X-ray diffraction is a powerful nondestructive technique that uses monochromatic X-rays to determine the interplanar spacings of crystalline materials in order to characterize their structures, phases, and other structural parameters like grain size and defects. It provides information through analyzing the diffraction peaks produced by constructive interference of the X-rays scattered from the lattice planes, with the peak intensities determined by the atomic distribution and making the pattern a fingerprint of the material. This review summarizes recent scientific trends in using X-ray diffraction over the past five years across various fields including pharmaceuticals, forensics, geology, microelectronics, glass, and corrosion analysis.