This document provides an overview of statistical process control (SPC) techniques. It discusses key SPC concepts such as identifying assignable causes of variation, determining whether a process is in or out of control using control charts, and analyzing process capabilities. The document covers different types of control charts for variable and attribute data and how they can be used to monitor processes and drive quality improvements. It traces the origins of SPC to the work of Walter Shewart and W. Edwards Deming and explains how SPC is now used widely in manufacturing.