SPICE MODEL of GT15J321 (Professional+FWDP PSpice Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS: Insulated Gate Bipolar Transistor (IGBT)
PART NUMBER: GT15J321
MANUFACTURER: TOSHIBA
*REMARK: Free-Wheeling Diode Professional Model
Bee Technologies Inc.
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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2. Circuit Configuration
Collector
Gate
Emitter
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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3. Transfer Characteristics
Circuit Simulation result
30A
25A
20A
15A
10A
5A
0A
0V 4V 8V 12V 16V 20V
I(U1:C)
V_VGE
Evaluation circuit
U2
DGT15J321_P
VCE
5Vdc
VGE U1
15Vdc GT15J321
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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4. Comparison Graph
Simulation result
Comparison table
Test condition: VCE =5 (V)
VGE (V)
IC (A) %Error
Measurement Simulation
1 6.700 6.769 1.02
2 6.900 6.969 1.01
5 7.280 7.380 1.37
10 7.800 7.863 0.81
15 8.200 8.248 0.58
20 8.550 8.582 0.38
25 8.800 8.885 0.96
30 9.050 9.165 1.27
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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5. Fall Time Characteristics
Circuit Simulation result
20V
0V
V(U1:G)
20A
SEL>>
-5A
9.4us 9.8us 10.2us 10.6us 11.0us 11.4us
I(U1:C)
Time
Evaluation circuit
U4
RG2 DGT15J321_P
-VGE
15Vdc43 U2 L1
GT15J321 20mH
2 1
IC = 15
VCE
300
U3
Rg DGT15J321_P
V1 = 0
V2 = 15
TD = 5u V1 43
TR = 10n U1
TF = 10n GT15J321
PW = 4.998u
PER = 100u
0
Test condition: IC=15 (A), VCC=300 (V), VGE= 15 (V), RG=43(Ω)
Parameter Unit Measurement Simulation %Error
tf us 0.030 0.029 -4.330
toff us 0.340 0.343 0.973
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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6. Gate Charge Characteristics
Circuit Simulation result
20V
16V
12V
8V
4V
0V
0 20n 40n 60n 80n 100n
V(W1:1)
Time*1mA
Evaluation circuit
V2
0
IC
U2 D2
DGT15J321_P Dbreak 15
I1 = 0
I2 = 1m W1 W
TF = 10n + IOFF = 100uA VCC
TR = 10n ION = 0A U1
TD = 0 I2 -
GT15J321 300
PER = 700m
PW = 7m
0
Test condition: VCC=300 (V), IC=15(A), VGE=15 (V)
Parameter Unit Measurement Simulation %Error
Qge nc 20.000 20.000 0.000
Qgc nc 30.000 30.000 0.000
Qg nc 85.000 88.070 3.612
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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7. Saturation Characteristics
Circuit Simulation result
50A
40A
30A
20A
10A
0A
0V 1.0V 2.0V 3.0V 4.0V 5.0V
I(IC)
V(IC:-)
Evaluation circuit
U2
DGT15J321_P
IC
0Adc
VGE U1
15Vdc GT15J321
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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8. Comparison Graph
Simulation result
Comparison table
Test condition: VGE =15 (V)
VCE (V)
Ic(A) %Error
Measurement Simulation
1 0.915 0.956 4.51
2 1.050 1.060 0.96
5 1.330 1.314 -1.23
10 1.650 1.648 -0.13
15 1.900 1.916 0.85
20 2.150 2.148 -0.09
25 2.380 2.369 -0.45
30 2.600 2.605 0.19
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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9. Output Characteristics
Circuit Simulation result
50A
40A
30A
20V 15V 9V
20A
8V
10A
VGE=7V
0A
0V 1.0V 2.0V 3.0V 4.0V 5.0V
I(R1)
V_VCE
Evaluation circuit
R1
0.001m
U2
DGT15J321_P VCE
5Vdc
VGE U1
0 GT15J321
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
9

10. FWD Forward Current Characteristics
Circuit Simulation result
30A
25A
20A
15A
10A
5A
0A
0V 0.4V 0.8V 1.2V 1.6V 2.0V
I(Vsense)
V(EC)
Evaluation circuit
Vsense
V1
EC
0Vdc
U2 0Vdc
DGT15J321_P
V2 U1
GT15J321
0
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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11. Comparison Graph
Simulation result
Comparison table
VF (V)
IF(A) %Error
Measurement Simulation
1 1.090 1.093 0.23
2 1.170 1.162 -0.71
5 1.260 1.269 0.73
10 1.375 1.377 0.11
15 1.460 1.459 -0.08
20 1.538 1.531 -0.46
25 1.600 1.598 -0.15
30 1.655 1.661 0.34
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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12. Reverse Recovery Characteristics
Circuit Simulation result
15A
0A
-5A
5.04us 5.12us 5.20us 5.28us 5.36us 5.44us
I(FWD)
Time
Evaluation circuit
L2
1 2
2.82uH
U4
DGT15J321_P
RG2
-VGE
FWD
15Vdc 43 U3 L1
GT15J321 20mH
2 1
IC = 15
C VCE
300
U2
Rg DGT15J321_P
V1 = 0
V2 = 15
TD = 5u V1 43
TR = 10n U1
TF = 10n GT15J321
PW = 4.998u
PER = 100u
0
Test condition: VCC=300 (V), IF=15 (A), –di/dt=100 A/usec
Parameter Unit Measurement Simulation %Error
trr ns 110.000 109.505 -0.450
Irr A 4.200 4.164 -0.857
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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