         Series Resistance
     IKF         High-injection Knee Current
     CJO         Zero-bias Junction Capacitance
      M          Junction Grading Coefficient
      VJ         Junction Potential
     ISR         Recombination Current Saturation Value
      BV         Reverse Breakdown Voltage(a positive value)
     IBV         Reverse Breakdown Current(a positive value)
      TT         Transit Time
     EG          Energy-band Gap




              All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                             2
Forward Current Characteristics


Circuit Simulation result


              15A
              14A
              13A
              12A
              11A
              10A
               9A
               8A
               7A
               6A
               5A
               4A
               3A
               2A
               1A
               0A
                     0V     0.5V 1.0V     1.5V    2.0V 2.5V    3.0V   3.5V 4.0V
                          I(R1)
                                                     V_V1

Evaluation circuit



                                             R1

                                             0.01m


                                     V1                         U1
                                                                C4D08120E




                                    0




                      All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                     3
Comparison Graph

Circuit Simulation result




Comparison table


                                             VF (V)
               IF (A)                                                       %Error
                                Measurement           Simulation
                        0.1              0.820                 0.850              3.66
                        0.2              0.887                 0.878              -1.01
                        0.5              0.942                 0.933              -0.96
                            1            1.000                 1.002              0.20
                            2            1.143                 1.124              -1.63
                            5            1.459                 1.458              -0.07
                        10               1.989                 1.994              0.25
                        15               2.523                 2.522              -0.04




                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                          4
Reverse Current Characteristic

Circuit Simulation result


             500uA


             450uA


             400uA


             350uA


             300uA


             250uA


             200uA


             150uA


             100uA


              50uA


                0A
                     0V        0.2KV   0.4KV   0.6KV   0.8KV      1.0KV   1.2KV   1.4KV   1.6KV 1.8KV
                          I(R1)
                                                               V_V1




Evaluation circuit



                                               R1

                                               0.01m

                                       V1                  U1
                                                    C4D08120E




                                       0




                          All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                                        5
Comparison Graph

Circuit Simulation result




Comparison table


                                             IR (A)
              VR (V)                                                        %Error
                             Measurement               Simulation
                    1200                 6.500                 6.502              0.03
                    1300               15.500                15.461               -0.25
                    1400               37.800                36.812               -2.61
                    1500               85.000                87.880               3.39
                    1580              180.000               176.124               -2.15




                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                          6
Junction Capacitance Characteristic

Circuit Simulation result



              600p




              500p




              400p




              300p




              200p




              100p




                 0
                100mV                 1.0V            10V           100V            1.0KV
                    I(V2)/(1000V/10u)
                                                      V(R)




Evaluation circuit



                                                 V2
                                         R

                                                 0
                                                             U1
                            V1 = 0       V1           C4D08120E
                            V2 = 1000
                            TD = 0
                            TR = 10us
                            TF = 100ns
                            PW = 100us
                            PER = 10m


                                             0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                            7
Comparison Graph

Circuit Simulation result




Comparison table

                                             C (pF)
              VR (V)                                                        %Error
                                Measurement           Simulation
                       0.1            536.000               539.095               0.58
                       0.2            520.000               522.465               0.47
                       0.5            480.000               480.637               0.13
                            1         430.400               429.081               -0.31
                            2         368.000               362.904               -1.38
                            5         260.000               266.756               2.60
                       10             201.400               201.953               0.27
                       20             146.400               148.780               1.63
                       50             100.000                97.346               -2.65
                       100             72.000                70.050               -2.71
                       200             52.000                50.140               -3.58
                       500             32.000                32.220               0.69
                    1000               23.200                23.070               -0.56

                   All Rights Reserved Copyright (C) Bee Technologies Inc. 2012
                                                                                          8

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SPICE MODEL of C4D08120E (Professional Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: SILICON CARBIDE SCHOTTKY DIODE PART NUMBER: C4D08120E MANUFACTURER: CREE REMARK: PROFESSIONAL MODEL Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 1
  • 2. Circuit Configuration U2 C4D08120E DIODE MODEL PARAMETERS PSpice model Model description parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 2
  • 3. Forward Current Characteristics Circuit Simulation result 15A 14A 13A 12A 11A 10A 9A 8A 7A 6A 5A 4A 3A 2A 1A 0A 0V 0.5V 1.0V 1.5V 2.0V 2.5V 3.0V 3.5V 4.0V I(R1) V_V1 Evaluation circuit R1 0.01m V1 U1 C4D08120E 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 3
  • 4. Comparison Graph Circuit Simulation result Comparison table VF (V) IF (A) %Error Measurement Simulation 0.1 0.820 0.850 3.66 0.2 0.887 0.878 -1.01 0.5 0.942 0.933 -0.96 1 1.000 1.002 0.20 2 1.143 1.124 -1.63 5 1.459 1.458 -0.07 10 1.989 1.994 0.25 15 2.523 2.522 -0.04 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 4
  • 5. Reverse Current Characteristic Circuit Simulation result 500uA 450uA 400uA 350uA 300uA 250uA 200uA 150uA 100uA 50uA 0A 0V 0.2KV 0.4KV 0.6KV 0.8KV 1.0KV 1.2KV 1.4KV 1.6KV 1.8KV I(R1) V_V1 Evaluation circuit R1 0.01m V1 U1 C4D08120E 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 5
  • 6. Comparison Graph Circuit Simulation result Comparison table IR (A) VR (V) %Error Measurement Simulation 1200 6.500 6.502 0.03 1300 15.500 15.461 -0.25 1400 37.800 36.812 -2.61 1500 85.000 87.880 3.39 1580 180.000 176.124 -2.15 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 6
  • 7. Junction Capacitance Characteristic Circuit Simulation result 600p 500p 400p 300p 200p 100p 0 100mV 1.0V 10V 100V 1.0KV I(V2)/(1000V/10u) V(R) Evaluation circuit V2 R 0 U1 V1 = 0 V1 C4D08120E V2 = 1000 TD = 0 TR = 10us TF = 100ns PW = 100us PER = 10m 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 7
  • 8. Comparison Graph Circuit Simulation result Comparison table C (pF) VR (V) %Error Measurement Simulation 0.1 536.000 539.095 0.58 0.2 520.000 522.465 0.47 0.5 480.000 480.637 0.13 1 430.400 429.081 -0.31 2 368.000 362.904 -1.38 5 260.000 266.756 2.60 10 201.400 201.953 0.27 20 146.400 148.780 1.63 50 100.000 97.346 -2.65 100 72.000 70.050 -2.71 200 52.000 50.140 -3.58 500 32.000 32.220 0.69 1000 23.200 23.070 -0.56 All Rights Reserved Copyright (C) Bee Technologies Inc. 2012 8