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FMV12N50E FUJI POWER MOSFET
Super FAP-E3 series N-CHANNEL SILICON POWER MOSFET
Features
Maintains both low power loss and low noise
Lower RDS(on) characteristic
More controllable switching dv/dt by gate resistance
Smaller VGS ringing waveform during switching
Narrow band of the gate threshold voltage (3.0±0.5V)
High avalanche durability
Applications
Switching regulators
UPS (Uninterruptible Power Supply)
DC-DC converters
Maximum Ratings and Characteristics
Absolute Maximum Ratings at Tc=25°C (unless otherwise specified)
Description Symbol Characteristics Unit Remarks
Drain-Source Voltage
VDS 500 V
VDSX 500 V VGS = -30V
Continuous Drain Current ID ±12 A
Pulsed Drain Current IDP ±48 A
Gate-Source Voltage VGS ±30 V
Repetitive and Non-Repetitive Maximum Avalanche Current IAR 12 A Note*1
Non-Repetitive Maximum Avalanche Energy EAS 400 mJ Note*2
Repetitive Maximum Avalanche Energy EAR 6.0 mJ Note*3
Peak Diode Recovery dV/dt dV/dt 6.5 kV/µs Note*4
Peak Diode Recovery -di/dt -di/dt 100 A/µs Note*5
Maximum Power Dissipation PD
2.16
W
Ta=25°C
60 Tc=25°C
Operating and Storage Temperature range
Tch 150 °C
Tstg -55 to +150 °C
Isolation Voltage VISO 2 kVrms t = 60sec, f = 60Hz
Outline Drawings [mm] Equivalent circuit schematic
Electrical Characteristics at Tc=25°C (unless otherwise specified)
Description Symbol Conditions min. typ. max. Unit
Drain-Source Breakdown Voltage BVDSS ID=250µA, VGS=0V 500 - - V
Gate Threshold Voltage VGS (th) ID=250µA, VDS=VGS 2.5 3.0 3.5 V
Zero Gate Voltage Drain Current IDSS
VDS=500V, VGS=0V Tch=25°C - - 25
µA
VDS=400V, VGS=0V Tch=125°C - - 250
Gate-Source Leakage Current IGSS VGS=±30V, VDS=0V - 10 100 nA
Drain-Source On-State Resistance RDS (on) ID=6A, VGS=10V - 0.444 0.52 Ω
Forward Transconductance gfs ID=6A, VDS=25V 6.5 13 - S
Input Capacitance Ciss VDS=25V
VGS=0V
f=1MHz
- 1600 2400
pFOutput Capacitance Coss - 160 240
Reverse Transfer Capacitance Crss - 11.5 17.5
Turn-On Time
td(on) Vcc=300V
VGS=10V
ID=6A
RG=15Ω
- 20 30
ns
tr - 9 13.5
Turn-Off Time
td(off) - 100 150
tf - 18 27
Total Gate Charge QG Vcc=300V
ID=12A
VGS=10V
- 47 70.5
nCGate-Source Charge QGS - 10.5 16
Gate-Drain Charge QGD - 14 21
Avalanche Capability IAV L=2.12mH, Tch=25°C 12 - - A
Diode Forward On-Voltage VSD IF=12A, VGS=0V, Tch=25°C - 0.88 1.32 V
Reverse Recovery Time trr IF=12A, VGS=0V
-di/dt=100A/µs, Tch=25°C
- 0.36 - µs
Reverse Recovery Charge Qrr - 4.1 - µC
Note *1 : Tch≤150°C
Note *2 : Stating Tch=25°C, IAS=5A, L=29.2mH, Vcc=50V, RG=50Ω
EAS limited by maximum channel temperature and avalanche current.
See to 'Avalanche Energy' graph.
Thermal Characteristics
Description Symbol Test Conditions min. typ. max. Unit
Thermal resistance
Rth (ch-c) Channel to Case 2.083 °C/W
Rth (ch-a) Channel to Ambient 58.0 °C/W
Gate(G)
Source(S)
Drain(D)
Note *3 : Repetitive rating : Pulse width limited by maximum channel temperature.
See to the 'Transient Themal impeadance' graph.
Note *4 : IF≤-ID, -di/dt=100A/µs, Vcc≤BVDSS, Tch≤150°C.
Note *5 : IF≤-ID, dv/dt=6.5kV/µs, Vcc≤BVDSS, Tch≤150°C.
TO-220F(SLS)
2
FMV12N50E
2
FUJI POWER MOSFET
0 25 50 75 100 125 150
0
10
20
30
40
50
60
70
80
Allowable Power Dissipation
PD=f(Tc)
PD[W]
Tc [°C]
0 2 4 6 8 10 12 14
0
2
4
6
8
10
12
14
16
18
20
ID[A]
VDS [V]
Typical Output Characteristics
ID=f(VDS):80 µs pulse test,Tch=25 °C
2 3 4 5 6
10
-4
10
-3
10
-2
10
-1
10
0
10
1
ID[A]
VGS[V]
Typical Transfer Characteristic
ID=f(VGS):80 µs pulse test,VDS=25V,Tch=25 °C
0.01 0.1 1 10 100
0.01
0.1
1
10
100
gfs[S]
ID [A]
Typical Transconductance
gfs=f(ID):80 µs pulse test,VDS=25V,Tch=25 °C
0 5 10 15 20
0.3
0.4
0.5
0.6
0.7
0.8
0.9
4.5V
RDS(on)[]
ID [A]
Typical Drain-Source on-state Resistance
RDS(on)=f(ID):80 µs pulse test,Tch=25 °C
10V
6V
20V
5V
VGS=4.0V
10
-1
10
0
10
1
10
2
10
3
10
-2
10
-1
10
0
10
1
10
2
DC
t
PD
Power loss waveform :
Square waveform
t
PD
t
PD
Power loss waveform :
Square waveform
ID[A] VDS [V]
Safe Operating Area
ID=f(VDS):Duty=0(Single pulse),Tc=25 °c
t=
1
10
1ms
100µs
20V
10V
6.0V
5.0V
4.5V
VGS=4.0V
Ω
µs
µs
33
FUJI POWER MOSFETFMV12N50E
-50 -25 0 25 50 75 100 125 150
0
1
2
3
4
5
6
typ.
max.
min.
Gate Threshold Voltage vs. Tch
VGS(th)=f(Tch):VDS=VGS,ID=250µA
VGS(th)[V]
Tch [°C]
10
-1
10
0
10
1
10
2
10
0
10
1
10
2
10
3
Typical Switching Characteristics vs. ID
td(on)
tr
tf
td(off)
t[ns]
0 10 20 30 40 50 60 70 80
0
2
4
6
8
10
12
14
16
18
20
Qg [nC]
Typical Gate Charge Characteristics
VGS=f(Qg):ID=12A,Tch=25 °C
VGS[V]
400V
250V
Vcc= 100V
10
-2
10
-1
10
0
10
1
10
2
10
0
10
1
10
2
10
3
10
4
C[pF]
VDS [V]
Typical Capacitance
C=f(VDS):VGS=0V,f=1MHz
Crss
Coss
Ciss
0.00 0.25 0.50 0.75 1.00 1.25 1.50
0.01
0.1
1
10
100
IF[A]
VSD [V]
Typical Forward Characteristics of Reverse Diode
IF=f(VSD):80 µs pulse test,Tch=25 °C
-50 -25 0 25 50 75 100 125 150
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
RDS(on)[]
Tch [
typ.
max.
Drain-Source On-state Resistance
RDS(on)=f(Tch):ID=6A,VGS=10V
Ω
°C]
ID[A]
t=f(ID):Vcc=300V,VGS=10V,RG=15 Ω
4
FMV12N50E
4
FUJI POWER MOSFET
Transient Thermal Impedance
Zth(ch-c)=f(t):D=0
0 25 50 75 100 125 150
0
100
200
300
400
500
IAS=5A
IAS=8A
IAS=12A
EAV[mJ]
starting Tch [
Maximum Avalanche Energy vs. starting Tch
E(AV)=f(starting Tch):Vcc=50V,I(AV)<=12A
°C]
10-6
10-5
10-4
10-3
10-2
10-1
100
10-3
10-2
10-1
100
101
Zth(ch-c)[°C/W]
t [sec]
55
FUJI POWER MOSFETFMV12N50E
WARNING
1. This Catalog contains the product specifications, characteristics, data, materials, and structures as of October 2008.
The contents are subject to change without notice for specification changes or other reasons. When using a product listed in this
Catalog, be sure to obtain the latest specifications.
2. All applications described in this Catalog exemplify the use of Fuji's products for your reference only. No right or license, either
express or implied, under any patent, copyright, trade secret or other intellectual property right owned by Fuji Electric Device
Technology Co., Ltd. is (or shall be deemed) granted. Fuji Electric Device Technology Co., Ltd. makes no representation or
warranty, whether express or implied, relating to the infringement or alleged infringement of other's intellectual property rights which
may arise from the use of the applications described herein.
3. Although Fuji Electric Device Technology Co., Ltd. is enhancing product quality and reliability, a small percentage of semiconductor
products may become faulty. When using Fuji Electric semiconductor products in your equipment, you are requested to take
adequate safety measures to prevent the equipment from causing a physical injury, fire, or other problem if any of the products
become faulty. It is recommended to make your design fail-safe, flame retardant, and free of malfunction.
4. The products introduced in this Catalog are intended for use in the following electronic and electrical equipment which has
normal reliability requirements.
• Computers • OA equipment • Communications equipment (terminal devices) • Measurement equipment
• Machine tools • Audiovisual equipment • Electrical home appliances • Personal equipment • Industrial robots etc.
5. If you need to use a product in this Catalog for equipment requiring higher reliability than normal, such as for the equipment listed
below, it is imperative to contact Fuji Electric Device Technology Co., Ltd. to obtain prior approval. When using these products for
such equipment, take adequate measures such as a backup system to prevent the equipment from malfunctioning even if a Fuji's
product incorporated in the equipment becomes faulty.
• Transportation equipment (mounted on cars and ships) • Trunk communications equipment
• Traffic-signal control equipment • Gas leakage detectors with an auto-shut-off feature
• Emergency equipment for responding to disasters and anti-burglary devices • Safety devices
• Medical equipment
6. Do not use products in this Catalog for the equipment requiring strict reliability such as the following and equivalents to strategic
equipment (without limitation).
• Space equipment • Aeronautic equipment • Nuclear control equipment
• Submarine repeater equipment
7. Copyright ©1996-2008 by Fuji Electric Device Technology Co., Ltd. All rights reserved.
No part of this Catalog may be reproduced in any form or by any means without the express permission of Fuji Electric Device
Technology Co., Ltd.
8. If you have any question about any portion in this Catalog, ask Fuji Electric Device Technology Co., Ltd. or its sales agents before
using the product.
Neither Fuji Electric Device Technology Co., Ltd. nor its agents shall be liable for any injury caused by any use of the products not in
accordance with instructions set forth herein.

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Original N-Channel MOSFET TK10A50D 10A50 10A 500V TO-220F New ToshibaOriginal N-Channel MOSFET TK10A50D 10A50 10A 500V TO-220F New Toshiba
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Original N Channel Mosfet T5A50D K5A50D 5A50D TO-220 5A 500V New Toshiba(Repl...
 
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Original N-Channel Mosfet FMV12N50E 12N50E 500V 12A TO-220F New Fuji Electric

  • 1. 1 FMV12N50E FUJI POWER MOSFET Super FAP-E3 series N-CHANNEL SILICON POWER MOSFET Features Maintains both low power loss and low noise Lower RDS(on) characteristic More controllable switching dv/dt by gate resistance Smaller VGS ringing waveform during switching Narrow band of the gate threshold voltage (3.0±0.5V) High avalanche durability Applications Switching regulators UPS (Uninterruptible Power Supply) DC-DC converters Maximum Ratings and Characteristics Absolute Maximum Ratings at Tc=25°C (unless otherwise specified) Description Symbol Characteristics Unit Remarks Drain-Source Voltage VDS 500 V VDSX 500 V VGS = -30V Continuous Drain Current ID ±12 A Pulsed Drain Current IDP ±48 A Gate-Source Voltage VGS ±30 V Repetitive and Non-Repetitive Maximum Avalanche Current IAR 12 A Note*1 Non-Repetitive Maximum Avalanche Energy EAS 400 mJ Note*2 Repetitive Maximum Avalanche Energy EAR 6.0 mJ Note*3 Peak Diode Recovery dV/dt dV/dt 6.5 kV/µs Note*4 Peak Diode Recovery -di/dt -di/dt 100 A/µs Note*5 Maximum Power Dissipation PD 2.16 W Ta=25°C 60 Tc=25°C Operating and Storage Temperature range Tch 150 °C Tstg -55 to +150 °C Isolation Voltage VISO 2 kVrms t = 60sec, f = 60Hz Outline Drawings [mm] Equivalent circuit schematic Electrical Characteristics at Tc=25°C (unless otherwise specified) Description Symbol Conditions min. typ. max. Unit Drain-Source Breakdown Voltage BVDSS ID=250µA, VGS=0V 500 - - V Gate Threshold Voltage VGS (th) ID=250µA, VDS=VGS 2.5 3.0 3.5 V Zero Gate Voltage Drain Current IDSS VDS=500V, VGS=0V Tch=25°C - - 25 µA VDS=400V, VGS=0V Tch=125°C - - 250 Gate-Source Leakage Current IGSS VGS=±30V, VDS=0V - 10 100 nA Drain-Source On-State Resistance RDS (on) ID=6A, VGS=10V - 0.444 0.52 Ω Forward Transconductance gfs ID=6A, VDS=25V 6.5 13 - S Input Capacitance Ciss VDS=25V VGS=0V f=1MHz - 1600 2400 pFOutput Capacitance Coss - 160 240 Reverse Transfer Capacitance Crss - 11.5 17.5 Turn-On Time td(on) Vcc=300V VGS=10V ID=6A RG=15Ω - 20 30 ns tr - 9 13.5 Turn-Off Time td(off) - 100 150 tf - 18 27 Total Gate Charge QG Vcc=300V ID=12A VGS=10V - 47 70.5 nCGate-Source Charge QGS - 10.5 16 Gate-Drain Charge QGD - 14 21 Avalanche Capability IAV L=2.12mH, Tch=25°C 12 - - A Diode Forward On-Voltage VSD IF=12A, VGS=0V, Tch=25°C - 0.88 1.32 V Reverse Recovery Time trr IF=12A, VGS=0V -di/dt=100A/µs, Tch=25°C - 0.36 - µs Reverse Recovery Charge Qrr - 4.1 - µC Note *1 : Tch≤150°C Note *2 : Stating Tch=25°C, IAS=5A, L=29.2mH, Vcc=50V, RG=50Ω EAS limited by maximum channel temperature and avalanche current. See to 'Avalanche Energy' graph. Thermal Characteristics Description Symbol Test Conditions min. typ. max. Unit Thermal resistance Rth (ch-c) Channel to Case 2.083 °C/W Rth (ch-a) Channel to Ambient 58.0 °C/W Gate(G) Source(S) Drain(D) Note *3 : Repetitive rating : Pulse width limited by maximum channel temperature. See to the 'Transient Themal impeadance' graph. Note *4 : IF≤-ID, -di/dt=100A/µs, Vcc≤BVDSS, Tch≤150°C. Note *5 : IF≤-ID, dv/dt=6.5kV/µs, Vcc≤BVDSS, Tch≤150°C. TO-220F(SLS)
  • 2. 2 FMV12N50E 2 FUJI POWER MOSFET 0 25 50 75 100 125 150 0 10 20 30 40 50 60 70 80 Allowable Power Dissipation PD=f(Tc) PD[W] Tc [°C] 0 2 4 6 8 10 12 14 0 2 4 6 8 10 12 14 16 18 20 ID[A] VDS [V] Typical Output Characteristics ID=f(VDS):80 µs pulse test,Tch=25 °C 2 3 4 5 6 10 -4 10 -3 10 -2 10 -1 10 0 10 1 ID[A] VGS[V] Typical Transfer Characteristic ID=f(VGS):80 µs pulse test,VDS=25V,Tch=25 °C 0.01 0.1 1 10 100 0.01 0.1 1 10 100 gfs[S] ID [A] Typical Transconductance gfs=f(ID):80 µs pulse test,VDS=25V,Tch=25 °C 0 5 10 15 20 0.3 0.4 0.5 0.6 0.7 0.8 0.9 4.5V RDS(on)[] ID [A] Typical Drain-Source on-state Resistance RDS(on)=f(ID):80 µs pulse test,Tch=25 °C 10V 6V 20V 5V VGS=4.0V 10 -1 10 0 10 1 10 2 10 3 10 -2 10 -1 10 0 10 1 10 2 DC t PD Power loss waveform : Square waveform t PD t PD Power loss waveform : Square waveform ID[A] VDS [V] Safe Operating Area ID=f(VDS):Duty=0(Single pulse),Tc=25 °c t= 1 10 1ms 100µs 20V 10V 6.0V 5.0V 4.5V VGS=4.0V Ω µs µs
  • 3. 33 FUJI POWER MOSFETFMV12N50E -50 -25 0 25 50 75 100 125 150 0 1 2 3 4 5 6 typ. max. min. Gate Threshold Voltage vs. Tch VGS(th)=f(Tch):VDS=VGS,ID=250µA VGS(th)[V] Tch [°C] 10 -1 10 0 10 1 10 2 10 0 10 1 10 2 10 3 Typical Switching Characteristics vs. ID td(on) tr tf td(off) t[ns] 0 10 20 30 40 50 60 70 80 0 2 4 6 8 10 12 14 16 18 20 Qg [nC] Typical Gate Charge Characteristics VGS=f(Qg):ID=12A,Tch=25 °C VGS[V] 400V 250V Vcc= 100V 10 -2 10 -1 10 0 10 1 10 2 10 0 10 1 10 2 10 3 10 4 C[pF] VDS [V] Typical Capacitance C=f(VDS):VGS=0V,f=1MHz Crss Coss Ciss 0.00 0.25 0.50 0.75 1.00 1.25 1.50 0.01 0.1 1 10 100 IF[A] VSD [V] Typical Forward Characteristics of Reverse Diode IF=f(VSD):80 µs pulse test,Tch=25 °C -50 -25 0 25 50 75 100 125 150 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 RDS(on)[] Tch [ typ. max. Drain-Source On-state Resistance RDS(on)=f(Tch):ID=6A,VGS=10V Ω °C] ID[A] t=f(ID):Vcc=300V,VGS=10V,RG=15 Ω
  • 4. 4 FMV12N50E 4 FUJI POWER MOSFET Transient Thermal Impedance Zth(ch-c)=f(t):D=0 0 25 50 75 100 125 150 0 100 200 300 400 500 IAS=5A IAS=8A IAS=12A EAV[mJ] starting Tch [ Maximum Avalanche Energy vs. starting Tch E(AV)=f(starting Tch):Vcc=50V,I(AV)<=12A °C] 10-6 10-5 10-4 10-3 10-2 10-1 100 10-3 10-2 10-1 100 101 Zth(ch-c)[°C/W] t [sec]
  • 5. 55 FUJI POWER MOSFETFMV12N50E WARNING 1. This Catalog contains the product specifications, characteristics, data, materials, and structures as of October 2008. The contents are subject to change without notice for specification changes or other reasons. When using a product listed in this Catalog, be sure to obtain the latest specifications. 2. All applications described in this Catalog exemplify the use of Fuji's products for your reference only. No right or license, either express or implied, under any patent, copyright, trade secret or other intellectual property right owned by Fuji Electric Device Technology Co., Ltd. is (or shall be deemed) granted. Fuji Electric Device Technology Co., Ltd. makes no representation or warranty, whether express or implied, relating to the infringement or alleged infringement of other's intellectual property rights which may arise from the use of the applications described herein. 3. Although Fuji Electric Device Technology Co., Ltd. is enhancing product quality and reliability, a small percentage of semiconductor products may become faulty. When using Fuji Electric semiconductor products in your equipment, you are requested to take adequate safety measures to prevent the equipment from causing a physical injury, fire, or other problem if any of the products become faulty. It is recommended to make your design fail-safe, flame retardant, and free of malfunction. 4. The products introduced in this Catalog are intended for use in the following electronic and electrical equipment which has normal reliability requirements. • Computers • OA equipment • Communications equipment (terminal devices) • Measurement equipment • Machine tools • Audiovisual equipment • Electrical home appliances • Personal equipment • Industrial robots etc. 5. If you need to use a product in this Catalog for equipment requiring higher reliability than normal, such as for the equipment listed below, it is imperative to contact Fuji Electric Device Technology Co., Ltd. to obtain prior approval. When using these products for such equipment, take adequate measures such as a backup system to prevent the equipment from malfunctioning even if a Fuji's product incorporated in the equipment becomes faulty. • Transportation equipment (mounted on cars and ships) • Trunk communications equipment • Traffic-signal control equipment • Gas leakage detectors with an auto-shut-off feature • Emergency equipment for responding to disasters and anti-burglary devices • Safety devices • Medical equipment 6. Do not use products in this Catalog for the equipment requiring strict reliability such as the following and equivalents to strategic equipment (without limitation). • Space equipment • Aeronautic equipment • Nuclear control equipment • Submarine repeater equipment 7. Copyright ©1996-2008 by Fuji Electric Device Technology Co., Ltd. All rights reserved. No part of this Catalog may be reproduced in any form or by any means without the express permission of Fuji Electric Device Technology Co., Ltd. 8. If you have any question about any portion in this Catalog, ask Fuji Electric Device Technology Co., Ltd. or its sales agents before using the product. Neither Fuji Electric Device Technology Co., Ltd. nor its agents shall be liable for any injury caused by any use of the products not in accordance with instructions set forth herein.