SPICE MODEL of GT15J321 (Professional+FWD+SP LTspice Model) in SPICE PARK

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SPICE MODEL of GT15J321 (Professional+FWD+SP LTspice Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

Technology

Device Modeling Report

COMPONENTS: Insulated Gate Bipolar Transistor (IGBT)
PART NUMBER: GT15J321
MANUFACTURER: TOSHIBA
* REMARK: Free-Wheeling Diode Special Model

Bee Technologies Inc.

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
1

Circuit Configuration

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
2

Transfer Characteristics

Circuit Simulation result

Evaluation circuit

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
3

Comparison Graph

Simulation result

Comparison table

Test condition: VCE =5 (V)

VGE (V)
IC (A) %Error
Measurement Simulation
1 6.700 6.769 1.02
2 6.900 6.969 1.01
5 7.280 7.380 1.37
10 7.800 7.863 0.81
15 8.200 8.248 0.58
20 8.550 8.582 0.38
25 8.800 8.885 0.96
30 9.050 9.165 1.27

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
4

Fall Time Characteristics

Circuit Simulation result

Time

Evaluation circuit

Test condition: IC=15 (A), VCC=300 (V), VGE= 15 (V), RG=43(Ω)

Parameter Unit Measurement Simulation %Error
tf us 0.030 0.030 -1.072
toff us 0.340 0.346 1.838

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
5

Gate Charge Characteristics

Circuit Simulation result

Evaluation circuit

Test condition: VCC=300 (V), IC=15 (A), VGE=15 (V)

Parameter Unit Measurement Simulation %Error
Qge nc 20.000 20.000 0.000
Qgc nc 30.000 30.000 0.000
Qg nc 85.000 88.038 3.574

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
6

Saturation Characteristics

Circuit Simulation result

Evaluation circuit

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
7

Comparison Graph

Simulation result

Comparison table

Test condition: VGE =15 (V)

VCE (V)
Ic(A) %Error
Measurement Simulation
1 0.915 0.956 4.51
2 1.050 1.060 0.96
5 1.330 1.314 -1.23
10 1.650 1.648 -0.13
15 1.900 1.916 0.85
20 2.150 2.148 -0.09
25 2.380 2.369 -0.45
30 2.600 2.605 0.19

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
8

Output Characteristics

Circuit Simulation result

20V 15V 9V

8V

VGE=7V

Evaluation circuit

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
9

FWD Forward Current Characteristics

Circuit Simulation result

Evaluation circuit

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
10

Comparison Graph

Simulation result

Comparison table

VF (V)
IF(A) %Error
Measurement Simulation
1 1.090 1.093 0.23
2 1.170 1.162 -0.71
5 1.260 1.269 0.73
10 1.375 1.377 0.11
15 1.460 1.459 -0.08
20 1.538 1.531 -0.46
25 1.600 1.598 -0.15
30 1.655 1.661 0.34

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
11

Reverse Recovery Characteristics

Circuit Simulation result

Time

Evaluation circuit

Test condition: VCC=300 (V), IF=15 (A), –di/dt=100 A/usec

Parameter Unit Measurement Simulation %Error
trr ns 110.000 109.810 -0.173
Irr A 4.200 4.208 0.185

All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
12

The document is a device modeling report for an Insulated Gate Bipolar Transistor (IGBT) manufactured by Toshiba. It includes the part number, simulations of the IGBT's transfer characteristics, comparison graphs between measured and simulated values, and evaluations of the IGBT's fall time, gate charge, saturation, forward current, and reverse recovery characteristics. Simulation results show good agreement with measurements, with most errors under 2%.

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Welcome to UiPath Test Automation using UiPath Test Suite series part 6. In this session, we will cover Test Automation with generative AI and Open AI. UiPath Test Automation with generative AI and Open AI webinar offers an in-depth exploration of leveraging cutting-edge technologies for test automation within the UiPath platform. Attendees will delve into the integration of generative AI, a test automation solution, with Open AI advanced natural language processing capabilities. Throughout the session, participants will discover how this synergy empowers testers to automate repetitive tasks, enhance testing accuracy, and expedite the software testing life cycle. Topics covered include the seamless integration process, practical use cases, and the benefits of harnessing AI-driven automation for UiPath testing initiatives. By attending this webinar, testers, and automation professionals can gain valuable insights into harnessing the power of AI to optimize their test automation workflows within the UiPath ecosystem, ultimately driving efficiency and quality in software development processes. What will you get from this session? 1. Insights into integrating generative AI. 2. Understanding how this integration enhances test automation within the UiPath platform 3. Practical demonstrations 4. Exploration of real-world use cases illustrating the benefits of AI-driven test automation for UiPath Topics covered: What is generative AI Test Automation with generative AI and Open AI. UiPath integration with generative AI Speaker: Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP

Cosa hanno in comune un mattoncino Lego e la backdoor XZ?

Speck&Tech

ABSTRACT: A prima vista, un mattoncino Lego e la backdoor XZ potrebbero avere in comune il fatto di essere entrambi blocchi di costruzione, o dipendenze di progetti creativi e software. La realtà è che un mattoncino Lego e il caso della backdoor XZ hanno molto di più di tutto ciò in comune. Partecipate alla presentazione per immergervi in una storia di interoperabilità, standard e formati aperti, per poi discutere del ruolo importante che i contributori hanno in una comunità open source sostenibile. BIO: Sostenitrice del software libero e dei formati standard e aperti. È stata un membro attivo dei progetti Fedora e openSUSE e ha co-fondato l'Associazione LibreItalia dove è stata coinvolta in diversi eventi, migrazioni e formazione relativi a LibreOffice. In precedenza ha lavorato a migrazioni e corsi di formazione su LibreOffice per diverse amministrazioni pubbliche e privati. Da gennaio 2020 lavora in SUSE come Software Release Engineer per Uyuni e SUSE Manager e quando non segue la sua passione per i computer e per Geeko coltiva la sua curiosità per l'astronomia (da cui deriva il suo nickname deneb_alpha).

Mariano G Tinti - Decoding SpaceX

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HCL Notes and Domino License Cost Reduction in the World of DLAU

panagenda

Webinar Recording: https://www.panagenda.com/webinars/hcl-notes-and-domino-license-cost-reduction-in-the-world-of-dlau/ The introduction of DLAU and the CCB & CCX licensing model caused quite a stir in the HCL community. As a Notes and Domino customer, you may have faced challenges with unexpected user counts and license costs. You probably have questions on how this new licensing approach works and how to benefit from it. Most importantly, you likely have budget constraints and want to save money where possible. Don’t worry, we can help with all of this! We’ll show you how to fix common misconfigurations that cause higher-than-expected user counts, and how to identify accounts which you can deactivate to save money. There are also frequent patterns that can cause unnecessary cost, like using a person document instead of a mail-in for shared mailboxes. We’ll provide examples and solutions for those as well. And naturally we’ll explain the new licensing model. Join HCL Ambassador Marc Thomas in this webinar with a special guest appearance from Franz Walder. It will give you the tools and know-how to stay on top of what is going on with Domino licensing. You will be able lower your cost through an optimized configuration and keep it low going forward. These topics will be covered - Reducing license cost by finding and fixing misconfigurations and superfluous accounts - How do CCB and CCX licenses really work? - Understanding the DLAU tool and how to best utilize it - Tips for common problem areas, like team mailboxes, functional/test users, etc - Practical examples and best practices to implement right away

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UiPath Test Automation using UiPath Test Suite series, part 6

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SPICE MODEL of GT15J321 (Professional+FWD+SP LTspice Model) in SPICE PARK

1. Device Modeling Report COMPONENTS: Insulated Gate Bipolar Transistor (IGBT) PART NUMBER: GT15J321 MANUFACTURER: TOSHIBA * REMARK: Free-Wheeling Diode Special Model Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 1

4. Comparison Graph Simulation result Comparison table Test condition: VCE =5 (V) VGE (V) IC (A) %Error Measurement Simulation 1 6.700 6.769 1.02 2 6.900 6.969 1.01 5 7.280 7.380 1.37 10 7.800 7.863 0.81 15 8.200 8.248 0.58 20 8.550 8.582 0.38 25 8.800 8.885 0.96 30 9.050 9.165 1.27 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 4

5. Fall Time Characteristics Circuit Simulation result Time Evaluation circuit Test condition: IC=15 (A), VCC=300 (V), VGE= 15 (V), RG=43(Ω) Parameter Unit Measurement Simulation %Error tf us 0.030 0.030 -1.072 toff us 0.340 0.346 1.838 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 5

6. Gate Charge Characteristics Circuit Simulation result Evaluation circuit Test condition: VCC=300 (V), IC=15 (A), VGE=15 (V) Parameter Unit Measurement Simulation %Error Qge nc 20.000 20.000 0.000 Qgc nc 30.000 30.000 0.000 Qg nc 85.000 88.038 3.574 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 6

8. Comparison Graph Simulation result Comparison table Test condition: VGE =15 (V) VCE (V) Ic(A) %Error Measurement Simulation 1 0.915 0.956 4.51 2 1.050 1.060 0.96 5 1.330 1.314 -1.23 10 1.650 1.648 -0.13 15 1.900 1.916 0.85 20 2.150 2.148 -0.09 25 2.380 2.369 -0.45 30 2.600 2.605 0.19 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 8

11. Comparison Graph Simulation result Comparison table VF (V) IF(A) %Error Measurement Simulation 1 1.090 1.093 0.23 2 1.170 1.162 -0.71 5 1.260 1.269 0.73 10 1.375 1.377 0.11 15 1.460 1.459 -0.08 20 1.538 1.531 -0.46 25 1.600 1.598 -0.15 30 1.655 1.661 0.34 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 11

12. Reverse Recovery Characteristics Circuit Simulation result Time Evaluation circuit Test condition: VCC=300 (V), IF=15 (A), –di/dt=100 A/usec Parameter Unit Measurement Simulation %Error trr ns 110.000 109.810 -0.173 Irr A 4.200 4.208 0.185 All Rights Reserved Copyright (C) Bee Technologies Inc. 2011 12

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SPICE MODEL of GT15J321 (Professional+FWD+SP LTspice Model) in SPICE PARK