Introduction to material science What kind of analyses methods will you take to examine the lattice constants surface morphology with 1-10 mu m dislocation preferred orientation? Solution a) For lattice constant X-ray diffraction (XRD) is the best technique to analyse. The atomic planes of a crystal cause an incident beam of X-rays to interfere with one another as they leave the crystal. This phenomenon is known as X-ray diffraction. X-ray diffraction has been in use in two main areas, for the fingerprint characterization of crystalline materials and determination of their structure. Each crystalline solid has its unique characteristic X-ray powder pattern which may be used as a “fingerprint” for its identification. b) For surface morphology Scanning electron microscopy (SEM) is the best technique to analyse. Scanning electron microscope is an instrument where entire primary electron beams emitted from an electron source are scanned on sample and a scanning image is obtained from a detection signal produced by secondary particles generated from the sample. Scanning electron microscope actually capable of obtaining a scanning image with high spatial resolution within a low acceleration voltage region c) For dislocation Weak-Beam Dark-Field is the best methdo to analyse. d)For orientation Geiger counter xray spectrometer is the best device to use..

1. Introduction to material science What kind of analyses methods will you take to examine the
lattice constants surface morphology with 1-10 mu m dislocation preferred orientation?
Solution
a) For lattice constant X-ray diffraction (XRD) is the best technique to analyse.
The atomic planes of a crystal cause an incident beam of X-rays to interfere with one another as
they leave the crystal. This phenomenon is known as X-ray diffraction. X-ray diffraction has
been in use in two main areas, for the fingerprint characterization of crystalline materials and
determination of their structure. Each crystalline solid has its unique characteristic X-ray powder
pattern which may be used as a “fingerprint” for its identification.
b) For surface morphology Scanning electron microscopy (SEM) is the best technique to analyse.
Scanning electron microscope is an instrument where entire primary electron beams emitted
from an electron source are scanned on sample and a scanning image is obtained from a
detection signal produced by secondary particles generated from the sample. Scanning electron
microscope actually capable of obtaining a scanning image with high spatial resolution within a
low acceleration voltage region
c) For dislocation Weak-Beam Dark-Field is the best methdo to analyse.
d)For orientation Geiger counter xray spectrometer is the best device to use.