The document describes the four probe method used to measure the resistivity and determine the band gap of a semiconductor sample (germanium crystal). It discusses the history of the four probe technique and limitations of the two probe method. The experimental procedure, apparatus used, formulas, observations, calculations and results are presented. The band gap of the germanium sample is determined to be 0.68eV from the linear relationship between the log of resistivity and inverse temperature. Applications and references are also listed.