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Graphene Based Transistors For Digital And
Analog Application
- A Simulation Study
Vishal Anand Agam Gupta Abhishek
Anand 1204059 1204056
1204055
Project Supervisor: Dr. M. W. Akram
Contents:-
• Motivation
• Project Roadmap
• Introduction
• Basics of Graphene
• Structure of GFET
• Software Introduction
• Software Simulation
• Parametric Results
• Comparisons
• Conclusion
Project Roadmap
Motivation:-
• Gordon Moore suggested that the number of
transistors get doubled approximately every
two years.
• The devices have become smaller.
• The introduction of new channel material,
device performance can be optimized.
Ref:[1].www.intelcorporations.com
Beyond C-MOS
Ref[2]:- Roadmap for 22 nm and beyond H. Iwai * Frontierl Research Center, Tokyo
Institute of Technology, 4259-J2-68, Nagatsuta, Midori-ku, Yokohama 226-8502, Japan
Ref[3] :- Carbon Nanotubes and Graphene Nanoribbons: Potentials for Nanoscale
Electrical Interconnects .Caterina Soldano , Saikat Talapatra and Swastik Kar
So What’s The Way Out ???
TWO
OPTIONS
NEW
DEVICE
STRUCTURE
FinFET
NEW
CHANNEL
MATERIAL
GRAPHENE
NANO
RIBBON GRAPHENE SHEETFinFET
Ref:-[4] www.google.com
What Is Graphene ?
Thermodynamically stable graphene sheet was first
discovered in 2004 by Giem and Novoselov.
Graphene is a two –dimensional sheet of sp2 bonded
carbon atoms arranged ina honeycomb crystal
structure with two carbon atoms in each unit cell.
Ref:- [5]Fabrication and Characterization of Graphene Field Effect Transistors by Sam Vaziri
Graphite
Single-layer Graphene
Single-wall Carbon
Nanotub
Ref:- [6] K. S. Novoselov et al., “Electric Field Effect in Atomically
Thin Carbon Films,” Science, 306 (2004) 666.
Types of Graphene structures
Ref:-[13]Characterization of Graphene Field Effect Transistors by Sam Vaziri
GNR Width(nm)
The variation of bandgaps of Arm-chair GNRs with width(W)
How to fabricate GNR ?
We can divide the GNR fabrication in two different methods :
• Chemical method: It involves assembling the small molecules into GNRs.Many
groups have reported the chemical fabrication of GNRs with
small molecules.
• Physical methods :- By gradual unzipping of one wall of a carbon nanotube to form
a
nanoribbon
Ref[7]:-Representation of the gradual unzipping of one wall of a carbon nanotube to form a
nanoribbon (Kosynkin et al, 2009)
Graphene Electronic Properties :
• Semi-metal or zero-gap semiconductor
• Linear dispersion relation Optoelectronics
• Massless dirac fermions, v ~ c/300 Intrinsic carrier mobility
(suspended graphene in vacuum 2,00,000 cm2 V-1s-1
• Carrier mobility of graphene on SiO2 at room-temperature
10,000-
20,000 cm2 V-1s-1
• Maximum current density J > 108 A/cm2
• Velocity saturation vsat = 5 x 107 cm/s (10 x Si, 2 x GaAs)
Fig:-Dispersion relation of graphene in fist Brillouin zone
Ref:-[8] Fabrication and Characterization of Graphene Field Effect Transistors by Sam Vaziri
1. Mechanical properties
• Young’s modulus: ~1.10 TPa (Si ~ 130 GPa)
• Elastically stretchable by 20%
• Strongest material known
• Flexible
2. Thermal conductivity
• ∼5000 W/m•K at room temperature
Diamond: ∼2000 W/m•K, 10 x higher than Cu, Al
3. Transparent (only 1 atom thin)
Transparent flexible conductive electrodes
4. High surface to volume ratio
5. Most important advantage of Graphene technology is that it is compatible with standard sillicon
technology
making it easy and cost effective to integrate with the existing CMOS fabrication plants.
Simulation Side
• Our simulation software=> NanoTCAD ViDES
• Our documentation software=>Origin8, Plot Digitizer
• OS required=>Linux
• Languages=>Python, C.
• Equations used=>Solution of Poisson & Schrodinger equations, NEGF(Non-
Equilibrium Green’s Function )
• Modules required=>Pylab, NumPy, SciPy.
Why device simulation???
They allow to:
• predict the device behaviour
• understand the physical mechanisms underlying
the device operation
• test the impact of device design parameters on the
device performance (device optimization)
Ref:-[9] User Manual of NanoTcad Vides.
Mathematics Involved
Newton Raphson Method of iteration Jacobian Method
Ref:-[10] Ryaben'kii, Victor S.; Tsynkov, Semyon V. (2006), A Theoretical Introduction to Numerical Analysis
Template of 2D Metal Field Effect Transistor.
Ref:-[11] User Manual of NanoTcad Vides.
Ref:-[12] ViDES Graphical User Interface
Fig. showing graph between Id-Vgs-Vds Fig.showing graph between id-T-Vds
Results Obtained:-
GNR FET OUTPUT MODEL : -
Caliberation
Turn-on characteristics at Vds=0.3VOutput characteristics at Vgs=0.6V
Blue:-By nanoTcadVides
Red:- By papers=Performance comparison of graphene nanoribbon FET and MOSFET by
Gianluca Fiori and Giuseppe Iannaccone.
Parameters:-
W=1.5 nm
L=14nm
Both gate sweep
Conclusion:-
As Vds is increased ,
current increases as it
is directly
proportional to Vds
and Vgs.
Parameters:-
W=1.5 nm
L=14nm
Both gate sweep
Conclusion:-
At particular value of Vds
as different Vgs are
applied, current increases
to a large extent.
Parameters:-
Vg1=1.0V=Vg2
L=14nm
Conclusion:-
• The width(W) of GNR is
inversely proportional to
its bandgap(eV).
• Therefore as W increases
bandgap decreases and
the device shows metallic
characteristics as the
device enters into
saturation at lower value
of Vds.
Parameters:-
W=1.5nm
Vg1=Vg2=1.0V
Conclusion:-
• Length(L) is inversely
proportional to the
drain current(Ids).
• Therefore as the length
is increased, the drain
current starts to
decrease.
Parameters:-
W=1.5nm
Vg1=Vg2=1.0
Both gate sweep
Conclusion:-
• Capacitance is inversely
prop. to oxide thickness.
• Ids is directly prop. to the
capacitance.
• Therefore as the oxide
thickness is increased, the
capacitance decreases and
the over all current
decreases.
Parameters:-
W=1.5nm
Vg1=1.0=Vg2(both gate sweep)
L=14nm
Conclusion:-
As the doping increases while
keeping the channel length
same, the increased no. of
carriers result in the increase
of particle-to-particle collision
and hence the mobility
decreases and the resultant
value of current is less.
Parameters:-
W=1.5nm
L=14nm
Vg1=Vg2=1.0(both gates
sweep)
Conclusion:-
• Capacitance of the device
is directly proportional to
the relative di-electric
constant.
• As the di-electric
constant increases,
capacitance increases
and hence the Ids value
increases.
Analog & Digital Parameters Calculation for GNRFETs
Graphs Used :
• Id vs Vgs for different Vds
• Id vs Vgs for different GNR width
• Id vs Vds for different Vgs
• Id vs Vds for different GNR width
Digital Parameters: Analog Parameters:
ION/IOFF ratio Trans-conductance (gm)
Subthreshold Swing (SS) Drain Resistance (rd)
DIBL (mV/V) Amplification factor (µ)
Digital Parameters
ION/IOFF ratio: It is the figure of merit for having high performance (more ION) and low leakage power (less
IOFF) for the CMOS transistors. Typically more gate control leads to more ION/IOFF ratio.
Subthreshold Swing (SS): The subthreshold swing is defined as the gate voltage required to change the
drain current by one order of magnitude, 1 decade. In the MOSFET, the
subthreshold swing is limited to (kT/q) ln10 or 60 mV/dec at room
temperature.
SS= ∆Vgs / ∆ (log10 Id
DIBL (mV/V): Drain-induced barrier lowering or DIBL is a Short channel effect in MOSFETs referring
originally to a reduction of threshold voltage of the transistor at higher drain voltages.
Analog Parameters
Trans-conductance (gm): It is very often denoted as a conductance, gm, with a
subscript, m, for mutual. Trans-conductance is
defined as
follows:
Drain Resistance (rd): It is given by rd = ∆ Vds / ∆ Id Ω
Amplification factor (µ): It is given by gm * rd
Digital Parameters Calculation
• For different values of Vds
ION/IOFF ratio= (1*10^-6) / (1*10^-10) =1*10^4
SS= ∆Vgs / ∆ (log10 Id) =60 mV/dec
Fig Id vs Vgs at Vds=0.6V
Id vs Vgs curve at Vds=0.6V Id vs Vgs curve at Vds=0.8V
ION/IOFF ratio= (6.5*10^-6) / (2*10^-8) =325
SS= ∆Vgs / ∆ (log10 Id) = 210 mV/dec
ION/IOFF ratio= (6.5*10^-6) / (2.8*10^-
8)=232
SS= ∆Vgs / ∆ (log10 Id) = 190 mV/dec
For different GNR width
Id vs Vgs curve for W=1.5nm Id vs Vgs curve for W=2nm
ION/IOFF ratio= (9*10^-6) / (7*10^-7) =13
SS= ∆Vgs / ∆ (log10 Id) =175 mV/dec
ION/IOFF ratio= (6.5*10^-6) / (3.8*10^-7) =17
SS= ∆Vgs / ∆ (log10 Id) = (0.4-0.3) / (3*10^-6-
8*10^-7) = 450
Id vs Vgs curve for DIBL calculation
Vth
DD (by red curve) = 0.18V
Vth
LOW (by black curve) = 0.3V
VDD = 1V
VD
Low = 0.05V
DIBL= - (0.18- 0.3) / (1-0.05) = 126 mV/V
Analog Parameters:
Id vs Vds for W=1.5nm Id vs Vds for W=2.0 nm
gm = ∆ Id / ∆ Vgs = (4*10^-6 – 2.2*10^-6)/(0.4-
0.3) = 18 * 10^-6 Ω-1
rd = ∆ Vds / ∆ Id = (0.7-0.5) / (4.8*10^-6 –
3.8*10^-6) = 200 *10^3 Ω
µ = gm * rd = (18 * 10^-6 ) * (200 *10^3) = 3.6
gm = ∆ Id / ∆ Vgs = (3*10^-6 – 0.8*10^-6)/(0.4-
0.3) = 22 * 10^-6 Ω-1
rd = ∆ Vds / ∆ Id = (0.3-0.1) / (2.5*10^-6 –
1.55*10^-6) = 210 *10^3 Ω
µ = gm * rd = (22 * 10^-6 ) * (210 *10^3) = 4.62
Vds (volts) Ion/Ioff ratio SS(mV/dec)
0.05 10000 60
0.6 325 210
0.8 232 190
DIGITAL PARAMETERS
For different Vds
For different GNR width
GNR Width(nm) Ion/Ioff ratio SS(mV/dec)
1.5 13 175
2.0 17 450
ANALOG PARAMETERS
For different GNR width
GNR Width(nm) gm (Ω-1) (*10-6) rd (Ω) (*103) µ
1.5 18 200 3.6
2.0 22 210 4.62
Conclusion :
A model for the graphene FET using NEGF written in GUI Nano TCAD ViDES has been reported. The top-
gated graphene FET has been simulated.Typical simulations is then successfully performed for various
parameters of the grapheme FET. The modeling results agree with the experimental data. The model is not only
able to accurately describe ID-VG, ID-VD characteristics of the graphene FET, but also affects of channel
materials, gate materials, size of graphene FET, Doping,Channel width ,Channel length and Dielectric material
on the characteristics.
POSITIVES:
• According to scaling theory, as noted previously, a thin channel region allows short-channel effects to be
suppressed and thus makes it feasible to scale MOSFETs to very short gate lengths.
• The two- dimensional nature of graphene means it offers us the thinnest possible channel, so graphene
MOSFETs should be more scalable than their competitors.
• High velocity is observed in case of GNR FET ,which results in fast switching of the device and it gives better
performance compared to silicon based or GaAs device.
CHALLENGES :
• CMOS logic requires both n-channel and p-channel FETs with well-controlled threshold voltages, and
graphene FETs with all these properties have not yet been reported.
• These devices had relatively thick back-gate oxides, so voltage swings of several volts were needed for
switching, which is significantly more than the swings of 1 V and less needed to switch Si CMOS device
• Nanoribbon graphene, which does have a bandgap and results in transistors that can be switched off, has
serious fabrication issues because of the small widths required and the presence of edge disorder
Note : The latest ITRS road- map strongly recommends intensified research into graphene and even
contains a research and development schedule for car- bon-based nanoelectronics2. The race is still open and
the pros- pects for graphene devices are at least as promising as those for alternative concepts.
References:
[1] A.C.Ferrari,F.Bonaccorso,V.Fal'ko,K.S.Novoselov,S.Roche,P.Boggild, S.Borini, F.H.L. Koppens, V. Palermo, N.
Pugno, J.A. Garrido, R. Sordan, A.Bianco, L.Ballerini, M.Prato, E. Lidorikis, J. Kivioja, C. Marinelli, T.
Ryhanen, A. Morpurgo, J.N. Coleman, V. Nicolosi, L. Colombo, A. Fert,M. Garcia- Hernandez, A. Bachtold, G.F.
Schneider, F.Guinea, C.Dekker, M.Barbone, Z. Sun, C.Galiotis, A.N.Grigorenko, G.Konstantatos,
A.Kis,M.Katsnelson, L. Vandersypen, A.Loiseau, V.Morandi, D.Neumaier, E.Treossi, V.Pellegrini, M. Polini,
A.Tredicucci,G.M.Williams,B.HeeHong,J.-H.Ahn, J.MinKim, H. Zirath, B.J.vanWees, H.vander Zant, L.
Occhipinti, A. DiMatteo, I. A.Kinloch,T.Seyller,E.Quesnel,X.Feng,K.Teo,N.Rupesinghe,P.Hakonen, S.R.T.Neil,
Q.Tannock, T.Lofwander, J.Kinaret, Science and technology roadmap for graphene, related two-dimensional
crystals, and hybrid systems, Nanoscale7(2015)4598–4810, http://dx.doi.org/10.1039/ C4NR01600A.
[2] Peierls, R. 1935. Quelques properties typiques des corpes solides. Annales d’ Institut Henri Poincare 5: 177.
[3] Landau, L. 1937. Zur Theorei der phasenumwandlugen II. Physikalische Zeitschrift Sowjetunion 11: 26.
[4] Mermin, N. D. 1968. Crystalline order in two dimensions. Physical Review 176: 250.
[5] A.Geim, Graphene update, Bulletin of the American Physical Society 55(2). URL
〈http://meetings.aps.org/link/BAPS.2010.MAR.J21.4〉.
[6] M.C. Lemme, “Current Status of Graphene Transistors,” Solid State Phenomena, vol. 158,
2010, pp. 499-509
[7] A. Obraztsov, E. Obraztsova, A. Tyurnina, and A. Zolotukhin, “Chemical Vapor
Deposition of thin graphite films of nanometer thickness,” Carbon, vol. 45, Sep. 2007, pp.
2017-2021.
[8] A. Reina, X. Jia, J. Ho, D. Nezich, H. Son, V. Bulovic, M.S. Dresselhaus, and J. Kong,
“Large area, few-layer graphene films on arbitrary substrates by Chemical Vapor
Deposition.” Nano letters, vol. 9, Jan. 2009, pp. 30-5.
[9] J. Coraux, A.T. NıDiaye, C. Busse, and T. Michely, “Structural Coherency of Graphene
On Ir (111).,” Nano letters, vol. 8, Feb. 2008, pp. 565-70.
[10] Kan, E; Xiang, H.; Yang, J. & Hou, J. (2007a). Electronic structures of atomic Ti chains on graphene Nano
ribbons: A first-principles study. The Journal of Chemical Physics, Vol.127, No. 16, 164706, ISSN: 0021-9606.
[11] K.S. Novoselov, a K. Geim, S.V. Morozov, D. Jiang, Y. Zhang, S.V. Dubonos, I.V.
Grigorieva, and a Firsov, “Electric field effect in atomically thin carbon films.” Science
(New York, N.Y.), vol. 306, Oct. 2004, pp. 666-9.
[12] Kan, E; Li, Z.; Yang, J. & Hou, J. (2007b). Will zigzag graphene nanoribbon turn to half metal under electric
field ? Applied Physics Letters, Vol. 91, No. 24, 243116, ISSN: 0003-6951
[13] G. H. Wannier, “The structure of electronic excitation levels in insulating crystals,” Phys. Rev., vol. 52, pp.
191–197, Aug. 1937.
[13] G. H. Wannier, “The structure of electronic excitation levels in insulating crystals,” Phys. Rev., vol. 52, pp. 191–197,
Aug. 1937.
[14] W. Kohn, “Analytic properties of Bloch waves and Wannier functions,” Phys. Rev., vol. 115, pp. 809–821, Aug.
1959.
[15] J. D. Cloizeaux, “Orthogonal orbitals and generalized Wannier functions, “Phys. Rev., vol. 129, pp. 554–566, Jan.
1963.
[16] Youngki Yoon1,a, Gianluca Fiori2,b, Seokmin Hong1, Giuseppe Iannaccone2, and Jing Guo “Performance comparision of
Graphene Nanoribbon FETs with Schottky contact and doped reservior”
Graphene Transistors : Study for Analog and Digital applications

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Graphene Transistors : Study for Analog and Digital applications

  • 1. Graphene Based Transistors For Digital And Analog Application - A Simulation Study Vishal Anand Agam Gupta Abhishek Anand 1204059 1204056 1204055 Project Supervisor: Dr. M. W. Akram
  • 2. Contents:- • Motivation • Project Roadmap • Introduction • Basics of Graphene • Structure of GFET • Software Introduction • Software Simulation • Parametric Results • Comparisons • Conclusion
  • 4. Motivation:- • Gordon Moore suggested that the number of transistors get doubled approximately every two years. • The devices have become smaller. • The introduction of new channel material, device performance can be optimized. Ref:[1].www.intelcorporations.com
  • 5. Beyond C-MOS Ref[2]:- Roadmap for 22 nm and beyond H. Iwai * Frontierl Research Center, Tokyo Institute of Technology, 4259-J2-68, Nagatsuta, Midori-ku, Yokohama 226-8502, Japan Ref[3] :- Carbon Nanotubes and Graphene Nanoribbons: Potentials for Nanoscale Electrical Interconnects .Caterina Soldano , Saikat Talapatra and Swastik Kar
  • 6. So What’s The Way Out ??? TWO OPTIONS NEW DEVICE STRUCTURE FinFET NEW CHANNEL MATERIAL GRAPHENE NANO RIBBON GRAPHENE SHEETFinFET Ref:-[4] www.google.com
  • 7. What Is Graphene ? Thermodynamically stable graphene sheet was first discovered in 2004 by Giem and Novoselov. Graphene is a two –dimensional sheet of sp2 bonded carbon atoms arranged ina honeycomb crystal structure with two carbon atoms in each unit cell. Ref:- [5]Fabrication and Characterization of Graphene Field Effect Transistors by Sam Vaziri
  • 8. Graphite Single-layer Graphene Single-wall Carbon Nanotub Ref:- [6] K. S. Novoselov et al., “Electric Field Effect in Atomically Thin Carbon Films,” Science, 306 (2004) 666.
  • 9. Types of Graphene structures
  • 10. Ref:-[13]Characterization of Graphene Field Effect Transistors by Sam Vaziri
  • 11. GNR Width(nm) The variation of bandgaps of Arm-chair GNRs with width(W)
  • 12. How to fabricate GNR ? We can divide the GNR fabrication in two different methods : • Chemical method: It involves assembling the small molecules into GNRs.Many groups have reported the chemical fabrication of GNRs with small molecules. • Physical methods :- By gradual unzipping of one wall of a carbon nanotube to form a nanoribbon
  • 13. Ref[7]:-Representation of the gradual unzipping of one wall of a carbon nanotube to form a nanoribbon (Kosynkin et al, 2009)
  • 14. Graphene Electronic Properties : • Semi-metal or zero-gap semiconductor • Linear dispersion relation Optoelectronics • Massless dirac fermions, v ~ c/300 Intrinsic carrier mobility (suspended graphene in vacuum 2,00,000 cm2 V-1s-1 • Carrier mobility of graphene on SiO2 at room-temperature 10,000- 20,000 cm2 V-1s-1 • Maximum current density J > 108 A/cm2 • Velocity saturation vsat = 5 x 107 cm/s (10 x Si, 2 x GaAs) Fig:-Dispersion relation of graphene in fist Brillouin zone Ref:-[8] Fabrication and Characterization of Graphene Field Effect Transistors by Sam Vaziri
  • 15. 1. Mechanical properties • Young’s modulus: ~1.10 TPa (Si ~ 130 GPa) • Elastically stretchable by 20% • Strongest material known • Flexible 2. Thermal conductivity • ∼5000 W/m•K at room temperature Diamond: ∼2000 W/m•K, 10 x higher than Cu, Al 3. Transparent (only 1 atom thin) Transparent flexible conductive electrodes 4. High surface to volume ratio 5. Most important advantage of Graphene technology is that it is compatible with standard sillicon technology making it easy and cost effective to integrate with the existing CMOS fabrication plants.
  • 16. Simulation Side • Our simulation software=> NanoTCAD ViDES • Our documentation software=>Origin8, Plot Digitizer • OS required=>Linux • Languages=>Python, C. • Equations used=>Solution of Poisson & Schrodinger equations, NEGF(Non- Equilibrium Green’s Function ) • Modules required=>Pylab, NumPy, SciPy.
  • 17. Why device simulation??? They allow to: • predict the device behaviour • understand the physical mechanisms underlying the device operation • test the impact of device design parameters on the device performance (device optimization)
  • 18. Ref:-[9] User Manual of NanoTcad Vides.
  • 19. Mathematics Involved Newton Raphson Method of iteration Jacobian Method Ref:-[10] Ryaben'kii, Victor S.; Tsynkov, Semyon V. (2006), A Theoretical Introduction to Numerical Analysis
  • 20. Template of 2D Metal Field Effect Transistor. Ref:-[11] User Manual of NanoTcad Vides.
  • 21.
  • 22.
  • 23. Ref:-[12] ViDES Graphical User Interface Fig. showing graph between Id-Vgs-Vds Fig.showing graph between id-T-Vds Results Obtained:-
  • 24. GNR FET OUTPUT MODEL : -
  • 25.
  • 26. Caliberation Turn-on characteristics at Vds=0.3VOutput characteristics at Vgs=0.6V Blue:-By nanoTcadVides Red:- By papers=Performance comparison of graphene nanoribbon FET and MOSFET by Gianluca Fiori and Giuseppe Iannaccone.
  • 27. Parameters:- W=1.5 nm L=14nm Both gate sweep Conclusion:- As Vds is increased , current increases as it is directly proportional to Vds and Vgs.
  • 28. Parameters:- W=1.5 nm L=14nm Both gate sweep Conclusion:- At particular value of Vds as different Vgs are applied, current increases to a large extent.
  • 29. Parameters:- Vg1=1.0V=Vg2 L=14nm Conclusion:- • The width(W) of GNR is inversely proportional to its bandgap(eV). • Therefore as W increases bandgap decreases and the device shows metallic characteristics as the device enters into saturation at lower value of Vds.
  • 30. Parameters:- W=1.5nm Vg1=Vg2=1.0V Conclusion:- • Length(L) is inversely proportional to the drain current(Ids). • Therefore as the length is increased, the drain current starts to decrease.
  • 31. Parameters:- W=1.5nm Vg1=Vg2=1.0 Both gate sweep Conclusion:- • Capacitance is inversely prop. to oxide thickness. • Ids is directly prop. to the capacitance. • Therefore as the oxide thickness is increased, the capacitance decreases and the over all current decreases.
  • 32. Parameters:- W=1.5nm Vg1=1.0=Vg2(both gate sweep) L=14nm Conclusion:- As the doping increases while keeping the channel length same, the increased no. of carriers result in the increase of particle-to-particle collision and hence the mobility decreases and the resultant value of current is less.
  • 33. Parameters:- W=1.5nm L=14nm Vg1=Vg2=1.0(both gates sweep) Conclusion:- • Capacitance of the device is directly proportional to the relative di-electric constant. • As the di-electric constant increases, capacitance increases and hence the Ids value increases.
  • 34. Analog & Digital Parameters Calculation for GNRFETs Graphs Used : • Id vs Vgs for different Vds • Id vs Vgs for different GNR width • Id vs Vds for different Vgs • Id vs Vds for different GNR width Digital Parameters: Analog Parameters: ION/IOFF ratio Trans-conductance (gm) Subthreshold Swing (SS) Drain Resistance (rd) DIBL (mV/V) Amplification factor (µ)
  • 35. Digital Parameters ION/IOFF ratio: It is the figure of merit for having high performance (more ION) and low leakage power (less IOFF) for the CMOS transistors. Typically more gate control leads to more ION/IOFF ratio. Subthreshold Swing (SS): The subthreshold swing is defined as the gate voltage required to change the drain current by one order of magnitude, 1 decade. In the MOSFET, the subthreshold swing is limited to (kT/q) ln10 or 60 mV/dec at room temperature. SS= ∆Vgs / ∆ (log10 Id DIBL (mV/V): Drain-induced barrier lowering or DIBL is a Short channel effect in MOSFETs referring originally to a reduction of threshold voltage of the transistor at higher drain voltages.
  • 36. Analog Parameters Trans-conductance (gm): It is very often denoted as a conductance, gm, with a subscript, m, for mutual. Trans-conductance is defined as follows: Drain Resistance (rd): It is given by rd = ∆ Vds / ∆ Id Ω Amplification factor (µ): It is given by gm * rd
  • 37. Digital Parameters Calculation • For different values of Vds ION/IOFF ratio= (1*10^-6) / (1*10^-10) =1*10^4 SS= ∆Vgs / ∆ (log10 Id) =60 mV/dec Fig Id vs Vgs at Vds=0.6V
  • 38. Id vs Vgs curve at Vds=0.6V Id vs Vgs curve at Vds=0.8V ION/IOFF ratio= (6.5*10^-6) / (2*10^-8) =325 SS= ∆Vgs / ∆ (log10 Id) = 210 mV/dec ION/IOFF ratio= (6.5*10^-6) / (2.8*10^- 8)=232 SS= ∆Vgs / ∆ (log10 Id) = 190 mV/dec
  • 39. For different GNR width Id vs Vgs curve for W=1.5nm Id vs Vgs curve for W=2nm ION/IOFF ratio= (9*10^-6) / (7*10^-7) =13 SS= ∆Vgs / ∆ (log10 Id) =175 mV/dec ION/IOFF ratio= (6.5*10^-6) / (3.8*10^-7) =17 SS= ∆Vgs / ∆ (log10 Id) = (0.4-0.3) / (3*10^-6- 8*10^-7) = 450
  • 40. Id vs Vgs curve for DIBL calculation Vth DD (by red curve) = 0.18V Vth LOW (by black curve) = 0.3V VDD = 1V VD Low = 0.05V DIBL= - (0.18- 0.3) / (1-0.05) = 126 mV/V
  • 41. Analog Parameters: Id vs Vds for W=1.5nm Id vs Vds for W=2.0 nm gm = ∆ Id / ∆ Vgs = (4*10^-6 – 2.2*10^-6)/(0.4- 0.3) = 18 * 10^-6 Ω-1 rd = ∆ Vds / ∆ Id = (0.7-0.5) / (4.8*10^-6 – 3.8*10^-6) = 200 *10^3 Ω µ = gm * rd = (18 * 10^-6 ) * (200 *10^3) = 3.6 gm = ∆ Id / ∆ Vgs = (3*10^-6 – 0.8*10^-6)/(0.4- 0.3) = 22 * 10^-6 Ω-1 rd = ∆ Vds / ∆ Id = (0.3-0.1) / (2.5*10^-6 – 1.55*10^-6) = 210 *10^3 Ω µ = gm * rd = (22 * 10^-6 ) * (210 *10^3) = 4.62
  • 42. Vds (volts) Ion/Ioff ratio SS(mV/dec) 0.05 10000 60 0.6 325 210 0.8 232 190 DIGITAL PARAMETERS For different Vds For different GNR width GNR Width(nm) Ion/Ioff ratio SS(mV/dec) 1.5 13 175 2.0 17 450
  • 43. ANALOG PARAMETERS For different GNR width GNR Width(nm) gm (Ω-1) (*10-6) rd (Ω) (*103) µ 1.5 18 200 3.6 2.0 22 210 4.62
  • 44. Conclusion : A model for the graphene FET using NEGF written in GUI Nano TCAD ViDES has been reported. The top- gated graphene FET has been simulated.Typical simulations is then successfully performed for various parameters of the grapheme FET. The modeling results agree with the experimental data. The model is not only able to accurately describe ID-VG, ID-VD characteristics of the graphene FET, but also affects of channel materials, gate materials, size of graphene FET, Doping,Channel width ,Channel length and Dielectric material on the characteristics. POSITIVES: • According to scaling theory, as noted previously, a thin channel region allows short-channel effects to be suppressed and thus makes it feasible to scale MOSFETs to very short gate lengths. • The two- dimensional nature of graphene means it offers us the thinnest possible channel, so graphene MOSFETs should be more scalable than their competitors. • High velocity is observed in case of GNR FET ,which results in fast switching of the device and it gives better performance compared to silicon based or GaAs device.
  • 45. CHALLENGES : • CMOS logic requires both n-channel and p-channel FETs with well-controlled threshold voltages, and graphene FETs with all these properties have not yet been reported. • These devices had relatively thick back-gate oxides, so voltage swings of several volts were needed for switching, which is significantly more than the swings of 1 V and less needed to switch Si CMOS device • Nanoribbon graphene, which does have a bandgap and results in transistors that can be switched off, has serious fabrication issues because of the small widths required and the presence of edge disorder Note : The latest ITRS road- map strongly recommends intensified research into graphene and even contains a research and development schedule for car- bon-based nanoelectronics2. The race is still open and the pros- pects for graphene devices are at least as promising as those for alternative concepts.
  • 46. References: [1] A.C.Ferrari,F.Bonaccorso,V.Fal'ko,K.S.Novoselov,S.Roche,P.Boggild, S.Borini, F.H.L. Koppens, V. Palermo, N. Pugno, J.A. Garrido, R. Sordan, A.Bianco, L.Ballerini, M.Prato, E. Lidorikis, J. Kivioja, C. Marinelli, T. Ryhanen, A. Morpurgo, J.N. Coleman, V. Nicolosi, L. Colombo, A. Fert,M. Garcia- Hernandez, A. Bachtold, G.F. Schneider, F.Guinea, C.Dekker, M.Barbone, Z. Sun, C.Galiotis, A.N.Grigorenko, G.Konstantatos, A.Kis,M.Katsnelson, L. Vandersypen, A.Loiseau, V.Morandi, D.Neumaier, E.Treossi, V.Pellegrini, M. Polini, A.Tredicucci,G.M.Williams,B.HeeHong,J.-H.Ahn, J.MinKim, H. Zirath, B.J.vanWees, H.vander Zant, L. Occhipinti, A. DiMatteo, I. A.Kinloch,T.Seyller,E.Quesnel,X.Feng,K.Teo,N.Rupesinghe,P.Hakonen, S.R.T.Neil, Q.Tannock, T.Lofwander, J.Kinaret, Science and technology roadmap for graphene, related two-dimensional crystals, and hybrid systems, Nanoscale7(2015)4598–4810, http://dx.doi.org/10.1039/ C4NR01600A. [2] Peierls, R. 1935. Quelques properties typiques des corpes solides. Annales d’ Institut Henri Poincare 5: 177. [3] Landau, L. 1937. Zur Theorei der phasenumwandlugen II. Physikalische Zeitschrift Sowjetunion 11: 26. [4] Mermin, N. D. 1968. Crystalline order in two dimensions. Physical Review 176: 250. [5] A.Geim, Graphene update, Bulletin of the American Physical Society 55(2). URL 〈http://meetings.aps.org/link/BAPS.2010.MAR.J21.4〉. [6] M.C. Lemme, “Current Status of Graphene Transistors,” Solid State Phenomena, vol. 158, 2010, pp. 499-509
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