Obviously, 2018 was a mixed year but here I’ll review a few good things happened in 2018.

1. Review of my 2018
12-31-2018
As the old saying goes, “If you are always numbering your troubles, you will never find time
counting your blessings.” That is once on a while one should count the blessings in their lives
too. Obviously, 2018 was a mixed year but here I’ll review a few good things happened in 2018.
I’m thankful to all my colleagues and mentors for their support and inspiration. Among a few
papers published in 2018, likely the most important one is, “Nanoscale metrology of line patterns
on semiconductor by continuous wave terahertz multispectral reconstructive 3D imaging
overcoming the Abbe diffraction limit,” published by the IEEE Transactions on Semiconductor
Manufacturing [1]. This paper outlines a technique for nano-scale imaging and measurements
without an electron microscope and other improvements over the current techniques. It outlines
how the “Abbe diffraction limit” is broken, a problem that was outstanding since 1873. Outside
the reviewers, this article was appreciated by reputed scientists, “Thank you for sharing such an
excellent paper with me, it is great to see evidence in print of such extreme resolution, you have
forwarded the field irreversibly!” Mike
– Dr. Michael L. Norton, Dr. Michael L. Norton, Department of Chemistry, 1 John
Marshall Drive, Marshall University, Huntington, WV 25755
Another notable paper published by the Springer’s Journal of Nanoparticle Research, “Terahertz-
based nanometrology: multispectral imaging of nanoparticles and nanoclusters in suspensions”
[2]. This paper also addresses an advancement of nanoparticle imaging and measurements while
they are still suspended in a medium. However, this paper also formally acknowledges the
“Rahman-Tomalia” effect, the first of its kind that exploits electro-optic dendrimer for terahertz
radiation generation. This paper was also appreciated by a colleague, “Hi Anis, Good to see all
of the publications cited in the article you sent to me – even an “Rahman-Tomalia (RT) Effect”
named after you! Glad to hear that you are doing so well, best wishes!” –Bruce
– Bruce A. Stanley, Ph.D., Director, Scientific Programs, Section of Research Resources
H093, Director, Proteomics/Mass Spectrometry Facility.
References
[1] A. Rahman and A. K. Rahman, "Nanoscale metrology of line patterns on semiconductor by
continuous wave terahertz multispectral reconstructive 3D imaging overcoming the Abbe
diffraction limit," in IEEE Transactions on Semiconductor Manufacturing.
doi: 10.1109/TSM.2018.2865167
Keywords: Image resolution; Three-dimensional displays; Image reconstruction;
Diffraction; Scanning electron microscopy; Metrology; Imaging; Volume measurement;
Nanotechnology; Nondestructive testing.
URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8443127&isnumber=5159394
[2] Rahman, A. & Tomalia, D.A., “Terahertz-based nanometrology: multispectral imaging of
nanoparticles and nanoclusters in suspensions,” J Nanopart Res (2018) 20: 297.
Doi: 10.1007/s11051-018-4396-y

2. Keywords: Terahertz multispectral reconstructive imaging, Nanoslurry, Silica nanoparticles,
Nanoclusters, Nanosuspension, Nanoscale instrumentation.
URL: https://link.springer.com/content/pdf/10.1007%2Fs11051-018-4396-y.pdf
Anis Rahman, PhD
Hummelstown, PA 17036
Email: info@arphotonics.net
http://arphotonics.net