2. 2 | ni.com/nidays
Table of Contents
Conference Highlights
Top 5 Reasons to Attend 3
Event Agenda 4
Keynote Sessions 5
NI Engineering Impact Award 7
Conference Content
Measurements Session 8
AutomatedTest and RF Session 9
Embedded Control and Monitoring Sessions 10
Exhibition
Exhibitors 11
Exhibition Floor Map 16
General Information 17
Sponsors
3. ni.com/nidays | 3
Join us at NIDays 2015
National Instruments is delighted to invite you to NIDays 2015 in Singapore, our annual
Graphical System Design Conference and largest regional technology and innovation event
in Singapore that brings together 100’s of leading engineers and scientists.
This complimentary, full-day, multi-track event features keynote presentations, interactive
session taught by NI and industry experts, guest industry case studies, networking
opportunities, and an exhibition showcasing the latest technologies, best practices, and
application trends or software-defined systems in test, measurement, and embedded
systems.
Top 5 Reasons to Attend
1. Inspirational Guest Keynote Speakers including Charles Schroeder, Vice President of Product Marketing, RF and
Wireless Communications, Chandran Nair, Vice President – Asia Pacific, Matej Krajnc, Regional Director ASEAN and
ANZ. Learn how together, you and NI are using a platform-based approach to overcome escalating complexity and
create the Internet ofThings, and hear from our speakers about NIs vision of empowering engineers and scientists to
make this trend a reality.
2. Over 15 hours of technical content across 18 sessions and 3 application specific tracks; Embedded Systems,
AutomatedTest and RF, and Measurements, allowing you to maximise your learning experience.
3. The opportunity to network and connect with hundreds of peers and domain experts from industry and research
institutions; build your network, discuss your application interests, share your ideas and learn from fellow innovators.
4. Hear and learn from influential guest presenters from industry and academia; with 5 guest case study presentations
from companies including ST Kinetics, Honeywell, Accusys,Tessolve Semiconductor, and Ken Engineering and
Consulting, on topics including Hyper-Domain Data Analytics, SemiconductorTest, Machine Condition Monitoring and
Data Acquisition.
5. Explore exhibits from technology partners, system integrators and 11 interactive application demonstrations featuring
the latest NI technologies for applications including 5G Research, Wireless ProductionTest, PA system design and
prototyping, smart wearable devices with NI SOM, advanced control, data acquisition, the IoT and many more
Thanks to all our sponsors, exhibitors and delegates for participating in NIDays 2015. I encourage you to take advantage
of this ultimate learning environment to advance your skills, explore the possibilities of graphical system design and
inspire innovation in your own work.
We look forward to welcoming you there,
Best regards,
Matej Kranjc
Regional Director - ASEAN and ANZ
National Instruments
4. 4 | ni.com/nidays
Agenda
8:45-9:15 Registration & Light Breakfast
9:15-10:30
Keynote: Using a Platform-Based Approach to Create the Internet ofThings
Matej Kranjc, Regional Director of ASEAN and ANZ, National Instruments
Charles Schroeder, Vice President of Product Marketing, RF and Wireless, National Instruments
10:30-11:00 MorningTea Break
11:00-11:45
Enabling Innovation and Inspiring Customer Success
Goh Yih-Hsiung (YH), Regional Sales Manager of ASEAN, National Instruments and Guests
11:45-12:00
NI Engineering Impact Awards
Chandran Nair, Vice President of APAC, National Instruments
12:00-13:00 Lunch
Automated Test Track
Embedded Control
and Monitoring Track
Measurements Track
13:00-13:45
Create Without Limits:
4 Ways to CustomizeYour
Software-Designed
Instrument
Yousi Ng, Area Sales Manager,
National Instruments
Introducing NewTechnologies to
Enable the Industrial Internet of
Things
Wong Teck Chin (Jeffrey),
Field Sales Engineer,
National Instruments
A Discussion About the Future of
LabVIEW
Swathi Madhavan,
Technical Marketing Engineer,
National Instruments
13:45-14:15
NI STS-T2 for MEMS Test
Development
M. Banukumar, Senior Manager,
Tessolve Semiconductors
Software-based approach to
Asset Monitoring and Machine
Condition Monitoring
Ken Ng, Managing Director,
Ken Engineering and Consulting
Upgrading a High Channel Count
Data Acquisition System
John Tan, Manager,
Honeywell Aerospace Singapore
14:15-15:00
Exploring the Architecture and
Key Features of NI
SemiconductorTest System
Software
Gobinath Tamil Vanan,
Technical Marketing Engineer,
National Instruments
Data Communication Methods
for Embedded Systems
Guo Min, District Sales Manager,
National Instruments
New HardwareTechnologies for
DAQ Applications
Froinand Fajardo, District Sales
Manager,
National Instruments
15:00-15:30 Afternoon Break
15:30-16:00
Hyper-Domain Data Analytics
Solutions Turning Big
Analogue Data into
Actionable Insights
Jack Wong, Assistant Manager,
ST Kinetics
Your NI Machine Vision Solution
within 30 Minutes
Winston Hoo, Technical Manager,
Accusys
Practical Advice for Ensuring
Accurate Electrical Measurement
Neo Wei Ren, Field Sales Engineer,
National Instruments
16:00-16:45
Prototyping with Software
Defined Radio for Industry,
Academic, and Defense
Applications
Malay Duggar, RF Specialist,
National Instruments
Choosing a Software
Architecture forYour Next
Embedded Application
Leon Tan,
Field Applications Engineer,
National Instruments
Top SoftwareTips for Deployed
or Distributed DAQ Systems
Wu Rong,
Marketing Engineering Manager,
National Instruments
16:45-17:00 Q&A, Lucky Draw
5. ni.com/nidays | 5
Join us at NIDays 2015
NIDays keynote presentations give attendees a first glimpse at new
cutting-edge innovations from NI as well as an opportunity to learn about
customers and real-world solutions using NI tools.
Keynote: Using a Platform-Based Approach to Create the Internet ofThings
9:15-10:30 | Grand Salon
Together, you and NI are using a platform-based approach to overcome escalating complexity and create the Internet of
Things.
Join the NI executives as they explore the latest advances in the NI platform and how you are using them to speed up
test, reach measurement decisions faster and enable smarter machines in the IoT.The keynote will feature live
demonstrations of application examples and the technology powering real-world IoT systems such as wireless test, data
management, condition monitoring, and communications system design.
Among the keynote speakers are:
Matej Kranjc, Managing Director of ASEAN and ANZ, National Instruments
With 30 years of engineering industry experience, Matej Krajnc is an internationally-known speaker, trend analyst and
applied engineering consultant. His expertise covers various fields, including automated test, control, and design for the
military, aerospace, automotive, and paper industries. As managing director for the ASEAN and ANZ divisions of
National Instruments, Krajnc is responsible for the growth of NI presence, visibility, sales, and application engineering
throughout Australia, New Zealand, and Southeast Asia. His experience has helped him establish NI as a powerful
solutions provider throughout his region. He and his team have developed an excellent reputation as a resource for
solving numerous industrial engineering challenges.
Charles Schroeder, Vice President of Product Marketing, RF and Wireless, National Instruments
As Vice President of Product Marketing for RF and Wireless Communications, Charles Schroeder leads the global team
responsible for product management, product marketing, and application segments of NI’s RF and wireless
communications business. Since joining NI in 1995, Schroeder has held various leadership roles across the IMAQ, DAQ,
modular instruments, and RF product lines and is recognized for his excellent communication and presentation skills as
witnessed by his regular presence on the NIWeek stage. Schroeder holds a bachelor’s and master’s degree in electrical
engineering fromTexas A&M University.
6. 6 | ni.com/nidays
Keynote: Enabling Innovation and Inspiring Customer Success
11:00-11:45 | Grand Salon
Around the world, NI platforms are enabling local innovators to take on engineering challenges and engineer a better
world for us all, across application areas ranging from the Internet ofThings and wireless research, to high-performance
automated test for the semiconductor industry and machine condition monitoring systems to increase efficiency in
renewable energy systems.
JoinYH Goh, Regional Sales Manager for South East Asia, as he is joined during this keynote presentation by local
customers and partners to discuss their application demands and the innovative solutions they have developed using NI
platforms.
Goh Yih-Hsiung (YH), Regional Sales Manager of ASEAN, National Instruments
YH has been with National Instruments since 2002 and is currently the Regional Sales Manager overseeing the sales
operations for Southeast Asia.
Prior to this, he was the Area Sales Manager responsible for the sales operations for Singapore and Indonesia.YH has
worked with engineers and scientist from the academia and various industry sectors such as Electronics, Industrial
Monitoring, Automotive, Semiconductor, Aerospace and MCM applications for more than 10 years.
YH graduated from NanyangTechnological University majoring in Electrical Electronics. He started his career as an
Applications Engineer before moving to Sales. He was also instrumental in growing the presence of National
Instruments in the Philippines, Indonesia, Vietnam and Southern Malaysia.
7. ni.com/nidays | 7
NI Engineering Impact Awards showcase the most innovative projects
based on NI software and hardware. During NIDays 2015 and immediately
following the second Keynote presentation, Chandran Nair, Vice President
for Asia Pacific, and Mark Phillips, Marketing Manager for ASEAN and
ANZ, will recognize and celebrate local winners of the 2015 Awards.
Visit the contest poster display, to learn about the winners’ applications for
academic and industry categories, as well as the several featured awards
including the Advanced Manufacturing and Control, Advanced Research,
RF and Communications, Energy and Editor’s Choice.
NI Engineering Impact Awards
Industry Winner
New NI PXI-Based Power Supply SequencingTester:
Making a Big Difference
Junifer B. Frenila, Bien Verlito A. Javier, Meriam C.
Yuson and Jessy P. Cantor, Analog Devices Inc.
Philippines, Philippines
Industry Honorary Mention
EDA Memory CharacterizationTester (EDA MCT):
Characterizing the Next Generation of Semiconductors
Using NI PXI
Sanka Hettiarachchi and Nikolaus Utomo, Providev,
Singapore and EDA Industries (Asia Pacific), Singapore
Academic Winner & RF and Communications
Award
Infrastructure-light and Infrastructure-less RealTime
Localization System (RTLS)
Assoc Prof Tan Soon Yim and Dr. Seow Chee Kiat,
Nanyang Technological University, Singapore
Academic Honorary Mention, Advanced
Research Award & Editor’s Choice
Solution to an Autonomous Vehicle Platform Integrated
with Remote Human Intervention and Supervision
Du Xinxin, Kyaw Ko Ko Htet and Prof. Tan Kok Kiong,
National University of Singapore, Singapore
Advanced Manufacturing Control Award
Increasing Reliability and Safety of Industrial Stamping
Machines with NI CompactRIO and NI LabVIEW
Ken Ng, Ken Engineering and Consulting Pte Ltd,
Singapore
Energy Award
Thermal Effects of Electrical Energy Harvested from a
Laminated Piezoelectric Device
Pornrawee Thonapalin and Asst. Prof. Sontipee
Aimmanee, King Mongkut’s University of Technology
Thonburi (KMUTT), Thailand
Best Video Award
A Bus Flagging Prototype System for the Visually Impaired
Utilizing a Reconfigurable NI myRIO
Alex See Kok Bin, Ph.D, Chin Siet Choo, Yuen Mun
Leong, Zhu TaiXiu, Ph.D, Muhammad Anas Bin
Ariffin and Chan Jian Long, Ngee Ann Polytechnic,
Singapore
Explore the Winner’s applications in detail and download the 2015 NI ASEAN Engineering Impact Awards full case study
booklet at singapore.ni.com/impactawards
8. 8 | ni.com/nidays
Measurements Sessions
A Discussion About the Future of LabVIEW
13:00-13:45 | Grand Salon
Swathi Madhavan, Technical Marketing Engineer,
National Instruments
LabVIEW has helped engineers across almost every
region, market, and industry make a marked improvement
to their everyday productivity as it relates to automating
measurements. At this session, learn about the
improvements in the latest version of LabVIEW, LabVIEW
2015, and explore where NI continues to invest in our
software platform.
Upgrading a High Channel Count Data Acquisition System
13:45-14:15 | Grand Salon
John Tan, Manager, Honeywell Aerospace Singapore
Honeywell offers complete test facilities for all of its OE
products including Fan, Turboprop, APU and vehicle
propulsion engines. During this presentation, John Tan
will explore the recent upgrade to a high channel count
data acquisition system with over 300 channels of
measurement required. He will discuss the application
requirements, and why Honeywell chose an NI PXI-
based solution and the LabVIEW graphical development
environment as well as the efficiencies that have been
realized with the new solution.
New HardwareTechnologies for DAQ Applications
14:15-15:00 | Grand Salon
Froinand Fajardo, District Sales Manager,
National Instruments
Whether your application involves taking a few voltage
measurements, a few dozen sensor measurements or
even a few hundred synchronized measurements, NI is
constantly developing new technology and releasing new
products that improve your ability to meet application
requirements.This session will introduce the major DAQ
product lines for engineers less familiar with the NI
platform, before looking in detail at new hardware
releases, their enabling technology and their application
use cases. Finally it will glimpse into the future of what
the NI DAQ platform has to offer.
Practical Advice for Ensuring Accurate Electrical
Measurement
15:30-16:00 | Grand Salon
Neo Wei Ren, Field Sales Engineer, National Instruments
Every physical system component increases signal error,
noise, and uncertainty.Thankfully, you have many
established techniques for minimizing your DAQ system’s
exposure to these predigitization errors. At this session,
hear best practices for shielding, gain, noise reduction,
grounding, and connectivity that help increase the
accuracy of your measurement.
Top Software Tips for Deployed or Distributed DAQ
Systems
16:00-16:45 | Grand Salon
Wu Rong, Marketing Engineering Manager,
National Instruments
When you deploy systems into the field for distributed or
in-vehicle applications, errors and inaccuracies can grow
into expensive and sometimes safety-critical failures. At
this session, hear from experienced engineers as they
offer their top tips for the reliable acquisition, analysis,
storage, and management of measurement data for
deployed applications.
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Automated Test and RF Sessions
Create Without Limits: 4 Ways to Customize Your
Software-Designed Instrument
13:00-13:45 | Salon 1 & 2
Yousi Ng, Area Sales Manager, National Instruments
Engineers are using software-designed instruments to
reduce test time, increase test throughput, overcome
obsolescence challenges, and perform innovative tests.
In this session, focus on four key software approaches for
developing code on software-designed instruments: (1)
using standard instrument drivers, (2) enhancing
instrument driver functionality with FPGA extensions, (3)
leveraging NI-installed sample projects, and (4) reusing
application-specific IP from the NI Community. Buckle up
for details and demonstrations of the approaches,
including FPGA code modification on NI reconfigurable
oscilloscopes and high-speed serial instruments.
NI STS-T2 for MEMS Test Development
13:45-14:15 | Salon 1 & 2
M. Banukumar, Senior Manager, Tessolve
Semiconductor India
Tessolve works with a wide range of ATEs to meet
semiconductor test requirements for different customer
needs. One of the test solutions recently developed by
Tessolve in close working with National Instruments is
the MEMS test solution. This presentation would give
you an overview of the MEMS test requirements and the
methodology applied by Tessolve to configure the NI
STS tester for this application. It would also give a brief
introduction about the NI-STS-T2 including some of the
benefits such as its wide range of hardware modules
catering to different test needs, suitability for low cost
solutions, user flexibility to customize hardware and
software requirements. Multi-site testing using LabVIEW
and TSM software are also highlighted. MEMS dynamic
tests using Shakers / Rate tables, low cost solutions,
along with the proof of concept on motion tests would
also be discussed.
Exploring the Architecture and Key Features of NI
Semiconductor Test System Software
14:15-15:00 | Salon 1 & 2
Gobinath Tamil Vanan, Technical Marketing Engineer,
National Instruments
This session provides a brief overview of key software
features for NI SemiconductorTest System (STS) including
overall software architecture, support for code modules
developed in multiple languages, device-centric
programming with pin and channel mapping, native
multi-site support and more.
Hyper-Domain Data Analytics Solutions Turning Big
Analogue Data into Actionable Insights
15:30-16:00 | Salon 1 & 2
Jack Wong, Assistant Manager, ST Kinetics
ST Kinetics has successfully delivered numerous
Intelligence Analytics Solutions, including Radio
Communications Management Solutions (RCMS),
Large-Scale Distributed Management Solutions (LSDMS),
Industrial Automation (IA) and Data Analytics Solutions
(DAS) used for both commercial and homeland security
purpose, with use of NI virtual instrumentation platform.
In this presentation, we will talk about the Hyper-Domain
Data Analytics Solutions which turn big analogue data into
actionable insights in variety of applications.
Prototyping with Software Defined Radio for Industry,
Academic, and Defence Applications
16:00-16:45 | Salon 1 & 2
Malay Duggar, RF Specialist, National Instruments
Advancements in Software Defined Radio technology is
making wireless more accessible than ever before
benefiting industry, academia, and defense applications.
In this session, we share how you can leverage a
common software defined radio platform and choose the
right software tool flow to design, prototype, and deploy
SDR based systems.Topics include designing new
waveforms, prototyping high channel count systems,
deployed spectrum monitoring, educational teaching
solutions, and 5G research.
10. 10 | ni.com/nidays
Embedded Control and Monitoring Sessions
Introducing New Technology to Enable the Industrial
Internet of Things
13:00-13:45 | Salon 5 & 6
Jeffrey Wong, Field Sales Engineer,
National Instruments
In this session, learn about the new NI technology for
embedded control and monitoring applications. Products
include the latest CompactRIO and Single-Board RIO
controllers, the new Controller for FlexRIO, and the latest
C Series I/O modules.These devices incorporate the most
up-to-date technology and provide new I/O points to offer
you innovative and advanced functionality that can
increase your productivity and system performance.
Attend this session to see some of this new technology in
action and learn how it can enable your next application.
Software-based approach to Asset Monitoring and
Machine Condition Monitoring
13:45-14:15 | Salon 5 & 6
Ken Ng, Managing Director, Ken Engineering and
Consulting
Traditionally, asset monitoring (AM) and machine condition
monitoring (MCM) are technically low-level systems that
monitor a specific machine or asset. In the increasingly
connected environment, where different machines are
connected or related to each other, it becomes paramount
to be able to monitor your assets or machines on a higher
level in real time.This presentation will talk about a case
study on using NI LabVIEW to develop a software-based
approach to AM and MCM in real time; providing real-time
data on the health of various machines as well as able to
do complex high level analysis for system level reporting.
Data Communication Methods for Embedded Systems
14:15-15:00 | Salon 5 & 6
Guo Min, District Sales Manager, National Instruments
Coordinating data between your embedded controller and
other nodes in the system is identified by NI customers as
one of the top challenges in embedded system design
and will be crucial for Internet ofThings applications. In
this session we’ll introduce effective distributed
communication architectures between targets running
LabVIEW, focusing on Network Published Shared
Variables and Network Streams.
Your NI Machine Vision Solution within 30 Minutes
15:30-16:00 | Salon 5 & 6
Winston Hoo, Technical Manager, Accusys
Demonstrating on how to create simple machine vision
solution utilizing NI technologies, started from system
design, component selection, program development to
results output.
Choosing a Software Architecture for Your Next
Embedded Application
16:00-16:45 | Salon 5 & 6
LeonTan, Field Applications Engineer, National
Instruments
Developing software for embedded applications can be
challenging. For starters, the business logic for these
systems is rarely simple. However, the real challenge
often lies in processes like connecting that logic to I/O,
integrating the application into an existing system, and
ensuring that the application runs properly for months or
years at a time.These projects also frequently encounter
logistical challenges such as supporting multi developer
teams with tight time-to-market pressures. At this session,
discover how a good architecture can help address these
issues and review your different architecture options.
11. ni.com/nidays | 11
Keynote Demonstrations
Revolutionizing 5G Research with LabVIEW
Communications
Grand Salon
Learn how to rapidly prototype with software that detects,
configures, and manages your hardware while saving time
and focus on innovation with the latest release of the
802.11 and LTE application frameworks. Also find out
ways to take advantage of the all new SDR hardware
support for wide-bandwidth applications enabling your 5G
research at its peak.
LowerYour Cost of Wireless ManufacturingTest
Booth 10
Engage in multistandard testing of the latest cellular and
connectivity devices, from LTE-A to 802.11ac to Bluetooth
Low Energy, with the WirelessTest System (WTS). With
the WTS, you can be sure to reduce test cost by testing
up to 8 DUTs in parallel and perform data analysis on the
latest Intel processors. Along with that, also learn on ways
to rapidly deploy testers with ready-to-run test sequences
and a standard SCPI interface with this insightful
demonstration.
The Future of the Internet ofThings
Booth 15
Watch how NI is helping to create a climate of innovation
where tomorrow’s engineers will realize the true potential
of the IoT.Take part and join effort with NI to inspire,
motivate, inform, and build confidence among engineers
on the role of our customers, partners, and NI in shaping
the future of IoT.
High Speed Measurements with the New Controller for
FlexRIO
Booth 13
Watch NI Engineers show ways to acquire and process
data on full bandwidth data in real-time to isolate signals
of interest and provide valuable knowledge to users.
Deploy your algorithms to run stand-alone in the field,
running on big Kintex-7 K410T FPGAs and dual-core ARM
processors with NI Linux Real-Time to serve up low
bandwidth data over the network while streaming back up
to 1.25 GB/s of data over fiber or copper cabling.
Exhibition Area
NIDays will feature an extensive exhibition and demonstration area,
featuring interaction application demonstrations from both NI and our
Alliance Partners; specialist system integrators and experts in developing
solutions based on NI Platforms. Take the chance to get a closer, deeper
look at all the latest technologies, including those featured in the Keynote
presentations.
12. 12 | ni.com/nidays
Automated Test and RF Demonstrations
Wafer Probe Loadboard/PIB (STST2 MB)
Booth 5
DTS has a full line of standard PIBs for all major tester
platforms. Custom PIB designs can accommodate any
test head, prober and manipulator configuration, including
probe card changers, overhead direct dock setups and
cable interfaces. DTS wafer test loadboards are
compatible with a variety of pogo pin interface towers. All
PIBs are constructed with impedance control, precision
matched line lengths, full power and ground planes and
both analog and digital resources to provide high quality
signal integrity directly to the device.
DynamicTest Solutions Asia
www.dynamic-test.com
PackageTest Loadboard/ DIB (STS ATE LB)
Booth 5
DTS PackageTest (DIB) loadboards are designed to
specific devices and configured for both hand test and
fully automated handler applications. DTS loadboards
incorporate any brand of socket or contactor and can be
configured for multi-site testing. Designs incorporate all
necessary components, connectors, mechanical hardware
and stiffeners to provide a complete plug-n-play solution.
DTS has a vast database of tester and handler information
which allow designs to be started and completed quickly
without burdening the customer to supply excessive
information. DTS designers are experienced in all device
types, including digital, analog, mixed signal and RF
devices
DynamicTest Solutions Asia
www.dynamic-test.com.
An Integrated HTRB and THB Test Platform for
MOSFETs Using PXI and LabVIEW
Booth 6
A fully automatic HTRB andTHB process was made
possible by integrating a parametric test subsystem
based around the NI PXI platform, with a climatic
chamber.The whole system was controlled by a custom
software created using the NI LabVIEW platform.The
result has reduced the time for each characterization test
from a few days to a few hours, and guarantees that the
test result is easily obtainable and reliable.
EDA Industries (Asia Pacific)
www.eda-industries.net
Automatic Unknown Emitter Detection (AUED)
Booth 7
To detect the unknown emitters in HF frequency range
(3-30MHz) is challenging where the noise floor is uneven
and the HF band is congested with multiple emitters.
Using FPGA-based wavelet analysis, the system can
automatically detect the emitter in real time.
Singapore Technologies Kinetics Ltd
www.stengg.com
Test Development for MEMS Inertial Sensors on NI
STS T2
Booth 8
Observe the power of the NI STS-T2 configuration used
for MEMS Inertial Sensor test while going through the
challenges and constraints faced and how the engineers
solved every single one of them. Also obtain primary
source information on the development methodologies
directly from the exhibitors. Learn more about the
NI-STS’ multi-site testing capabilities and the design
concept of universal mother boards and daughter boards.
Tessolve Engineering Services Pte Ltd
www.tessolve.com
Build your Test Applications with NI PXI and
TestStand
Booth 9
Learn how NI helps to you to develop test systems faster
with ready-to-run Test Management Software, the NI
TestStand. With the combination of the NI TestStand and
the NI PXI platform, you can be sure to increase test
development productivity and reduce overall test costs.
The flexibility of the software-defined measurements are
boundless, providing high-speed measurements with
perfect timing controls.
Base Station and Small Cell PA Design
Booth 10
Efficiently develop software prototypes of your Power
Amplifier design for easy simulation. Explore the simple
demonstration to obtain great insights on ways to readily
retarget base station/FEMtoCell designs to evolving
standards
13. ni.com/nidays | 13
Embedded Control and Monitoring Demonstrations
Increasing Reliability and Safety of Manufacturing
Machines with KEC Machine Condition Monitoring
(MCM) Solution
Booth 2
Harness the power of CompactRIO and LabVIEW to
monitor, identify and rectify anomalies in real-time during
continuous manufacturing operations.This rugged and
independent CompactRIO system operations dramatically
increase Operator SafetyFEC MCM Solution records and
stores machineSafety.Together with KEC MCM Solution,
machine condition data can be continuously recorded and
stored in Host Server for post analysis.
Ken Engineering and Consulting Pte Ltd
www.kec.sg
Environmental Monitoring System
Booth 3
A Temperature and humidity monitoring for laboratory,
production floor, warehouse and building which uses NI’s
compactRIO real-time embedded system for monitoring.
It features include: (1) Administrative (administrator and
user management with system access and data security),
(2) Alert (alarm trigger of individual monitoring point), (3)
Report management (report generation and report
retention), (3) Centralized monitoring Microwave
Education and Research Through NI and AWR Integrated
Solutions.
T2 Integrated Solutions Pte Ltd
www.t2is.com.sg
Robotics from the Dungeons to Daily Lives
Booth 4
Robots are commonly used in manufacturing sectors are
usually behind closed doors.They are now much more
mature to be used in daily lives such as warehouses,
material handling, healthcare and even hospitality.
HOPETechnik Pte Ltd
www.hopetechnik.com
Dynamic Measurement with Smart Glasses and NI
SOM
Booth 12
Learn how NI solves real world problems with this
intelligent human embedded sensing demonstration with
wearable devices such as a safety helmet. Explore
together the abilities of NI SOM to obtain dynamic and
real-time measurement of environmental data together
with extremely efficient processing capabilities.
Rugged and Reconfigurable Control and Monitoring
System
Booth 14
Discover how NI CompactRIO combines an open
embedded architecture with small size, extreme
ruggedness, hot-swappable industrial I/O modules, and is
powered by the NI LabVIEW reconfigurable I/O (RIO)
architecture. Using the NI CompactRIO, you can simplify
development, increase productivity, and dramatically
reduce time to market with the help of user-
programmable FPGA, where you can implement custom
hardware for high-speed control, inline data processing, or
complex timing and triggering.
14. 14 | ni.com/nidays
Academic and Measurements Demonstrations
PitscoTETRIX PRIME for NI myRIO: Students Create
Robots to Learn Controls and Mechatronics
Booth 1
Introduce students to engineering and robotics with
step-by-step instructions for three robot models while at
the same time helping students implement controls,
mechatronics, and robotics theory learned in the
classroom. Equip students to create their own designs
with graphical programming, sophisticated sensors and
actuators, and industry relevant technology.
Simplify Measurement Systems with NI’s
CompactDAQ
Booth 16
Feast your eyes with the portable, rugged DAQ platform
that integrates connectivity and signal conditioning into
modular I/O for directly interfacing to any sensors or
signals with the help of LabVIEW software to customize
how you acquire, analyze, present, and manage your
measurement data. Obtain great insights on the
applications, from in-vehicle data logging, to benchtop
research, the breadth of bus, chassis, controller, and I/O
conditioning options which provide the best solution to
meet the needs of any medium-channel-count application.
VirtualBench: 5 Instruments. 1 Device.
Radically Practical
Booth 17
Broaden your mind with the practical approach to
benchtop instrumentation. Five essential instruments, one
device, and an intuitive software interface. A single
benchtop instrument with Oscilloscope, Function
Generator, Digital I/Os, Power Supply, and Digital
Multimeter, all with the ability to view and interact with
data using intuitive, user-friendly software for Windows
and iPad.
15. ni.com/nidays | 15
LabVIEW Usergroup Demonstrations
Singapore LabVIEW Usergroup
Singapore LabVIEW Usergroup is a group of LabVIEW enthusiasts that
gathers to improve their LabVIEW skills and knowledge with others. Visit
their booth to learn more from them.
Split Video Screen with LabVIEW ActiveX Control and
Windows Mediaplayer
This demo uses ActiveX Control technology to split
screen for video sources technology that could be useful
for surveillance purposes.
Customizable Imaging Concept for Photonics and
Bio-imaging
We demonstrate a flexible concept for displaying scan
images for photonics and bio-imaging applications. Users
are able to easily customize settings for their imagery
with minimal programming, such as image size,
resolution, signal gain and scaling bar, with the aim of
letting users get their imaging experiments up and
running in a shorter amount of time.
Singapore Live Irradiance Map
The system comprises of 25 meteorological stations
located strategically around the Singapore Island. Full sets
of meteorological parameters are received every one
second at the Central Monitoring System at SERIS. Solar
irradiance readings from all the stations are aggregated
and displayed as interpolated color map overlaid with
Singapore contour map.
The map is updated every 2-3 seconds. It shows rapid
changes of irradiance values in real time, and visualizes
clouds movement over the island.These readings are one
of the components of solar irradiance forecasting system
developed by SERIS. Due to fast increase in the number of
grid connected solar photovoltaic systems, there is a need
to adjust energy generation from conventional power
plants, ahead of significant variations of solar irradiance.
Live Irradiance map is also available to public at the
National Solar Repository Web page at:
www.solar-repository.sg, with update rate.
16. 16 | ni.com/nidays
Exhibition Floor Map
Exhibition Hours
08:15 a.m. – 09:00 a.m.
10:30 a.m. – 11:00 a.m.
12:00 p.m. – 01:00 p.m.
03:00 p.m. – 03:30 p.m.
AutomatedTestTrack
Salon 1 & 2
Embedded Control and
MonitoringTrack
Salon 5 & 6
Keynote and
MeasurementTrack
Grand Salon 1 & 2
Entrance
Registration
Media Room
Buffet Buffet Buffet Buffet
Buffet
AutomatedTest and RF Demonstrations
Embedded Control and Monitoring Demonstrations
Academic and Measurements Demonstrations
C LV 2 3 4 5 6 7 8
9101112131 14151617
C Customer Education
LabVIEW User GroupLV
17. ni.com/nidays | 17
NI Certification
Validate Your Expertise
• Demonstrate skills and work quality
• Inspire confidence in managers, peers and
customers
Differentiate Yourself
• Set yourself apart from your colleagues
• Be known for your expertise
Network With Peers
• Access private online communities
• Learn from and interact with other certified
professionals at annual certification summits
Standardize Across Your Organization
• Use uniform and secure exams worldwide
• Invest in your employees’ success, gauge their skills,
and ensure work quality
• Clearly define and reward technical skill development
goals for individuals
• Recognize technical leaders and develop
communication channels and communities that
promote the use of best practices and quick problem
resolution
TheValue of NI Certification
Join the nearly 20,000 certified professionals worldwide who demonstrate
their skills with NI products so that anyone, whether managers,
customers, or peers, can be confident in the quality of their work.
Certification Offered
Skill Level
LabVIEW
TestStand LabWindows™/CVI
Core Embedded Systems
Developer
Architect Master architecting
and managing
applications
Demonstrate
proficiency in
designing and
deploying embedded
control and
monitoring
applications
Architect and manage
applications
No certification
offered
Developer Create functional,
well-documented
code with minial
development
Completely
understand the core
features and
functional
Completely
understand the core
features and
functional
Associate Developer Understand the core features of and the
ability to interpret existing LabVIEW code
No certification
offered
No certification
offered
Visit the Customer education booth to speak to ourTraining Specialist or visit singapore.ni.com/training
18. 18 | ni.com/nidays
Conference Information
Venue Information
Grand Hyatt Singapore
10 Scotts Road
Singapore 228211
Free Registration
For more details and to register, please visit
singapore.ni.com/nidays
Email: asean.events@ni.com
Call: (65) 6226 5886
Toll free: 1800 226 5886
Map and Directions
Grand Hyatt Singapore is conveniently located on Scotts
Road, at the start of the Orchard Road shopping precinct.
Parking Charges
Car
Monday - Saturday:
- 4:00am - 4:59pm:
- 1st hour – SGD 3, Subsequent half hour – SGD 1
After 5:00pm:
SGD 5.00 per entry
Motorcycle
SGD 5 per entry
19. ni.com/nidays | 19
Lucky Draw
Prize Draw
All attendees* are eligible to enter a prize draw on the day to win an iPad
mini 4 and IPodTouch, 32gb
*Excludes exhibitors and staff
Sponsored by:
Providev and Ken Engineering and Consulting Pte Ltd.
