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Dr.Yarub A. Estaitia , Int. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 6, Issue 8, (Part - 3) August 2016, pp.29-32
www.ijera.com 29|P a g e
Enhancing the Design of VRM for Testing Magnetic Components
Dr.Yarub A. Estaitia
Al-Taif University
ABSTRACT
The aim of this work is to design, build and test a voltage regulator module circuit (VRM) that can be used to
compare the performance of different magnetic component designs. The VRM will be used to convert the input
voltage (typically 12V) to a lower level which will supply a microprocessor load e.g. the Intel Pentium. The
work will include review of VRM circuit topologies for VRM 10.1 specification. Circuit design will be
performed for available controller IC. Simulation and analysis of the circuit in PSPICE and characterization
under transient conditions, a circuit will be designed for simulating a transient load change in PSPICE.
Finally all required components will be ordered and the circuit will be built and can be used for testing of
inductors and transformers.
Keywords: PSpice, Voltage regulator, Module, testing, magnetic components
I. INTRODUCTION
The increases in microprocessor speeds
and transistor number have resulted in an increase
in current demands and transition speeds. The
supply voltages of the microprocessors have been
decreased in order to reduce power consumption.
As Intel predicted, with the continuous
advances being made with semiconductor
technology, the microprocessors need to operate at
significantly lower operating voltages, higher
currents and higher slew rates.
These low voltages, high currents and
high slew rates are the challenges imposed on
power supplies for microprocessors.
The industry standard power supply
architecture used is a dedicated DC-DC converter,
the voltage regulator module (VRM), placed close
to the microprocessor to minimize the impedance
between the VRM and the microprocessor.
Voltage regulator modules are a special
class of power converter circuits used to supply
microprocessor loads e.g. the Intel Pentium. The
VRM converts the system bus voltage (typically 12
V) to a lower level.
While current operating voltages are in the
range of 1 - 1.5 V, it is expected that the required
operating voltages in the next few years will
decrease below 1 V while increasing the drawn
current (the required current can easily exceed
100A) from the power supply in order to reduce the
power consumption while increasing the
microprocessor speed.
With such low voltage levels, one of the
main challenges of VRM design is to maintain the
constant output voltage under varying and transient
load (current) conditions, when the microprocessor
switches from one state to the other, voltage drop
spikes occur, these spikes must be limited.
The main limit is caused by the large
inductance values required to maintain ripple levels
for steady-state operation. The standard industry
solution is a multi-phase buck converter, in which
the inductance is distributed between several
phases that are controlled in parallel.
A buck derived voltage regulator module
(VRM) will be designed to satisfy these
requirements.
II. DESIGN PROCEDURE
This section summarizes a step-by-step
procedure for a 12V-to-1.3V @120A power supply
for high current and high transient speed
applications.
 Setting clock frequency
RT is an external resistor used to set the
clock frequency. This clock frequency divided by
the number of phases determines the switching
frequency per phase. The switching frequency will
be used to determine the size of the inductors and
input and output capacitors and switching losses.
RT = 

k
pFfn SW
27
5.4
1
= 

k
pFk
27
5.44854
1
= 87.55kΩ
Where 4.5 pF and 27 kΩ are internal IC component
values.
 Soft Start & Current Limit Latch off delay
times
Soft start allows the power converter to
gradually reach the initial steady state operating
point, this reduces start up stress and surges. The
RESEARCH ARTICLE OPEN ACCESS
Dr.Yarub A. Estaitia , Int. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 6, Issue 8, (Part - 3) August 2016, pp.29-32
www.ijera.com 30|P a g e
capacitor and resistor combination establish the
soft start time.
CDLY =
VID
SS
DLY
VID
V
t
R
V
A 








2
20
Where tSS is the desired soft start time of 2.5ms.
CDLY = 40nF
Choosing the closest 1 % standard capacitor
CDLY = 39nF
RDLY =
DLY
DELAY
C
t96.1
= 452kΩ
Choosing the closest 5 % standard resistor
RDLY = 470kΩ
 Inductor Selection
The choice of inductance for the inductor
determines the ripple current in the inductor. The
smaller the inductance the bigger the ripple current,
which increases the output voltage ripple and
conduction losses in the MOSFETs but the
advantages are using smaller inductors and less
total output capacitance.
L ≥
RIPPLESW
OVID
Vf
DnRV

 ))(1(
≥
mVkHz
mV
18500
))108.04(1(3.13.1


≥ 110nH
Choose inductor value
L = 105nH
IR =
Lf
DV
SW
VID

 )1(
= 22 A
IR 50% of max DC current in inductor
Inductor should not saturate at peak current of 41 A
III. DCR (DC RESISTANCE)
The DCR is used for measuring the phase
currents. A large DCR can cause excessive power
losses, while too small a value can lead to
increased measurement error.
DCR should be 1 - 1½ times droop
resistance (RO)
Use a DCR of 1.4mΩ
 Output Droop Resistance
The design requires that the regulator
output voltage measured at the CPU pins drops
when the output current increases. The specified
voltage drop corresponds to a dc output resistance
(Ro)
The output current is measured by
summing the voltage across each inductor and
passing the signal through a low-pass filter.
RO = L
XPH
CS
R
R
R

)(
RPH(X) = 


k
m
m
100
0.1
2.1
= 120kΩ
 Inductor DCR temperature correction
The Inductor’s DCR is used as the sense
element and copper wire is source of the DCR,
need to compensate for temperature changes of the
inductors winding.
Temperature coefficient of copper = 0.39 % / 0
C =
0.0039
A =
)25(
)50(
0
0
CTH
CTH
R
R
B =
)25(
)90(
0
0
CTH
CTH
R
R
Relative values of RCS for each temperature 500
C
& 900
C
r1=
))25((1
1
1  TTC
= 0.9112
r2=
))25((1
1
2  TTC
= 0.7978
Relative values for RCS1, RCS2 and RTH
rCS2 =
)()1()1(
)1()1()(
21
1221
BArABrBA
rABrBArrBA


= 0.7195
rCS1 =
22 11
1
)1(
CSCS rr
A
r
A




= 0.3795
rTH =
12
1
1
1
1
CSCS rr


= 1.075
RTH = CSTH Rr  = 118.28kΩ
k =
)(
)(
CALCULATEDTH
ACTUALTH
R
R
= 0.8455
Calculate RCS1 and RCS2
RCS1 = 1CSCS rkR  R = 35.3kΩ
RCS2 = ))()1(( 2CSCS rkkR  = 83.9kΩ
Dr.Yarub A. Estaitia , Int. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 6, Issue 8, (Part - 3) August 2016, pp.29-32
www.ijera.com 31|P a g e
Choosing closest 1 % resistor gives:
RCS1 = 35.7 kΩ
RCS2 = 84.5kΩ
 Output Offset
The Intel specification requires that at no
load the nominal output voltage of the regulator be
offset to a value lower than the nominal voltage
corresponding to the VID code.
Offset set by constant current source from FB pin
through RB
RB =
FB
ONLVID
I
VV 
=
A
VV
5.15
28.13.1 
= 1.29kΩ
Choosing closest 1 % standard resistor gives
RB = 1.3 kΩ
 COUT Selection
Ceramic Capacitance
Use 18 X 10μF 1206 capacitors
Cz = 180 μF
Bulk Capacitance
Cx(MIN) ≥ Z
VID
O
rl
O
O
C
V
I
V
Rn
IL






)(
≥ F
V
A
mV
m
AnH
180
3.1)
100
50
25.1(4
100105



= 1 mF
Cx(MAX) ≤
Z
O
V
VID
V
VID
V
O
C
L
nKR
V
V
t
V
V
RnK
L
 )1)(1( 2
22
Where k = -ln )(
V
ERR
V
V
= 5.2
* The VRM must be capable of accepting
voltage level changes of 12.5 mV steps every 5
μs, up to 36 steps (450 mV) in 180 μs
VV = 450 mV, tV = 180 μs, VERR = 2.5 mV.
Cx(MAX) ≤ F
nHmV
mVs
Vm
mVnH


180)1)
105450
25.12.543.1180
(1(
3.125.12.54
450105 2
22






Cx(MAX) ≤ 27.3mF
Use eight 560 μF Al-Poly capacitors with a typical
ESR of 5mΩ each yields Cx = 4.48 mF with an Rx
= 0.63mΩ
Lx ≤
22
QRC OZ 
≤
225.1180 2
 mF ≤ 563pF
Where Q is limited to 2 to ensure a critically
damped system.
 Power MOSFETS
Guideline is to limit power dissipation to 1
W per MOSFET
Synchronous MOSFETs
With conduction losses being dominant
The power dissipated in each synchronous
MOSFET
PSF = )(
22
])(
12
1
)[()1( SFDS
SF
R
SF
O
R
n
In
n
I
D 


= 

 m
AA
4.6])
8
224
(
12
1
)
8
120
[()108.01( 22
PSF = 1.34 W
Main MOSFETs
There are two main power dissipation
components in main MOSFETs
Switching loss per main MOSFET:
PS(MF) = ISS
MF
G
MF
OCC
SW C
n
n
R
n
IV
f 

2
= pF
AV
kHz 800
4
8
3
8
12012
5002 


= 864mW
Conduction loss per main MOSFET:
PC(MF) = )(
22
])(
12
1
)[( MFDS
MF
R
MF
O
R
n
In
n
I
D 


= 

 m
AA
23])
8
224
(
12
1
)
8
120
[(108.0 22
= 584mW
The power dissipated in each main MOSFET
PMF = 1.45 W
Dr.Yarub A. Estaitia , Int. Journal of Engineering Research and Applications www.ijera.com
ISSN: 2248-9622, Vol. 6, Issue 8, (Part - 3) August 2016, pp.29-32
www.ijera.com 32|P a g e
Figure(1) The circuit Diagram
IV. CONCLUSIONS
The overall aim of this project was to
design and build a voltage regulator module
(VRM) so it could be used to test magnetic
components. This goal was realized and switching
circuit is ready for testing of inductors. A complete
switching circuit is now fully completed and
working. This can now be used for testing of
different types and sizes of inductors and analyzing
their performance.
The future for voltage regulator module
(VRM) designers will be very demanding. As the
currents increase and voltages decrease, stricter
demands will be placed on the load line and
thermal issues will become extremely important. In
the future it is expected that the parasitic resistance
between the regulator and microprocessor will
become much more of an issue and it may be
necessary to integrate the voltage regulator onto the
microprocessor die but this will require a big
breakthrough in silicon technologies.
REFERENCES
[1]. Investigation of candidate VRM
topologies for future microprocessors,
F.C.Y. Lee and others, IEEE Transactions
on Power Electronics · December 2000,
DOI: 10.1109/63.892832 · Source: IEEE
Xplore.
[2]. Synthesis and design of integrated-
magnetic-circuit transformer for VRM
application, R. -T. Chen ; Dept. of Electr.
Eng., Nat. Taiwan Univ., Taipei, Taiwan
; Y. -Y. Chen, IEE Proceedings - Electric
Po ...> Volume:153 Issue:3.
[3]. Synthesis and design of integrated-
magnetic-circuit transformer for VRM
application R.-T. Chen and Y.-Y. Chen,
The Institution of Engineering and
Technology 2006 IEE Proceedings online
no. 20050386 doi:10.1049/ip-
epa:20050386.
[4]. Rozman, A., Fellhoelter, K., Circuit
considerations for fast sensitive, low-
voltage loads in a distributed power
system (1995), Proc. IEEE APEC'95.
[5]. Xu, P., Ye, M., Wong, P.L., and Lee,
F.C.: ‘Design of 48 V voltage regulator
modules with a novel integrated
magnetics’, IEEE Trans. Power Electron.,
2002, 17, pp. 990–998.
[6]. Chen, R.T., and Chen, Y.Y.: ‘A novel
single stage push pull converter with
integrated magnetics and ripple-free input
current’. Trans. IEEE Power Electronics
Specialist Conf., 2004, pp. 3848–3853.

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Enhancing VRM Design for Testing Magnetic Components

  • 1. Dr.Yarub A. Estaitia , Int. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 6, Issue 8, (Part - 3) August 2016, pp.29-32 www.ijera.com 29|P a g e Enhancing the Design of VRM for Testing Magnetic Components Dr.Yarub A. Estaitia Al-Taif University ABSTRACT The aim of this work is to design, build and test a voltage regulator module circuit (VRM) that can be used to compare the performance of different magnetic component designs. The VRM will be used to convert the input voltage (typically 12V) to a lower level which will supply a microprocessor load e.g. the Intel Pentium. The work will include review of VRM circuit topologies for VRM 10.1 specification. Circuit design will be performed for available controller IC. Simulation and analysis of the circuit in PSPICE and characterization under transient conditions, a circuit will be designed for simulating a transient load change in PSPICE. Finally all required components will be ordered and the circuit will be built and can be used for testing of inductors and transformers. Keywords: PSpice, Voltage regulator, Module, testing, magnetic components I. INTRODUCTION The increases in microprocessor speeds and transistor number have resulted in an increase in current demands and transition speeds. The supply voltages of the microprocessors have been decreased in order to reduce power consumption. As Intel predicted, with the continuous advances being made with semiconductor technology, the microprocessors need to operate at significantly lower operating voltages, higher currents and higher slew rates. These low voltages, high currents and high slew rates are the challenges imposed on power supplies for microprocessors. The industry standard power supply architecture used is a dedicated DC-DC converter, the voltage regulator module (VRM), placed close to the microprocessor to minimize the impedance between the VRM and the microprocessor. Voltage regulator modules are a special class of power converter circuits used to supply microprocessor loads e.g. the Intel Pentium. The VRM converts the system bus voltage (typically 12 V) to a lower level. While current operating voltages are in the range of 1 - 1.5 V, it is expected that the required operating voltages in the next few years will decrease below 1 V while increasing the drawn current (the required current can easily exceed 100A) from the power supply in order to reduce the power consumption while increasing the microprocessor speed. With such low voltage levels, one of the main challenges of VRM design is to maintain the constant output voltage under varying and transient load (current) conditions, when the microprocessor switches from one state to the other, voltage drop spikes occur, these spikes must be limited. The main limit is caused by the large inductance values required to maintain ripple levels for steady-state operation. The standard industry solution is a multi-phase buck converter, in which the inductance is distributed between several phases that are controlled in parallel. A buck derived voltage regulator module (VRM) will be designed to satisfy these requirements. II. DESIGN PROCEDURE This section summarizes a step-by-step procedure for a 12V-to-1.3V @120A power supply for high current and high transient speed applications.  Setting clock frequency RT is an external resistor used to set the clock frequency. This clock frequency divided by the number of phases determines the switching frequency per phase. The switching frequency will be used to determine the size of the inductors and input and output capacitors and switching losses. RT =   k pFfn SW 27 5.4 1 =   k pFk 27 5.44854 1 = 87.55kΩ Where 4.5 pF and 27 kΩ are internal IC component values.  Soft Start & Current Limit Latch off delay times Soft start allows the power converter to gradually reach the initial steady state operating point, this reduces start up stress and surges. The RESEARCH ARTICLE OPEN ACCESS
  • 2. Dr.Yarub A. Estaitia , Int. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 6, Issue 8, (Part - 3) August 2016, pp.29-32 www.ijera.com 30|P a g e capacitor and resistor combination establish the soft start time. CDLY = VID SS DLY VID V t R V A          2 20 Where tSS is the desired soft start time of 2.5ms. CDLY = 40nF Choosing the closest 1 % standard capacitor CDLY = 39nF RDLY = DLY DELAY C t96.1 = 452kΩ Choosing the closest 5 % standard resistor RDLY = 470kΩ  Inductor Selection The choice of inductance for the inductor determines the ripple current in the inductor. The smaller the inductance the bigger the ripple current, which increases the output voltage ripple and conduction losses in the MOSFETs but the advantages are using smaller inductors and less total output capacitance. L ≥ RIPPLESW OVID Vf DnRV   ))(1( ≥ mVkHz mV 18500 ))108.04(1(3.13.1   ≥ 110nH Choose inductor value L = 105nH IR = Lf DV SW VID   )1( = 22 A IR 50% of max DC current in inductor Inductor should not saturate at peak current of 41 A III. DCR (DC RESISTANCE) The DCR is used for measuring the phase currents. A large DCR can cause excessive power losses, while too small a value can lead to increased measurement error. DCR should be 1 - 1½ times droop resistance (RO) Use a DCR of 1.4mΩ  Output Droop Resistance The design requires that the regulator output voltage measured at the CPU pins drops when the output current increases. The specified voltage drop corresponds to a dc output resistance (Ro) The output current is measured by summing the voltage across each inductor and passing the signal through a low-pass filter. RO = L XPH CS R R R  )( RPH(X) =    k m m 100 0.1 2.1 = 120kΩ  Inductor DCR temperature correction The Inductor’s DCR is used as the sense element and copper wire is source of the DCR, need to compensate for temperature changes of the inductors winding. Temperature coefficient of copper = 0.39 % / 0 C = 0.0039 A = )25( )50( 0 0 CTH CTH R R B = )25( )90( 0 0 CTH CTH R R Relative values of RCS for each temperature 500 C & 900 C r1= ))25((1 1 1  TTC = 0.9112 r2= ))25((1 1 2  TTC = 0.7978 Relative values for RCS1, RCS2 and RTH rCS2 = )()1()1( )1()1()( 21 1221 BArABrBA rABrBArrBA   = 0.7195 rCS1 = 22 11 1 )1( CSCS rr A r A     = 0.3795 rTH = 12 1 1 1 1 CSCS rr   = 1.075 RTH = CSTH Rr  = 118.28kΩ k = )( )( CALCULATEDTH ACTUALTH R R = 0.8455 Calculate RCS1 and RCS2 RCS1 = 1CSCS rkR  R = 35.3kΩ RCS2 = ))()1(( 2CSCS rkkR  = 83.9kΩ
  • 3. Dr.Yarub A. Estaitia , Int. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 6, Issue 8, (Part - 3) August 2016, pp.29-32 www.ijera.com 31|P a g e Choosing closest 1 % resistor gives: RCS1 = 35.7 kΩ RCS2 = 84.5kΩ  Output Offset The Intel specification requires that at no load the nominal output voltage of the regulator be offset to a value lower than the nominal voltage corresponding to the VID code. Offset set by constant current source from FB pin through RB RB = FB ONLVID I VV  = A VV 5.15 28.13.1  = 1.29kΩ Choosing closest 1 % standard resistor gives RB = 1.3 kΩ  COUT Selection Ceramic Capacitance Use 18 X 10μF 1206 capacitors Cz = 180 μF Bulk Capacitance Cx(MIN) ≥ Z VID O rl O O C V I V Rn IL       )( ≥ F V A mV m AnH 180 3.1) 100 50 25.1(4 100105    = 1 mF Cx(MAX) ≤ Z O V VID V VID V O C L nKR V V t V V RnK L  )1)(1( 2 22 Where k = -ln )( V ERR V V = 5.2 * The VRM must be capable of accepting voltage level changes of 12.5 mV steps every 5 μs, up to 36 steps (450 mV) in 180 μs VV = 450 mV, tV = 180 μs, VERR = 2.5 mV. Cx(MAX) ≤ F nHmV mVs Vm mVnH   180)1) 105450 25.12.543.1180 (1( 3.125.12.54 450105 2 22       Cx(MAX) ≤ 27.3mF Use eight 560 μF Al-Poly capacitors with a typical ESR of 5mΩ each yields Cx = 4.48 mF with an Rx = 0.63mΩ Lx ≤ 22 QRC OZ  ≤ 225.1180 2  mF ≤ 563pF Where Q is limited to 2 to ensure a critically damped system.  Power MOSFETS Guideline is to limit power dissipation to 1 W per MOSFET Synchronous MOSFETs With conduction losses being dominant The power dissipated in each synchronous MOSFET PSF = )( 22 ])( 12 1 )[()1( SFDS SF R SF O R n In n I D    =    m AA 4.6]) 8 224 ( 12 1 ) 8 120 [()108.01( 22 PSF = 1.34 W Main MOSFETs There are two main power dissipation components in main MOSFETs Switching loss per main MOSFET: PS(MF) = ISS MF G MF OCC SW C n n R n IV f   2 = pF AV kHz 800 4 8 3 8 12012 5002    = 864mW Conduction loss per main MOSFET: PC(MF) = )( 22 ])( 12 1 )[( MFDS MF R MF O R n In n I D    =    m AA 23]) 8 224 ( 12 1 ) 8 120 [(108.0 22 = 584mW The power dissipated in each main MOSFET PMF = 1.45 W
  • 4. Dr.Yarub A. Estaitia , Int. Journal of Engineering Research and Applications www.ijera.com ISSN: 2248-9622, Vol. 6, Issue 8, (Part - 3) August 2016, pp.29-32 www.ijera.com 32|P a g e Figure(1) The circuit Diagram IV. CONCLUSIONS The overall aim of this project was to design and build a voltage regulator module (VRM) so it could be used to test magnetic components. This goal was realized and switching circuit is ready for testing of inductors. A complete switching circuit is now fully completed and working. This can now be used for testing of different types and sizes of inductors and analyzing their performance. The future for voltage regulator module (VRM) designers will be very demanding. As the currents increase and voltages decrease, stricter demands will be placed on the load line and thermal issues will become extremely important. In the future it is expected that the parasitic resistance between the regulator and microprocessor will become much more of an issue and it may be necessary to integrate the voltage regulator onto the microprocessor die but this will require a big breakthrough in silicon technologies. REFERENCES [1]. Investigation of candidate VRM topologies for future microprocessors, F.C.Y. Lee and others, IEEE Transactions on Power Electronics · December 2000, DOI: 10.1109/63.892832 · Source: IEEE Xplore. [2]. Synthesis and design of integrated- magnetic-circuit transformer for VRM application, R. -T. Chen ; Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Y. -Y. Chen, IEE Proceedings - Electric Po ...> Volume:153 Issue:3. [3]. Synthesis and design of integrated- magnetic-circuit transformer for VRM application R.-T. Chen and Y.-Y. Chen, The Institution of Engineering and Technology 2006 IEE Proceedings online no. 20050386 doi:10.1049/ip- epa:20050386. [4]. Rozman, A., Fellhoelter, K., Circuit considerations for fast sensitive, low- voltage loads in a distributed power system (1995), Proc. IEEE APEC'95. [5]. Xu, P., Ye, M., Wong, P.L., and Lee, F.C.: ‘Design of 48 V voltage regulator modules with a novel integrated magnetics’, IEEE Trans. Power Electron., 2002, 17, pp. 990–998. [6]. Chen, R.T., and Chen, Y.Y.: ‘A novel single stage push pull converter with integrated magnetics and ripple-free input current’. Trans. IEEE Power Electronics Specialist Conf., 2004, pp. 3848–3853.