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Study of X-ray induced conductivity of ZnSe
and the development of high-temperature
detectors of ionizing radiation
Andrii Sofiienko – Chief Physicist, Head of research laboratory, Ph.D.
Volodimir Degoda – Director of RPC “Arvina”, Dr. Sci. Phys.
2011
1
Table of contents
 General information about ZnSe.
 Methods to investigate the conductivity and
luminescence.
 Research results.
 Design of detectors based on ZnSe.
2
General information about ZnSe
ZnSe - binary diamond-like semiconductors with a
band gap of 2.7 - 2.8 eV.
ZnSe is used for the manufacture of optical
components (windows, lenses, prisms and mirrors) for
the visible and infrared range (0.5-22) microns in
optical systems and laser CO2 optics. ZnSe has a
high transmittance value, strength, hardness, optical
uniformity, wide transparency range, erosion and
thermal stability.
3
General information about ZnSe
4
Fig. 1 The samples of ZnSe
General information about ZnSe
5
Parameter
Semiconductors
ZnSe CdTe CdZnTe Si Ge GaAs SiC
Eg (300 K), eV 2.80 1.51 1.57 1.11 0.67 1.43 2.86
Т(smelting), 0С 1798 1090 1100 1420 940 1240 2800
ρ, gcm3
5.4 5.9 6.0 2.3 5.3 5.3 --
μе, cm2/V∙s
μh, cm2/V∙s
700
25÷40
1050
100
1000
100
1500
480
4500
1900
8500
450
1200÷800
80÷140
α (300 К), К-1
7.5 4.9 5.0 2.4 5.8 6.0 ≈ 3.0
Radiation
resistance to γ,
Gy
107 < 105 < 106 < 105 < 106 ≈ 3∙105 ≈ 106
Radiation
resistance to n,
1/cm2
1016 < 1013 < 1014 < 1012 < 1014 < 1012 < 1015
The threshold
energy for defect
formation, eV
~ 40 6 ÷ 8 6 ÷ 8 11 ÷ 20 12 ÷ 20 8 ÷ 20 50 ÷ 150
ρR, Ohm∙cm 1011 109 1011 105 104 108 109
Experimental methods
The main directions of research on the physical
characteristics of wide band-gap semiconductors:
 photo and X-ray luminescence
 photo and X-ray conductivity;
 relaxation of the current and phosphorescence;
 thermally stimulated luminescence and conductivity.
Generally used for more than 10 techniques to study
the characteristics of semiconductors in the
temperature range from -265 0C to 300 0C.
6
Experimental methods
Fig. 2 A schematic of the experimental setup
7
Research results
8
0 50 100 150 200 250
10
0
10
1
10
2
10
3
10
4
10
5
up to 1000 times
E ~ 1.0 eV
single crystal
E ~ 0.82 eV
polycrystal
Intrinsicconductivity,pA
T,
0
C
1
2
Fig. 3 Temperature dependencies of intrinsic conductivity of polycrystalline ZnSe (1)
and single-crystal (2), Е0 = 400 V/cm
Research results
9
-50 0 50 100 150 200 250 300
10
-12
10
-11
10
-10
10
-9
10
-8
10
-7
10
-6
10
-5
Conductivity,A
T,
0
C
10
3
times10
5
times
1, X-ray conductivity (~ 1 kGy/h)
2, intrinsic conductivity
Temperature stabilization of
X-ray conductivity
Fig. 4 Temperature dependencies of X-ray conductivity of single-crystal ZnSe (1) and
intrinsic conductivity (2), Е0 = 400 V/cm
Research results
10
0.0 2.0x10
3
4.0x10
3
6.0x10
3
8.0x10
3
1.0x10
4
0.00
0.06
0.12
0.18
0.24
0.30
0.36 i(600 V) D
1.36
i(400 V) D
1.60
D, Gy/h
IX
(D),A
1
2
3
i(200 V) D
1.75
Fig. 4 Dose dependencies of X-ray conductivity of single-crystal ZnSe:
U = 200V (1), U = 400V (2), U = 600V (3)
Design of detectors based on ZnSe
When we design a high-temperature detectors based
on ZnSe, we consider the following requirements:
 high optical quality of crystals;
 minimum intrinsic conductivity;
 possibility of compensating for the intrinsic
conductivity in the on-line;
 temperature range up to 200 0C without cooling;
 high efficiency of absorption of ionizing radiation.
11
Design of detectors based on ZnSe
12
Fig. 5 Single-crystal multielectrode detector with automatic compensation of intrinsic
conductivity
Design of detectors based on ZnSe
13
Fig. 6 Double-crystal multielectrode detector with automatic compensation of
intrinsic conductivity
Design of detectors based on ZnSe
14
Fig. 7 Detection efficiency of gamma radiation of ZnSe detectors, [d] = cm
Design of detectors based on ZnSe
15
Fig. 8 A Schematic of the measuring system for isotopic thickness gauge
CONCLUSIONS
16
Change of intrinsic conductivity of ZnSe specimens within the range of
temperatures from 10 0С up to 240 0С showed that single-crystal specially
undoped ZnSe has extremely low intrinsic conductivity. This attribute of obtained
specimens can be used during the designing and manufacturing of gamma and X-
ray radiation detectors for the application in radiation hot rolling thickness gauges
which are widely used in the metallurgy. Distinctive feature of such detectors is
that there is no necessity to perform additional cooldown which considerably
simplifies measuring part of thickness gauge.
It was determined that “dose rate - current” calibrating characteristic of analyzed
specimens approaches to the linear one when electric field is increased in the
specimen up to Е0 ≥ 1400 V/cm. However, since the current of X-ray induced
conductivity is described precisely enough with simple power function of the
following type IX ~ Db, which is linearized in double logarithmic scale, then in
practice significantly lesser electric fields 500-1000 V/cm can be used what
decreases the probability of surface breakdown of sensors.
17
“Ukrainian atom instruments and systems” Corporation
Director General : Petrenko Valeriy Stepanovich
03150, Ukraine, Kiev, Gorkogo str., 152, office 224
Tel/fax: +38 044 5016178
E-mail: info@uap.kiev.ua
Research and Production Center “ARVINA”
Director: Degoda Volodimir Yakovich
01033, Ukraine, Kiev, Saksaganskogo str., 31
Tel: +38 066 2431530
E-mail: degoda@univ.kiev.ua
Contact information:

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ZnSe detectors - experimental methods and results 2011

  • 1. Study of X-ray induced conductivity of ZnSe and the development of high-temperature detectors of ionizing radiation Andrii Sofiienko – Chief Physicist, Head of research laboratory, Ph.D. Volodimir Degoda – Director of RPC “Arvina”, Dr. Sci. Phys. 2011 1
  • 2. Table of contents  General information about ZnSe.  Methods to investigate the conductivity and luminescence.  Research results.  Design of detectors based on ZnSe. 2
  • 3. General information about ZnSe ZnSe - binary diamond-like semiconductors with a band gap of 2.7 - 2.8 eV. ZnSe is used for the manufacture of optical components (windows, lenses, prisms and mirrors) for the visible and infrared range (0.5-22) microns in optical systems and laser CO2 optics. ZnSe has a high transmittance value, strength, hardness, optical uniformity, wide transparency range, erosion and thermal stability. 3
  • 4. General information about ZnSe 4 Fig. 1 The samples of ZnSe
  • 5. General information about ZnSe 5 Parameter Semiconductors ZnSe CdTe CdZnTe Si Ge GaAs SiC Eg (300 K), eV 2.80 1.51 1.57 1.11 0.67 1.43 2.86 Т(smelting), 0С 1798 1090 1100 1420 940 1240 2800 ρ, gcm3 5.4 5.9 6.0 2.3 5.3 5.3 -- μе, cm2/V∙s μh, cm2/V∙s 700 25÷40 1050 100 1000 100 1500 480 4500 1900 8500 450 1200÷800 80÷140 α (300 К), К-1 7.5 4.9 5.0 2.4 5.8 6.0 ≈ 3.0 Radiation resistance to γ, Gy 107 < 105 < 106 < 105 < 106 ≈ 3∙105 ≈ 106 Radiation resistance to n, 1/cm2 1016 < 1013 < 1014 < 1012 < 1014 < 1012 < 1015 The threshold energy for defect formation, eV ~ 40 6 ÷ 8 6 ÷ 8 11 ÷ 20 12 ÷ 20 8 ÷ 20 50 ÷ 150 ρR, Ohm∙cm 1011 109 1011 105 104 108 109
  • 6. Experimental methods The main directions of research on the physical characteristics of wide band-gap semiconductors:  photo and X-ray luminescence  photo and X-ray conductivity;  relaxation of the current and phosphorescence;  thermally stimulated luminescence and conductivity. Generally used for more than 10 techniques to study the characteristics of semiconductors in the temperature range from -265 0C to 300 0C. 6
  • 7. Experimental methods Fig. 2 A schematic of the experimental setup 7
  • 8. Research results 8 0 50 100 150 200 250 10 0 10 1 10 2 10 3 10 4 10 5 up to 1000 times E ~ 1.0 eV single crystal E ~ 0.82 eV polycrystal Intrinsicconductivity,pA T, 0 C 1 2 Fig. 3 Temperature dependencies of intrinsic conductivity of polycrystalline ZnSe (1) and single-crystal (2), Е0 = 400 V/cm
  • 9. Research results 9 -50 0 50 100 150 200 250 300 10 -12 10 -11 10 -10 10 -9 10 -8 10 -7 10 -6 10 -5 Conductivity,A T, 0 C 10 3 times10 5 times 1, X-ray conductivity (~ 1 kGy/h) 2, intrinsic conductivity Temperature stabilization of X-ray conductivity Fig. 4 Temperature dependencies of X-ray conductivity of single-crystal ZnSe (1) and intrinsic conductivity (2), Е0 = 400 V/cm
  • 10. Research results 10 0.0 2.0x10 3 4.0x10 3 6.0x10 3 8.0x10 3 1.0x10 4 0.00 0.06 0.12 0.18 0.24 0.30 0.36 i(600 V) D 1.36 i(400 V) D 1.60 D, Gy/h IX (D),A 1 2 3 i(200 V) D 1.75 Fig. 4 Dose dependencies of X-ray conductivity of single-crystal ZnSe: U = 200V (1), U = 400V (2), U = 600V (3)
  • 11. Design of detectors based on ZnSe When we design a high-temperature detectors based on ZnSe, we consider the following requirements:  high optical quality of crystals;  minimum intrinsic conductivity;  possibility of compensating for the intrinsic conductivity in the on-line;  temperature range up to 200 0C without cooling;  high efficiency of absorption of ionizing radiation. 11
  • 12. Design of detectors based on ZnSe 12 Fig. 5 Single-crystal multielectrode detector with automatic compensation of intrinsic conductivity
  • 13. Design of detectors based on ZnSe 13 Fig. 6 Double-crystal multielectrode detector with automatic compensation of intrinsic conductivity
  • 14. Design of detectors based on ZnSe 14 Fig. 7 Detection efficiency of gamma radiation of ZnSe detectors, [d] = cm
  • 15. Design of detectors based on ZnSe 15 Fig. 8 A Schematic of the measuring system for isotopic thickness gauge
  • 16. CONCLUSIONS 16 Change of intrinsic conductivity of ZnSe specimens within the range of temperatures from 10 0С up to 240 0С showed that single-crystal specially undoped ZnSe has extremely low intrinsic conductivity. This attribute of obtained specimens can be used during the designing and manufacturing of gamma and X- ray radiation detectors for the application in radiation hot rolling thickness gauges which are widely used in the metallurgy. Distinctive feature of such detectors is that there is no necessity to perform additional cooldown which considerably simplifies measuring part of thickness gauge. It was determined that “dose rate - current” calibrating characteristic of analyzed specimens approaches to the linear one when electric field is increased in the specimen up to Е0 ≥ 1400 V/cm. However, since the current of X-ray induced conductivity is described precisely enough with simple power function of the following type IX ~ Db, which is linearized in double logarithmic scale, then in practice significantly lesser electric fields 500-1000 V/cm can be used what decreases the probability of surface breakdown of sensors.
  • 17. 17 “Ukrainian atom instruments and systems” Corporation Director General : Petrenko Valeriy Stepanovich 03150, Ukraine, Kiev, Gorkogo str., 152, office 224 Tel/fax: +38 044 5016178 E-mail: info@uap.kiev.ua Research and Production Center “ARVINA” Director: Degoda Volodimir Yakovich 01033, Ukraine, Kiev, Saksaganskogo str., 31 Tel: +38 066 2431530 E-mail: degoda@univ.kiev.ua Contact information: