3. 3ni.com
Markets in Need of Next-GenerationTest Systems
Wireless
Production Test
Semiconductor
Characterization
Semiconductor
Production Test
4. 4ni.com
NI PXI: Increased Productivity with NI LabVIEW
Test Code Development Time
Customer
TestCode
Algorithms
ThreadManagement
BusCommunication
HardwareAbstraction
IPIntegration
AnalysisLibraries
Cross-Compiling
GarbageCollection
MemoryAllocation
ThreadManagement
BusCommunication
HardwareAbstraction
IPIntegration
AnalysisLibraries
Cross-Compiling
GarbageCollection
MemoryAllocation
TestCode
Algorithms
Time Savings
t=0
“Nearly 30 years of test and
measurement-specific software
development”
5. 5ni.com
NI PXI: Increased Productivity with NITestStand
Custom Operator
Interface
Sequence Execution
Engine
Database
Logging
Report
Generation
Parallel
Execution
Unit (Serial Number)
Tracking
Interface to
Coding Languages
Documentation
DevelopmentTime perTest Executive [Man-days]
10087.57512.5 25 37.5 50 62.5
Developing Custom
Leveraging TestStand
6. 6ni.com
NI PXI: Industry-Leading Instrumentation Portfolio
PXIe-5646R
6GHz Vector Signal
Transceiver
PXIe-5162
4ch, 1.5GHz, 10-bit Digitizer
PXI-4071
7½-digit, 1kV Precision
DMM
PXIe-2543
6GHz, 8ch, Solid-State Mux
PXIe-6556
24ch, 200MHz, PPMU Digital
PXIe-4112
2ch, 60V, 1A DC Power Supply
PXIe-5451
2ch, 400MS/s, 16-bit AWG
PXIe-4139
Precision System SMU
7. 7ni.com
NI PXI: Open FPGATechnology
NI PXI Chassis
NI Software-Defined InstrumentNI Embedded PXI Controller
Open
FPGA
Signal
I/O
Measurement
Analysis
Test
Executive
Test
Routine
Other Vendor’s PXI Chassis
PXI Modular InstrumentEmbedded PXI Controller
Locked
FPGA
Signal
I/O
Measurement
Analysis
Test
Executive
Test
Routine
8. 8ni.com
NI PXI: Software-Designed Instruments
PXIe-5668R
26.5 GHz, >765MHz BW
RTBW Vector Signal
Analyzer
NI PXIe-6591/92R
12.5 Gbps, 4-8 ch.
High Speed Serial
PXIe-5070/71R
250 MS/s, 14-bit, 4-8 ch.
Oscilloscope
PXIe-7976R
3.5GB/s Streaming
K410T K7 FlexRIO
PXIe-5646R
6GHz, 200MHz BW
Vector Signal Transceiver
PXIe-5624R
2 GS/s, 12-bit
IF Digitizer
“Fully-functional
instrument
out-of-the box”
LabVIEW
FPGA
Customize
functionality with
13. 13ni.com
Evolution of SemiconductorTest Requirements
Historical Requirements
• High Digital Pin Count
• Few Analog Pins
• No Sensor Integration
• No RF Antennas
• Microprocessors
• Memory Chips
Market Forces
IoT Enabled Devices
AD
Modern Requirements
• Reduced Digital Pin Count
• Increased Analog Pins
• Sensors (MEMS)
• Multi-port Antennas
• Power Management (PMIC)
• Power Amplifiers (RFIC)
15. 15ni.com
Test Efficiency is Necessary to Stay Profitable
Time
Device Complexity
Time
Chipset Cost
Time
Implications on Test
"To remain profitable in the future, companies will need to rethink their
approach for wireless test and embrace new paradigms”
- Olga Shapiro, Analyst, Frost & Sullivan
16. 17ni.com
Markets in Need of Next-GenerationTest Systems
Wireless
Production Test
Semiconductor
Characterization
Semiconductor
Production Test
17. 18ni.com
Markets in Need of Next-GenerationTest Systems
Semiconductor
Characterization
Requirements
• Software Development
• Numerous Test Iterations
• Mixed-Signal Devices
• Complex Algorithms
• High Measurement Quality
18. 19ni.com
Previous PXI Phase 1 PXI Phase 2
“We improved test speeds by
more than 200X compared to
traditional rack-and-stack
instruments while significantly
improving test coverage."
Technology
Traditional Box
Instrumentation
NI PXI RF
Instrumentation
NI Vector Signal
Transceiver
Year Early 2000’s 2007 2012
Test Time
Reduction
1X 10X 200X
WLAN
Protocols
Tested
802.11a
802.11b
802.11g
802.11a
802.11b
802.11g
802.11n
802.11a
802.11b
802.11g
802.11n
802.11ac
Qualcomm: Reduced CharacterizationTestTime
19. 20ni.com
Markets in Need of Next-GenerationTest Systems
Wireless
Production Test
Semiconductor
Characterization
Semiconductor
Production Test
21. 22ni.com
Case Study: MEMSTest Cost Reduction with PXI
"Using PXI and LabVIEW, we were
able to test our MEMS devices at a
fraction of the cost, weight, power
consumption, and footprint of our
previous ATE system.”
Previous ATE PXI System Reduction
Cost $450k $40k 11X
Footprint 277 ft3 1.75 ft3 158X
Weight 4000 lbs. 60 lbs. 66X
Energy 10 kW 0.6 kW 16X
23. 24ni.com
PXI Simplifies Data Correlation with Standardization
NI STS T1NI PXI
Characterization
PXI Chassis and Controller
NI STS T4NI STS T2
Production
PXI RF and Modular Instrumentation
NI LabVIEW (Code Module Development) and NI TestStand (Test Management)
STS Standardized Docking and Cabling Interface
24. 25ni.com
Standard Docking and Interfacing
Coax Spring Probe
Interface
(<2GHz)
DC Spring Probe
Interface
RF Blind Mate
w/ compressible connector
All interface locations are configurable
Device Interface
Board (DIB) Locker
(Reid Ashman)
25. 26ni.com
FlexibleTest Software
Test Sequence Editor with Multisite Support
Operator Interface
DUT Binning
Handler/Prober
Integration
Debugging Tools
Database Logging
Pin and Channel Mapping
Integration with 3rd Party
Instrumentation
Calibration, Monitoring,
and Diagnostics
SemiconductorTest System Software
26. 27ni.com
Semiconductor ProductionTest - IDT
“Traditional ATE systems require major
costly retooling efforts as generations of
test systems become obsolete or unable to
meet new test requirements, but the
nature of the open PXI architecture of the
STS helps us retain our original investment
and build upon it rather than throw it away.’’
Glen Peer, Director of Test,
Integrated Device Technology
PXI-based STS System Benefits
• 50% test cost reduction
• Standard 110V connection
• Standardization across multiple departments
• Obsolescence mitigation
• High-performance measurements
• Ability to Scale for future requirements
27. 28ni.com
Markets in Need of Next-GenerationTest Systems
Wireless
Production Test
Semiconductor
Characterization
Semiconductor
Production Test
29. 30ni.com
Customer Example: peiker acustic
"The WTS allowed us to reduce our test costs by more than 25% by
testing four devices in parallel, with three antenna ports each, using
multiple wireless technologies ranging from LTE to Wi-Fi to GPS all
with the same equipment”
System Integrated by NOFFZ
30. 31ni.com
Fastest Measurement Hardware
The modular of the PXI platform ensures that test systems use the fastest
CPUs and FPGAs – to guarantee the fastest test times.
Total MeasurementTime
Process Measurement
Traditional Solutions
Acquire
Process Measurement
PXI-based Solutions
Acquire
Up to 50% faster!
Quad-core Central Processing
Intel Core i7 Processor
Inline Signal Processing
Xilinx Virtex-6 FPGA
35. 36ni.com
Markets in Need of Next-GenerationTest Systems
Wireless
ProductionTest
Semiconductor
Characterization
Semiconductor
ProductionTest
36. 37ni.com
NI Delivers Next-GenerationTest Systems with PXI
Wireless
ProductionTest
Semiconductor
Characterization
Semiconductor
ProductionTest
NI PXI
NI STS
NI WTS
Powerful Algorithm Software
High-performance, Flexible PXI Hardware
37. 38ni.com
Any Questions?
Next Sessions
11:15 – 12:00
Using PXI and SQL to Control
your Factory
Simon Hutchings - EMS Radio
Fire and Security Systems
The evolution of Mil/Aero test:
From rack and stack to rucksack
IanTonge - Serco
Aerospace and DefenceAutomated Test and RF
