1. Ralph (Butch) Thornburg 2340 Spring Hill, FL 34609 H-501-369-5861, 913-957-0066 rthornburg0135@msn.com
SUMMARY
Over twenty years of accomplishments in test engineering management, site management, NPI, DFT, DFM engineer,
lead engineer, test hardware support, QMP &network manager, test engineering trainer and new test strategy
development. I’ve demonstrated ability in positions with America's premiere high tech and military electronic support
companies. I have solid experience in all areas of in-circuit testing (Teradyne/GenRad & AgilentHP), flying Probers
(SPEA, Scorpion, SEICA), boundary scan (Goepel, Corelis, Asset, and Acculogic) testing, functional electronic testing
(TeradyneSpectrum 9XXX, L210, Agilent(HP)V, NI LabWindows and LabView) and cable testing (Cirris, DITMCO).
I have managed test strategies going to contract manufacturing locations domestically and internationally. I have
worked with ATLAS, DEC RSX, VAX, UNIX(LINIX), MSWindows, BASIC, C and GENRAD software for the
development of test programs.
EXPERIENCE
Sparton Electronics – Brooksville, FL. Test Engineer Lead 2013 - current
Senior test engineer (Lead) in charge of support for flyingprobe (SPEA), in-circuit testing (Teradyne1880, GR/Teradyne test
station, Agilent/HP3070), Cable testing (Cirris) as well as boundary scan testing (Goepel). I support current production and new
developments for board testing. Familiar with SPEA Leonardo, Teradyne D2B, Test fixture development and Agile
configuration systems. Assist in thebidding and proposals for contracts from new customers in theareas of Flying Probe, ICT,
boundary scan, functional test, cable test, ESS and vibe. I support thedepartment at factory production meetings and new Test
developments. I manage and coordinate an ICT contract engineer.
IEC Electronics – Albuquerque, NM.Lead Test EngineerIV 2010 – 2013
Test Engineer IV in charge of all aspects of testing a high mix low volume defense contracting manufacturing operation. Among
the areas of my test development and support areincircuit test, boundary scan, cable test, flying probe, functional bench and
automated ATE and environmental testing (both ESS, and vibration). Write test programs for ICT (over 25 in 2011) and
boundary scan (over 20 in 2011). I quoted and develop SOW for testing of numerous applications, developed test plans,
procedures, and supported defensecustomers. Support and develop functional testing hardware and software. Provide testability
(DFT) analysis to my company and customers. Recently I saved the company over $120,000 by developing in-house
programming of board level test. Developed new test strategies to repair failed circuit cards with ICT, boundary scan and
functional which saved our company tens of thousands. Built most of my own testset hardware, some ITAs, STA’s and test
fixtures as well as supporting, maintaining and repairing equipment which I support. I Left this position to move close to my
family in Florida.
X Technologies– San Antonio, TX SeniorTest EngineerAnalyst 2009 – 2010 (contract)
Developed test programs and solutions for Lackland AFB to modernize test program sets for a satellite communication system.
This contract has required me to create several DOD documents. My responsibilities involved the transfer of legacy tapes test
data from HP-VEE test station running HP-UX to a CD in Windows format. This required transferring thedata by using a
LINUX server to run the test softwareand transfer thedata to a Windows readable format. Wrote a procedure and trained
engineers to convert tapes to CDs. Since no source code was provided we had to reverse engineer the tests sets by capturing the
data via theI488 and VXI busses and rewriting thesetests using SCPI commands useable by the VDATS Teradynespectrum
9000 systemLabWindows/CVI.
TES for Northrop Grumman - contractor -Topeka, KS Test Engineer Manager 2008-2009 (contract)
I managed a team of six test engineers. We performed functional testing and repair of printed circuit cards. Directed their
activities and evaluated their work performance. Develop new test strategies for postaldepot hardware repair with tools such as
LabView for motor testing and flying probe, boundary scan for testing motherboards, various circuit cards assembles and power
supplies
DRS-Technologies-Johnstown, PA SeniorCCATest Engineer2007 - 2008
My responsibilities include JTAG and ICT development for new products and the support on several test strategies, including
functional testing with RF, flying probe test strategies for new and legacy products. I have some experience with AOI, X-Ray
and NPI responsibilities. I have introduced Teradyne functional Spectrum 9100, Corelis boundary scan and GenRad ICT test
strategies to legacy and new products. We manufacture and test RF, digital and wireless products from various defense
contractors. I left this position to get back into a managerial role.
EADS-NA Def. (Hill AFB)-Ogden, UT Site Manager - Test Engineer 2003 – 2007 (contract)
I was a site manager for a team of 17 contract engineers who are responsiblefor re-hosting of legacy ATLAS Test Program Sets.
We developed a new test station with the TeradyneSpectrum 9000 to replace aging E35E HP1000 based equipment for the test
of LRU and SRU in the Minuteman Missilesystem. I also performed TPS re-hosting (test development). I developed 12

2. program tests for analog and digital circuit cards. I left this position when the contract was completed.
A.T.E (for Lockheed)-Orlando, FL Test Contract Engineer 2002 – 2003 (contract)
I was responsiblefor implementing JTAG testingfor 8 digital circuit boards, which were used in theComanche helicopter.
These boards were designed almost 10 years previously so I had to develop test fixtures for accessing the JTAG chain and
develop a unique connectorized external boundary-scan test strategy. This enabled me to complete this project with the highest
possibletest coverage. I left when the contract was completed ahead of schedule.
Marconi Communications – Warrendale, PA SeniorTest Engineer 1999 – 2002 (chapter 11)
My senior level responsibilities included developing manufacturing test strategies for many of Marconi’s leading edge network
switches such as BXR ATM network equipment and other products. I managed the development of B/S (JTAG), ICT, X-Ray,
and flying probefor our facility and our remote contract manufacturer locations. I have been instrumental in thepush to switch
to (Agilent 5DX) X-Ray and (Corelis) JTAG testingin order to test our boards that range from 7,000 – 25,000 nodes. Through
this process we have been able to greatly reduce our costs while increasing test coverage (1.2 million in savings). I have worked
on my company’s international test committee, which has standardize all locations on a test approach using National Instrument’s
Test Stand for functional testing and Corelis for B/S testing. My employer has sent me to the U.K., Canada and Germany in
order to educate, train and assist in the development of board test strategies for our remote facilities. I have given presentations
to test conferences both here and abroad about our test methods and experiences. I trained several test engineers on boundary
scan test development. I was laid off from this position when Marconi went into bankruptcy.
3Com Corporation – Salt Lake City, UT Test Support Manager 1998 – 1999 closed
Responsible for managing third shift test support for eight high volume production lines. We supported many HP 3070 systems
with inline and offline capabilities, functional modem testing, and many other functional PC based platforms. I trained production
operators and test engineers on thesupport, maintenance and operation of ICT and functional tests. I left when our factory was
sold to Manufacturers Unlimited.
TRW Automotive Electronics – Marshall, IL SeniorTest Engineer 1997 - 1998
I was responsiblefor the 3rd
generation Chrysler airbag electronic modules’ incircuit test. Wroteand debugged programs for
several new products, which used priority protocols to dataload electronic modules. Helped setup several incircuit test systems
and support production on many different incircuit test lines. I left for family issues.
Compaq Computer Corporation - Houston, TX Test Engineer2 1989 to 1992
Responsibilities included the following: developing in-circuit test strategies, performing testability’s, interfacing with
development engineering, writing test models for both analog and digital, development of fixturing for printed circuit boards
(PWBs), writing test programs and supportingthemon the production line, and running audits on test coverage using such tools
as GENRAD's ALLFAULT and QCHECK. I have experience in developing test strategies and writing test programs for
modems, option cards, power supplies and PC processor boards. Considered analog ICT expert from my usage of the GENRAD
ATL, LIB, and ACL. Presented technical papers “UsingATO”(analog test option), “Preprocessor and AIO (analog instrument
option) for thefunctional testing with the GENRAD in circuit tester and “AWARE test with 5DX and HP3070”. Compaq was
the largest GR testing facility (over 20 GR 2282's, about 10 2276's, 2 MICRO-VAX's and a UNIX work station). Acquired
several weeks of training at GR in both Boston and California areas acquiring training in the latest new developments including
HILO, VAX and UNIX. I was laid off from this position when Compaq had financial difficulties.
Bell Labs, AT&T, Lucent Technologies - IN, LA MTS 1980 - 1989, 1992 – 1997 closed
I was one of the primary incircuit development engineers at this large manufacturing facility. My responsibilities included
supportingtheproduction line on the GenRad (GR) test programs for many telephony products (analog and digital circuit cards),
expanding test coverage by adding testing in both ICT (incircuit test) and functional tests. Network manager for over twenty-five
227x systems, 2294 systemmanager for 2 systems and plant QMP manager for the plant. Supported over four production lines
and 60 test programs at one time. Took part in the training of several test engineers and QMP manager. Trained several
engineers and technicians as test operators, test maintenance and test engineers on ICT. Worked on several task forces which
increased 1st
pass yields to better than 95% which eventually eliminated much redundant testing. Implemented the upgrades to
GR UNIX based test systems and GR NT based systems. I assisted on the outsourcing of many test facilities to several OEM
manufacturing facilities both in and out of this country. Our facilities were closing so I left when our last factory was phasing
down.

3. EDUCATION
KellerGraduate School – Project management, 6hrs completed 2007
Sandy, UT (MBA program) (GPA 4.0/4.0)
Purdue University – Masters in Industrial Engineering, 6hrs completed 1996 - 1996
West Lafayette, IN (Lucent summer on campus program) (GPA 3.0/4.0)
Bachelors of Science Degree in OrganizationalManagement 1993 - 1995
Wiley College, Marshall, Texas (GPA 3.1/4.0) 0
Louisiana State University of Shreveport 6hrs completed
Shreveport, LA 15 credits
Associate Degree of Science in Electronics Technology
Vincennes University, Vincennes, Indiana (GPA 3.35/4.0)
Southwestern Indiana University
Evansville, Indiana (EET 13 credits)
Clearance – Secret (2009) and a U.S. citizen
TRAINING
SPEA FP development, LabWindows/CVI, LabVIEW, TestStand, ATLAS functional test systemoverview, PAWS AN/GSM -
315A programming language training, CMMI training, ITAR, Corelis B/S, Goepel B/S, introduction to Acculogic B/S training,
ASSET Intertech B/S, HP 3070 Maintenance Class and Phillips board handler maintenance class, GenRad 227x/228x training,
Teradyne18XX, TeradyneD2B, HILO simulation, Analog and Digital Library, Systemadministration schools in UNIX, DEC,
and Windows environments. Worked with C, C++, basic and wrote macro’s in ED2, Microsoft Office (Word, Excel,
PowerPoint). Attended GenRad test conferences (1984, 86,88,91,97,98). Presented papers at GenRad test conferences (1988,91
and 98). Attended QS 9000 and ISO9001 training at Lucent and TRW. Presenter at Agilent’s 5DX and ICT conferences in
Spring and Summer of 2000, presented AWARE Test presentation at Marconi’s global Test Conference and head up a test
committee on test standards in Coventry U.K. and Offenburg Germany. Attended Boundary Scan Test Development/Diagnostics
Repair Workshop and Advanced Test Development classes for Acculogic, Corelis and Goepel boundary scan.
PERSONAL & LEADERSHIP
Usher and greeter for Family First Assembly, Royal Rangers Senior Commander (like boy scouts), Eagle Scout. Alumni
Member of Sigma Phi Epsilon (Iota chapter-Vincennes Indiana).