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TERM PAPER 
ON 
INTERFERENCE AND DIFFRACTION 
OF LIGHT 
SUBMITTED BY SUBMITTED TO 
SUNNY KUMAR GUPTA SAMITA DEV 
ROLL NO.-A06 
SECTION-M2408
Interference 
In constructive interference the amplitude of the resultant wave is greater than 
that of either individual wave. 
In destructive interference the amplitude of the resultant wave is less than that of 
either individual wave. 
All interference associated with light waves arises when the electromagnetic 
fields that constitute the individual waves combine. 
Section 37.1
Conditions for Interference 
To observe interference in light waves, the following two conditions must be met: 
 The sources must be coherent. 
 They must maintain a constant phase with respect to each other. 
 The sources should be monochromatic. 
 Monochromatic means they have a single wavelength. 
Section 37.1
Producing Coherent Sources 
Light from a monochromatic source is used to illuminate a barrier. 
The barrier contains two small openings. 
 The openings are usually in the shape of slits. 
The light emerging from the two slits is coherent since a single source produces 
the original light beam. 
This is a commonly used method. 
Section 37.1
Young’s Double-Slit Experiment: Schematic 
Thomas Young first demonstrated 
interference in light waves from two 
sources in 1801. 
The narrow slits S1 and S2 act as 
sources of waves. 
The waves emerging from the slits 
originate from the same wave front and 
therefore are always in phase. 
Section 37.1
Resulting Interference Pattern 
The light from the two slits forms a 
visible pattern on a screen. 
The pattern consists of a series of 
bright and dark parallel bands called 
fringes. 
Constructive interference occurs where 
a bright fringe occurs. 
Destructive interference results in a 
dark fringe. 
Section 37.1
Interference Pattern 1 
Constructive interference occurs at 
point O. 
The two waves travel the same 
distance. 
 Therefore, they arrive in phase 
As a result, constructive interference 
occurs at this point and a bright fringe is 
observed. 
Section 37.1
Interference Patterns 2 
The lower wave has to travel farther 
than the upper wave to reach point P. 
The lower wave travels one wavelength 
farther. 
 Therefore, the waves arrive in 
phase 
A second bright fringe occurs at this 
position. 
Section 37.1
Interference Patterns 3 
The upper wave travels one-half of a 
wavelength farther than the lower wave 
to reach point R. 
The trough of the upper wave overlaps 
the crest of the lower wave. 
This is destructive interference. 
 A dark fringe occurs. 
Section 37.1
Diffraction 
If the light traveled in a straight line 
after passing through the slits, no 
interference pattern would be observed. 
From Huygens’s principle we know the 
waves spread out from the slits. 
This divergence of light from its initial 
line of travel is called diffraction. 
Section 37.1
Young’s Double-Slit Experiment: Geometry 
The path difference, δ, is found from 
geometry. 
δ = r2 – r1 = d sin θ 
 This assumes the paths are 
parallel. 
 Not exactly true, but a very good 
approximation if L is much greater 
than d 
Section 37.2
Interference Equations 
For a bright fringe produced by constructive interference, the path difference 
must be either zero or some integer multiple of the wavelength. 
δ = d sin θbright = mλ 
 m = 0, ±1, ±2, … 
 m is called the order number 
 When m = 0, it is the zeroth-order maximum 
 When m = ±1, it is called the first-order maximum 
When destructive interference occurs, a dark fringe is observed. 
This needs a path difference of an odd half wavelength. 
δ = d sin θdark = (m + ½)λ 
 m = 0, ±1, ±2, … 
Section 37.2
Interference Equations, final 
Assumptions in a Young’s Double Slit Experiment: 
 L >> d 
 d >> λ 
Approximation: 
 θ is small and therefore the small angle approximation tan θ ~ sin θ can be 
used 
y = L tan θ ≈ L sin θ 
For small angles, 
mλ y = L mλ y = 
L 
bright dark 
1 
( + 
) 
and 2 
d d 
Section 37.2
Uses for Young’s Double-Slit Experiment 
Young’s double-slit experiment provides a method for measuring wavelength of 
the light. 
This experiment gave the wave model of light a great deal of credibility. 
 It was inconceivable that particles of light could cancel each other in a way 
that would explain the dark fringes. 
Section 37.2
Intensity Distribution: Double-Slit Interference Pattern 
The bright fringes in the interference pattern do not have sharp edges. 
 The equations developed give the location of only the centers of the bright 
and dark fringes. 
We can calculate the distribution of light intensity associated with the double-slit 
interference pattern. 
Assumptions: 
 The two slits represent coherent sources of sinusoidal waves. 
 The waves from the slits have the same angular frequency, ω. 
 The waves have a constant phase difference, φ. 
The total magnitude of the electric field at any point on the screen is the 
superposition of the two waves. 
Section 37.3
Intensity Distribution, Electric Fields 
The magnitude of each wave at point P on a screen can be found. 
 E1 = Eo sin ωt 
 E2 = Eo sin (ωt + φ) 
 Both waves have the same amplitude, Eo.
Intensity Distribution, Phase Relationships 
The phase difference between the two waves at P depends on their path 
difference. 
 δ = r– r= d sin θ 
2 1 A path difference of λ (for constructive interference) corresponds to a phase 
difference of 2π rad. 
A path difference of δ is the same fraction of λ as the phase difference φ is of 2π. 
This gives 
φ = 2π δ = 
2π d sin θ 
λ λ 
Section 37.3
Intensity Distribution, Resultant Field 
The magnitude of the resultant electric field comes from the superposition 
principle. 
 EP = E1+ E2 = Eo[sin ωt + sin (ωt + φ)] 
This can also be expressed as 
E = 2 Eωt cos æ φ ö æ φ ö P o çè ø¸ sin 
èç + 2 2 
ø¸ 
 EP has the same frequency as the light at the slits. 
 The magnitude of the field is multiplied by the factor 2 cos (φ / 2). 
Section 37.3
Light Intensity, Graph 
The interference pattern consists of 
equally spaced fringes of equal intensity 
Section 37.3
Multiple Slits, Graph 
With more than two slits, the pattern 
contains primary and secondary 
maxima. 
For N slits, the intensity of the primary 
maxima is N2 
times greater than that 
due to a single slit. 
As the number of slits increases, the 
primary maxima increase in intensity 
and become narrower. 
 The secondary maxima decrease 
in intensity relative to the primary 
maxima. 
The number of secondary maxima is 
N – 2, where N is the number of slits. 
Section 37.3

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M2408 a06 term paper

  • 1. TERM PAPER ON INTERFERENCE AND DIFFRACTION OF LIGHT SUBMITTED BY SUBMITTED TO SUNNY KUMAR GUPTA SAMITA DEV ROLL NO.-A06 SECTION-M2408
  • 2. Interference In constructive interference the amplitude of the resultant wave is greater than that of either individual wave. In destructive interference the amplitude of the resultant wave is less than that of either individual wave. All interference associated with light waves arises when the electromagnetic fields that constitute the individual waves combine. Section 37.1
  • 3. Conditions for Interference To observe interference in light waves, the following two conditions must be met:  The sources must be coherent.  They must maintain a constant phase with respect to each other.  The sources should be monochromatic.  Monochromatic means they have a single wavelength. Section 37.1
  • 4. Producing Coherent Sources Light from a monochromatic source is used to illuminate a barrier. The barrier contains two small openings.  The openings are usually in the shape of slits. The light emerging from the two slits is coherent since a single source produces the original light beam. This is a commonly used method. Section 37.1
  • 5. Young’s Double-Slit Experiment: Schematic Thomas Young first demonstrated interference in light waves from two sources in 1801. The narrow slits S1 and S2 act as sources of waves. The waves emerging from the slits originate from the same wave front and therefore are always in phase. Section 37.1
  • 6. Resulting Interference Pattern The light from the two slits forms a visible pattern on a screen. The pattern consists of a series of bright and dark parallel bands called fringes. Constructive interference occurs where a bright fringe occurs. Destructive interference results in a dark fringe. Section 37.1
  • 7. Interference Pattern 1 Constructive interference occurs at point O. The two waves travel the same distance.  Therefore, they arrive in phase As a result, constructive interference occurs at this point and a bright fringe is observed. Section 37.1
  • 8. Interference Patterns 2 The lower wave has to travel farther than the upper wave to reach point P. The lower wave travels one wavelength farther.  Therefore, the waves arrive in phase A second bright fringe occurs at this position. Section 37.1
  • 9. Interference Patterns 3 The upper wave travels one-half of a wavelength farther than the lower wave to reach point R. The trough of the upper wave overlaps the crest of the lower wave. This is destructive interference.  A dark fringe occurs. Section 37.1
  • 10. Diffraction If the light traveled in a straight line after passing through the slits, no interference pattern would be observed. From Huygens’s principle we know the waves spread out from the slits. This divergence of light from its initial line of travel is called diffraction. Section 37.1
  • 11. Young’s Double-Slit Experiment: Geometry The path difference, δ, is found from geometry. δ = r2 – r1 = d sin θ  This assumes the paths are parallel.  Not exactly true, but a very good approximation if L is much greater than d Section 37.2
  • 12. Interference Equations For a bright fringe produced by constructive interference, the path difference must be either zero or some integer multiple of the wavelength. δ = d sin θbright = mλ  m = 0, ±1, ±2, …  m is called the order number  When m = 0, it is the zeroth-order maximum  When m = ±1, it is called the first-order maximum When destructive interference occurs, a dark fringe is observed. This needs a path difference of an odd half wavelength. δ = d sin θdark = (m + ½)λ  m = 0, ±1, ±2, … Section 37.2
  • 13. Interference Equations, final Assumptions in a Young’s Double Slit Experiment:  L >> d  d >> λ Approximation:  θ is small and therefore the small angle approximation tan θ ~ sin θ can be used y = L tan θ ≈ L sin θ For small angles, mλ y = L mλ y = L bright dark 1 ( + ) and 2 d d Section 37.2
  • 14. Uses for Young’s Double-Slit Experiment Young’s double-slit experiment provides a method for measuring wavelength of the light. This experiment gave the wave model of light a great deal of credibility.  It was inconceivable that particles of light could cancel each other in a way that would explain the dark fringes. Section 37.2
  • 15. Intensity Distribution: Double-Slit Interference Pattern The bright fringes in the interference pattern do not have sharp edges.  The equations developed give the location of only the centers of the bright and dark fringes. We can calculate the distribution of light intensity associated with the double-slit interference pattern. Assumptions:  The two slits represent coherent sources of sinusoidal waves.  The waves from the slits have the same angular frequency, ω.  The waves have a constant phase difference, φ. The total magnitude of the electric field at any point on the screen is the superposition of the two waves. Section 37.3
  • 16. Intensity Distribution, Electric Fields The magnitude of each wave at point P on a screen can be found.  E1 = Eo sin ωt  E2 = Eo sin (ωt + φ)  Both waves have the same amplitude, Eo.
  • 17. Intensity Distribution, Phase Relationships The phase difference between the two waves at P depends on their path difference.  δ = r– r= d sin θ 2 1 A path difference of λ (for constructive interference) corresponds to a phase difference of 2π rad. A path difference of δ is the same fraction of λ as the phase difference φ is of 2π. This gives φ = 2π δ = 2π d sin θ λ λ Section 37.3
  • 18. Intensity Distribution, Resultant Field The magnitude of the resultant electric field comes from the superposition principle.  EP = E1+ E2 = Eo[sin ωt + sin (ωt + φ)] This can also be expressed as E = 2 Eωt cos æ φ ö æ φ ö P o çè ø¸ sin èç + 2 2 ø¸  EP has the same frequency as the light at the slits.  The magnitude of the field is multiplied by the factor 2 cos (φ / 2). Section 37.3
  • 19. Light Intensity, Graph The interference pattern consists of equally spaced fringes of equal intensity Section 37.3
  • 20. Multiple Slits, Graph With more than two slits, the pattern contains primary and secondary maxima. For N slits, the intensity of the primary maxima is N2 times greater than that due to a single slit. As the number of slits increases, the primary maxima increase in intensity and become narrower.  The secondary maxima decrease in intensity relative to the primary maxima. The number of secondary maxima is N – 2, where N is the number of slits. Section 37.3