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All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
1
Device Modeling Report
Bee Technologies Inc.
COMPONENTS: MOSFET (Model Parameters)
PART NUMBER: TPCA8065-H
MANUFACTURER: TOSHIBA
REMARK: Body Diode (Model Parameters)
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
2
MOSFET MODEL
PSpice model
parameter
Model description
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
3
Transconductance Characteristics
Circuit Simulation result
Comparison table
ID (A)
gfs (S)
%Error
Measurement Simulation
5 25 24.384 -2.46
10 35 34.432 -1.62
20 49 48.580 -0.86
30 59 59.389 0.66
VDS=10V
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
4
V_VGS
0V 1.0V 2.0V 3.0V 4.0V 5.0V
-I(VDS)
0A
10A
20A
30A
VGS
0
VDS
10VU1
TPCA8065-H
Vgs-Id Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
5
Comparison Graph
Circuit Simulation result
Comparison table
ID (A)
VGS (V)
%Error
Measurement Simulation
1 2.500 2.427 -2.92
2 2.580 2.502 -3.02
5 2.720 2.653 -2.46
10 2.860 2.823 -1.29
20 3.050 3.064 0.46
30 3.230 3.249 0.59
VDS=10V
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
6
VGS
10V
0
VDS
U1
TPCA8065-H
V_VDS
0V 20mV 40mV 60mV 80mV
-I(VDS)
0A
4.0A
8.0A
Rds(on) Characteristics
Circuit Simulation result
Evaluation circuit
Test condition: ID=8(A), VGS=10(V)
Parameter Unit Measurement Simulation %Error
RDS(on) mΩ 9.4 9.4 0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
7
Time*1m
0s 4ns 8ns 12ns 16ns 20ns 24ns
V(W1:3)
0V
4V
8V
12V
0
D1
DMod
-
+
W1
ION = 0
IOFF = 1mA
W
IGTD = 0
TF = 10n
PW = 10m
PER = 1
I1 = 0
I2 = 1m
TR = 10n
ID
16A
VDD
24V
U1
TPCA8065-H
Gate Charge Characteristics
Circuit Simulation result
Evaluation circuit
Test condition: VDD=24(V), ID=16(A), VGS=10(V)
Parameter Unit Measurement Simulation %Error
Qgs nc 4.4 4.4 0
Qgd nc 2.1 62.1 0
Qg nc 51 15.741 -21.30
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
8
Capacitance Characteristics
Simulation result
Comparison table
VDS (V)
Cbd (pF)
%Error
Measurement Simulation
0.1 775 772 -0.39
0.5 580 600 3.45
1.0 515 491 -4.66
5.0 250 259 3.60
10.0 182 188 3.30
30.0 116 111 -4.31
Simulation
Measurement
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
9
Time
1.84us 1.92us 2.00us 2.08us 2.16us 2.24us
V(G) V(D)/1.5
0V
5V
10V
15V
20V
D
U1
TPCA8065-H
V1TD = 2u
TF = 20n
PW = 5u
PER = 500u
V1 = 0
TR = 20n
V2 = 20 VCC
15
0
RL
1.88
L2
50nH
12
L1
30nH
12
R2
4.7
G
R1
4.7
Switching Time Characteristics
Circuit Simulation result
Evaluation circuit
Test condition: ID=8(A), VDD=15(V), VGS=10/0(V)
Parameter Unit Measurement Simulation %Error
ton ns 8.2 8.175 -0.30
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
10
V_VDS
0V 0.4V 0.8V 1.2V 1.6V 2.0V
-I(VDS)
0A
4A
8A
12A
16A
20A
VGS
0
VDS
U1
TPCA8065-H
Output Characteristics
Circuit Simulation result
Evaluation circuit
VGS=2.6V
2.8
2.9
3.0
3.1
3.2
3.3
10, 8, 6, 5
4.5
3.4
4
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
11
V_VDS
0V -0.2V -0.4V -0.6V -0.8V -1.0V
I(VDS)
100mA
1.0A
10A
100A
VDS
0
U1
TPCA8065-H
FWD Forward Current Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
12
Comparison Graph
Simulation result
Comparison table
IDR (A)
-VDS (V)
%Error
Measurement Simulation
0.1 0.651 0.651 0.00
0.2 0.671 0.671 0.00
0.5 0.697 0.698 0.14
1 0.721 0.720 -0.14
2 0.749 0.745 -0.53
5 0.789 0.789 0.00
10 0.839 0.840 0.12
20 0.918 0.922 0.44
30 1.000 0.997 -0.30
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
13
Time
9.88us 9.96us 10.04us 10.12us 10.20us
I(R1)
-400mA
-300mA
-200mA
-100mA
-0mA
100mA
200mA
300mA
400mA
0
V1TD = 0ns
TF = 10ns
PW = 10us
PER = 1ms
V1 = -9.2V
TR = 10ns
V2 = 10.7V
R1
50
U1
TPCA8065-H
Reverse Recovery Characteristics
Circuit Simulation result
Evaluation circuit
Compare Measurement vs. Simulation
Parameter Unit Measurement Simulation %Error
trj ns 14.4 14.292 -0.75
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
14
Reverse Recovery Characteristics Reference
Trj = 14.4(ns)
Trb = 24.8(ns)
Conditions: Ifwd = lrev = 0.2(A), Rl = 50
Relation between trj and trb
Example
Measurement

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SPICE MODEL of TPCA8065-H (Standard+BDS Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: MOSFET (Model Parameters) PART NUMBER: TPCA8065-H MANUFACTURER: TOSHIBA REMARK: Body Diode (Model Parameters)
  • 2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 2 MOSFET MODEL PSpice model parameter Model description LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility
  • 3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 3 Transconductance Characteristics Circuit Simulation result Comparison table ID (A) gfs (S) %Error Measurement Simulation 5 25 24.384 -2.46 10 35 34.432 -1.62 20 49 48.580 -0.86 30 59 59.389 0.66 VDS=10V
  • 4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 4 V_VGS 0V 1.0V 2.0V 3.0V 4.0V 5.0V -I(VDS) 0A 10A 20A 30A VGS 0 VDS 10VU1 TPCA8065-H Vgs-Id Characteristics Circuit Simulation result Evaluation circuit
  • 5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 5 Comparison Graph Circuit Simulation result Comparison table ID (A) VGS (V) %Error Measurement Simulation 1 2.500 2.427 -2.92 2 2.580 2.502 -3.02 5 2.720 2.653 -2.46 10 2.860 2.823 -1.29 20 3.050 3.064 0.46 30 3.230 3.249 0.59 VDS=10V
  • 6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 6 VGS 10V 0 VDS U1 TPCA8065-H V_VDS 0V 20mV 40mV 60mV 80mV -I(VDS) 0A 4.0A 8.0A Rds(on) Characteristics Circuit Simulation result Evaluation circuit Test condition: ID=8(A), VGS=10(V) Parameter Unit Measurement Simulation %Error RDS(on) mΩ 9.4 9.4 0
  • 7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 7 Time*1m 0s 4ns 8ns 12ns 16ns 20ns 24ns V(W1:3) 0V 4V 8V 12V 0 D1 DMod - + W1 ION = 0 IOFF = 1mA W IGTD = 0 TF = 10n PW = 10m PER = 1 I1 = 0 I2 = 1m TR = 10n ID 16A VDD 24V U1 TPCA8065-H Gate Charge Characteristics Circuit Simulation result Evaluation circuit Test condition: VDD=24(V), ID=16(A), VGS=10(V) Parameter Unit Measurement Simulation %Error Qgs nc 4.4 4.4 0 Qgd nc 2.1 62.1 0 Qg nc 51 15.741 -21.30
  • 8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 8 Capacitance Characteristics Simulation result Comparison table VDS (V) Cbd (pF) %Error Measurement Simulation 0.1 775 772 -0.39 0.5 580 600 3.45 1.0 515 491 -4.66 5.0 250 259 3.60 10.0 182 188 3.30 30.0 116 111 -4.31 Simulation Measurement
  • 9. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 9 Time 1.84us 1.92us 2.00us 2.08us 2.16us 2.24us V(G) V(D)/1.5 0V 5V 10V 15V 20V D U1 TPCA8065-H V1TD = 2u TF = 20n PW = 5u PER = 500u V1 = 0 TR = 20n V2 = 20 VCC 15 0 RL 1.88 L2 50nH 12 L1 30nH 12 R2 4.7 G R1 4.7 Switching Time Characteristics Circuit Simulation result Evaluation circuit Test condition: ID=8(A), VDD=15(V), VGS=10/0(V) Parameter Unit Measurement Simulation %Error ton ns 8.2 8.175 -0.30
  • 10. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 10 V_VDS 0V 0.4V 0.8V 1.2V 1.6V 2.0V -I(VDS) 0A 4A 8A 12A 16A 20A VGS 0 VDS U1 TPCA8065-H Output Characteristics Circuit Simulation result Evaluation circuit VGS=2.6V 2.8 2.9 3.0 3.1 3.2 3.3 10, 8, 6, 5 4.5 3.4 4
  • 11. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 11 V_VDS 0V -0.2V -0.4V -0.6V -0.8V -1.0V I(VDS) 100mA 1.0A 10A 100A VDS 0 U1 TPCA8065-H FWD Forward Current Characteristics Circuit Simulation result Evaluation circuit
  • 12. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 12 Comparison Graph Simulation result Comparison table IDR (A) -VDS (V) %Error Measurement Simulation 0.1 0.651 0.651 0.00 0.2 0.671 0.671 0.00 0.5 0.697 0.698 0.14 1 0.721 0.720 -0.14 2 0.749 0.745 -0.53 5 0.789 0.789 0.00 10 0.839 0.840 0.12 20 0.918 0.922 0.44 30 1.000 0.997 -0.30
  • 13. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 13 Time 9.88us 9.96us 10.04us 10.12us 10.20us I(R1) -400mA -300mA -200mA -100mA -0mA 100mA 200mA 300mA 400mA 0 V1TD = 0ns TF = 10ns PW = 10us PER = 1ms V1 = -9.2V TR = 10ns V2 = 10.7V R1 50 U1 TPCA8065-H Reverse Recovery Characteristics Circuit Simulation result Evaluation circuit Compare Measurement vs. Simulation Parameter Unit Measurement Simulation %Error trj ns 14.4 14.292 -0.75
  • 14. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 14 Reverse Recovery Characteristics Reference Trj = 14.4(ns) Trb = 24.8(ns) Conditions: Ifwd = lrev = 0.2(A), Rl = 50 Relation between trj and trb Example Measurement