This document summarizes the results of a study that used terahertz imaging to quantify the lattice dilation of plasma-sprayed nickel films in four samples. The study found that the lattice spacing of the nickel films was greater than that of pure metallic nickel, indicating lattice dilation. The degree of dilation decreased in the order of the four samples and was correlated with their exposure to high energy electric fields. This provides direct evidence of lattice dilation in plasma-sprayed nickel due to experimental conditions.
Nanoimprint Lithography head points:
Approaches: thermal and UV NIL
Properties of NIL
Overview. of NIL
Thermal NIL resists.
Residual layer after NIL.
NIL for large features (more difficult than small one).
Room temperature NIL, reverse NIL, inking.
NIL of bulk resist (polymer sheet, pellets).
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Preeti Choudhary
Three dimensional particle image velocimetrypawankumar9275
Three-dimensional particle image velocimetry for the flows near the wall. A brief introduction to measurement methods in fluid fields in general and imaging methods in particular. A general overview of famous three-dimensional particle imaging methods and detailed description of image velocimetry for the near wall flows
MODELING STUDY OF LASER BEAM SCATTERING BY DEFECTS ON SEMICONDUCTOR WAFERSjmicro
Accurate modeling of light scattering from nanometer scale defects on Silicon wafersiscritical for enabling
increasingly shrinking semiconductor technology nodes of the future. Yet, such modeling of defect
scattering remains unsolved since existing modeling techniques fail to account for complex defect and
wafer geometries. Here, we present results of laser beam scattering from spherical and ellipsoidal
particles located on the surface of a silicon wafer. A commercially available electromagnetic field solver
(HFSS) was deployed on a multiprocessor cluster to obtain results with previously unknown accuracy
down to light scattering intensity of -170 dB. We compute three dimensional scattering patterns of silicon
nanospheres located on a semiconductor wafer for both perpendicular and parallel polarization and show
the effect of sphere size on scattering. We further computer scattering patterns of nanometer scale
ellipsoidal particles having different orientation angles and unveil the effects of ellipsoidal orientation on
scattering.
Synthesis and Characterization of Mn, Ce Co-Doped CDS Nanoparticles Synthesiz...IJMER
Mn, Ce co-doped CdS nanoparticles were prepared by chemical co-precipitation method at room temperature. The prepared samples were characterized by X- ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive analysis of X-rays (EDAX), photoluminescence (PL) and
high resolution Raman spectroscopic techniques. X-ray diffraction studies showed that the diameter of the particles was around 10-12 nm. Broadened XRD peaks revealed the formation of nanoparticles with wurtzite structure. The Raman spectra of undoped and Mn, Ce ions co-doped CdS nanoparticles showed longitudinal optical mode. Compared with the 1LO and 2LO Raman modes (296 and 590 cm-1
) of undoped CdS nanoparticles, the Raman modes of Mn, Ce co- doped CdS nanoparticles were slightly shifted towards lower frequency. PL spectra of the samples showed remarkable enhancement in the intensity upon doping
Nanoimprint Lithography head points:
Approaches: thermal and UV NIL
Properties of NIL
Overview. of NIL
Thermal NIL resists.
Residual layer after NIL.
NIL for large features (more difficult than small one).
Room temperature NIL, reverse NIL, inking.
NIL of bulk resist (polymer sheet, pellets).
https://www.linkedin.com/in/preeti-choudhary-266414182/
https://www.instagram.com/chaudharypreeti1997/
https://www.facebook.com/profile.php?id=100013419194533
https://twitter.com/preetic27018281
Please like, share, comment and follow.
stay connected
If any query then contact:
chaudharypreeti1997@gmail.com
Thanking-You
Preeti Choudhary
Three dimensional particle image velocimetrypawankumar9275
Three-dimensional particle image velocimetry for the flows near the wall. A brief introduction to measurement methods in fluid fields in general and imaging methods in particular. A general overview of famous three-dimensional particle imaging methods and detailed description of image velocimetry for the near wall flows
MODELING STUDY OF LASER BEAM SCATTERING BY DEFECTS ON SEMICONDUCTOR WAFERSjmicro
Accurate modeling of light scattering from nanometer scale defects on Silicon wafersiscritical for enabling
increasingly shrinking semiconductor technology nodes of the future. Yet, such modeling of defect
scattering remains unsolved since existing modeling techniques fail to account for complex defect and
wafer geometries. Here, we present results of laser beam scattering from spherical and ellipsoidal
particles located on the surface of a silicon wafer. A commercially available electromagnetic field solver
(HFSS) was deployed on a multiprocessor cluster to obtain results with previously unknown accuracy
down to light scattering intensity of -170 dB. We compute three dimensional scattering patterns of silicon
nanospheres located on a semiconductor wafer for both perpendicular and parallel polarization and show
the effect of sphere size on scattering. We further computer scattering patterns of nanometer scale
ellipsoidal particles having different orientation angles and unveil the effects of ellipsoidal orientation on
scattering.
Synthesis and Characterization of Mn, Ce Co-Doped CDS Nanoparticles Synthesiz...IJMER
Mn, Ce co-doped CdS nanoparticles were prepared by chemical co-precipitation method at room temperature. The prepared samples were characterized by X- ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive analysis of X-rays (EDAX), photoluminescence (PL) and
high resolution Raman spectroscopic techniques. X-ray diffraction studies showed that the diameter of the particles was around 10-12 nm. Broadened XRD peaks revealed the formation of nanoparticles with wurtzite structure. The Raman spectra of undoped and Mn, Ce ions co-doped CdS nanoparticles showed longitudinal optical mode. Compared with the 1LO and 2LO Raman modes (296 and 590 cm-1
) of undoped CdS nanoparticles, the Raman modes of Mn, Ce co- doped CdS nanoparticles were slightly shifted towards lower frequency. PL spectra of the samples showed remarkable enhancement in the intensity upon doping
A Multiscale Simulation Approach for Diesel Particulate Filter Design Based o...Ries Bouwman
The majority of Diesel exhaust gas aftertreatment system design and development
work is done experimentally by means of long and expensive engine bench tests.
The final system configuration is generally the product of a series of experimental
“trial and error” operations. In order to shorten the development process, to reduce
testing costs and to increase the durability of Diesel Particulate Filters (DPFs), multidisciplinary
simulation tools are needed to predict possible failures of the DPF.
Recently, several numerical models have been developed to simulate globally the
soot loading capacity, the pressure drop evolution and the regeneration behaviour in
ceramic wall-flow filters. Less effort has been devoted to the development of
dedicated models for the simulation of the microstructural flow phenomena and
thermo-mechanical behaviour of the filters.
This paper describes the development of a multi-physics software tool based on
OpenFOAM embedded in the DexaSIM Graphical User Interface (GUI) which is able
to handle the evolution of microstructural material properties and complex physical
phenomena inside the filter material as well as response of complete filters under
engine operating conditions.
The modelling approach hence builds on the multiscale link between microstructural
evolution and specific macroscopic exhaust system features with the objective to
achieve major improvements in material design and lifecycle assessment.
Pulse Energy Effect on the Optical Properties of Pulse Laser Deposited SiO2 T...ijtsrd
In this work the effect of laser pulse energy on the optical properties of five samples of SiO2 thin film deposited using pulse laser deposition technique was studied Pulse energies of 100,150,180, 200 and 250 mj with fixed pulse repetition rate and number of pulses of 2 Hz, and 10 pulses, were used The target to substrate distance and angle were fixed The film thickness was measured by FESEM, and the transmission spectrum at certain wavelengths for each film was recorded SiO2 thin films transmission data and the measured film thicknesses were used to deduce their optical properties The results showed that increasing the pulse energy results in an increase of the film thickness and the morphology of the films becomes more dense and non-smooth at higher pulse energy, also the optical properties showed to be affected by the thickness variation and hence by the pulse energy Nafie A. Almuslet | Yousif H. Alsheikh | Kh. M. Haroun "Pulse Energy Effect on the Optical Properties of Pulse Laser Deposited SiO2 Thin Films" Published in International Journal of Trend in Scientific Research and Development (ijtsrd), ISSN: 2456-6470, Volume-2 | Issue-6 , October 2018, URL: http://www.ijtsrd.com/papers/ijtsrd18341.pdf
DEVELOPING CRYO-ELECTRON MICROSCOPY OF BIOMOLECULES IN WATERGuttiPavan
Cryo-electron microscopy (Cryo-EM) is a type of transmission electron microscopy that allows for the specimen of interest to be viewed at cryogenic temperatures (-150°C)
Following years of improvement, the cryo-electron microscope has become a valuable tool for viewing and studying the 3D structures of various biological molecules in water.
Abstract
Terahertz sub-surface imaging offers an effective solution for surface and 3D imaging because of minimal
sample preparation requirements and its ability to “see” below the surface. Another important property is the ability
to inspect on a layer-by layer basis via a non-contact route, non-destructive route. Terahertz 3D imager designed
at Applied Research and Photonics (Harrisburg, PA) has been used to demonstrate reconstructive imaging with a
resolution of less than a nanometer. Gridding with inverse distance to power equations has been described for 3D
image formation. A continuous wave terahertz source derived from dendrimer dipole excitation has been used for
reflection mode scanning in the three orthogonal directions. Both 2D and 3D images are generated for the analysis
of silver iodide quantum dots’ size parameter. Layer by layer image analysis has been outlined. Graphical analysis
was used for particle size and layer thickness determinations. The demonstrated results of quantum dot particle
size checks well with those determined by TEM micrograph and powder X-ray diffraction analysis. The reported
non-contact measurement system is expected to be useful for characterizing 2D and 3D naomaterials as well as for process development and/or quality inspection at the production line.
Abstract— This paper demonstrates overcoming of the Abbe diffraction limit (ADL) on image resolution. Here, terahertz multispectral reconstructive imaging has been described and used for analyzing nanometer size metal lines fabricated on a silicon wafer. It has also been demonstrated that while overcoming the ADL is a required condition, it is not sufficient to achieve sub-nanometer image resolution with longer wavelengths. A nanoscanning technology has been developed that exploits the modified Beer-Lambert’s law for creating a measured reflectance data matrix and utilizes the ‘inverse distance to power equation’ algorithm for achieving 3D, sub-nanometer image resolution. The nano-lines images reported herein, were compared to SEM images. The terahertz images of 70 nm lines agreed well with the TEM images. The 14 nm lines by SEM were determined to be ~15 nm. Thus, the wavelength dependent Abbe diffraction limit on image resolution has been overcome. Layer-by-layer analysis has been demonstrated where 3D images are analyzed on any of the three orthogonal planes. Images of grains on the metal lines have also been analyzed. Unlike electron microscopes, where the samples must be in the vacuum chamber and must be thin enough for electron beam transparency, terahertz imaging is non-destructive, non-contact technique without laborious sample preparation.
A Multiscale Simulation Approach for Diesel Particulate Filter Design Based o...Ries Bouwman
The majority of Diesel exhaust gas aftertreatment system design and development
work is done experimentally by means of long and expensive engine bench tests.
The final system configuration is generally the product of a series of experimental
“trial and error” operations. In order to shorten the development process, to reduce
testing costs and to increase the durability of Diesel Particulate Filters (DPFs), multidisciplinary
simulation tools are needed to predict possible failures of the DPF.
Recently, several numerical models have been developed to simulate globally the
soot loading capacity, the pressure drop evolution and the regeneration behaviour in
ceramic wall-flow filters. Less effort has been devoted to the development of
dedicated models for the simulation of the microstructural flow phenomena and
thermo-mechanical behaviour of the filters.
This paper describes the development of a multi-physics software tool based on
OpenFOAM embedded in the DexaSIM Graphical User Interface (GUI) which is able
to handle the evolution of microstructural material properties and complex physical
phenomena inside the filter material as well as response of complete filters under
engine operating conditions.
The modelling approach hence builds on the multiscale link between microstructural
evolution and specific macroscopic exhaust system features with the objective to
achieve major improvements in material design and lifecycle assessment.
Pulse Energy Effect on the Optical Properties of Pulse Laser Deposited SiO2 T...ijtsrd
In this work the effect of laser pulse energy on the optical properties of five samples of SiO2 thin film deposited using pulse laser deposition technique was studied Pulse energies of 100,150,180, 200 and 250 mj with fixed pulse repetition rate and number of pulses of 2 Hz, and 10 pulses, were used The target to substrate distance and angle were fixed The film thickness was measured by FESEM, and the transmission spectrum at certain wavelengths for each film was recorded SiO2 thin films transmission data and the measured film thicknesses were used to deduce their optical properties The results showed that increasing the pulse energy results in an increase of the film thickness and the morphology of the films becomes more dense and non-smooth at higher pulse energy, also the optical properties showed to be affected by the thickness variation and hence by the pulse energy Nafie A. Almuslet | Yousif H. Alsheikh | Kh. M. Haroun "Pulse Energy Effect on the Optical Properties of Pulse Laser Deposited SiO2 Thin Films" Published in International Journal of Trend in Scientific Research and Development (ijtsrd), ISSN: 2456-6470, Volume-2 | Issue-6 , October 2018, URL: http://www.ijtsrd.com/papers/ijtsrd18341.pdf
DEVELOPING CRYO-ELECTRON MICROSCOPY OF BIOMOLECULES IN WATERGuttiPavan
Cryo-electron microscopy (Cryo-EM) is a type of transmission electron microscopy that allows for the specimen of interest to be viewed at cryogenic temperatures (-150°C)
Following years of improvement, the cryo-electron microscope has become a valuable tool for viewing and studying the 3D structures of various biological molecules in water.
Abstract
Terahertz sub-surface imaging offers an effective solution for surface and 3D imaging because of minimal
sample preparation requirements and its ability to “see” below the surface. Another important property is the ability
to inspect on a layer-by layer basis via a non-contact route, non-destructive route. Terahertz 3D imager designed
at Applied Research and Photonics (Harrisburg, PA) has been used to demonstrate reconstructive imaging with a
resolution of less than a nanometer. Gridding with inverse distance to power equations has been described for 3D
image formation. A continuous wave terahertz source derived from dendrimer dipole excitation has been used for
reflection mode scanning in the three orthogonal directions. Both 2D and 3D images are generated for the analysis
of silver iodide quantum dots’ size parameter. Layer by layer image analysis has been outlined. Graphical analysis
was used for particle size and layer thickness determinations. The demonstrated results of quantum dot particle
size checks well with those determined by TEM micrograph and powder X-ray diffraction analysis. The reported
non-contact measurement system is expected to be useful for characterizing 2D and 3D naomaterials as well as for process development and/or quality inspection at the production line.
Abstract— This paper demonstrates overcoming of the Abbe diffraction limit (ADL) on image resolution. Here, terahertz multispectral reconstructive imaging has been described and used for analyzing nanometer size metal lines fabricated on a silicon wafer. It has also been demonstrated that while overcoming the ADL is a required condition, it is not sufficient to achieve sub-nanometer image resolution with longer wavelengths. A nanoscanning technology has been developed that exploits the modified Beer-Lambert’s law for creating a measured reflectance data matrix and utilizes the ‘inverse distance to power equation’ algorithm for achieving 3D, sub-nanometer image resolution. The nano-lines images reported herein, were compared to SEM images. The terahertz images of 70 nm lines agreed well with the TEM images. The 14 nm lines by SEM were determined to be ~15 nm. Thus, the wavelength dependent Abbe diffraction limit on image resolution has been overcome. Layer-by-layer analysis has been demonstrated where 3D images are analyzed on any of the three orthogonal planes. Images of grains on the metal lines have also been analyzed. Unlike electron microscopes, where the samples must be in the vacuum chamber and must be thin enough for electron beam transparency, terahertz imaging is non-destructive, non-contact technique without laborious sample preparation.
Abstract:
This paper demonstrates overcoming of the Abbe diffraction limit (ADL) on image resolution. Here, terahertz multispectral reconstructive imaging has been described and used for analyzing nanometer size metal lines fabricated on a silicon wafer. It has also been demonstrated that while overcoming the ADL is a required condition, it is not sufficient to achieve sub-nanometer image resolution with longer wavelengths. A nanoscanning technology has been developed that exploits the modified Beer-Lambert’s law for creating a measured reflectance data matrix and utilizes the ‘inverse distance to power equation’ algorithm for achieving 3D, sub-nanometer image resolution. The nano-lines images reported herein, were compared to SEM images. The terahertz images of 70 nm lines agreed well with the TEM images. The 14 nm lines by SEM were determined to be 15 nm. Thus, the wavelength dependent Abbe diffraction limit on image resolution has been overcome. Layer-by-layer analysis has been demonstrated where 3D images are analyzed on any of the three orthogonal planes. Images of grains on the metal lines have also been analyzed. Unlike electron microscopes, where the samples must be in the vacuum chamber and must be thin enough for electron beam transparency, terahertz imaging is non-destructive, non-contact technique without laborious sample preparation.
Abstract
Terahertz spectral analysis has been conducted on epitaxially grown semiconductor structures. Epitaxially grown semiconductors are important for microelectronic and optoelectronic devices and also for integrated circuits
fabricated using semiconductors. In this paper, we report results of terahertz time-domain spectroscopy of grown
SiGe layers on Ge buffer and separately a Ge buffer that was grown on a Si <001> wafer. In particular, evolution of
the time-domain spectra as a function of thickness of both samples was investigated by the terahertz pump-probe
technique. Representative spectra were analyzed to determine the respective layers’ spectral signatures. It was found that the spectroscopic analysis uniquely identified different layers by characteristic absorbance peaks. In addition, terahertz imaging was conducted in a non-destructive, non-contact mode for detecting lattice stacking fault and dislocations. Sub-surface imaging of grown SiGe layers on Ge buffer and that of the Ge buffer grown on a Si wafer reveals interesting lattice features in both samples. A comparison with TEM images of the samples exhibits that the terahertz image reproduces the dimensions found from TEM images within the experimental error limits. In particular, 3D images of both samples were generated by the terahertz reconstructive technique. The images were analyzed by graphical means to determine the respective layer thicknesses. Thus, this technique offers a versatile tool for both semiconductor research and in-line inspections.
A new Compton scattered tomography modality and its application to material n...irjes
Imaging modalities exploiting the use of Compton scattering are currently under active investigation. However, despite many innovative contributions, this topic still poses a formidable mathematical and technical challenge. Due to the very particular nature of the Compton effect, the main problem consists of obtaining the reconstruction of the object electron density. Investigations on Compton scatter imaging for biological tissues, organs and the like have been performed and studied widely over the years. However in material sciences, in particular in non-destructive evaluation and control, this type of imaging procedure is just at its beginning. In this paper, we present a new scanning process which collects scattered radiation to reconstruct the internal electronic distribution of industrial materials. As an illustration, we shall look at one of the most widely used construction material: concrete and its variants in civil engineering. The Compton scattered radiation approach is particularly efficient in imaging steel frame and voids imbedded in bulk concrete objects.
We present numerical simulation results to demonstrate the viability and performances of this imaging modality.
Keywords :- Compton scattering , Gamma-ray imaging , Non-destructive testing/evaluation (NDT/NDE), Concrete: structure and defects, Radon transform
Metallic Thin Film Deposition for Sensing ApplicationsMinh Tran
This poster presented the deposition of metallic thin film by the wet-chemistry methods, i.e. the galvanic displacement and the electrodeposition. The methods offered not only the simplicity and low-cost of the experimental setup, but also certain levels of control over the morphology, density, and size of the deposited metallic nanostructures. Several characterization methods were applied to examine the thin films, including the SEM, AFM, XRD, and XPS. Furthermore, thin film deposition by physical and chemical vapor deposition will be outlined for future work. Finally, the samples were tested for their applicability for Surface Enhanced Raman Spectroscopy (SERS) in which low concentrations of Rhodamine 6G (R6G) dye and paraoxon, a highly toxic organophosphate pesticide, were detected. They showed promising results.
STUDY ON THE ABSORPTION AND SCATTERING EFFICIENCIES OF THE CADMIUM TELLURIDE ...IJAMSE Journal
The optical properties of cadmium telluride nanowires have been simulated using the Mie scattering
coefficients. It is seen that the absorption efficiency shows multiple peaks along the spectrum due to leaky
mode resonance. The nanowires showed strong polarization dependence in smaller radius. Higher angle of
incidence showed a suppressing effect on lower valued peaks on absorption efficiency. Scattering efficiency
showed peaks at visible spectrum from 30nm to 100nm. Transverse magnetic wave showed a more
pronounced effect in scattering than transverse electric wave.
Porosity and the Magnetic Properties of Aluminium Doped Nickel Ferriteijtsrd
The nanocrystalline particles of Aluminium Al doped nickel Ni ferrites with general formula NiAlxFe2 xO4 x = 0.0, 0.2, 0.4, 0.6, 0.8 and 1.0 were synthesized by sol gel auto combustion technique. The formation of single phase cubic spinel was confirmed by X ray diffraction analyses. Morphological features of the samples are studied by Scanning Electron Microscopy SEM to examine the particle size, shape and homogeneity of sample. The magnetic hysteresis graphs were obtained to understand their magnetic behaviours. The relative permeability µr of AlNi ferrite samples shows a decrease for all samples as Al content increases. Sandar Oo | Ye Wint Tun | Shwe Zin Oo "Porosity and the Magnetic Properties of Aluminium Doped Nickel Ferrite" Published in International Journal of Trend in Scientific Research and Development (ijtsrd), ISSN: 2456-6470, Volume-3 | Issue-5 , August 2019, URL: https://www.ijtsrd.com/papers/ijtsrd25240.pdfPaper URL: https://www.ijtsrd.com/physics/other/25240/porosity-and-the-magnetic-properties-of-aluminium-doped-nickel-ferrite/sandar-oo
MODELING STUDY OF LASER BEAM SCATTERING BY DEFECTS ON SEMICONDUCTOR WAFERSjmicro
Accurate modeling of light scattering from nanometer scale defects on Silicon wafersiscritical for enabling
increasingly shrinking semiconductor technology nodes of the future. Yet, such modeling of defect
scattering remains unsolved since existing modeling techniques fail to account for complex defect and
wafer geometries. Here, we present results of laser beam scattering from spherical and ellipsoidal
particles located on the surface of a silicon wafer. A commercially available electromagnetic field solver
(HFSS) was deployed on a multiprocessor cluster to obtain results with previously unknown accuracy
down to light scattering intensity of -170 dB. We compute three dimensional scattering patterns of silicon
nanospheres located on a semiconductor wafer for both perpendicular and parallel polarization and show
the effect of sphere size on scattering. We further computer scattering patterns of nanometer scale
ellipsoidal particles having different orientation angles and unveil the effects of ellipsoidal orientation on
scattering.
A Front Surface Optimization Study for Photovoltaic ApplicationTELKOMNIKA JOURNAL
In this paper, we presented a possible front surface optical enhancement of Si solar cell by
optimizing the Antireflection (AR) and light trapping (LT) schemes. Conventional plasma enhanced
chemical vapor deposition (PECVD) and in house hot wire chemical vapor deposition (HWCVD) tool was
used to deposit Silicon Nitride (SiNX) layer and optimized at 668nm wavelength. This was followed by
surface texturing of random pyramids to further enhance the broadband reflectance of the front surface.
Broadband reflectance measurement using integrating sphere method showed achieved weighted average
reflectance (WAR) value of as low as 1.8% and 1.5%, when 85nm SiNX was deposited on top of random
pyramids structure using HWCVD and PECVD methods, respectively.
Neutron Imaging and Tomography with Medipix2 and Dental Microroentgenography:...IJAEMSJORNAL
An over view of Neutron Imaging and Tomography (NIT) with Medipix2 and Dental Micro-roentgenography have been presented in this article. This over view confined to semiconductor detector Medipix2, neutron radiography and tomography and dental microroentgenography. Medipix2 is a pixel-based detector technology employed to measure charge particles, photons (visible through gammas) and neutron. Neutron Beam for this technology are LVR-15 Research Reactor ( 107 n/cm2 s) and Spallation neutron source ( 3×106n/cm2 s) .This technology has been verified with photograph and neutronogram of a relay and photograph and tomographic 3D reconstruction of a bullet cartidge, tooth and fishing thread. Comparison of spatial resolution among different imagers also has been presented.
Similar to Lattice dilation of plasma sprayed nickel film quantified by high resolution terahertz imaging nrs.000545 (20)
Terahertz (T-ray) techniques for measuring, profiling, and mapping of semiconductor features and doping concentration of via a T-ray volume imaging route, deep-level spectroscopy, and empirical modeling; and application thereof for semiconductor doping concentration thickness profiling and surface mapping for both undoped and doped semiconductors.
This paper outlines the basic technology and economic model of the core silicon technology. Silicon is the second most abundant element on the earth’s crust but there is no specific deposit or mine for silicon.
The only source for silicon is “sand” that the earth has an abundant supply. Here we outline the basic steps of manufacturing silicon ingot and wafers. It is projected that, once produced, these products will gain immediate market access, thus creating economic activities in a reasonably short period of time. The three initial products that could stem from the basic silicon ingot are silicon wafers, for both semiconductor and solar cell applications, and optical fiber for communication. This report focuses on the essential silicon
technology to produce silicon ingot, and silicon wafer, as the first step. Finally, the historic data available for the silicon wafer consumption per year have been modeled with the well-known Bass diffusion model.
It was found that with modified parameters, the Bass model fits the historic data well and the same model allows a projection for a few years in the future. This projected economic activities, therefore, encourages a social transformation towards a technological self-sufficiency.
Keywords: Silicon technology; Bass diffusion model; Silicon wafer consumption; Social transformation;
Technological self-sufficiency
DOI: 10.31031/NRS.2022.11.000760
Abstracts and Bios of the Chief Guest, Guest of Honor, distinguished Speakers and Panelists of the 2021 AABEA-FOBANA joint Seminar in Washington DC, November 27 and 28, 2021.
Two critical nanoscale design parameters (CNDPs); namely, surface chemistry and interior compositions of poly(amidoamine) (PAMAM) dendrimers were systematically engineered to produce unique hyperpolarizable, electro-optical substrates. These electro-optically active dendritic films were demonstrated to produce high quality, continuous wave terahertz radiation when exposed to a suitable pump laser that could be used for spectrometry and molecular imaging. These dendrimer based dipole excitation (DDE) terahertz sources were used to construct a working spectrometer suitable for many practical applications including THz imaging and analysis of encapsulated hydrogen species in fullerenes.
Abstract: Non-destructive terahertz reflection interferometry offers many advantages for sub-surface inspection such as interrogation of hidden defects and measurement of layers’ thicknesses. Here, we describe a terahertz reflection interferometry (TRI) technique for non-contact measurement of paint panels where the paint is comprised of different layers of primer, basecoat, topcoat and clearcoat. Terahertz interferograms were generated by reflection from different layers of paints on a metallic substrate. These interferograms’ peak spacing arising from the delay-time response of respective layers, allow one to model the thicknesses of the constituent layers. Interferograms generated at different incident angles show that the interferograms are more pronounced at certain angles than others. This “optimum” angle is also a function of different paint and substrate combinations. An automated angular scanning algorithm helps visualizing the evolution of the interferograms as a function of incident angle and also enables the identification of optimum reflection angle for a given paint-substrate combination. Additionally, scanning at different points on a substrate reveals that there are observable variations from one point to another of the same sample over its entire surface area. This ability may be used as a quality control tool for in-situ inspection in a production line.
Electro-optic Dendrimer is used to generate milliwatts of terahertz power by difference frequency
method. A terahertz time-domain spectrometer (THz-TDS) has been designed around this source that
exhibits wide broadband terahertz range, 0.1 to 35 THz. Examples of molecular characterization are discussed
for three common explosives and the vibrational states of Fullerenes. The explosives’ spectra are
unique for each explosive that allow detection and identification of the species. The Fullerenes C60 and
H2@C60 also exhibit distinctively different spectra and absorbance states indicating that the THz-TDS is
suitable for probing increased number of vibrational states expected from molecular vibrations.
2011 Elsevier B.V. All rights reserved.
http://thz-pacifichem.blogspot.com/
Call for Abstracts
Advances in Terahertz Spectroscopy and Imaging (#413)
THE INTERNATIONAL CHEMICAL CONGRESS OF
PACIFIC BASIN SOCIETIES
Honolulu, Hawaii, USA DECEMBER 15 - 20, 2015
Dear Colleague:
It is our great pleasure to announce a symposium on “Advances in Terahertz Spectroscopy and Imaging” at the Pacifichem 2015 in Hawaii. Please see the link above for details. Contributions are solicited addressing subjects from all walks of terahertz applications. As an emerging area of science and technology, terahertz applications, such as spectroscopy, reflectometry and imaging, have the potential for addressing some of the critical problems of the 21st century. As indicated by increased attendance and number of papers in the past, the proposed symposium will fill a gap in the technical program by attracting the terahertz spectroscopy and related communities from all over the world. While there are other spectroscopic techniques, terahertz technology provides unique information that is not available from the predecessors. Therefore, this symposium solicits papers on the advances of terahertz applications in crucial matters such as: biomedical research, early detection of skin cancer, transdermal drug delivery, biopharmaceuticals, materials for energy, conservation and forensic science, security & screening, geology and minerals, semiconductors and any other relevant areas. This symposium will present an opportunity for the exchange of knowledge in a global forum, including results and discussions of current and breakthrough terahertz techniques and their applications. Papers, including spectroscopic, reflectometry and imaging techniques on the above mentioned areas and other terahertz applications in solving important problems are welcome. Formal abstracts submission will be open from January 1 – April 3, 2015. See this link for details of submission: http://www.pacifichem.org/congress-details/abstracts/
Sincerely yours,
Anis Rahman (USA): a.rahman@arphotonics.net
Choonho Kim (S Korea): chkim1202@gmail.com
Wolfgang Jaeger (Canada): wolfgang.jaeger@ualberta.ca
Sing Kiong Nguang (New Zealand): sk.nguang@auckland.ac.nz
Yacov Shamash (USA): yacovshamash@yahoo.com
Terahertz dynamic scanning reflectometry (TDSR) was used for measuring layered materials’ deformation kinetics
spectra. Multi-layered materials are used for protective devices such as helmet and body armor. An in-situ measurement of deformation profile and other dynamic characteristics is important when such material is subjected to ballistic impacts. Current instrumentation is limited in their abilities to provide sub-surface information in a non-destructive fashion. A high sensitivity TDSR has been used to measure dynamic surface deformation characteristics in real-time (in-situ) and also at post deformation (ex-situ). Real-time ballistic deformation kinetics was captured with a high speed measurement system. The kinetics spectra was used to compute a number of crucial parameters such as deformation
length and its propagation profile, the relaxation position, and the macroscopic vibration profile. In addition, the loss of mass due to impact was quantified for accurate determination of the trauma causing energy. For non-metallic substrates, a transmitted beam was used to calibrate mass loss, a priori, of the laminate layers due to impact. Deformation kinetics information may then be used to formulate trauma diagnosis conditions from blunt hit via the Sturdivan criterion [1].
The basic difference in the proposed approach is that here diagnostic criteria are inferred by measuring the helmet itself; no need to draw blood or any biopsy from the patient.
The 25th Annual SEMI Advanced Semiconductor Manufacturing Conference – ASMC 2014
May 19-21, 2014
Saratoga Hilton/City Center
534 Broadway
Saratoga Springs, NY 12866 USA
Tel: 1-518-584-4000 Fax: 1-518-584-7430
More from Applied Research and Photonics, Inc. (20)
The ability to recreate computational results with minimal effort and actionable metrics provides a solid foundation for scientific research and software development. When people can replicate an analysis at the touch of a button using open-source software, open data, and methods to assess and compare proposals, it significantly eases verification of results, engagement with a diverse range of contributors, and progress. However, we have yet to fully achieve this; there are still many sociotechnical frictions.
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Lattice dilation of plasma sprayed nickel film quantified by high resolution terahertz imaging nrs.000545
1. Lattice Dilation of Plasma Sprayed Nickel
Film Quantified by High Resolution
Terahertz Imaging
Anis Rahman1
*, Francis Tanzella2
, Aunik K Rahman1
, Carl Page3
and Robert
Godes4
1
Applied Research & Photonics, USA
2
Energy Research Center LLC, USA
3
Anthropocene Institute, USA
4
Brillouin Energy, USA
Introduction
Lattice dilation is the root cause of many physical transformation of solid materials,
including hydrogen embrittlement, crystal to glass transition, or in general, the
amorphization of metals. This solid state amorphization can be induced by various
perturbations. Such external stimuli include particle beam irradiations, chemical
reactions, external electric field stress, and mechanical deformations. The signature of
such amorphization is not easy to detect until some macroscopic change is manifested in
a given structure. Therefore, a lattice scale direct evidence of such transition via lattice
dilation is important for an early stage detection; such detection is not easy from SEM/
TEM images because of the strictly 2D nature of those images. The unit cell of nickel is
a face-centered cube with the lattice parameter of 0.352nm, giving an atomic radius of
0.124nm. This crystal structure is stable to pressures of at least 70 GPa. Nickel belongs to
the transition metals; it is hard and ductile. In this paper, the lattice of metallic nickel has
been investigated under different experimental conditions via terahertz high-resolution
imaging technique [1]. The objectives of these investigations are to use the high-resolution
images of the samples of the present study, known as the “Hydrogen Hot Tube (HHT)” or
the LENR tube cells [2,3]. As described in ref. [2], these HHTs are used for Isoperibolic
calorimeterexperimentsforinvestigatingthelowenergynuclearreaction(LENR)possibilities
(see the Discussion section). It is hoped that the high-resolution images will shed light for
understanding the mechanism via which the LENR effect, if any, may take place. However,
the present investigation is also important for understanding the hydrogen embrittlement
phenomenon [4] that occurs via lattice dilation.
Crimson Publishers
Wings to the Research
Research Article
*Corresponding author: Anis Rahman,
Applied Research & Photonics, USA
Submission: November 15, 2019
Published: December 03, 2019
Volume 2 - Issue 4
How to cite this article: Anis R, Francis
T, Aunik K R, Carl Page, Robert Godes.
Lattice Dilation of Plasma Sprayed Nickel
Film Quantified by High Resolution
Terahertz Imaging. Nov Res Sci.2(4).
NRS.000545.2019.
DOI: 10.31031/NRS.2019.2.000545
Copyright@ Anis Rahman, This article is
distributed under the terms of the Creative
Commons Attribution 4.0 International
License, which permits unrestricted use
and redistribution provided that the
original author and source are credited.
1Novel Research in Sciences
Abstract
Lattice dilation of metallic nickel film deposited by plasma-spraying on a ceramic layer that is also
prepared by plasma-spraying, has been investigated by high resolution terahertz imaging and sequential
zooming of the images to quantify the lattice parameter by graphical analysis. A metallic nickel sample
was first imaged, and its measured lattice constant was found to be in agreement with the known value.
Subsequently, four additional samples containing plasma-sprayed nickel film have also been imaged via an
identical procedure. The lattice images of all samples were used for graphical analysis and quantification
of the respective lattice parameters. Four samples, viz., 77, 81, 129 and 111 have been analyzed and their
lattice dilation was investigated. It was found that the lattice distance (d) of these samples is in the order
as, 77 81 129 111d d d d< < < and higher than the value of metallic nickel. Unit cell volume and density were also
calculated for each sample from the measured lattice parameter. The density was found in the decreasing
order for the 4 samples; i.e., 77 81 129 111ρ ρ ρ ρ> > > and the density values are significantly lower than the
value for nickel. To our knowledge, this is the first direct evidence of the lattice dilation of plasma-sprayed
metallic nickel measured via the terahertz lattice imaging, without requiring an electron microscope.
Thus, the results presented herein establish an exciting extension of camera-less, reconstructive terahertz
imaging technique that produces such a clear lattice image of nickel and allows to quantify the lattice
parameter. The technique, however, is a general one, applicable to any material.