The document presents a comprehensive report on the device modeling of the TC75S56FE CMOS voltage comparator by Toshiba Bee Technologies Inc. It includes detailed simulations, measurement comparisons, and error analysis related to characteristics such as voltage levels, current sink/source, propagation delays, and gain. All results underline the performance metrics and discrepancies between simulated and actual measurements.

1. Device Modeling Report
COMPONENTS : VOLTAGE COMPARATOR (CMOS)
PART NUMBER : TC75S56FE
MANUFACTURER : TOSHIBA
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

2. MODEL PARAMETER
Pspice model
Model description
parameter
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Modility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

3. Output Low Voltage
Simulation result
Simulation
Evaluation Circuit
VDD VOUT
Vol
U1
- +
tc75s56f
VIN- VSS VIN+
V2 I1
5
5m
V1
1
0
Comparison Table
Isink=5mA Measurement Simulation %Error
Vol (V) 0.1 0.097569 -2.431
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

4. Output high Voltage
Simulation result
Simulation
Evaluation Circuit
VDD VOUT
Voh
U2
- +
tc75s56f
V5 I2
5 VIN- VSS VIN+
5m
V6
1
0
Comparison Table
Isource = 5mA Measurement Simulation %Error
VOH (V) 4.9 4.8899 -0.206
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

5. Output Sink Current
Simulation result
Simulation
Evaluation Circuit
VDD VOUT
U3
tc75s56f
- +
Vsink
VIN- VSS VIN+ 0.5
5 V3
V4
1
0
Comparison Table
VOL = 0.5 V Measurement Simulation %Error
Isink (mA) 25 24.371 -2.516
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

6. Output Source Current
Simulation result
Simulation
Evaluation Circuit
VDD VOUT
U4
tc75s56f
Vsource
- +
V7
VIN- VSS VIN+ 4.5
V8
5 1
0
Comparison Table
VOH = 4.5 V Measurement Simulation %Error
Isource (mA) 21 21.625 2.976
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

7. Propagation Delay Time and Response Time
Simulation result
Simulation
Evaluation Circuit
VDD VOUT
OUTPUT
U1
- +
tc75s56f
V1 VIN- VSS VIN+
5
V4
V2 V3 V1 = -100m
0 V2 = 100m
0 TD = 1u
TR = 10n
TF = 10n
PW = 5u
PER = 10u
0
Comparison Table
Over drive=100mV Measurement Simulation %Error
tPLH (ns) 680 663.805 -2.382
tPHL (ns) 250 247.4 -1.040
tr (ns) 60 59.462 -0.897
tf (ns) 8 7.9819 -0.226
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

8. Input Bias Current and Input Offset Current Characteristics
Simulation result
Ib
Ios
Evaluation Circuit
VDD VOUT
U1
- +
tc75s56f
V4 VIN- VSS VIN+
5 R1
1k
V2 V3 V1
0
0
0
0
Comparison Table
Measurement Simulation %Error
Ib (pA) 1 0.9979 -0.210
Ios(pA) 1 0.9980 -0.200
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

9. Input Offset Voltage Characteristics
Simulation result
Simulation
Evaluation Circuit
VDD VOUT
output
U1
- +
tc75s56f
VIN- VSS VIN+
V3
5
V1
0
0
Comparison Table
Measurement Simulation %Error
Vio(mV) 1 1.0495 4.95
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

10. Voltage Gain Characteristics
Simulation result
Simulation
Evaluation Circuit
OUTPUT
VDD VOUT
U1
- +
tc75s56f
V1 VIN- VSS VIN+
5
V2 VIN
0 V3
VOFF = 1.0495m
VAMPL = 0
FREQ = 0
AC = 1m
0
Comparison Table
Measurement Simulation %Error
Av (dB) 94 93.148 -0.906
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005