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THE RIETVELD
REFINEMENT METHOD
IN GSAS-II
R. B. VON DREELE
ANL, vondreele@anl.gov
Acknowledgements: DOE/SC
HISTORY – H.M. RIETVELD
2
Hugo Rietveld; neutron powder diffractometer,
Petten, Netherlands
Papers: H.M. Rietveld, Acta Cryst. 22, 151-
2(1967)
H.M. Rietveld, J. App. Cryst., 2, 65-71 (1969)
Multi-parameter, nonlinear LS curve fitting
Exact overlaps
- symmetry
Incomplete overlaps
Io
SIc 
 
 2
2
o
c
o
wp
wI
)
I
w(I
R
Residuals:
Rietveld Minimize
 
 2
)
( c
o
R I
I
w
M
Ic
c2 = MR/(n-p)
“chi-squared” or
“goodness-of-fit”
LINEAR LEAST SQUARES THEORY
3
and a function
then the best estimate of the values pi is found by
minimizing
This is done by setting the derivative to zero
Results in n “normal” equations (one for each variable) -
solve for pi
)
...,
,
,
( 3
2
1 n
calc p
p
p
p
f
I 
Given a set of observations Iobs
2
)
( c
o I
I
w
M 
 
0
)
( 




j
c
c
o
p
I
I
I
w
NON-LINEAR LEAST SQUARES THEORY
4
Problem - I(pi) is nonlinear & transcendental (sin, cos, etc.)
so can’t solve directly
Expand I(pi) as Taylor series & toss high order terms
 




i
i
i
c
i
c
i
c p
p
I
a
I
p
I )
(
)
( ai - initial values of pi
pi = pi - ai (shift)
)
(
0 i
c
o
j
c
i
i
i
c
a
I
I
I
p
I
p
p
I
I
w 
















 
Outer sum over observations
Solve for pi - shifts of parameters, NOT values
Normal equations - one for each pi
LEAST SQUARES THEORY - CONTINUED
5
Rearrange
1
1
1 p
I
I
w
p
p
I
p
I
w c
i
n
i i
c
c



















 
.
.
.
n
c
i
n
i i
c
n
c
p
I
I
w
p
p
I
p
I
w



















 1
Matrix form: Ax=v
i
c
i
j
j
j
c
i
c
j
i
p
I
I
w
v
p
x
p
I
p
I
w
a










 
 )
(
,
Solve: x = A-1v = Bv; B = A-1 This gives set of Δpi to apply
to “old” set of ai; repeat until pi small.
GSAS-II ALGORITHM
GSAS – process point-by-point to make
Ic (value) & Ic/pi (vector)
Hessian matrix - A
/pi
I
c
/p
j
Ic/pi
Sw[Ic/pi]·[Ic/pj]
GSAS-II – process reflection-by-reflection
to make Ic (vector) & Ic/pi (Jacobian
matrix)
2 or TOF
2
or
TOF
p
i
pi
x
NB: GSAS-II – needs large memory!
Jacobian matrix - J wJTJ = A
Hessian matrix - A
REFINEMENT VIA MODIFIED
LEVENBERG/MARQUARDT-SVD ALGORITHM
Steps:
1. Compute
2. Normalize
3. compute c2(p)
4. Select l (=0.001, “damping factor”)
5. Modify
6. Make SVD inversion of A”
7. Solve for dp (unnormalized!) & compute c2(p+dp)
8. If c2(p+dp) > c2(p) then l*10 go to 5
9. Else apply dp to p & go to 1 (new cycle)
10.Quit when c2(p) - c2(p+dp) / c2(p) < 0.0001
SLOW step
FAST steps
NB: all in ~40 lines of python; all double precision
NB2: this thing is exceedingly robust – no user damping factors needed
SVD – SINGULAR VALUE DECOMPOSITION
Singularities & near singularities – see Mathematical Recipes 2.9
8
LS matrix: solve for x Ax=b by x=A-1b; x are the parameter shifts
SVD: replace A = UwV where U & V are such that U-1 = UT & V-1 = VT
& w – diagonal matrix; all same size as A
Then: A-1 = V(1/wii)UT
The trick: what to do if wii ~ 0? (singularity)  make 1/wii = 0! (instead of ꝏ)
Then: x = V(1/wii)UTb does away with ill-conditioned terms
Have to choose tolerance on wii ~0 (typically 10-6 but 10-3 for proteins works well)
SVD is in python library as numpy.linalg.svd
& uses LAPACK _gesdd routine (fortran – code in MR 2.9)
NB: all double precision in python; downside is wii not 1:1 to parameters so id of
failures difficult.
LEAST SQUARES ALGORITHMS IN GSAS-II
Useful choices – found in Controls
9
Analytic Hessian – default Levenberg-Marquardt SVD from Hessian & computed derivatives
Downside: hard singularities hard to find  “linear algebra errors” cause failures
Analytic Jacobian – uses Jacobian matrix (not Hessian) no SVD; identifies singularities &
Removes them from LS refinement; always runs to convergence
Hessian SVD – no Levenberg-Marquardt (might be better for single crystal data)
Same downside as Analytic Hessian
Numeric – no derivatives & slow – mostly for testing purposes.
LEAST SQUARES THEORY - CONTINUED
10
Error estimates (mostly from W.C. Hamilton)
Given observations n > m parameters
with distributions that have finite 2nd moments
(no need to be “normal” although usually are for powders)
Then LS gives parameter estimates (shifts in our case)
with the minimum variance in any linear combination
The error estimates (“esd’s”) are
m
n
I
I
w
b c
o
ii
i





2
2
2
)
(
c
c

bii - diagonal elements of the inverted A matrix
Note: There is little justification for additional scaling of
the i NB: systematic errors will bias results
beyond i.
RIETVELD MODEL: IC = II{SKPF2
PMPLPP(P) + IB}
11
Ii - incident intensity - variable for fixed 2 (e.g. neutron TOF)
kp - scale factor for particular phase
F2
p - structure factor for particular reflection
mp - reflection multiplicity
Lp - correction factors on intensity - texture, etc.
P(p) - peak shape function - size & microstrain, etc.
Sum over all reflections under a profile point (multiple
phases)
Ib – background function
More complex model than for single crystal diffraction
PROFILE FUNCTIONS P(P) – BASICS
12
Gaussian profile - generally instrumental origin
Lorentzian profile - largely sample effect












 2
2
2
)
(
2
ln
4
exp
2
ln
4
)
,
(
T
T
G

p = Treflection-Tprofile (T = 2 or TOF)
2
2
1
1
2
)
,
(







 






T
T
L
Voigt – convolution = G  L
Pseudo-Voigt – linear combination = hL+(1-h)G
h via Thompson, Cox & Hastings – pseudoVoigt = Voigt
CW Asymmetry from axial divergence – Finger, Cox & Jephcoat
NB: in gsas & GSAS-II, T is 2 in centideg or TOF in ms
Small (<1mm) crystals  not d-functions
Size distribution 
superposition of sharp to broad spots
 Shape ~Lorentzian
Width d* = constant = d/d2 = cot/d
Bragg’s Law: 2 = ld/d2cos (= X/cos)
Scherrer equation
k=1,p = size
a*
b*
𝑆 =
180𝑘𝜆
𝜋𝑝 cos 𝛩
Isotropic Crystallite size & mstrain broadening
SAMPLE BROADENING
a*
b*
Size
mstrain
Unit cell variation (defects??)
Lorentzian distribution  shape
d/d = constant = d*/d*=cot
Or: 2 = 2dtan/d (= Ytan)
m – mstrain (x106) parameter
𝑀 = 180𝜇 tan Θ/𝜋
CW PROFILE COEFFICENTS
 Size: mstrain:
 Need: S (Gauss) & S (Lorentzian) sample broadening (2 slides back)
 Mixing coeff for each; ms & mm (NB: called ‘mx’ in GSAS-II; range 0-1)
 Normally ms & mm = 1 (all Lorentzian sample broadening) so:
S = S + M
S = 0 (no Gaussian sample broadening)
 X,Y,Z = 0 (no Lorentzian instrument broadening)
Lorentzian vs Gaussian sample broadening?
14
𝑆 =
180𝑘𝜆
𝜋𝑝 cos 𝛩
𝑀 = 180𝜇 tan Θ/𝜋
𝑔
2
= 8𝑙𝑛2(𝑈𝑡𝑎𝑛2Θ + 𝑉𝑡𝑎𝑛Θ + 𝑊 + 𝑆Γ)
𝛾 =
𝑋
𝑐𝑜𝑠Θ
+ 𝑌𝑡𝑎𝑛Θ + 𝑍 + 𝑆𝛾
𝑆𝛾 = 𝑚𝑠𝑆 + 𝑚𝜇𝑀
𝑆Γ = [ 1 − 𝑚𝑠
2
𝑆2
+ 1 − 𝑚𝜇
2
𝑀2
]/8𝑙𝑛2
CW PROFILE PEAK BROADENING IN GSAS-II
The split of sample broadening from instrumental contribution
15
Instrument – fixed from calibration
Sample – phase & histogram dependent
Refined & constrained as needed
NB: for APS 11BM X,Y & Z = 0
Sample:
New NIST SRMS
640f & 676b
TOF PROFILE FUNCTION IN GSAS-II
The best of gsas fxns 1, 3, 4 & 5 combined (2 is not implemented)
16
eat e-bt  (1-h)G(T,)
 hL(T,)
 )  )    )  )
   )  )
 
 
q
q
p
p
N
z
y
N
T
H v
u
1
1 E
exp
Im
E
exp
Im
η
2
erfc
e
erfc
e
η
1 






Convolution of paired exponentials and a pseudoVoigt
N, p, q, u, v, x & y functions of a, b,  & 
Empirical relationships to d-spacing
𝛼 = Τ
∝0
𝑑; 𝛽 = 𝛽0 + ൗ
𝛽1
𝑑4 + ൗ
𝛽𝑞
𝑑2
𝜎2 = 𝑠0 + 𝑠1𝑑2 + 𝑠2𝑑4 + 𝑆𝑞𝑑 + 𝑆Γ
𝛾 = 𝑋𝑑 + 𝑌𝑑2
+ 𝑍 + 𝑆𝛾
Sample broadening terms
- earlier slide; may be hkl
dependent
Peak position
– not peak top
New terms for
epithermal effects
T = Cd+Ad2+B/d+Z
MIXING
 Size: mstrain:
 Need: S (Gauss) & S (Lorentzian) sample broadening (2 slides back)
 Mixing coeff for each; ms & mm (NB: called ‘mx’ in GSAS-II; range 0-1)
 Normally ms & mm = 1 (all Lorentzian sample broadening) so:
S = S + M
S = 0 (no Gaussian sample broadening)
 X,Y,Z = 0 (no Lorentzian instrument broadening)
Lorentzian vs Gaussian sample broadening?
17
𝑆 =
180𝑘𝜆
𝜋𝑝 cos 𝛩
𝑀 = 180𝜇 tan Θ/𝜋
𝑔
2
= 8𝑙𝑛2(𝑈𝑡𝑎𝑛2Θ + 𝑉𝑡𝑎𝑛Θ + 𝑊 + 𝑆Γ)
𝛾 =
𝑋
𝑐𝑜𝑠Θ
+ 𝑌𝑡𝑎𝑛Θ + 𝑍 + 𝑆𝛾
𝑆𝛾 = 𝑚𝑠𝑆 + 𝑚𝜇𝑀
𝑆Γ = [ 1 − 𝑚𝑠
2
𝑆2
+ 1 − 𝑚𝜇
2
𝑀2
]/8𝑙𝑛2
18
TOF PROFILE PEAK BROADENING IN GSAS-II
The split of sample broadening from instrumental contribution
Instrument – fixed from calibration Sample – phase & histogram dependent
Independent of experiment (e.g. CW or TOF)
Sample:
New NIST SRMS
640f & 676b
AXIAL BROADENING FUNCTION – CONST.
WAVELENGTH
19
Finger, Cox & Jephcoat based on van Laar & Yelon
2Bragg
2i
2min
 Pseudo-Voigt
= profile function
Depend on slit & sample “heights” wrt diffr. radius
H/L & S/L - parameters in function; combined as H+S/L in GSAS-II
(typically 0.005 - 0.020)
Debye-Scherrer
cone
2 Scan
Slit
H
HOW GOOD IS THIS FUNCTION?
20
Protein Rietveld refinement - Very low angle fit
1.0-4.0° peaks - strong asymmetry
“perfect” fit to shape
PROFILE FUNCTION – COMPLEXITIES
AN EXAMPLE – UNUSUAL LINE BROADENING
21
Sharp lines
Broad lines
Seeming inconsistency in line broadening - hkl dependent
MICROSTRAIN BROADENING
– PHYSICAL MODEL
22
Stephens, P.W. (1999). J. Appl. Cryst. 32, 281-
289.
Also see Popa, N. (1998). J. Appl. Cryst. 31,
176-180.
Model – elastic deformation of crystallites
hk
hl
kl
l
k
h
M
d
hkl
hkl
6
5
4
2
3
2
2
2
1
2
1
a
a
a
a
a
a 






d-spacing expression
 )  




j
i j
i
ij
hkl
M
M
C
M
,
2
a
a

Broadening – variance in Mhkl; refine Cij
NA PARAHYDROXYBENZOATE
23
Unusual micostrain effects - peak broadening
Directional
dependence -
Lattice defects?
Inclusion allowed
OH atom
placement from F
map
INTENSITY EXTRACTION
Structure factors from powder patterns?  structure solution
24
Apportion Io by ratios of Ic(H)
for contributing reflections 
Sum over all under peak profile
Correct for multiplicity & Lp, etc.
Result is F2(H)
Here 4 reflections contribute
LeBail algorithm – extracted F2
o  new F2
c then next cycle;
refine only background, peak shapes & positions – few parameters
No constraints needed for overlaps – Simple
Pawley refinement – F2
o are parameters
+ background, peak shapes & positions – many parameters
Constraints & restraints required for overlaps - Complex
THANK YOU

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rietveld_method.pdf

  • 1. THE RIETVELD REFINEMENT METHOD IN GSAS-II R. B. VON DREELE ANL, vondreele@anl.gov Acknowledgements: DOE/SC
  • 2. HISTORY – H.M. RIETVELD 2 Hugo Rietveld; neutron powder diffractometer, Petten, Netherlands Papers: H.M. Rietveld, Acta Cryst. 22, 151- 2(1967) H.M. Rietveld, J. App. Cryst., 2, 65-71 (1969) Multi-parameter, nonlinear LS curve fitting Exact overlaps - symmetry Incomplete overlaps Io SIc     2 2 o c o wp wI ) I w(I R Residuals: Rietveld Minimize    2 ) ( c o R I I w M Ic c2 = MR/(n-p) “chi-squared” or “goodness-of-fit”
  • 3. LINEAR LEAST SQUARES THEORY 3 and a function then the best estimate of the values pi is found by minimizing This is done by setting the derivative to zero Results in n “normal” equations (one for each variable) - solve for pi ) ..., , , ( 3 2 1 n calc p p p p f I  Given a set of observations Iobs 2 ) ( c o I I w M    0 ) (      j c c o p I I I w
  • 4. NON-LINEAR LEAST SQUARES THEORY 4 Problem - I(pi) is nonlinear & transcendental (sin, cos, etc.) so can’t solve directly Expand I(pi) as Taylor series & toss high order terms       i i i c i c i c p p I a I p I ) ( ) ( ai - initial values of pi pi = pi - ai (shift) ) ( 0 i c o j c i i i c a I I I p I p p I I w                    Outer sum over observations Solve for pi - shifts of parameters, NOT values Normal equations - one for each pi
  • 5. LEAST SQUARES THEORY - CONTINUED 5 Rearrange 1 1 1 p I I w p p I p I w c i n i i c c                      . . . n c i n i i c n c p I I w p p I p I w                     1 Matrix form: Ax=v i c i j j j c i c j i p I I w v p x p I p I w a              ) ( , Solve: x = A-1v = Bv; B = A-1 This gives set of Δpi to apply to “old” set of ai; repeat until pi small.
  • 6. GSAS-II ALGORITHM GSAS – process point-by-point to make Ic (value) & Ic/pi (vector) Hessian matrix - A /pi I c /p j Ic/pi Sw[Ic/pi]·[Ic/pj] GSAS-II – process reflection-by-reflection to make Ic (vector) & Ic/pi (Jacobian matrix) 2 or TOF 2 or TOF p i pi x NB: GSAS-II – needs large memory! Jacobian matrix - J wJTJ = A Hessian matrix - A
  • 7. REFINEMENT VIA MODIFIED LEVENBERG/MARQUARDT-SVD ALGORITHM Steps: 1. Compute 2. Normalize 3. compute c2(p) 4. Select l (=0.001, “damping factor”) 5. Modify 6. Make SVD inversion of A” 7. Solve for dp (unnormalized!) & compute c2(p+dp) 8. If c2(p+dp) > c2(p) then l*10 go to 5 9. Else apply dp to p & go to 1 (new cycle) 10.Quit when c2(p) - c2(p+dp) / c2(p) < 0.0001 SLOW step FAST steps NB: all in ~40 lines of python; all double precision NB2: this thing is exceedingly robust – no user damping factors needed
  • 8. SVD – SINGULAR VALUE DECOMPOSITION Singularities & near singularities – see Mathematical Recipes 2.9 8 LS matrix: solve for x Ax=b by x=A-1b; x are the parameter shifts SVD: replace A = UwV where U & V are such that U-1 = UT & V-1 = VT & w – diagonal matrix; all same size as A Then: A-1 = V(1/wii)UT The trick: what to do if wii ~ 0? (singularity)  make 1/wii = 0! (instead of ꝏ) Then: x = V(1/wii)UTb does away with ill-conditioned terms Have to choose tolerance on wii ~0 (typically 10-6 but 10-3 for proteins works well) SVD is in python library as numpy.linalg.svd & uses LAPACK _gesdd routine (fortran – code in MR 2.9) NB: all double precision in python; downside is wii not 1:1 to parameters so id of failures difficult.
  • 9. LEAST SQUARES ALGORITHMS IN GSAS-II Useful choices – found in Controls 9 Analytic Hessian – default Levenberg-Marquardt SVD from Hessian & computed derivatives Downside: hard singularities hard to find  “linear algebra errors” cause failures Analytic Jacobian – uses Jacobian matrix (not Hessian) no SVD; identifies singularities & Removes them from LS refinement; always runs to convergence Hessian SVD – no Levenberg-Marquardt (might be better for single crystal data) Same downside as Analytic Hessian Numeric – no derivatives & slow – mostly for testing purposes.
  • 10. LEAST SQUARES THEORY - CONTINUED 10 Error estimates (mostly from W.C. Hamilton) Given observations n > m parameters with distributions that have finite 2nd moments (no need to be “normal” although usually are for powders) Then LS gives parameter estimates (shifts in our case) with the minimum variance in any linear combination The error estimates (“esd’s”) are m n I I w b c o ii i      2 2 2 ) ( c c  bii - diagonal elements of the inverted A matrix Note: There is little justification for additional scaling of the i NB: systematic errors will bias results beyond i.
  • 11. RIETVELD MODEL: IC = II{SKPF2 PMPLPP(P) + IB} 11 Ii - incident intensity - variable for fixed 2 (e.g. neutron TOF) kp - scale factor for particular phase F2 p - structure factor for particular reflection mp - reflection multiplicity Lp - correction factors on intensity - texture, etc. P(p) - peak shape function - size & microstrain, etc. Sum over all reflections under a profile point (multiple phases) Ib – background function More complex model than for single crystal diffraction
  • 12. PROFILE FUNCTIONS P(P) – BASICS 12 Gaussian profile - generally instrumental origin Lorentzian profile - largely sample effect              2 2 2 ) ( 2 ln 4 exp 2 ln 4 ) , ( T T G  p = Treflection-Tprofile (T = 2 or TOF) 2 2 1 1 2 ) , (                T T L Voigt – convolution = G  L Pseudo-Voigt – linear combination = hL+(1-h)G h via Thompson, Cox & Hastings – pseudoVoigt = Voigt CW Asymmetry from axial divergence – Finger, Cox & Jephcoat NB: in gsas & GSAS-II, T is 2 in centideg or TOF in ms
  • 13. Small (<1mm) crystals  not d-functions Size distribution  superposition of sharp to broad spots  Shape ~Lorentzian Width d* = constant = d/d2 = cot/d Bragg’s Law: 2 = ld/d2cos (= X/cos) Scherrer equation k=1,p = size a* b* 𝑆 = 180𝑘𝜆 𝜋𝑝 cos 𝛩 Isotropic Crystallite size & mstrain broadening SAMPLE BROADENING a* b* Size mstrain Unit cell variation (defects??) Lorentzian distribution  shape d/d = constant = d*/d*=cot Or: 2 = 2dtan/d (= Ytan) m – mstrain (x106) parameter 𝑀 = 180𝜇 tan Θ/𝜋
  • 14. CW PROFILE COEFFICENTS  Size: mstrain:  Need: S (Gauss) & S (Lorentzian) sample broadening (2 slides back)  Mixing coeff for each; ms & mm (NB: called ‘mx’ in GSAS-II; range 0-1)  Normally ms & mm = 1 (all Lorentzian sample broadening) so: S = S + M S = 0 (no Gaussian sample broadening)  X,Y,Z = 0 (no Lorentzian instrument broadening) Lorentzian vs Gaussian sample broadening? 14 𝑆 = 180𝑘𝜆 𝜋𝑝 cos 𝛩 𝑀 = 180𝜇 tan Θ/𝜋 𝑔 2 = 8𝑙𝑛2(𝑈𝑡𝑎𝑛2Θ + 𝑉𝑡𝑎𝑛Θ + 𝑊 + 𝑆Γ) 𝛾 = 𝑋 𝑐𝑜𝑠Θ + 𝑌𝑡𝑎𝑛Θ + 𝑍 + 𝑆𝛾 𝑆𝛾 = 𝑚𝑠𝑆 + 𝑚𝜇𝑀 𝑆Γ = [ 1 − 𝑚𝑠 2 𝑆2 + 1 − 𝑚𝜇 2 𝑀2 ]/8𝑙𝑛2
  • 15. CW PROFILE PEAK BROADENING IN GSAS-II The split of sample broadening from instrumental contribution 15 Instrument – fixed from calibration Sample – phase & histogram dependent Refined & constrained as needed NB: for APS 11BM X,Y & Z = 0 Sample: New NIST SRMS 640f & 676b
  • 16. TOF PROFILE FUNCTION IN GSAS-II The best of gsas fxns 1, 3, 4 & 5 combined (2 is not implemented) 16 eat e-bt  (1-h)G(T,)  hL(T,)  )  )    )  )    )  )     q q p p N z y N T H v u 1 1 E exp Im E exp Im η 2 erfc e erfc e η 1        Convolution of paired exponentials and a pseudoVoigt N, p, q, u, v, x & y functions of a, b,  &  Empirical relationships to d-spacing 𝛼 = Τ ∝0 𝑑; 𝛽 = 𝛽0 + ൗ 𝛽1 𝑑4 + ൗ 𝛽𝑞 𝑑2 𝜎2 = 𝑠0 + 𝑠1𝑑2 + 𝑠2𝑑4 + 𝑆𝑞𝑑 + 𝑆Γ 𝛾 = 𝑋𝑑 + 𝑌𝑑2 + 𝑍 + 𝑆𝛾 Sample broadening terms - earlier slide; may be hkl dependent Peak position – not peak top New terms for epithermal effects T = Cd+Ad2+B/d+Z
  • 17. MIXING  Size: mstrain:  Need: S (Gauss) & S (Lorentzian) sample broadening (2 slides back)  Mixing coeff for each; ms & mm (NB: called ‘mx’ in GSAS-II; range 0-1)  Normally ms & mm = 1 (all Lorentzian sample broadening) so: S = S + M S = 0 (no Gaussian sample broadening)  X,Y,Z = 0 (no Lorentzian instrument broadening) Lorentzian vs Gaussian sample broadening? 17 𝑆 = 180𝑘𝜆 𝜋𝑝 cos 𝛩 𝑀 = 180𝜇 tan Θ/𝜋 𝑔 2 = 8𝑙𝑛2(𝑈𝑡𝑎𝑛2Θ + 𝑉𝑡𝑎𝑛Θ + 𝑊 + 𝑆Γ) 𝛾 = 𝑋 𝑐𝑜𝑠Θ + 𝑌𝑡𝑎𝑛Θ + 𝑍 + 𝑆𝛾 𝑆𝛾 = 𝑚𝑠𝑆 + 𝑚𝜇𝑀 𝑆Γ = [ 1 − 𝑚𝑠 2 𝑆2 + 1 − 𝑚𝜇 2 𝑀2 ]/8𝑙𝑛2
  • 18. 18 TOF PROFILE PEAK BROADENING IN GSAS-II The split of sample broadening from instrumental contribution Instrument – fixed from calibration Sample – phase & histogram dependent Independent of experiment (e.g. CW or TOF) Sample: New NIST SRMS 640f & 676b
  • 19. AXIAL BROADENING FUNCTION – CONST. WAVELENGTH 19 Finger, Cox & Jephcoat based on van Laar & Yelon 2Bragg 2i 2min  Pseudo-Voigt = profile function Depend on slit & sample “heights” wrt diffr. radius H/L & S/L - parameters in function; combined as H+S/L in GSAS-II (typically 0.005 - 0.020) Debye-Scherrer cone 2 Scan Slit H
  • 20. HOW GOOD IS THIS FUNCTION? 20 Protein Rietveld refinement - Very low angle fit 1.0-4.0° peaks - strong asymmetry “perfect” fit to shape
  • 21. PROFILE FUNCTION – COMPLEXITIES AN EXAMPLE – UNUSUAL LINE BROADENING 21 Sharp lines Broad lines Seeming inconsistency in line broadening - hkl dependent
  • 22. MICROSTRAIN BROADENING – PHYSICAL MODEL 22 Stephens, P.W. (1999). J. Appl. Cryst. 32, 281- 289. Also see Popa, N. (1998). J. Appl. Cryst. 31, 176-180. Model – elastic deformation of crystallites hk hl kl l k h M d hkl hkl 6 5 4 2 3 2 2 2 1 2 1 a a a a a a        d-spacing expression  )       j i j i ij hkl M M C M , 2 a a  Broadening – variance in Mhkl; refine Cij
  • 23. NA PARAHYDROXYBENZOATE 23 Unusual micostrain effects - peak broadening Directional dependence - Lattice defects? Inclusion allowed OH atom placement from F map
  • 24. INTENSITY EXTRACTION Structure factors from powder patterns?  structure solution 24 Apportion Io by ratios of Ic(H) for contributing reflections  Sum over all under peak profile Correct for multiplicity & Lp, etc. Result is F2(H) Here 4 reflections contribute LeBail algorithm – extracted F2 o  new F2 c then next cycle; refine only background, peak shapes & positions – few parameters No constraints needed for overlaps – Simple Pawley refinement – F2 o are parameters + background, peak shapes & positions – many parameters Constraints & restraints required for overlaps - Complex