ERAP develops integrated automatic test equipment, special test equipment, radar signal simulators, and simulation and training software. It also produces ground support equipment to test components, inspect aircraft and vehicles, and diagnose issues. ERAP offers reliability testing systems for semiconductors, power modules, and photovoltaic cells to evaluate performance under different temperature and electrical conditions.

1. www.ERAPKOREA.co.kr
• Integrated Automatic Test Equipment (ATE) dev.
• Special Exclusive Test Equipment (STE) dev.
• Radar Signal Simulator dev.
• Simulator & CBT dev.
GSE

2. ERAP GSE
Equipment test sets diagnose LRU and SRU functions, and also check their errors in
aeronautic electronic and ground artillery systems. The equipment selectively verifies
and validates OFP installed in LRU.
It is built in open modular design to carry out most efficient compatibility for VXI
or PXI products. Furthermore, various options are available including analog signals,
digital signals, RF, and video signal generation. In certain circumstance, the system
can be integrated with power and air coolant.
Ground Support Equipment

3. ERAP’s GSE
1. GSE (Ground Support Equipment) design, development, and manufacturing to
perfom component test, inspection, and diagnosis for aircrafts, helicopters,
tanks, and radar etc.
2. Custom manufacturing to make a LRU test quicker and more accurate
3. High reliability with AS 9100/ 9110 certifications
4. Utilization of advanced convergence technology including radar signal
processing etc.
5. Factory, deposit, and intermediate-level tests of LRU and SRU
ERAP’s ATE
1. Integrated automatic test equipment
to provide total solutions
2. Design concept of commercial COTS
(Commercial-Off-The Shelf) adopted
by U.S. DOD
3. Interworking with high-tech
electronic communication systems in
the aerospace industry
4. Accuracy, stability, and reliability
assurance through integrated tests,
self-simulation, and diagnostic
software
5. High-technology applicable to high
precision ATE used in state-of-the-art
industries
ERAP’s STE
1. Exclusive test equipments for specific
units and module
2. Analysis of a power signal, types of
applied signals, and expected output
values etc. after circuit analysis of the
UUT (units under test),
3. Semiautomatic or manual test
equipments with built-in a power
supply, measuring instruments, and
necessary special circuits
4. Initial cost minimization compared
with universal test equipments

4. ERAP GSE
LRU list for MRO capability by ARATSTM
4500
Total Solution System
for Engineering Development, Production, and I & D Level MRO
1 Accelerometer Assy 17 Color Multi-function Display System (type B only)
2 Distributed Air Data Module 18 DTS (w/ unit cartridge)
3 Control Stick Transducer 19 Fault Data Recorder
4 Flight Control Test/Flutter Panel 20 Head-up Display
5 Flight Control Computer 21 Interference Blanker Unit
6 Probe Heater Monitor 22 Identification Friend or Foe
7 Rate Gyro Assembly 23 Inertial Navigation System/GPS
8 Rudder/Brake Pedal Transducer Assy 24 Intercom with Video Multiplexer Unit
9 Total Air Temperature Sensor 25 Instrument Landing System
10 Multi-function Air Data Cones 26 Multi-Function Display
11 Control Stick Grip 27 RADAR
12 Throttle 28 RADAR Altimeter
13 Throttle Grip 29 RADAR Warning Receiver
14 ECS Controller 30 Stores Management System
15 Advanced Data Processor (Mission Computer) 31 TACAN
16 Airborne Video Tape Recorder 32 UHF/VHF
GSE Military
ARATSTM
4500

5. Applicable Platforms
Nomenclature Model
COMM UHF AN/ARC-187
U/VHF TALON RT-8105
HF HF-9500
TELETYPE MDM-2201
DATALINK CONVERTER MDM-2202
AN/ASQ-ICS AN/AIC-39
Emergency Transmitter AN/PRT-5
Crash Locator System AN/URT-26
NAV INS/SPS LN-100G
Avionics Management System FMS-800
TACAN AN/ARN-118
VOR AN/ARN-147
Radar Altimeter AN/APN-194
UHF-DF OTPI DF-430
LF-DF(ADF) ADF-206
FDI MFD-225
HSI MFD-225
DATA Digital Computer SET IDHS
Magnetic Tape Transport MDLR
Tactical Display(TACCO,SS3) 20.1” AMLCD
Tactical Display(Pilot) 10” AMLCD
Time Code Generator 9150-3053
Key Sets Keyboard
Data Entry Panel 13” AMLCD
Printer Printer
Tactical Display Group 20.1” AMLCD
NAV AFCS AFCS
RAWS AN/APQ-107
Air Data Computer ADC-2000
IFF AN/APX-76, 100
N.AUD MAD/SAD AN/ASQ-508
RADAR EL/M-2022A(V)3
ESM AN/ALR-95(V)1
EO/IRDS AN/AAQ-22
AUD Sono Signal Processor AN/AQS-970
CEMP
Sono Receiver AN/ARR-502
Acoustic Test Signal Generator X
CASS Generator AN/ASA-76A
Analog Tape Recorder/Rep. AN/AQH-13
ARM Harpoon Launch System Weapon Management System
Torpedo Presetter Torpedo Pre. Panel
ARATSTM
Series
T/A-50
UH-60 F-16

6. ERAP GSE
RWR Software Support System
GSE Military
Main Functions
Features
UUT (Unit Under Test)
EUT simulation parameters
• Radar signal simulation system for RWR
(Radar Warning Receiver) of helicopters
such as UH-60 and AH-64 etc.
• Generating and uploading the emitter of
RWR equipment mounted on the UH-60
helicopters.
• Enemy threat detection by generating
simulated radar signals to the RWR set
on the test bench
• Easy-to-use operating program
• Simulation up to 40GHz radar signal
• Windows-based EID (Emitter Identification
Data) processing program
• Self-test function
• UPS system
• Easy maintenance due to modular
hardware design
• Printable EID data (coding sheet,
ambiguity report)
• Test Program Language and Tool :
Labview, Visual C
AH-1S, AH-64A/D, CH-47D, MH-47E, UH-
60A/L, UH-1N, UH-60Q, MH-60K, OH-58C/D
Stable, Stagger, Switcher, Jitter
RWR (Model APR-39A(V)3 and etc
Application for Tacktical Operation
UH-60
Ah-1S
ARATSTM
1500RF

7. KT-1/KA-1 Basic / Attack Trainer Total Test Equipment
Main Functions
Features
UUT (Unit Under Test)
Automatic test system for various avionics
parts of KA-1 aircraft. It performs manual
and automatic performance/function
inspections by microprocessor technology to
verify whether the parts are out-of-order or
in normal condition.
• Various KA-1 component test by one test
equipment.
• Printable Test reports
• LabVIEW & C language-based operating
program
Application for I & D Level MRO
KT-1, KA-1
Matrix test
equipment
Diode
Relay
DC motor driving unit
Wire assembly
Total
function
test panel
Relay / Time-delay relay
Linear actuator
Pedal controller
Navigation/Collision-avoidance lamp
Landing/taxing lamp
Ejection-seat actuator
FLAP control-handle assembly
Control stick
Liner Operator
Pedal Adjuster
Landing/Runway Light
FLAP Pilot Handle Assemble
Flight Control Matrix
Seat Actuator
Naviation/
Prevention
of collision
Indicator
Relay
KT-1
Control handle
ARATSTM
Series
ARATSTM
450

8. ERAP GSE
UUT (Unit Under Test)
EEI, EFI, DC
Application for I & D Level MRO
KT-1, KA-1
Main Function
LRU Level test equipment (SRU level expandable ) to perform maintenance and problem
troubleshooting through functional and operational tests on airborne equipments of a low-speed
controller (KO-1 controller), such as EEI, EFI & DC
Features
• Electronic air-borne equipment tester
• Supplied to 15th fighter wing
• Software: Visual C++/ LabVIEW/ Modular Design
• Hardware: VXI System/ Industrial GPIP meter/ Alink-429 Interface unit
• Operational voltage : 115, 220 or 240VAC, 47.5~63Hz
ARATSTM
3000Electronic Total Testing System
GSE Military

9. Features
Application
K1, K1A1
UUT (Unit Under Test)
Main Functions
• Automatic test system for various electric units of land
vehicles including K1/K1A1 tanks and aircrafts
• Performance test and fault detection of 16 items in 13 kinds
of electrical units/ devices
• Software for precision control
• Real-time monitoring of operating test data
• Test data storage, management and output
• Automatic pass or fail judgement
• Printable test reports
• Software-LabVIEW-based operating program/
Self-test function included
EUT name Type
Hybrid Network Box
(HNB)
Distribution Box
• Lamp Circuits
• Lamp Pressure Switch
Circuits
• Fuel Pump Circuits)
Hybrid Power
Distribution Box (HPDB)
Distribution Box (Hybrid
Power)
Turret Network Box
(TNB)
Turret Network Box
• Turret Drive Circuits
• Drift Control Circuits
• Lamp Circuits
• Elevation Rate
Amplifier Circuits
• Relay Drive Circuits
Fire Control Electronic
Box (FCEU)
Control Unit
Driver Alarm Panel
(DAP)
Panel
Driver Indicator Panel
(DIP)
Panel
Driver Control Panel
(DCP)
Panel
EUT name Type
Launcher Control Panel
(LCP)
Power Distribution
Panel (Fire Control)
Gunner Control Panel
(GCP)
Power Distribution
Panel (Fire Control)
Chief Control Panel
(CCP)
Power Distribution
Panel (Fire Control)
Switch Control
Electronic Unit (SCEU)
Switch Control Unit
Pilot Scope Electronic
Unit (PSEU)
Control Unit (Power
Supply)
Gun/Turret Drive
Electronic Unit (GTDEU)
Electronic Unit (Gun /
Turret Drive)
ARATSTM
Series
ARATSTM
2000
K1,K1A1 Tank Electric Tester
I & D Level Diagnostic TPS & MRO Support

10. ERAP GSE
K1,K1A1 Tank Gyro Tester
Features
Application K1, K1A1
UUT (Unit Under Test) Test Parameter
Main Function
Automatic test equipment of gyroscope performance
parameters in order by a computer test program
• Features
• Software for high-precision control
• High-speed control
• Instrument and control
• Measured value storage
• Calibration of measuring instruments, controller
• Real-time monitoring of operating test data
• Test data storage, management and output
• Automatic pass or fail judgement
• Printable Test reports
Gyro input volts and frequency Phrase angle
Maximum input rate Linear acceleration error
Maximum gyro output Cross coupling
Gyro AC null Starting power
Gyro output null Running power
Gyro threshold Gyro run up time
Output sensitivity Cable disconnect circuit
Output linearity Phase angle
Low frequency noise Linear acceleration error
Friction & hysteresis
GSE Military
ARATSTM
750

11. Cable Test for K1/K1A1 Tanks
ARATSTM
Series
ARATSTM
550C
FeaturesMain Function
Specifications
• Cable insulated resistance measurement
• High current transmission & characteristic
measuring
• 200ft length measurement available
• Testing system between Interface cabling
and 13 different electric line replace units
• 13 LRU testing itself and Interface testing
with cabling & harness wiring
• Diagnostic and troubleshooting
• Component measurements
• Programmable thresholds
• Programmable test methods
• Wire list programming
• Statistical data reporting
• Body conductance
• Programmable build methods
• Shorts testing
• Color graphics
• Last-circuit retest
• Mass bundle cables (up to 1096 points)
• Shortest time looping & short test
• Various adaptors (60 types)
PARAMETER LOW-VOLTAGE HIGH-VOLTAGE
MODELS Series 90-S9
Series 90-S32
Series 90L4
Series 90L8
Series 90HV-S23
Series 90HB
CAPACITY Series 90:
Up to 131,072 test points
Series 90L4
Up to 512 test points
Series 90L8
Up to1024test points
Series 90HV:
Up to 47,104 test points
Series 90H8:
Up to 512 test points
(64-point increments)
CURRENT 0.512 ma to 5.12 ma (Auto ranging) 0.512 ma to 1.0 amp
ISOLATION
(Shorts Threshold)
10 ohms to 9.5 Mohms 10 ohms to 9.5 Mohms @ 5 vdc 500
kohms to 1.00 Gohms * (*Depends on
test voltage)
CONTINUITY TEST VOLTAGE 5 vdc or 200 mvdc
ISOLATION TEST VOLTAGE 5 vdc or 200 mvdc 5 vdc to 1500 vdc or 200 mvdc
RAMP TIME N/A 40 volts to 10 kvolts per second
RESISTNACE TEST 1.11 ohm to 8.64 Mohms (ㅁ10% ㅁ 1 ohm)
CAPACITNACE TEST Standard Version: 1.11 nf to 9.09 mf (ㅁ 20%)
TEST SPEED Continuity: 500 points/sec, Component: 50 points/sec
High Current: 20 points/sec
Isolation: 20 points/ sec *
(*Plus dwell & ramp-up time)

12. ERAP GSE
Module (PV Module) Reliability Test System
Power Distribution Unit
System Summary
• Simultaneous assessment of changes in DC
output and electrical characteristic (I/V Graph)
of various photovoltaic cells.
• Highly reliable results even during the short-
term assessments by minimizing possible
errors, and increasing the degree of precision.
• Rapid tests of various conditions.
Performance & Features
• Wide-range measurement from mass
photovoltaic to small amount cells
• High speed tracking possible
• MPPT functions using electronic load
• Long-term reliability due to PXI System
application
• Measurement of I/V Curve high resolution
• Acquisition of accurate yearly/ monthly/
daily data to compare and evaluate
performance improvement with data
including characteristic curve measurement of
photovoltaic cells
Internal Side External Side
DUT (Device Under Test): Photovoltaic Cell
GSE Commercial

13. Semiconductor Power Cycle Test System
System Summary
Measurement system of changes (defects) occurring
from a long-term temperature alteration from high
to low, which is a very important factor in thermal
design of package used from the development
stage of electronic devices to application fields
utilizing superior H/W and Labview S/W capabilities
Performance & Features
• Simultaneous test for inner and outer
mounted IPM in the controller
• P/S, V/I sensor to supply current to IGBT
• Noise elimination by forming SW Module very
closely to DUT
• Application of powerful and efficient cooling
system (air-cooling)
• Independent or simultaneous tests for multi-
channel power semiconductor (IGBT, FET etc.)
• Power distribution within automatic test equipment
• Power Inlet: 3-Phase 380V ± 10% (50Amp)
• Power Outlet: 3-Phase ± 10% (More than 3 places with over 10 Amp)
Single-Phase ± 10% (More than 5 places with over 15 Amp)
• Frequency: 47~63 Hz (Considering service environment)
• 19” Rack Mount Type, 4U Size, Aluminum case
DUT (Device Under Test): Power FET

14. ERAP GSE
Power Cycle Test System
System Summary
Measurement system of changes (defects) occurring from a long-term temperature alteration
from high to low, which is a very important factor in thermal design of package used from the
development stage of electronic devices to application fields utilizing superior H/W and Labview
S/W capabilities
Performance & Features
• Simultaneous test for inner and outer mounted IPM in the controller
• P/S, V/I sensor to supply current to IGBT
• Noise elimination by forming SW Module very closely to DUT
• Application of powerful and efficient cooling system(air-cooling)
• Independent or simultaneous tests for multi-channel power semiconductor (IGBT, FET etc.)
photovoltaic cells
DUT (Device Under Test) :
Module FET Power FET
GSE Commercial

15. Thermal Shock 4-wire Test System
System Summary
• Measurement system of changes (defects)
for electrical parts occurring from their long-
term temperature alteration from high to low,
interworking with a temperature chamber.
• Test system to continuously measure, monitor,
trouble shoot multi-channel resistance.
Performance & Features
• Continuous measurement of several resistances
in order (64~256 channels)
• Application of the 4-wire resistance
measurement method
• The precision of resistance measurement with
high resolution (22bit)
• Wide range of temperature cycle measurement
(-60~160 ℃)
• Effective monitoring of resistance change
• Unconstrained channel assignment
• Set-up of test periods, measurement locations,
and storage locations
DUT (Device Under Test) : Memory Semiconductor

16. Head Office: Migun II - #212, Yongsan-dong, Yuseong-gu, Daejeon, Korea
T:+82-42-936-1968 F:+82-42-936-1978
Factory: Hansan-gil 16, Cheongbuk-myeon, Pyeongtaek-si,
Gyeonggi-do, Korea T:+82-31-684-1968 F:+ 82-31-684-1908
Seoul Office: Ace-Hi End 6, 19th Fl. 234, Beotkkot-ro, Geumcheon-gu, Seoul
T:+82-2-586-1968 F: +82-2-586-1958
e-mail: Sales@erapkorea.co.kr Website : www.erapkorea.co.kr