The document summarizes the research activities of Sandipta Roy at IIT Bombay. It describes their expertise in simulation tools like Lumerical FDTD and their current work simulating infrared detectors and thin film solar cells. It also outlines their PhD work, which included fabricating and characterizing nickel-silicide Schottky diodes for methane detection in the near infrared. Key results were a barrier height of 0.62 eV measured from electrical characterization and an optical responsivity of 2.6 mA/W for infrared detection at zero bias and 1.5 micrometers.
Coating Measurement Using Handheld X-Ray FluorescenceOlympus IMS
Β
Coating Measurement Using Handheld X-Ray Fluorescence
Abstract
Handheld X-ray fluorescence (HHXRF) can be used to measure coating thicknesses with advantages in precision and portability compared to other technologies. For benchtop analysis, analyzing coatings applied over large surface areas often requires destructive procedures. HHXRF overcomes this limitation and provides a nondestructive coating thickness testing capability.
A simple, user-friendly calibration built into the instrument interface enables the use of a certified standard to determine up to three layers of accurate and precise coating thicknesses. HHXRF coating measurements, which are independent of the substrate material, provide a user the freedom to analyze any deposited coating comprised of elements Ti through Pu. Because of the large elemental range of analysis, many corrosion-, wear-, and adhesion-resistant coatings measured in labs near the site of action can benefit from the precise results returned by HHXRF.
2019-06-07 Characterization and research of semiconductors with an FTIR spect...LeonidBovkun
Β
2019-06-07 Educational seminar at EP-3 University of Wuerzburg
I will present particular experiments and related results with FTIR spectrometer, so one may consider these experiments complimentary for you research.
Coating Measurement Using Handheld X-Ray FluorescenceOlympus IMS
Β
Coating Measurement Using Handheld X-Ray Fluorescence
Abstract
Handheld X-ray fluorescence (HHXRF) can be used to measure coating thicknesses with advantages in precision and portability compared to other technologies. For benchtop analysis, analyzing coatings applied over large surface areas often requires destructive procedures. HHXRF overcomes this limitation and provides a nondestructive coating thickness testing capability.
A simple, user-friendly calibration built into the instrument interface enables the use of a certified standard to determine up to three layers of accurate and precise coating thicknesses. HHXRF coating measurements, which are independent of the substrate material, provide a user the freedom to analyze any deposited coating comprised of elements Ti through Pu. Because of the large elemental range of analysis, many corrosion-, wear-, and adhesion-resistant coatings measured in labs near the site of action can benefit from the precise results returned by HHXRF.
2019-06-07 Characterization and research of semiconductors with an FTIR spect...LeonidBovkun
Β
2019-06-07 Educational seminar at EP-3 University of Wuerzburg
I will present particular experiments and related results with FTIR spectrometer, so one may consider these experiments complimentary for you research.
Probing Molecular Electronic Structure Using High Harmonic Generation TomographyChelsey Crosse
Β
The structure of valence electronic orbitals of a molecule determines the majority of chemical properties. Generation of high-order harmonic frequencies from atomic sources has been directly related to the electronic structure of the atom, (1) and extended as far as tomographic reconstruction of linearly symmetric polyatomic molecular systems with some success. (2,3,4)
However, because of the increased resolution of these reconstructions, discrimination of fine details of the orbital reconstructions reveals some inconsistencies in the orbital shapes when compared with past models & theoretical calculations. (2) There are several proposed corrections to the Strong Field Approximation (SFA) that currently underlies tomographic reconstruction as well as all other experiments that use high harmonic generation (HHG) to probe molecular systems. (5,6,7)
---------------------------------------------------------------------
1. Lewenstein et al. Phys Rev A 49 (3) 1994.
2. Salieres, Maquet, Haessler, Caillat, Taieb. Rep. Prog. Phys. 75 (2012) 062401.
3. Li, Liu, Yang, Song, Zhao, Lu, Li, Xu. Opt. Ex. 21 (6) 2013. 7599.
4. Torres et al. Phys Rev. Lett. 98 (2007) 203007.
5. Diveki et. al. J. Chem Phys. 414 (2013) 121.
6. Yip, Palacios, Rescigno, McCurdy, Martin. J. Chem Phys 414 (2013) 112.
7. Spanner, Patchkovskii. J. Chem. Phys. 414 (2013) 10.
Ion Beam Analytical Technique PIXE for Pollution Study at Dhaka Van de Graaff...iosrjce
Β
IOSR Journal of Applied Physics (IOSR-JAP) is a double blind peer reviewed International Journal that provides rapid publication (within a month) of articles in all areas of physics and its applications. The journal welcomes publications of high quality papers on theoretical developments and practical applications in applied physics. Original research papers, state-of-the-art reviews, and high quality technical notes are invited for publications.
Plenary lecture of the XIII SBPMat (Brazilian MRS) meeting, given on September 29th 2014 by Prof. LuΓs Carlos Dias (Universidade de Aveiro, Portugal).
Indatech Beyond Spectroscopy is an innovative company, with expertise in optical measurements for on-line monitoring and controlling industrial processes. Raman NIR UV Spectroscopy; Hyperspectral imaging; Spatialy Resolved Spectroscopy
In this presentation, we cover how to pick the right technology to measure a coating thickness.
- An introduction to coatings
- Why coatings are used in industry
- Why to measure the thickness of a coating
- The best methods for coating thickness measurement
For more information, visit: Olympus-IMS.com.
Photosynthesis active radiation, often abbreviated PAR, designates the spectral range (wave band) of solar
radiation from 400 to 700 nanometers that photosynthetic organisms are able to use in the process of
photosynthesis.
Photoluminescence spectroscopy of silicon photonic crystal nanocavitiesRoberto Lo Savio
Β
We demonstrate the possibility to characterize Si photonic crystal (PhC) nanocavity modes made on Silicon on insulator (SOI), and operating at telecom wavelengths, through photoluminescence (PL) spectroscopy at room temperature. In fact, a wide PL band between 1200 and 1600 nm is observed under optical pumping when proper material processing is performed after the nanocavities fabrication, namely Ar/H2 plasma treatment and Si implantation. PL emission is originated through the carrier recombination occurring at defect states formed in silicon after such treatments.
Screening for Ceramic and Leaded Contaminants in Glass Recycling Streams Usin...Olympus IMS
Β
Screening of Ceramic and Leaded Contaminants in Glass Streams via Handheld X-Ray Fluorescence (HHXRF) Analyzers
Dillon McDowell
and Alex Thurston
Abstract
Material recovery facilities (MRFs) typically use magnetic and optical sorting systems to separate glass cullet from recycled glass. However, these systems are not effective at screening glass ceramic and leaded constituents from cullet streams. These
contaminants lower the value of glass cullet to glass manufacturers, as they represent manufacturing and safety concerns. Handheld X-ray fluorescence (HHXRF) analyzers are widely used in various recycling and manufacturing settings to quickly provide chemical composition on a variety of elements, even to the range of 1β10 ppm. We compare HHXRF analysis of prepared glass samples to laboratory assayed glass standards used by MRFs and glass manufacturers. Our results show that HHXRF can detect even small quantities (<100 ppm) of ceramic elements in glass and glass cullet streams in situ. Our results also show HHXRF detection of leaded contaminants and coloring
streams. We also demonstrate that the same technique can be applied to in-line monitoring systems to analyze material streams for the same constituents.
Screening of Ceramic and Leaded Contaminants in Glass Recycling Streams using...Olympus IMS
Β
For more information, visit: https://www.olympus-ims.com/en/xrf-xrd/xrf-handheld/
Overview
- The glass recycling industry and recycling process
- Dealing with contamination
- Ceramic glass issues
- Brief introduction to XRF
Glass Recycling
The majority of recycling concerns glass containers (bottles, jars, etc.)
Primarily soda glass
Glass is recovered, sorted, and cleaned to be turned into furnace-ready cullet
Soda glass can be completely recycled without any loss of quality
On average, newly produced glass containers consist of ~33% recycled content
Material recovery facilities (MRFs) may process as much as 20+ tons of cullet per hour
Material quality is key to hitting efficiency targets and reducing process cost
Ceramic Glass Issues
A variety of techniques that handle different types of contamination
Magnetic sorting (metallic contamination)
Vacuum suction and vibrating screens (light materials β paper, plastic, etc.)
Visual/infrared sorting (opaque materials β stones, gravel, etc.)
Some materials are difficult to separate through automated techniques
Other glass types (borosilicate, leaded crystal)
Ceramic glasses
Ceramic glasses are increasingly common in variety of products
Cookwear
Manufactured good
Electronics (smartphone screens)
Has many of the same physical properties as recyclable glass (weight, density, appearance, etc.)
Howeverβ¦
Has a different chemistry (unique ceramic elements)
Has a higher melting point (doesnβt fully melt in a furnace)
Increase furnace downtime and/or may irreparably damage them
Large risk to cutting systems
Water-cooled scissors may be damaged attempting to cut into ceramic glass
The final product is rendered defective and unusable by impurities
Glass products with ceramic may crack or shatter (sometimes explosively)
Instrumentation
Olympus Vantaβ’ handheld XRF analyzer
Model: VCR (rhodium (Rh) anode, silicon drift detector (SDD )system)
8 mm excitation point (down to 3 mm with collimation)
Used βSoilβ method as basis for testing
Compton normalization technique
Typically used to test SiO2 - based samples
Offers various excitation conditions (beams) for a variety of elements
Testing performed using a Vanta workstation
Enables consistent sample presentation
Closed-beam system while in workstation
Experiment
Gauge the effectiveness of HHXRF in identifying various elements
Ceramic identifiers: titanium (Ti), zirconium (Zr), strontium (Sr), and zinc (Zn)
Additional identifiers: iron (Fe), copper (Cu), and lead (Pb)
Stage 1: Certified material
Test certified glass samples (NIST 610, NIST 612)
Establish a baseline calibration
Stage 2: Test recovered ceramic glass samples
Use the calibration from the previous stage
Sample composition also verified via lab testing (ICP)
Focus on effects of sample size and analysis time
Brief
1. Car catalysts and their history
β Element basis and importance
2. Handheld X-ray fluorescence (XRF) basics
β Theory
β Instrument components
3. Handheld XRF results
β Accuracy
β Precision
MMEA (The Measurement, Monitoring and Environmental Efficiency Assessment) research program final seminar presentation by Assoc. Prof. Juha Toivonen, Tampere University of Technology
Probing Molecular Electronic Structure Using High Harmonic Generation TomographyChelsey Crosse
Β
The structure of valence electronic orbitals of a molecule determines the majority of chemical properties. Generation of high-order harmonic frequencies from atomic sources has been directly related to the electronic structure of the atom, (1) and extended as far as tomographic reconstruction of linearly symmetric polyatomic molecular systems with some success. (2,3,4)
However, because of the increased resolution of these reconstructions, discrimination of fine details of the orbital reconstructions reveals some inconsistencies in the orbital shapes when compared with past models & theoretical calculations. (2) There are several proposed corrections to the Strong Field Approximation (SFA) that currently underlies tomographic reconstruction as well as all other experiments that use high harmonic generation (HHG) to probe molecular systems. (5,6,7)
---------------------------------------------------------------------
1. Lewenstein et al. Phys Rev A 49 (3) 1994.
2. Salieres, Maquet, Haessler, Caillat, Taieb. Rep. Prog. Phys. 75 (2012) 062401.
3. Li, Liu, Yang, Song, Zhao, Lu, Li, Xu. Opt. Ex. 21 (6) 2013. 7599.
4. Torres et al. Phys Rev. Lett. 98 (2007) 203007.
5. Diveki et. al. J. Chem Phys. 414 (2013) 121.
6. Yip, Palacios, Rescigno, McCurdy, Martin. J. Chem Phys 414 (2013) 112.
7. Spanner, Patchkovskii. J. Chem. Phys. 414 (2013) 10.
Ion Beam Analytical Technique PIXE for Pollution Study at Dhaka Van de Graaff...iosrjce
Β
IOSR Journal of Applied Physics (IOSR-JAP) is a double blind peer reviewed International Journal that provides rapid publication (within a month) of articles in all areas of physics and its applications. The journal welcomes publications of high quality papers on theoretical developments and practical applications in applied physics. Original research papers, state-of-the-art reviews, and high quality technical notes are invited for publications.
Plenary lecture of the XIII SBPMat (Brazilian MRS) meeting, given on September 29th 2014 by Prof. LuΓs Carlos Dias (Universidade de Aveiro, Portugal).
Indatech Beyond Spectroscopy is an innovative company, with expertise in optical measurements for on-line monitoring and controlling industrial processes. Raman NIR UV Spectroscopy; Hyperspectral imaging; Spatialy Resolved Spectroscopy
In this presentation, we cover how to pick the right technology to measure a coating thickness.
- An introduction to coatings
- Why coatings are used in industry
- Why to measure the thickness of a coating
- The best methods for coating thickness measurement
For more information, visit: Olympus-IMS.com.
Photosynthesis active radiation, often abbreviated PAR, designates the spectral range (wave band) of solar
radiation from 400 to 700 nanometers that photosynthetic organisms are able to use in the process of
photosynthesis.
Photoluminescence spectroscopy of silicon photonic crystal nanocavitiesRoberto Lo Savio
Β
We demonstrate the possibility to characterize Si photonic crystal (PhC) nanocavity modes made on Silicon on insulator (SOI), and operating at telecom wavelengths, through photoluminescence (PL) spectroscopy at room temperature. In fact, a wide PL band between 1200 and 1600 nm is observed under optical pumping when proper material processing is performed after the nanocavities fabrication, namely Ar/H2 plasma treatment and Si implantation. PL emission is originated through the carrier recombination occurring at defect states formed in silicon after such treatments.
Screening for Ceramic and Leaded Contaminants in Glass Recycling Streams Usin...Olympus IMS
Β
Screening of Ceramic and Leaded Contaminants in Glass Streams via Handheld X-Ray Fluorescence (HHXRF) Analyzers
Dillon McDowell
and Alex Thurston
Abstract
Material recovery facilities (MRFs) typically use magnetic and optical sorting systems to separate glass cullet from recycled glass. However, these systems are not effective at screening glass ceramic and leaded constituents from cullet streams. These
contaminants lower the value of glass cullet to glass manufacturers, as they represent manufacturing and safety concerns. Handheld X-ray fluorescence (HHXRF) analyzers are widely used in various recycling and manufacturing settings to quickly provide chemical composition on a variety of elements, even to the range of 1β10 ppm. We compare HHXRF analysis of prepared glass samples to laboratory assayed glass standards used by MRFs and glass manufacturers. Our results show that HHXRF can detect even small quantities (<100 ppm) of ceramic elements in glass and glass cullet streams in situ. Our results also show HHXRF detection of leaded contaminants and coloring
streams. We also demonstrate that the same technique can be applied to in-line monitoring systems to analyze material streams for the same constituents.
Screening of Ceramic and Leaded Contaminants in Glass Recycling Streams using...Olympus IMS
Β
For more information, visit: https://www.olympus-ims.com/en/xrf-xrd/xrf-handheld/
Overview
- The glass recycling industry and recycling process
- Dealing with contamination
- Ceramic glass issues
- Brief introduction to XRF
Glass Recycling
The majority of recycling concerns glass containers (bottles, jars, etc.)
Primarily soda glass
Glass is recovered, sorted, and cleaned to be turned into furnace-ready cullet
Soda glass can be completely recycled without any loss of quality
On average, newly produced glass containers consist of ~33% recycled content
Material recovery facilities (MRFs) may process as much as 20+ tons of cullet per hour
Material quality is key to hitting efficiency targets and reducing process cost
Ceramic Glass Issues
A variety of techniques that handle different types of contamination
Magnetic sorting (metallic contamination)
Vacuum suction and vibrating screens (light materials β paper, plastic, etc.)
Visual/infrared sorting (opaque materials β stones, gravel, etc.)
Some materials are difficult to separate through automated techniques
Other glass types (borosilicate, leaded crystal)
Ceramic glasses
Ceramic glasses are increasingly common in variety of products
Cookwear
Manufactured good
Electronics (smartphone screens)
Has many of the same physical properties as recyclable glass (weight, density, appearance, etc.)
Howeverβ¦
Has a different chemistry (unique ceramic elements)
Has a higher melting point (doesnβt fully melt in a furnace)
Increase furnace downtime and/or may irreparably damage them
Large risk to cutting systems
Water-cooled scissors may be damaged attempting to cut into ceramic glass
The final product is rendered defective and unusable by impurities
Glass products with ceramic may crack or shatter (sometimes explosively)
Instrumentation
Olympus Vantaβ’ handheld XRF analyzer
Model: VCR (rhodium (Rh) anode, silicon drift detector (SDD )system)
8 mm excitation point (down to 3 mm with collimation)
Used βSoilβ method as basis for testing
Compton normalization technique
Typically used to test SiO2 - based samples
Offers various excitation conditions (beams) for a variety of elements
Testing performed using a Vanta workstation
Enables consistent sample presentation
Closed-beam system while in workstation
Experiment
Gauge the effectiveness of HHXRF in identifying various elements
Ceramic identifiers: titanium (Ti), zirconium (Zr), strontium (Sr), and zinc (Zn)
Additional identifiers: iron (Fe), copper (Cu), and lead (Pb)
Stage 1: Certified material
Test certified glass samples (NIST 610, NIST 612)
Establish a baseline calibration
Stage 2: Test recovered ceramic glass samples
Use the calibration from the previous stage
Sample composition also verified via lab testing (ICP)
Focus on effects of sample size and analysis time
Brief
1. Car catalysts and their history
β Element basis and importance
2. Handheld X-ray fluorescence (XRF) basics
β Theory
β Instrument components
3. Handheld XRF results
β Accuracy
β Precision
MMEA (The Measurement, Monitoring and Environmental Efficiency Assessment) research program final seminar presentation by Assoc. Prof. Juha Toivonen, Tampere University of Technology
The optical fibers are the hair thin fibers made of ultra transparent glass or plastic material. The optical fiber flexible and it is used to transmit the light.
The presentation here mainly focused on the brief explanation of principle, theory, characteristics, losses in fibers and applications.
International Journal of Engineering Research and Applications (IJERA) is an open access online peer reviewed international journal that publishes research and review articles in the fields of Computer Science, Neural Networks, Electrical Engineering, Software Engineering, Information Technology, Mechanical Engineering, Chemical Engineering, Plastic Engineering, Food Technology, Textile Engineering, Nano Technology & science, Power Electronics, Electronics & Communication Engineering, Computational mathematics, Image processing, Civil Engineering, Structural Engineering, Environmental Engineering, VLSI Testing & Low Power VLSI Design etc.
Implementation of a Radon Counter Measuring Apparatus using CCD Image Sensor ...ijtsrd
Β
Radon is an invisible, odorless gas produced by the decay of uranium ore. Various types of equipment and components have been proposed for use in effective radon detection. In this paper, we describe a radon measuring apparatus that uses an analog CCD image sensor module. Based on our studies, we believe that this system would be helpful in protecting many people from the dangers associated with radon exposure. Chungyong Kim | Gyu-Sik Kim"Implementation of a Radon Counter Measuring Apparatus using CCD Image Sensor Module" Published in International Journal of Trend in Scientific Research and Development (ijtsrd), ISSN: 2456-6470, Volume-2 | Issue-4 , June 2018, URL: http://www.ijtsrd.com/papers/ijtsrd14337.pdf http://www.ijtsrd.com/engineering/electrical-engineering/14337/implementation-of-a-radon-counter-measuring-apparatus-using-ccd-image-sensor-module/chungyong-kim
This content presents for basic of Synthetic Aperture Radar (SAR) including its geometry, how the image is created, essential parameters, interpretation, SAR sensor specification, and advantages and disadvantages.
An Optical Time Domain Reflectometer (OTDR) is an important instrument used by organizations to certify the performance of new fiber optics links and detect problems with existing fiber links.
Simulation of AlGaN/Si and InN/Si ELECTRIC βDEVICESijrap
Β
In this work, efficient solar-blind metal-semiconductor photodetectors grown on Si (111) by
molecular beam epitaxy are reported. Growth details are described,the comparison enters the
properties electric of InN/Si and AlGaN/Si photodectors with 0.2 ΞΌm of AlGaN and InN layers.
Modeling and simulation were performed by using ATLAS-TCAD simulator. Energy band
diagram, doping profile, conduction current density,I-V caracteristic , internal potential and
electric field were performed.
2. 2 of 18Sandipta Roy, CRNTS, IIT Bombay
Overview
1. Expertise in tools and software.
2. Present work, Simulation by Lumerical (FDTD)
of Infrared Detector and Thin film Solar cell.
3. Work during the PhD.
Click on the hyperlink to view more
Materials and Device
Characterization
Principle Application
3. 3 of 18Sandipta Roy, CRNTS, IIT Bombay
Tools handled
Lithography:
β’ Double side Aligner (DSA).
β’ Electron beam Lithography (EBL).
β’ Laser writer (for mask design).
Deposition tools:
β’ Metal-oxide chemical vapour deposition (MOCVD)
β’ Inductively coupled plasma chemical vapour deposition
(ICPCVD).
β’ Metal and dielectric sputter deposition.
β’ Electron-beam deposition
Characterization:
β’ Scanning Eelectron microscopy (SEM)
β’ UV-VIS-NIR 750
β’ Temperature dependent electrical characterization.
β’ Deep level transient spectroscopy (DLTS).
Setup design:
β’ Gas sensing setup, for optical process of gas
detection.
β’ Optical sensing setup
4. 4 of 18Sandipta Roy, CRNTS, IIT Bombay
Software skill
Simulation:
β’ Lumerical (FDTD)
β’ MATLAB.
β’ CST Microwave studio 2015.
β’ Synopsis (TCAD).
Analysis:
β’ Origin (Plotting and analysis).
β’ Xβpert High score plus (XRD
analysis)
β’ XPS Peak fit 4.1 (XPS analysis).
5. 5 of 18Sandipta Roy, CRNTS, IIT Bombay
Present work on plasmonic-based optical device
1) Simulation of Narrow band optical
detector (FDTD) by using Ge as a substrate
Au
Si
Au/Si hot-electron based IR detector
Absorption
in Au
Ge
6. 6 of 18Sandipta Roy, CRNTS, IIT Bombay
Plasmonic solar cell
SiN
Si
(100 nm)
Al
etch
Found 2 time increase in Jsc
for 100 nm Si Solar cell
7. Fabrication and characterization of nickel-silicide
Schottky diode near infrared sensor for methane
detection
BY
SANDIPTA ROY
CRNTS
IIT BOMBAY
Ph.D. work
8. 8 of 18Sandipta Roy, CRNTS, IIT Bombay
IR detection principle
Absorb IR at silicide
Generate hot (energized) electron
Cross the barrier from at the metal and
semiconductor junction
The cutoff wavelength is
π π(Β΅π) = 1.24/π π΅(ππ)
For this case π π΅ must be lower than
(1.24/1.65=0.75 eV)
9. 9 of 18Sandipta Roy, CRNTS, IIT Bombay
Phase Analysis
The percentage of presence phases in
the film was determined by peak fitting
and it was found to be ~15% of NiSi2
and ~85% of the film is NiSi.
This validates the observation of
Raman analysis.
10. 10 of 18Sandipta Roy, CRNTS, IIT Bombay
Electrical characterization
From the slope of Richardson plot and it is found to be 0.62 eV
The barrier height is comparable to as reported by Jeng et al, 1983.
12. 12 of 18Sandipta Roy, CRNTS, IIT Bombay
Arrhenius plot
The trap at 0.33 eV (E1), 0.52 eV (E2) and 0.55 eV (E3).
The E2 position corresponds to the bulk trap states.
The trap E1 causes by Ni interstitial position at in the Si Tian et al.
2002.
The E3 position is not reported till date (reported for GdSi2).
Considering the previous articles,
Therefore it can concluded that interface states are present in the
device and they are acceptor type.
Contβdβ¦
π π π2 =
exp((πΈ πΆβπΈ π)/ππ
π π πΎ π
, π π =
π‘2βπ‘1
ln(π‘2/π‘1)
14. 14 of 18Sandipta Roy, CRNTS, IIT Bombay
Methane detection
Because the optical absorption of the gas is confined to the overlapped
spectral region (π1 π‘π π2) the effective absorption cross section becomes
π πππ = π0 ΰΆ±
π1
π2
π(π) ππ
ππΊππ = ππ΄ππexp(βπ πππ ππ)
πΌ πβ = π π
πΌ πΊππ /πΌπ΄ππ = exp(βπ πππ ππ)
15. 15 of 18Sandipta Roy, CRNTS, IIT Bombay
NiSi/n-Si detector characterization for
1.65 Β΅m laser diode
The total diode current is πΌπ‘ππ‘ = πΌ πβ + πΌ ππ
16. 16 of 18Sandipta Roy, CRNTS, IIT Bombay
Gas sensing
Ξ€πΌ πΊππ πΌπ΄ππ β exp(βπ πππ ππ)
17. 17 of 18Sandipta Roy, CRNTS, IIT Bombay
Conclusion
β’The barrier height of the device was measured and found to be 0.62, 0.64 and 0.54 eV by I-V-T, C-V and optical technique.
(Roy, 2014, J. Appl. Phys)
β’The optical responsivity of the device was found promising for this cost effective application.
β’The difference in barrier height is attributed to the presence of acceptor like interface trap states. The trap density was
measured by DLTS and C-f technique and it was found to be ~1011 cm-2eV-1. (ICMAT 2015, Singapore)
β’The operating condition of the diode for methane sensing was established and found that zero bias is more suitable for the
application.
β’A moderate illumination power was used to avoid the shift in wavelength due to heating of the LD.
β’The methane sensing was demonstrated and found that the low level of detection is 3%. (Communicated)
β’The response and recovery time was found to be very swift, indicating the possibility in instantaneous detection.