Processing & Properties of Floor and Wall Tiles.pptx
L44 x ray fluorescence
1. OML751 TESTING OF MATERIALS
M.KARTHIKEYAN
ASSISTANT PROFESSOR
DEPARTMENT OF MECHANICAL ENGINEERING
AAA COLLEGE OF ENGINEERING & TECHNOLOGY, SIVAKASI
karthikeyan@aaacet.ac.in
2. UNIT V OTHER TESTING
1. Thermal Testing: Differential scanning calorimetry,
2. Differential thermal analysis. Thermo-mechanical and
3. Dynamic mechanical analysis:
4. Chemical Testing: X-Ray Fluorescence
5. Inductively Coupled Plasma-Optical Emission Spectroscopy and
6. Inductively Coupled Plasma-Mass Spectrometry.
3. XRF is an acronym for X-ray fluorescence spectroscopy.
XRF is a non-destructive analytical technique used to determine
the elemental composition of materials.
PRINCIPLE
XRF is based on the principle that individual atoms, when
excited by an external energy source, emit X-ray photons of a
characteristic energy or wavelength.
By counting the number of photons of each energy emitted from
a sample, the elements present may be identified and
quantitated.
4.
5. The instrument operates based on the principle of Bragg
diffraction.
A detector is angularly scanned relative to the analyzing
crystal, registering the spectrum.
The entire polychromatic spectrum from the sample is incident
upon a detector that is capable of registering the energy of each
photon that strikes it.
The detector electronics and data system then build the X-ray
spectrum as a histogram, with number of counts versus energy.
6. APPLICATIONS
X-Ray fluorescence is used in a wide range of applications,
including research in igneous, sedimentary, and metamorphic
petrology
soil surveys
mining (e.g., measuring the grade of ore)
cement production
ceramic and glass manufacturing
metallurgy (e.g., quality control)
environmental studies
petroleum industry
field analysis in geological and environmental studies
7. • If the absorption of electromagnetic radiation by matter
results in the emission of radiation of the same or longer
wavelengths for a short time, the phenomenon is termed
as which of the following?
Luminescence
Fluorescence
Phosphorescence
Spontaneous emission
MCQ - 1
8. • The energy of the emitted X-rays depends upon the
_________ of the atom and their intensity depends upon
the __________
Atomic number, amount of sample
Mass number, amount of sample
Mass number, concentration of atoms
Atomic number, concentration of atoms
MCQ - 2
9. • Prompt emission of X-ray by an atom ionised by a higher
energy X-ray is a type of which of the following
phenomena?
Luminescence
Fluorescence
Phosphorescence
Spontaneous emission
MCQ - 3
10. • The measurement of intensity of fluorescent X-rays
provide a simple and ____________ way of _____________
analysis.
Destructive, quantitative
Non-destructive, quantitative
Destructive, qualitative
Non-destructive, qualitative
MCQ - 4
11. • Which of the following components of the X-ray
fluorescent spectrometer induces fluorescent radiation?
Excitation source
Energy analyser
X-ray spectrometer
Detection System
MCQ - 5