SlideShare a Scribd company logo
1 of 47
Download to read offline
USB 3.1 Gen 2
Physical layer compliance testing and debug
4/24/2017 1
Karthik Radhakrishna
Field Applications Engineer
Agenda
 Introduction to the USB 3.1 Gen 2 ecosystem
- Defining the terminology
 Understanding the physical layer specifications
- Signaling, TX and RX parameters
 Compliance testing methodology
- Understanding the compliance test requirements and procedures
- Identifying the challenges in calibration and testing
- Automated compliance testing approach
 The Type-C connector
- Introduction to the interface and features
- Modes of operation
4/24/2017 2
The USB 3.1 Gen 2 ecosystem
4/24/2017 3
• The higher speed USB standard has
brought in newer terminology
• It is important to understand these
terms separately and also how they fit
in to the grand scheme of things
• Thorough understanding is required
for implementation and testing
approaches
Defining the terminology
 SuperSpeedPlus – Refers to the architectural layer portions of a system operating on USB 3.1 Gen 2 PHY
 Gen 2 - Gen 2 is an adjective used to refer to the Physical layer associated with a 10 Gbps signaling rate
 Connectors – Standard-A, Standard-B, Micro-A plug, Micro-AB receptacle, Micro-B, Type-C
 SigTest – Refers to the testing tool developed by the USB-IF to measure eye parameters such as Eye
height, width, Tj, Rj, Dj, UI etc. Compliance test results have to be obtained through SigTest irrespective of
the testing hardware used. The latest version is 4.0.23
 Normative and Informative – Normative parameters are those that are necessary to obtain certification.
Informative parameters are intended as guidelines for effective implementation
 Fixtures – Break out boards developed by USB-IF for compliance testing. Available on the USB-IF website
 Long channel and short channel – Long channel tests refer to the measurements performed at the end
of a reference channel as specified in the standard. For TX tests, this channel is embedded by the scope
using s-parameter templates. Short channel tests are performed without embedding.
 CTS – Compliance Test Specification which is different from the base standard. The CTS lists out all the
tests required for compliance certification and the necessary methodology
4/24/2017 4
Terminology continued…
 Type-C connector - is a 24-pin fully reversible-plug USB connector system allowing transport of data and
energy
 USB PD - USB Power Delivery enables the maximum functionality of USB by providing more flexible
power delivery along with data over a single cable
 Active cable - An Electronically Marked Cable with additional electronics to condition the data path signals
 Captive cable - A cable that is terminated on one end with a USB Type-C plug and has a vendor-specific
connect means (hardwired or custom detachable) on the opposite end
 Alternate Mode - Operation defined by a vendor or standards organization that is associated with a SVID
assigned by the USB-IF.
4/24/2017 5
4/24/2017 6
Understanding the Physical layer specifications
Gen 2 Transmitter and Receiver Architecture
4/24/2017 7
Signaling
 The Gen 2 link operates at 10Gbps and employs 128b/132b encoding
scheme
 Each block shall comprise a 4-bit Block Header and a 128-bit payload.
The 4-bit header is set to 0011b for data and 1100b for control blocks
 The PHYs (TX and RX) are required to be AC coupled
 Spread Spectrum Clocking (SSC) is enabled
 Power delivery option supports up to 100W of bus power
 Optimized Power Management states on the bus – idle, sleep and
suspend
 Standard-A and Standard-B type connectors have 2 differential pairs
 Type-C connector is bidirectional and has 4 differential pairs
4/24/2017 8
Compliance Patterns
4/24/2017 9
PLL implementation
4/24/2017 10
Fig.4 : Golden PLL for Gen 2 operations
• The Clock recovery circuits in Gen 2
receivers employ a Golden PLL to achieve
optimized tracking of jitter
• The frequency response of the PLL and
incoming data clock are shown in Fig.4
• The transfer function of the CDR is given as
• The jitter transfer function is given as
• All jitter frequencies within the 3dB cutoff
point of the CDR function are tracked by the
PLL
• The 3dB frequency for a Gen 2 Golden PLL
is specified as 15MHz
Gen 2 Transmitter requirements
 The standard specifies several normative parameters for transmitter
characterization. These include UI, differential pk-pk voltage, TX de-
emphasis, DC differential impedance, AC coupling capacitance etc.
 It also lists several informative parameters like minimum pulse width,
common mode impedance etc. which provide guidance to achieve
improved performance
 It also specifies limits for the transmitted eye mask as shown:
4/24/2017 11
Gen 2 Receiver requirements
 Configuration and initialization of a Gen 2 link involves receiver
equalization training. A spectrally rich TSEQ is used for this purpose
 The standard provides reference CTLE and DFE equalizers but the
actual equalizers are implementation specific
 The normative receiver electrical parameters include UI, RX DC
common mode impedance, LFPS threshold etc.
 The informative receiver electrical parameters include pk-pk ref voltage
after equalization, input capacitance, inherent timing error etc.
 RX must be loopback capable
 The receiver operation is tested by applying sinusoidal jitter at different
frequencies
4/24/2017 12
4/24/2017 13
PHY Compliance testing methodology
Test Fixtures – Complete set of Micro-B fixtures
4/24/2017 14
Device Fixture 1D
7.2” Mock host
5.6” CLB 7.1” CLB 8.1” CLB
Test setup for TX compliance testing
4/24/2017 15
• All transmitter compliance tests are performed at
the Test point TP1 after the reference test channel
• A reference CTLE with DC gain of -5dB and a 1-
bit DFE are used before Eye parameter
measurements as required by the compliance
standard
• For full compliance, these tests have to be
performed on SigTest software to maintain
uniformity in results with different equipment
TX LFPS testing
4/24/2017 16
- DUT transmitted
LFPS will be
captured on
Scope for analysis
- PeRT3 will send
LFPS signal prior
to DUT power up
Upon DUT
power up,
DUT will
detect
LFPS and
transmit its
own LFPS
signals
LFPS testing cont.
 Low frequency periodic signaling (LFPS) is used for side band
communication between the two ports across a link that is in a low
power link state
 Also used when link is under training
 Trigger on start of burst
 Signal level above 100 mV after power-up
 Measure parameters over first 5 bursts
 End of LFPS determined when level drops below 100 mV for 50 ns
 Burst Parameters
 Tburst, trepeat, VTX-PP-LFPS
 tPeriod, Duty Cycle, tRiseFall2080, VCM-DC-LFPS (measured from 100 ns after start to 100 ns before end)
4/24/2017 17
SSC Testing
Scope will demodulate
SSC profile from the
1010 pattern
PeRT3 will transmit
LFPS Ping to request
DUT to rotate to
transmit CP10
- After DUT power and LFPS handshake, DUT will automatically
enter TX compliance mode
- After detecting 1 LFPS ping, DUT will send CP10 (1010 pattern)
Transmitted SSC Profile
 Turn on the DUT and let it pass through to Polling.Compliance substate
 Send a PING.LFPS to the RX port of the device under test to cause the
compliance pattern to transition to CP10
 Capture the transmitted waveform on a high speed oscilloscope over a
minimum of 2,000,000 unit intervals (200 usec) at a sample interval of no
more than 12.5 ps in a single scope capture
 Compute the phase jitter for the captured waveform and apply a 60*33KHz
3 dB cutoff frequency, 40 dB/decade Low Pass Filter to the phase jitter.
 Use the filtered phase jitter to check that the SSC fundamental frequency is
between 30 and 33 KHz. Take the derivative to convert to ppm
 tSSC-FREQ-DEVIATION must vary between one of the following two ranges for each SSC cyle:
• +300/-300 and -3700/-5300 PPM
• -1700/-2300 and -3700/-5300 PPM
Transmitted Equalization test
4/24/2017 20
Figure showing a typical 3-tap equalizer used in Gen 2
Transmitters
Graphical depiction of TXEQ
Contd.
4/24/2017 21
• Gen 2 transmitters employ a 3-tap FIR-based equalizer
• For this test, the DUT needs to be put in a compliance mode and pinged to generate a CP13
pattern
• Transmit the CP13 compliance pattern on the USB port under test and capture the
transmitted waveform on a high speed oscilloscope over a minimum of 2,000,000 unit
intervals
• Repeat for CP14 and CP15 compliance patterns
• Use the SigTest Transmitter Equalization test option to read the saved waveform files for
CP13, CP14, and CP15 and compute the transmitter equalization values from these. All
transmitter equalization values must be within their specified limits
Jitter slew rate testing
4/24/2017 22
Transmitted Eye diagram test
4/24/2017 23
TP2
The Transmit Channel for
Host or Device testing is
simulated in scope software
using S-parameters
Signals are captured at TP2
at the output of the DUT
DUT
Reference channel for different connector types
4/24/2017 24
Connector Type Channel
Std-A Device Under Test >> USB 3.1 Host Fixture 1A >> SCOPE (Embed 6dB Cable + Device PCB)
SSGen2_TxComp12p2dB_Embedding.s4p
Micro-B Device Under Test >> USB 3.1 Device Fixture 1A >> SCOPE (Embed 6dB Cable + Host PCB)
SSGen2_TxComp12p2dB_Embedding.s4p
Micro-AB (Host Only) Device Under Test >> USB 3.1 Device Fixture 1A >> SCOPE (Embed 6dB Cable + Device PCB)
SSGen2_TxComp12p2dB_Embedding.s4p
Micro-AB (DRD) Device Under Test >> USB 3.1 Device Fixture 1A >> SCOPE (Embed 6dB Cable + Host/Device PCB)
SSGen2_TxComp12p2dB_Embedding.s4p
Type-C (Host) Device Under Test >> USB 3.1 Host Fixture 1C >> SCOPE (Embed 6dB Cable + Host/Device PCB)
SSGen2_TxComp12p2dB_Embedding.s4p
Type-C (Device) Device Under Test >> USB 3.1 Device Fixture 1C >> SCOPE (Embed 6dB Cable + Host/Device PCB)
SSGen2_TxComp12p2dB_Embedding.s4p
Captive (Standard A Plug) Device Under Test >> USB 3.1 Captive Cable Device Fixture Type-A >> SCOPE (Embed Host PCB)
Mock_Host_Cascaded_Model_TypeC_rspl.s8p (TBD – convert to 4p)
Captive (Standard C Plug) Device Under Test >> USB 3.1 Captive Device Fixture Type-C >> SCOPE (Embed Host PCB)
Mock_Host_Cascaded_Model_TypeC_rspl.s8p (TBD – convert to 4p)
All Types No Channel (breakout fixture only)
TX Eye diagram test procedure
4/24/2017 25
• Ping the DUT to put it in to Compliance pattern CP9. Capture the transmitted CP9 waveform over a minimum
of 2M UI with a capture rate no less than 12.5ps
• Repeat this procedure to capture 2M UI of CP10 waveform from the DUT
• Measure the Rj an compare it against the compliance spec.
• Choose the appropriate compliance channel from the table and embed to the measured waveform
• It is important to remember that the TX eye specification is defined after applying the reference equalizer and
jitter transfer function.
• Compute the data eye using CP9 using Rj as input from the CP10 waveform and compare it against
requirements for a 70 mV eye height and a 48.0 ps eye width both at 10-6 BER
• If the DUT is type-C the second differential pair is to be tested by flipping the connector or reconfiguring the
CC line
Signal Through Compliance Channel
Tx Rx
USB 3.1 Gen 2 Reference CTLE
• The Rx equalizer may be required to adapt to different channel losses using the Rx EQ training period
• The reference CTLE for Gen 2 is specified for -5dB DC gain as per the CTS
Different DC gain values are chosen
depending on channel length. For short
channel it is usually 0dB
Reference DFE
4/24/2017 28
 One bit reference DFE is to be used in transmitter compliance testing
 The limits on d1 are 0 to 50mV
 DFE might cause propagation of bit errors if CTLE fails to track an error
LeCroy SDA and Sigtest results
4/24/2017 29
Receiver Testing
4/24/2017 30
 This test verifies that the receiver properly functions in the presence of deterministic and random jitter at
multiple frequencies
 Compliance channels are defined for each connector type with 23dB of insertion loss
 The receiver is tested under loopback condition. The procedure to place a device in to loopback mode by
sending appropriate training sequences is specified in the USB 3.1 standard
 Once the device is in loopback, the BERT sends out a compliance pattern with added jitter through the
reference channels to the receiver
 The receiver loops back the same pattern and any difference to the transmitted sequence is considered a bit
error
 This test requires an extensive calibration process to tune the pattern generator to the amount of jitter to be
injected at different frequencies.
 The calibration process also includes inserting deterministic jitter through lossy compliance boards to close
the received eye to limits specified by the standard. The performance of the receiver is then tested in this
condition
Receiver Compliance Procedure
 Step 1: Calibration/Channel Setup
 Calibrate amplitude, signal conditions and jitter sources at TP1 and TP2
 Step 2: Loopback
 Put Device Under Test in loopback mode
 Step 3: Jitter Tolerance
 Sweep through specified Sj values and measure jitter tolerance based on
BER Transmit Channel
TP2
TP1
Rj and Sj calibration
4/24/2017 32
 Rj and Sj are calibrated at TP1 to limits specified in the standard
 First, the voltage swing and de-emphasis are calibrated at TP1 using a compliance pattern. The target signal
parameters are:
- Voltage swing = 800mV
- TX De-Emphasis = -1.0 +/- .1 dB, -3.1 +/- 1 dB, and -5.0 +/- .1 dB
- Fixed Pre-shoot = 2.2 +/- .1 dB
 Rj is calibrated to within 1.0 +0/-.1 ps RMS with a CP10 pattern without a reference equalizer
 Sj is calibrated to 17.0 ps +0/-10% at 100 MHz with a CP9 sequence. This step is repeated for different
frequencies of Sj from 50MHz to 500kHz at different amplitudes
Figure showing connection for Rj and Sj calibration
Eye height and width calibration
4/24/2017 33
 The purpose of this calibration is to achieve a target Eye height of 70mV +5/-0 mV and target Eye
width of 48 +2/-0 ps at the end of a lossy reference compliance channel defined as per the CTS
 Measure eye height with CP9 at a BER E-6 using the calibrated Sj and Rj values previously
determined using the reference equalizer with DFE and with the CTLE curve fixed to a DC gain of -
5 dB
 There are three compliance load boards of lengths 5.6”, 7.1” and 8.1” available from USB-IF
 The compliance standard mandates that the eye height is measured with each of these compliance
load boards in the reference channel.
 The load board which yields the eye height value closest to 70mV is chosen for the subsequent
steps during calibration and for RX jitter tolerance testing
 The de-emphasis on the pattern generator/BERT is adjusted to achieve the target eye width and
signal amplitude is adjusted to achieve the target eye height. In both cases the reference equalizer
is used
Eye height and width calibration setup
4/24/2017 34
Connector Type Calibration Channel
(Using breakout fixture to
measure at end of channel)
Test Channel
Std-A BERT >> USB 3.1 Compliance
Load Board >> 6 dB Cable >>
USB 3.1 Host Fixture 1A >> USB
3.1 Mock Host 7.2” >> SCOPE
BERT >> USB 3.1 Compliance
Load Board >> 6 dB Cable >>
USB 3.1 Host Fixture 1A >>
Host Under Test
Micro-B BERT >> USB 3.1 Compliance
Load Board >> 6 dB Cable >>
USB 3.1 Device Fixture 1A >>
USB 3.1 Mock Device 7.2” >>
SCOPE
BERT >> USB 3.1 Compliance
Load Board >> 6 dB Cable >>
USB 3.1 Device Fixture 1A >>
Device Under Test
Micro-AB (Host Only) BERT >> USB 3.1 Compliance
Load Board >> 6 dB Cable >>
USB 3.1 Device Fixture 1A >>
USB 3.1 Mock Device 7.2” >>
SCOPE
BERT >> USB 3.1 Compliance
Load Board >> 6 dB Cable >>
USB 3.1 Device Fixture 1A >>
Device Under Test
Micro-AB (DRD) BERT >> USB 3.1 Compliance
Load Board >> 6 dB Cable >>
USB 3.1 Device Fixture 1A >>
USB 3.1 Mock Device 7.2” >>
SCOPE
BERT >> USB 3.1 Compliance
Load Board >> 6 dB Cable >>
USB 3.1 Device Fixture 1A >>
Device Under Test
RX Jitter tolerance testing
4/24/2017 35
 Connect the DUT as shown in the setup diagram below. Use the De-Emphasis and signal
amplitude found during the eye calibration sequence and Sj of 100MHz
 Place the DUT in loopback using the protocol state machine specified in the standard
 Transmit a “modified” CP9 sequence from the signal source for a total of 2 minutes. The modified
CP9 pattern starts with a SYNC ordered set. Then data blocks are added and scrambled with the
USB10G specific PRBS-23 scrambler polynomial. A single SKP ordered set with 20SKP symbols
(192 bits) must be inserted in the sequence every 40 blocks. At least 65536 data blocks must be
sent before the pattern is repeated
 The test is considered a failure if more than 1 bit error is encountered over 10^12 bits
 The BERT instrument must be capable of removing the SKP sequences from the incoming data
stream
 This test is repeated for different frequencies of Sj
Jitter tolerance test setup
4/24/2017 36
Table showing different Sj frequencies and the amplitudes
Test setup for short channel JTOL testing. All calibrations
have to be repeated for this channel
QPHY USB 3.1 Automated compliance test software
4/24/2017 37
 QPHY-USB3.1-Tx-Rx offers fully automated transmitter and receiver
testing
 Support for both Gen1 (5 Gb/s) and Gen2 (10 Gb/s) DUTs
 Automatically change DUT compliance patterns using the PeRT3 -
QPHY-USB3.1-Tx-Rx can control the PeRT3 communication with
the DUT on the protocol layer by sending a specific number of
Ping.LFPS commands in order to stimulate it to output the required
CP for each test
 QPHY-USB3-Tx-Rx provides full reporting capability including
Pass/Fail indications and screenshots from pertinent test
 Eye Doctor™ II Advanced Signal Integrity Tools enable channel
emulation and CTLE/DFE equalization
 SDAIII-CompleteLinQ enables simultaneous analysis of multiple
points in the USB 3.1 channel
The PERT3 - Phoenix
4/24/2017 38
 PERT3 – Protocol Enabled Receiver Transmitter Tolerance Tester. It is a Bit Error
Rate tester with protocol aware capabilities
 True protocol handshake support in PeRT3 for loopback initialization and TSEQ
training during receiver compliance testing
 Jitter Tolerance Testing for characterization
 Built in 3 tap de-emphasis generator
 User defined test scripting functions for jitter tolerance, equalization optimization
search, and multi-parameter sweep testing
 In-built Rj, Sj, CM and DM sources to provide single box calibration and testing
solution for multiple serial protocols
 PeRT3 Phoenix System also offers true SKP symbol injections and SKP filtering
during BER testing, as well as 128b/132b pattern generation and detection
USB 3.1 - Required Test Equipment for PHY testing
 Oscilloscope
 16 GHz with 80 GS/s
 WaveMaster 816Zi-B or WaveMaster 816Zi-A with WM8Zi-2x80GS
 Software
 QPHY-USB3.1-Tx-Rx, SDAIII, and EyeDrII
 Upgrade option (RK-USB3-USB3.1) for existing QPHY-USB3-Tx-RX customers
 Receiver Tester
 PeRT3 Phoenix Platform,10G option for PeRT3 Phoenix, Receiver Tolerance Test
Suite, USB 3.0 Receiver Tolerance Test Suite and USB 3.1 Receiver Tolerance
Test Suite
 Test Fixtures
 Can be ordered from USB-IF (Custom fixtures for FYI testing)
4/24/2017 39
4/24/2017 40
The Type-C connector
Image courtesy of laptopmag.com. All rights reserved
Image courtesy laptopmag.com, All rights reserved
Type-C connector
 USB Type-C, commonly known as USB-C, is a 24-pin fully reversible plug connector system
allowing transport of data and energy
 A device that implements USB-C may not necessarily support USB 3.1 or USB Power delivery
 Unique cable architecture having same connector on both sides to plug in to either host or
device
 The connector provides four power/ground pairs, two differential pairs for non-SuperSpeed data
(though only one pair is populated in a USB-C cable) and four pairs for SuperSpeed data
 Devices with Type-C ports may be hosts or devices depending on what is detected at the other
end. These types of ports are called Dual-Role-Data (DRD)
 Dual role devices supporting power delivery may swap data and power roles, for example, a
data host might act as a power sink
4/24/2017 41
USB-C connector pin-out
4/24/2017 42
Pin Name Description Pin Name Description
A1 GND Ground return B12 GND Ground return
A2 SSTXp1
SuperSpeed
differential pair #1,
TX, positive
B11 SSRXp1
SuperSpeed
differential pair #2,
RX, positive
A3 SSTXn1
SuperSpeed
differential pair #1,
TX, negative
B10 SSRXn1
SuperSpeed
differential pair #2,
RX, negative
A4 VBUS Bus power B9 VBUS Bus power
A5 CC1
Configuration
channel
B8 SBU2
Sideband use
(SBU)
A6 Dp1
Non-SuperSpeed
differential pair,
position 1, positive
B7 Dn2
Non-SuperSpeed
differential pair,
position 2, negative
A7 Dn1
Non-SuperSpeed
differential pair,
position 1, negative
B6 Dp2
Non-SuperSpeed
differential pair,
position 2, positive
A8 SBU1
Sideband use
(SBU)
B5 CC2
Configuration
channel
A9 VBUS Bus power B4 VBUS Bus power
A10 SSRXn2
SuperSpeed
differential pair #4,
RX, negative
B3 SSTXn2
SuperSpeed
differential pair #3,
TX, negative
A11 SSRXp2
SuperSpeed
differential pair #4,
RX, positive
B2 SSTXp2
SuperSpeed
differential pair #3,
TX, positive
A12 GND Ground return B1 GND Ground return
USB-C receptacle
USB-C plug
Modes of operation
 Audio Adapter Accessory mode - USB-C plug supports analog headsets through an audio adapter
accessory with a 3.5 mm socket providing four standard analog audio signals (Left, Right, Mic, and GND).
The presence of the audio accessory is signalled through the configuration channel and VCONN
 Alternate mode
- An Alternate Mode dedicates some of the physical wires in a USB-C 3.1 cable for direct device-to-host transmission of
alternate data protocols
- The four high-speed lanes, two side-band pins, and (for dock, detachable device and permanent cable applications
only) two non-SuperSpeed data pins and one configuration pin can be used for alternate mode transmission
- The modes are configured using vendor-defined messages (VDM) through the configuration channel
 The available Alt modes are:
• Display Port Alternate mode
• MHL Alternate mode
• Thunderbird Alternate mode
• HDMI Alternate mode
 Other protocols such as PCIe and Base-T internet are being discussed
4/24/2017 43
DP 1.3 over USB Type-C – A case study
4/24/2017 44
Some USB-C interfaces
4/24/2017 45
Image courtesy of Choetech
Copyright ©2017 CHOETECH TECHNOLOGY
All Rights Reserved
Image courtesy of Satechi
©Satechi 2014 All Rights Reserved
Image courtesy of Apple Inc.
Copyright © 2017 Apple Inc. All rights reserved.
USB - PD
 The GRL-USB-PD software is a compliance package developed by Granite
River Labs which is now compatible with Teledyne LeCroy oscilloscopes
 The GRL-USB-PD-C1 Type-C hardware test controller is used to automate the
test process
 Performs testing as per chapters 5,6 and 7 of the compliance spec
 Supports USB Power Delivery Protocol, Compliance, Decode, and Debug along
with Electrical Measurements
 The Voyager M310C is Teledyne LeCroy’s USB protocol verification system
designed for the latest evolution of universal serial bus, USB Type-C, and
includes support for USB Power Delivery
4/24/2017 46
4/24/2017 47
Questions?

More Related Content

What's hot

Design of embedded systems
Design of embedded systemsDesign of embedded systems
Design of embedded systemsPradeep Kumar TS
 
Introduction to embedded system design
Introduction to embedded system designIntroduction to embedded system design
Introduction to embedded system designMukesh Bansal
 
Soc architecture and design
Soc architecture and designSoc architecture and design
Soc architecture and designSatya Harish
 
Arduino Interfacing with different sensors and motor
Arduino Interfacing with different sensors and motorArduino Interfacing with different sensors and motor
Arduino Interfacing with different sensors and motorAmarjeetsingh Thakur
 
Introduction to ESP32 Programming [Road to RIoT 2017]
Introduction to ESP32 Programming [Road to RIoT 2017]Introduction to ESP32 Programming [Road to RIoT 2017]
Introduction to ESP32 Programming [Road to RIoT 2017]Alwin Arrasyid
 
Esp8266 NodeMCU
Esp8266 NodeMCUEsp8266 NodeMCU
Esp8266 NodeMCUroadster43
 
ESP32 IoT presentation @ dev.bg
ESP32 IoT presentation @ dev.bgESP32 IoT presentation @ dev.bg
ESP32 IoT presentation @ dev.bgMartin Harizanov
 
ASIP (Application-specific instruction-set processor)
ASIP (Application-specific instruction-set processor)ASIP (Application-specific instruction-set processor)
ASIP (Application-specific instruction-set processor)Hamid Reza
 
Serial Communication Interfaces
Serial Communication InterfacesSerial Communication Interfaces
Serial Communication Interfacesanishgoel
 
Processors used in System on chip
Processors used in System on chip Processors used in System on chip
Processors used in System on chip A B Shinde
 
Unit 4 _ ARM Processors .pptx
Unit 4 _ ARM Processors .pptxUnit 4 _ ARM Processors .pptx
Unit 4 _ ARM Processors .pptxVijayKumar201823
 
Timing Analysis
Timing AnalysisTiming Analysis
Timing Analysisrchovatiya
 
Introduction to Arduino and Hands on to Iot
Introduction to Arduino and Hands on to IotIntroduction to Arduino and Hands on to Iot
Introduction to Arduino and Hands on to IotSachin S
 

What's hot (20)

Design of embedded systems
Design of embedded systemsDesign of embedded systems
Design of embedded systems
 
Introduction to embedded system design
Introduction to embedded system designIntroduction to embedded system design
Introduction to embedded system design
 
SoC Design
SoC DesignSoC Design
SoC Design
 
Soc architecture and design
Soc architecture and designSoc architecture and design
Soc architecture and design
 
ARM CORTEX M3 PPT
ARM CORTEX M3 PPTARM CORTEX M3 PPT
ARM CORTEX M3 PPT
 
DSP by FPGA
DSP by FPGADSP by FPGA
DSP by FPGA
 
Arduino Interfacing with different sensors and motor
Arduino Interfacing with different sensors and motorArduino Interfacing with different sensors and motor
Arduino Interfacing with different sensors and motor
 
Introduction to ESP32 Programming [Road to RIoT 2017]
Introduction to ESP32 Programming [Road to RIoT 2017]Introduction to ESP32 Programming [Road to RIoT 2017]
Introduction to ESP32 Programming [Road to RIoT 2017]
 
Esp8266 NodeMCU
Esp8266 NodeMCUEsp8266 NodeMCU
Esp8266 NodeMCU
 
ESP32 IoT presentation @ dev.bg
ESP32 IoT presentation @ dev.bgESP32 IoT presentation @ dev.bg
ESP32 IoT presentation @ dev.bg
 
ARM Processors
ARM ProcessorsARM Processors
ARM Processors
 
ASIP (Application-specific instruction-set processor)
ASIP (Application-specific instruction-set processor)ASIP (Application-specific instruction-set processor)
ASIP (Application-specific instruction-set processor)
 
Serial Communication Interfaces
Serial Communication InterfacesSerial Communication Interfaces
Serial Communication Interfaces
 
Processors used in System on chip
Processors used in System on chip Processors used in System on chip
Processors used in System on chip
 
Unit 4 _ ARM Processors .pptx
Unit 4 _ ARM Processors .pptxUnit 4 _ ARM Processors .pptx
Unit 4 _ ARM Processors .pptx
 
Pcie basic
Pcie basicPcie basic
Pcie basic
 
Timing Analysis
Timing AnalysisTiming Analysis
Timing Analysis
 
Introduction to PROFINET - Derek Lane of Wago
Introduction to PROFINET -  Derek Lane of WagoIntroduction to PROFINET -  Derek Lane of Wago
Introduction to PROFINET - Derek Lane of Wago
 
Real-Time Operating Systems
Real-Time Operating SystemsReal-Time Operating Systems
Real-Time Operating Systems
 
Introduction to Arduino and Hands on to Iot
Introduction to Arduino and Hands on to IotIntroduction to Arduino and Hands on to Iot
Introduction to Arduino and Hands on to Iot
 

Similar to USB 3.1 Gen 2 Physical layer compliance testing and debug

Automotive Ethernet: Physical Layer Compliance Testing Webinar Slides
Automotive Ethernet: Physical Layer Compliance Testing Webinar SlidesAutomotive Ethernet: Physical Layer Compliance Testing Webinar Slides
Automotive Ethernet: Physical Layer Compliance Testing Webinar Slidesteledynelecroy
 
4 g lte_drive_test_parameters
4 g lte_drive_test_parameters4 g lte_drive_test_parameters
4 g lte_drive_test_parametersAryan Chaturanan
 
LTE-Advanced Physical Layer
LTE-Advanced Physical LayerLTE-Advanced Physical Layer
LTE-Advanced Physical LayerPraveen Kumar
 
Adc lab
Adc labAdc lab
Adc labxyxz
 
Blueoptics bo25k859s2d 40gbase-sr4 qsfp transceiver 4x850nm 150 meter multimo...
Blueoptics bo25k859s2d 40gbase-sr4 qsfp transceiver 4x850nm 150 meter multimo...Blueoptics bo25k859s2d 40gbase-sr4 qsfp transceiver 4x850nm 150 meter multimo...
Blueoptics bo25k859s2d 40gbase-sr4 qsfp transceiver 4x850nm 150 meter multimo...CBO GmbH
 
Drive Test and Optimization Tutorial - I.pdf
Drive Test and Optimization Tutorial - I.pdfDrive Test and Optimization Tutorial - I.pdf
Drive Test and Optimization Tutorial - I.pdfhamdi_saif
 
4G-Fourth Generation Mobile Communication System
4G-Fourth Generation Mobile Communication System4G-Fourth Generation Mobile Communication System
4G-Fourth Generation Mobile Communication SystemSafaet Hossain
 
4G_Drive_Test_Parameters
4G_Drive_Test_Parameters4G_Drive_Test_Parameters
4G_Drive_Test_ParametersAmir Khan
 
4G_Drive_Test_Parameter (RSRP/RSRQ).pptx
4G_Drive_Test_Parameter (RSRP/RSRQ).pptx4G_Drive_Test_Parameter (RSRP/RSRQ).pptx
4G_Drive_Test_Parameter (RSRP/RSRQ).pptxSuguKumar14
 
Cross-Layer Design of Raptor Codes for Video Multicast over 802.11n MIMO Chan...
Cross-Layer Design of Raptor Codes for Video Multicast over 802.11n MIMO Chan...Cross-Layer Design of Raptor Codes for Video Multicast over 802.11n MIMO Chan...
Cross-Layer Design of Raptor Codes for Video Multicast over 802.11n MIMO Chan...Berna Bulut
 
PAM4 Analysis and Measurement Webinar Slidedeck
PAM4 Analysis and Measurement Webinar SlidedeckPAM4 Analysis and Measurement Webinar Slidedeck
PAM4 Analysis and Measurement Webinar Slidedeckteledynelecroy
 
PAM4 Analysis and Measurement Considerations Webinar
PAM4 Analysis and Measurement Considerations WebinarPAM4 Analysis and Measurement Considerations Webinar
PAM4 Analysis and Measurement Considerations WebinarHilary Lustig
 
Globecom 2015: Adaptive Raptor Carousel for 802.11
Globecom 2015: Adaptive Raptor Carousel for 802.11Globecom 2015: Adaptive Raptor Carousel for 802.11
Globecom 2015: Adaptive Raptor Carousel for 802.11Andrew Nix
 
L2 MAC LTE PROCEDURES revC
L2 MAC LTE PROCEDURES revCL2 MAC LTE PROCEDURES revC
L2 MAC LTE PROCEDURES revCVincent Daumont
 
Wcdma radio functionality
Wcdma radio functionalityWcdma radio functionality
Wcdma radio functionalityRiadh Bachrouch
 

Similar to USB 3.1 Gen 2 Physical layer compliance testing and debug (20)

Automotive Ethernet: Physical Layer Compliance Testing Webinar Slides
Automotive Ethernet: Physical Layer Compliance Testing Webinar SlidesAutomotive Ethernet: Physical Layer Compliance Testing Webinar Slides
Automotive Ethernet: Physical Layer Compliance Testing Webinar Slides
 
4 g lte_drive_test_parameters
4 g lte_drive_test_parameters4 g lte_drive_test_parameters
4 g lte_drive_test_parameters
 
LTE-Advanced Physical Layer
LTE-Advanced Physical LayerLTE-Advanced Physical Layer
LTE-Advanced Physical Layer
 
Adc lab
Adc labAdc lab
Adc lab
 
Zigbee 802-15-4
Zigbee 802-15-4Zigbee 802-15-4
Zigbee 802-15-4
 
E nodeb
E nodebE nodeb
E nodeb
 
Blueoptics bo25k859s2d 40gbase-sr4 qsfp transceiver 4x850nm 150 meter multimo...
Blueoptics bo25k859s2d 40gbase-sr4 qsfp transceiver 4x850nm 150 meter multimo...Blueoptics bo25k859s2d 40gbase-sr4 qsfp transceiver 4x850nm 150 meter multimo...
Blueoptics bo25k859s2d 40gbase-sr4 qsfp transceiver 4x850nm 150 meter multimo...
 
Drive Test and Optimization Tutorial - I.pdf
Drive Test and Optimization Tutorial - I.pdfDrive Test and Optimization Tutorial - I.pdf
Drive Test and Optimization Tutorial - I.pdf
 
4G-Fourth Generation Mobile Communication System
4G-Fourth Generation Mobile Communication System4G-Fourth Generation Mobile Communication System
4G-Fourth Generation Mobile Communication System
 
4G_Drive_Test_Parameters
4G_Drive_Test_Parameters4G_Drive_Test_Parameters
4G_Drive_Test_Parameters
 
4G_Drive_Test_Parameter (RSRP/RSRQ).pptx
4G_Drive_Test_Parameter (RSRP/RSRQ).pptx4G_Drive_Test_Parameter (RSRP/RSRQ).pptx
4G_Drive_Test_Parameter (RSRP/RSRQ).pptx
 
VLinkSys.ppt
VLinkSys.pptVLinkSys.ppt
VLinkSys.ppt
 
Cross-Layer Design of Raptor Codes for Video Multicast over 802.11n MIMO Chan...
Cross-Layer Design of Raptor Codes for Video Multicast over 802.11n MIMO Chan...Cross-Layer Design of Raptor Codes for Video Multicast over 802.11n MIMO Chan...
Cross-Layer Design of Raptor Codes for Video Multicast over 802.11n MIMO Chan...
 
PAM4 Analysis and Measurement Webinar Slidedeck
PAM4 Analysis and Measurement Webinar SlidedeckPAM4 Analysis and Measurement Webinar Slidedeck
PAM4 Analysis and Measurement Webinar Slidedeck
 
PAM4 Analysis and Measurement Considerations Webinar
PAM4 Analysis and Measurement Considerations WebinarPAM4 Analysis and Measurement Considerations Webinar
PAM4 Analysis and Measurement Considerations Webinar
 
MIL-STD-461G - CS
MIL-STD-461G - CSMIL-STD-461G - CS
MIL-STD-461G - CS
 
HSPA Essentials
HSPA EssentialsHSPA Essentials
HSPA Essentials
 
Globecom 2015: Adaptive Raptor Carousel for 802.11
Globecom 2015: Adaptive Raptor Carousel for 802.11Globecom 2015: Adaptive Raptor Carousel for 802.11
Globecom 2015: Adaptive Raptor Carousel for 802.11
 
L2 MAC LTE PROCEDURES revC
L2 MAC LTE PROCEDURES revCL2 MAC LTE PROCEDURES revC
L2 MAC LTE PROCEDURES revC
 
Wcdma radio functionality
Wcdma radio functionalityWcdma radio functionality
Wcdma radio functionality
 

More from teledynelecroy

Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...teledynelecroy
 
The Basics of Automotive Ethernet Webinar Slidedeck
The Basics of Automotive Ethernet Webinar SlidedeckThe Basics of Automotive Ethernet Webinar Slidedeck
The Basics of Automotive Ethernet Webinar Slidedeckteledynelecroy
 
Webinar: Practical DDR Testing for Compliance, Validation and Debug
Webinar: Practical DDR Testing for Compliance, Validation and DebugWebinar: Practical DDR Testing for Compliance, Validation and Debug
Webinar: Practical DDR Testing for Compliance, Validation and Debugteledynelecroy
 
Webinar Slides: Measurements and Analysis for Switched-mode Power Designs
Webinar Slides: Measurements and Analysis for Switched-mode Power DesignsWebinar Slides: Measurements and Analysis for Switched-mode Power Designs
Webinar Slides: Measurements and Analysis for Switched-mode Power Designsteledynelecroy
 
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and Why
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and WhyWebinar Slides: Probing Techniques and Tradeoffs – What to Use and Why
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and Whyteledynelecroy
 
Webinar Slides: Digital Power Management and Power Integrity Analysis and Tes...
Webinar Slides: Digital Power Management and Power Integrity Analysis and Tes...Webinar Slides: Digital Power Management and Power Integrity Analysis and Tes...
Webinar Slides: Digital Power Management and Power Integrity Analysis and Tes...teledynelecroy
 
Webinar Slides: Probing in Power Electronics - What to use and why
Webinar Slides:  Probing in Power Electronics - What to use and whyWebinar Slides:  Probing in Power Electronics - What to use and why
Webinar Slides: Probing in Power Electronics - What to use and whyteledynelecroy
 
Making Custom Oscilloscope Measurements
Making Custom Oscilloscope MeasurementsMaking Custom Oscilloscope Measurements
Making Custom Oscilloscope Measurementsteledynelecroy
 
Insights from S-parameters
Insights from S-parametersInsights from S-parameters
Insights from S-parametersteledynelecroy
 
Eliminate Pitfalls of DDR Memory Testing
Eliminate Pitfalls of DDR Memory TestingEliminate Pitfalls of DDR Memory Testing
Eliminate Pitfalls of DDR Memory Testingteledynelecroy
 
Identifying PCIe 3.0 Dynamic Equalization Problems
Identifying PCIe 3.0 Dynamic Equalization ProblemsIdentifying PCIe 3.0 Dynamic Equalization Problems
Identifying PCIe 3.0 Dynamic Equalization Problemsteledynelecroy
 
Essentials of jitter part 1 The Time Interval Error: TIE
Essentials of jitter part 1 The Time Interval Error: TIEEssentials of jitter part 1 The Time Interval Error: TIE
Essentials of jitter part 1 The Time Interval Error: TIEteledynelecroy
 
Essentials of jitter part 3 webinar slides
Essentials of jitter part 3 webinar slidesEssentials of jitter part 3 webinar slides
Essentials of jitter part 3 webinar slidesteledynelecroy
 
Using and OMA to Optimize QAM Optical Transceivers
Using and OMA to Optimize QAM Optical TransceiversUsing and OMA to Optimize QAM Optical Transceivers
Using and OMA to Optimize QAM Optical Transceiversteledynelecroy
 
Essential principles of jitter part 2 the components of jitter
Essential principles of jitter part 2 the components of jitterEssential principles of jitter part 2 the components of jitter
Essential principles of jitter part 2 the components of jitterteledynelecroy
 

More from teledynelecroy (15)

Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...
Webinar: High Voltage Fiber Optic (HVFO) Probe for Small Signal Floating Meas...
 
The Basics of Automotive Ethernet Webinar Slidedeck
The Basics of Automotive Ethernet Webinar SlidedeckThe Basics of Automotive Ethernet Webinar Slidedeck
The Basics of Automotive Ethernet Webinar Slidedeck
 
Webinar: Practical DDR Testing for Compliance, Validation and Debug
Webinar: Practical DDR Testing for Compliance, Validation and DebugWebinar: Practical DDR Testing for Compliance, Validation and Debug
Webinar: Practical DDR Testing for Compliance, Validation and Debug
 
Webinar Slides: Measurements and Analysis for Switched-mode Power Designs
Webinar Slides: Measurements and Analysis for Switched-mode Power DesignsWebinar Slides: Measurements and Analysis for Switched-mode Power Designs
Webinar Slides: Measurements and Analysis for Switched-mode Power Designs
 
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and Why
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and WhyWebinar Slides: Probing Techniques and Tradeoffs – What to Use and Why
Webinar Slides: Probing Techniques and Tradeoffs – What to Use and Why
 
Webinar Slides: Digital Power Management and Power Integrity Analysis and Tes...
Webinar Slides: Digital Power Management and Power Integrity Analysis and Tes...Webinar Slides: Digital Power Management and Power Integrity Analysis and Tes...
Webinar Slides: Digital Power Management and Power Integrity Analysis and Tes...
 
Webinar Slides: Probing in Power Electronics - What to use and why
Webinar Slides:  Probing in Power Electronics - What to use and whyWebinar Slides:  Probing in Power Electronics - What to use and why
Webinar Slides: Probing in Power Electronics - What to use and why
 
Making Custom Oscilloscope Measurements
Making Custom Oscilloscope MeasurementsMaking Custom Oscilloscope Measurements
Making Custom Oscilloscope Measurements
 
Insights from S-parameters
Insights from S-parametersInsights from S-parameters
Insights from S-parameters
 
Eliminate Pitfalls of DDR Memory Testing
Eliminate Pitfalls of DDR Memory TestingEliminate Pitfalls of DDR Memory Testing
Eliminate Pitfalls of DDR Memory Testing
 
Identifying PCIe 3.0 Dynamic Equalization Problems
Identifying PCIe 3.0 Dynamic Equalization ProblemsIdentifying PCIe 3.0 Dynamic Equalization Problems
Identifying PCIe 3.0 Dynamic Equalization Problems
 
Essentials of jitter part 1 The Time Interval Error: TIE
Essentials of jitter part 1 The Time Interval Error: TIEEssentials of jitter part 1 The Time Interval Error: TIE
Essentials of jitter part 1 The Time Interval Error: TIE
 
Essentials of jitter part 3 webinar slides
Essentials of jitter part 3 webinar slidesEssentials of jitter part 3 webinar slides
Essentials of jitter part 3 webinar slides
 
Using and OMA to Optimize QAM Optical Transceivers
Using and OMA to Optimize QAM Optical TransceiversUsing and OMA to Optimize QAM Optical Transceivers
Using and OMA to Optimize QAM Optical Transceivers
 
Essential principles of jitter part 2 the components of jitter
Essential principles of jitter part 2 the components of jitterEssential principles of jitter part 2 the components of jitter
Essential principles of jitter part 2 the components of jitter
 

Recently uploaded

Internship report on mechanical engineering
Internship report on mechanical engineeringInternship report on mechanical engineering
Internship report on mechanical engineeringmalavadedarshan25
 
Structural Analysis and Design of Foundations: A Comprehensive Handbook for S...
Structural Analysis and Design of Foundations: A Comprehensive Handbook for S...Structural Analysis and Design of Foundations: A Comprehensive Handbook for S...
Structural Analysis and Design of Foundations: A Comprehensive Handbook for S...Dr.Costas Sachpazis
 
Biology for Computer Engineers Course Handout.pptx
Biology for Computer Engineers Course Handout.pptxBiology for Computer Engineers Course Handout.pptx
Biology for Computer Engineers Course Handout.pptxDeepakSakkari2
 
High Profile Call Girls Nagpur Isha Call 7001035870 Meet With Nagpur Escorts
High Profile Call Girls Nagpur Isha Call 7001035870 Meet With Nagpur EscortsHigh Profile Call Girls Nagpur Isha Call 7001035870 Meet With Nagpur Escorts
High Profile Call Girls Nagpur Isha Call 7001035870 Meet With Nagpur Escortsranjana rawat
 
Software Development Life Cycle By Team Orange (Dept. of Pharmacy)
Software Development Life Cycle By  Team Orange (Dept. of Pharmacy)Software Development Life Cycle By  Team Orange (Dept. of Pharmacy)
Software Development Life Cycle By Team Orange (Dept. of Pharmacy)Suman Mia
 
SPICE PARK APR2024 ( 6,793 SPICE Models )
SPICE PARK APR2024 ( 6,793 SPICE Models )SPICE PARK APR2024 ( 6,793 SPICE Models )
SPICE PARK APR2024 ( 6,793 SPICE Models )Tsuyoshi Horigome
 
ZXCTN 5804 / ZTE PTN / ZTE POTN / ZTE 5804 PTN / ZTE POTN 5804 ( 100/200 GE Z...
ZXCTN 5804 / ZTE PTN / ZTE POTN / ZTE 5804 PTN / ZTE POTN 5804 ( 100/200 GE Z...ZXCTN 5804 / ZTE PTN / ZTE POTN / ZTE 5804 PTN / ZTE POTN 5804 ( 100/200 GE Z...
ZXCTN 5804 / ZTE PTN / ZTE POTN / ZTE 5804 PTN / ZTE POTN 5804 ( 100/200 GE Z...ZTE
 
Model Call Girl in Narela Delhi reach out to us at 🔝8264348440🔝
Model Call Girl in Narela Delhi reach out to us at 🔝8264348440🔝Model Call Girl in Narela Delhi reach out to us at 🔝8264348440🔝
Model Call Girl in Narela Delhi reach out to us at 🔝8264348440🔝soniya singh
 
GDSC ASEB Gen AI study jams presentation
GDSC ASEB Gen AI study jams presentationGDSC ASEB Gen AI study jams presentation
GDSC ASEB Gen AI study jams presentationGDSCAESB
 
Architect Hassan Khalil Portfolio for 2024
Architect Hassan Khalil Portfolio for 2024Architect Hassan Khalil Portfolio for 2024
Architect Hassan Khalil Portfolio for 2024hassan khalil
 
Coefficient of Thermal Expansion and their Importance.pptx
Coefficient of Thermal Expansion and their Importance.pptxCoefficient of Thermal Expansion and their Importance.pptx
Coefficient of Thermal Expansion and their Importance.pptxAsutosh Ranjan
 
Call Girls Delhi {Jodhpur} 9711199012 high profile service
Call Girls Delhi {Jodhpur} 9711199012 high profile serviceCall Girls Delhi {Jodhpur} 9711199012 high profile service
Call Girls Delhi {Jodhpur} 9711199012 high profile servicerehmti665
 
Analog to Digital and Digital to Analog Converter
Analog to Digital and Digital to Analog ConverterAnalog to Digital and Digital to Analog Converter
Analog to Digital and Digital to Analog ConverterAbhinavSharma374939
 
Porous Ceramics seminar and technical writing
Porous Ceramics seminar and technical writingPorous Ceramics seminar and technical writing
Porous Ceramics seminar and technical writingrakeshbaidya232001
 
Introduction and different types of Ethernet.pptx
Introduction and different types of Ethernet.pptxIntroduction and different types of Ethernet.pptx
Introduction and different types of Ethernet.pptxupamatechverse
 
(RIA) Call Girls Bhosari ( 7001035870 ) HI-Fi Pune Escorts Service
(RIA) Call Girls Bhosari ( 7001035870 ) HI-Fi Pune Escorts Service(RIA) Call Girls Bhosari ( 7001035870 ) HI-Fi Pune Escorts Service
(RIA) Call Girls Bhosari ( 7001035870 ) HI-Fi Pune Escorts Serviceranjana rawat
 
Introduction to IEEE STANDARDS and its different types.pptx
Introduction to IEEE STANDARDS and its different types.pptxIntroduction to IEEE STANDARDS and its different types.pptx
Introduction to IEEE STANDARDS and its different types.pptxupamatechverse
 
Study on Air-Water & Water-Water Heat Exchange in a Finned Tube Exchanger
Study on Air-Water & Water-Water Heat Exchange in a Finned Tube ExchangerStudy on Air-Water & Water-Water Heat Exchange in a Finned Tube Exchanger
Study on Air-Water & Water-Water Heat Exchange in a Finned Tube ExchangerAnamika Sarkar
 

Recently uploaded (20)

Internship report on mechanical engineering
Internship report on mechanical engineeringInternship report on mechanical engineering
Internship report on mechanical engineering
 
Structural Analysis and Design of Foundations: A Comprehensive Handbook for S...
Structural Analysis and Design of Foundations: A Comprehensive Handbook for S...Structural Analysis and Design of Foundations: A Comprehensive Handbook for S...
Structural Analysis and Design of Foundations: A Comprehensive Handbook for S...
 
Exploring_Network_Security_with_JA3_by_Rakesh Seal.pptx
Exploring_Network_Security_with_JA3_by_Rakesh Seal.pptxExploring_Network_Security_with_JA3_by_Rakesh Seal.pptx
Exploring_Network_Security_with_JA3_by_Rakesh Seal.pptx
 
Biology for Computer Engineers Course Handout.pptx
Biology for Computer Engineers Course Handout.pptxBiology for Computer Engineers Course Handout.pptx
Biology for Computer Engineers Course Handout.pptx
 
High Profile Call Girls Nagpur Isha Call 7001035870 Meet With Nagpur Escorts
High Profile Call Girls Nagpur Isha Call 7001035870 Meet With Nagpur EscortsHigh Profile Call Girls Nagpur Isha Call 7001035870 Meet With Nagpur Escorts
High Profile Call Girls Nagpur Isha Call 7001035870 Meet With Nagpur Escorts
 
Software Development Life Cycle By Team Orange (Dept. of Pharmacy)
Software Development Life Cycle By  Team Orange (Dept. of Pharmacy)Software Development Life Cycle By  Team Orange (Dept. of Pharmacy)
Software Development Life Cycle By Team Orange (Dept. of Pharmacy)
 
SPICE PARK APR2024 ( 6,793 SPICE Models )
SPICE PARK APR2024 ( 6,793 SPICE Models )SPICE PARK APR2024 ( 6,793 SPICE Models )
SPICE PARK APR2024 ( 6,793 SPICE Models )
 
ZXCTN 5804 / ZTE PTN / ZTE POTN / ZTE 5804 PTN / ZTE POTN 5804 ( 100/200 GE Z...
ZXCTN 5804 / ZTE PTN / ZTE POTN / ZTE 5804 PTN / ZTE POTN 5804 ( 100/200 GE Z...ZXCTN 5804 / ZTE PTN / ZTE POTN / ZTE 5804 PTN / ZTE POTN 5804 ( 100/200 GE Z...
ZXCTN 5804 / ZTE PTN / ZTE POTN / ZTE 5804 PTN / ZTE POTN 5804 ( 100/200 GE Z...
 
9953056974 Call Girls In South Ex, Escorts (Delhi) NCR.pdf
9953056974 Call Girls In South Ex, Escorts (Delhi) NCR.pdf9953056974 Call Girls In South Ex, Escorts (Delhi) NCR.pdf
9953056974 Call Girls In South Ex, Escorts (Delhi) NCR.pdf
 
Model Call Girl in Narela Delhi reach out to us at 🔝8264348440🔝
Model Call Girl in Narela Delhi reach out to us at 🔝8264348440🔝Model Call Girl in Narela Delhi reach out to us at 🔝8264348440🔝
Model Call Girl in Narela Delhi reach out to us at 🔝8264348440🔝
 
GDSC ASEB Gen AI study jams presentation
GDSC ASEB Gen AI study jams presentationGDSC ASEB Gen AI study jams presentation
GDSC ASEB Gen AI study jams presentation
 
Architect Hassan Khalil Portfolio for 2024
Architect Hassan Khalil Portfolio for 2024Architect Hassan Khalil Portfolio for 2024
Architect Hassan Khalil Portfolio for 2024
 
Coefficient of Thermal Expansion and their Importance.pptx
Coefficient of Thermal Expansion and their Importance.pptxCoefficient of Thermal Expansion and their Importance.pptx
Coefficient of Thermal Expansion and their Importance.pptx
 
Call Girls Delhi {Jodhpur} 9711199012 high profile service
Call Girls Delhi {Jodhpur} 9711199012 high profile serviceCall Girls Delhi {Jodhpur} 9711199012 high profile service
Call Girls Delhi {Jodhpur} 9711199012 high profile service
 
Analog to Digital and Digital to Analog Converter
Analog to Digital and Digital to Analog ConverterAnalog to Digital and Digital to Analog Converter
Analog to Digital and Digital to Analog Converter
 
Porous Ceramics seminar and technical writing
Porous Ceramics seminar and technical writingPorous Ceramics seminar and technical writing
Porous Ceramics seminar and technical writing
 
Introduction and different types of Ethernet.pptx
Introduction and different types of Ethernet.pptxIntroduction and different types of Ethernet.pptx
Introduction and different types of Ethernet.pptx
 
(RIA) Call Girls Bhosari ( 7001035870 ) HI-Fi Pune Escorts Service
(RIA) Call Girls Bhosari ( 7001035870 ) HI-Fi Pune Escorts Service(RIA) Call Girls Bhosari ( 7001035870 ) HI-Fi Pune Escorts Service
(RIA) Call Girls Bhosari ( 7001035870 ) HI-Fi Pune Escorts Service
 
Introduction to IEEE STANDARDS and its different types.pptx
Introduction to IEEE STANDARDS and its different types.pptxIntroduction to IEEE STANDARDS and its different types.pptx
Introduction to IEEE STANDARDS and its different types.pptx
 
Study on Air-Water & Water-Water Heat Exchange in a Finned Tube Exchanger
Study on Air-Water & Water-Water Heat Exchange in a Finned Tube ExchangerStudy on Air-Water & Water-Water Heat Exchange in a Finned Tube Exchanger
Study on Air-Water & Water-Water Heat Exchange in a Finned Tube Exchanger
 

USB 3.1 Gen 2 Physical layer compliance testing and debug

  • 1. USB 3.1 Gen 2 Physical layer compliance testing and debug 4/24/2017 1 Karthik Radhakrishna Field Applications Engineer
  • 2. Agenda  Introduction to the USB 3.1 Gen 2 ecosystem - Defining the terminology  Understanding the physical layer specifications - Signaling, TX and RX parameters  Compliance testing methodology - Understanding the compliance test requirements and procedures - Identifying the challenges in calibration and testing - Automated compliance testing approach  The Type-C connector - Introduction to the interface and features - Modes of operation 4/24/2017 2
  • 3. The USB 3.1 Gen 2 ecosystem 4/24/2017 3 • The higher speed USB standard has brought in newer terminology • It is important to understand these terms separately and also how they fit in to the grand scheme of things • Thorough understanding is required for implementation and testing approaches
  • 4. Defining the terminology  SuperSpeedPlus – Refers to the architectural layer portions of a system operating on USB 3.1 Gen 2 PHY  Gen 2 - Gen 2 is an adjective used to refer to the Physical layer associated with a 10 Gbps signaling rate  Connectors – Standard-A, Standard-B, Micro-A plug, Micro-AB receptacle, Micro-B, Type-C  SigTest – Refers to the testing tool developed by the USB-IF to measure eye parameters such as Eye height, width, Tj, Rj, Dj, UI etc. Compliance test results have to be obtained through SigTest irrespective of the testing hardware used. The latest version is 4.0.23  Normative and Informative – Normative parameters are those that are necessary to obtain certification. Informative parameters are intended as guidelines for effective implementation  Fixtures – Break out boards developed by USB-IF for compliance testing. Available on the USB-IF website  Long channel and short channel – Long channel tests refer to the measurements performed at the end of a reference channel as specified in the standard. For TX tests, this channel is embedded by the scope using s-parameter templates. Short channel tests are performed without embedding.  CTS – Compliance Test Specification which is different from the base standard. The CTS lists out all the tests required for compliance certification and the necessary methodology 4/24/2017 4
  • 5. Terminology continued…  Type-C connector - is a 24-pin fully reversible-plug USB connector system allowing transport of data and energy  USB PD - USB Power Delivery enables the maximum functionality of USB by providing more flexible power delivery along with data over a single cable  Active cable - An Electronically Marked Cable with additional electronics to condition the data path signals  Captive cable - A cable that is terminated on one end with a USB Type-C plug and has a vendor-specific connect means (hardwired or custom detachable) on the opposite end  Alternate Mode - Operation defined by a vendor or standards organization that is associated with a SVID assigned by the USB-IF. 4/24/2017 5
  • 6. 4/24/2017 6 Understanding the Physical layer specifications
  • 7. Gen 2 Transmitter and Receiver Architecture 4/24/2017 7
  • 8. Signaling  The Gen 2 link operates at 10Gbps and employs 128b/132b encoding scheme  Each block shall comprise a 4-bit Block Header and a 128-bit payload. The 4-bit header is set to 0011b for data and 1100b for control blocks  The PHYs (TX and RX) are required to be AC coupled  Spread Spectrum Clocking (SSC) is enabled  Power delivery option supports up to 100W of bus power  Optimized Power Management states on the bus – idle, sleep and suspend  Standard-A and Standard-B type connectors have 2 differential pairs  Type-C connector is bidirectional and has 4 differential pairs 4/24/2017 8
  • 10. PLL implementation 4/24/2017 10 Fig.4 : Golden PLL for Gen 2 operations • The Clock recovery circuits in Gen 2 receivers employ a Golden PLL to achieve optimized tracking of jitter • The frequency response of the PLL and incoming data clock are shown in Fig.4 • The transfer function of the CDR is given as • The jitter transfer function is given as • All jitter frequencies within the 3dB cutoff point of the CDR function are tracked by the PLL • The 3dB frequency for a Gen 2 Golden PLL is specified as 15MHz
  • 11. Gen 2 Transmitter requirements  The standard specifies several normative parameters for transmitter characterization. These include UI, differential pk-pk voltage, TX de- emphasis, DC differential impedance, AC coupling capacitance etc.  It also lists several informative parameters like minimum pulse width, common mode impedance etc. which provide guidance to achieve improved performance  It also specifies limits for the transmitted eye mask as shown: 4/24/2017 11
  • 12. Gen 2 Receiver requirements  Configuration and initialization of a Gen 2 link involves receiver equalization training. A spectrally rich TSEQ is used for this purpose  The standard provides reference CTLE and DFE equalizers but the actual equalizers are implementation specific  The normative receiver electrical parameters include UI, RX DC common mode impedance, LFPS threshold etc.  The informative receiver electrical parameters include pk-pk ref voltage after equalization, input capacitance, inherent timing error etc.  RX must be loopback capable  The receiver operation is tested by applying sinusoidal jitter at different frequencies 4/24/2017 12
  • 13. 4/24/2017 13 PHY Compliance testing methodology
  • 14. Test Fixtures – Complete set of Micro-B fixtures 4/24/2017 14 Device Fixture 1D 7.2” Mock host 5.6” CLB 7.1” CLB 8.1” CLB
  • 15. Test setup for TX compliance testing 4/24/2017 15 • All transmitter compliance tests are performed at the Test point TP1 after the reference test channel • A reference CTLE with DC gain of -5dB and a 1- bit DFE are used before Eye parameter measurements as required by the compliance standard • For full compliance, these tests have to be performed on SigTest software to maintain uniformity in results with different equipment
  • 16. TX LFPS testing 4/24/2017 16 - DUT transmitted LFPS will be captured on Scope for analysis - PeRT3 will send LFPS signal prior to DUT power up Upon DUT power up, DUT will detect LFPS and transmit its own LFPS signals
  • 17. LFPS testing cont.  Low frequency periodic signaling (LFPS) is used for side band communication between the two ports across a link that is in a low power link state  Also used when link is under training  Trigger on start of burst  Signal level above 100 mV after power-up  Measure parameters over first 5 bursts  End of LFPS determined when level drops below 100 mV for 50 ns  Burst Parameters  Tburst, trepeat, VTX-PP-LFPS  tPeriod, Duty Cycle, tRiseFall2080, VCM-DC-LFPS (measured from 100 ns after start to 100 ns before end) 4/24/2017 17
  • 18. SSC Testing Scope will demodulate SSC profile from the 1010 pattern PeRT3 will transmit LFPS Ping to request DUT to rotate to transmit CP10 - After DUT power and LFPS handshake, DUT will automatically enter TX compliance mode - After detecting 1 LFPS ping, DUT will send CP10 (1010 pattern)
  • 19. Transmitted SSC Profile  Turn on the DUT and let it pass through to Polling.Compliance substate  Send a PING.LFPS to the RX port of the device under test to cause the compliance pattern to transition to CP10  Capture the transmitted waveform on a high speed oscilloscope over a minimum of 2,000,000 unit intervals (200 usec) at a sample interval of no more than 12.5 ps in a single scope capture  Compute the phase jitter for the captured waveform and apply a 60*33KHz 3 dB cutoff frequency, 40 dB/decade Low Pass Filter to the phase jitter.  Use the filtered phase jitter to check that the SSC fundamental frequency is between 30 and 33 KHz. Take the derivative to convert to ppm  tSSC-FREQ-DEVIATION must vary between one of the following two ranges for each SSC cyle: • +300/-300 and -3700/-5300 PPM • -1700/-2300 and -3700/-5300 PPM
  • 20. Transmitted Equalization test 4/24/2017 20 Figure showing a typical 3-tap equalizer used in Gen 2 Transmitters Graphical depiction of TXEQ
  • 21. Contd. 4/24/2017 21 • Gen 2 transmitters employ a 3-tap FIR-based equalizer • For this test, the DUT needs to be put in a compliance mode and pinged to generate a CP13 pattern • Transmit the CP13 compliance pattern on the USB port under test and capture the transmitted waveform on a high speed oscilloscope over a minimum of 2,000,000 unit intervals • Repeat for CP14 and CP15 compliance patterns • Use the SigTest Transmitter Equalization test option to read the saved waveform files for CP13, CP14, and CP15 and compute the transmitter equalization values from these. All transmitter equalization values must be within their specified limits
  • 22. Jitter slew rate testing 4/24/2017 22
  • 23. Transmitted Eye diagram test 4/24/2017 23 TP2 The Transmit Channel for Host or Device testing is simulated in scope software using S-parameters Signals are captured at TP2 at the output of the DUT DUT
  • 24. Reference channel for different connector types 4/24/2017 24 Connector Type Channel Std-A Device Under Test >> USB 3.1 Host Fixture 1A >> SCOPE (Embed 6dB Cable + Device PCB) SSGen2_TxComp12p2dB_Embedding.s4p Micro-B Device Under Test >> USB 3.1 Device Fixture 1A >> SCOPE (Embed 6dB Cable + Host PCB) SSGen2_TxComp12p2dB_Embedding.s4p Micro-AB (Host Only) Device Under Test >> USB 3.1 Device Fixture 1A >> SCOPE (Embed 6dB Cable + Device PCB) SSGen2_TxComp12p2dB_Embedding.s4p Micro-AB (DRD) Device Under Test >> USB 3.1 Device Fixture 1A >> SCOPE (Embed 6dB Cable + Host/Device PCB) SSGen2_TxComp12p2dB_Embedding.s4p Type-C (Host) Device Under Test >> USB 3.1 Host Fixture 1C >> SCOPE (Embed 6dB Cable + Host/Device PCB) SSGen2_TxComp12p2dB_Embedding.s4p Type-C (Device) Device Under Test >> USB 3.1 Device Fixture 1C >> SCOPE (Embed 6dB Cable + Host/Device PCB) SSGen2_TxComp12p2dB_Embedding.s4p Captive (Standard A Plug) Device Under Test >> USB 3.1 Captive Cable Device Fixture Type-A >> SCOPE (Embed Host PCB) Mock_Host_Cascaded_Model_TypeC_rspl.s8p (TBD – convert to 4p) Captive (Standard C Plug) Device Under Test >> USB 3.1 Captive Device Fixture Type-C >> SCOPE (Embed Host PCB) Mock_Host_Cascaded_Model_TypeC_rspl.s8p (TBD – convert to 4p) All Types No Channel (breakout fixture only)
  • 25. TX Eye diagram test procedure 4/24/2017 25 • Ping the DUT to put it in to Compliance pattern CP9. Capture the transmitted CP9 waveform over a minimum of 2M UI with a capture rate no less than 12.5ps • Repeat this procedure to capture 2M UI of CP10 waveform from the DUT • Measure the Rj an compare it against the compliance spec. • Choose the appropriate compliance channel from the table and embed to the measured waveform • It is important to remember that the TX eye specification is defined after applying the reference equalizer and jitter transfer function. • Compute the data eye using CP9 using Rj as input from the CP10 waveform and compare it against requirements for a 70 mV eye height and a 48.0 ps eye width both at 10-6 BER • If the DUT is type-C the second differential pair is to be tested by flipping the connector or reconfiguring the CC line
  • 26. Signal Through Compliance Channel Tx Rx
  • 27. USB 3.1 Gen 2 Reference CTLE • The Rx equalizer may be required to adapt to different channel losses using the Rx EQ training period • The reference CTLE for Gen 2 is specified for -5dB DC gain as per the CTS Different DC gain values are chosen depending on channel length. For short channel it is usually 0dB
  • 28. Reference DFE 4/24/2017 28  One bit reference DFE is to be used in transmitter compliance testing  The limits on d1 are 0 to 50mV  DFE might cause propagation of bit errors if CTLE fails to track an error
  • 29. LeCroy SDA and Sigtest results 4/24/2017 29
  • 30. Receiver Testing 4/24/2017 30  This test verifies that the receiver properly functions in the presence of deterministic and random jitter at multiple frequencies  Compliance channels are defined for each connector type with 23dB of insertion loss  The receiver is tested under loopback condition. The procedure to place a device in to loopback mode by sending appropriate training sequences is specified in the USB 3.1 standard  Once the device is in loopback, the BERT sends out a compliance pattern with added jitter through the reference channels to the receiver  The receiver loops back the same pattern and any difference to the transmitted sequence is considered a bit error  This test requires an extensive calibration process to tune the pattern generator to the amount of jitter to be injected at different frequencies.  The calibration process also includes inserting deterministic jitter through lossy compliance boards to close the received eye to limits specified by the standard. The performance of the receiver is then tested in this condition
  • 31. Receiver Compliance Procedure  Step 1: Calibration/Channel Setup  Calibrate amplitude, signal conditions and jitter sources at TP1 and TP2  Step 2: Loopback  Put Device Under Test in loopback mode  Step 3: Jitter Tolerance  Sweep through specified Sj values and measure jitter tolerance based on BER Transmit Channel TP2 TP1
  • 32. Rj and Sj calibration 4/24/2017 32  Rj and Sj are calibrated at TP1 to limits specified in the standard  First, the voltage swing and de-emphasis are calibrated at TP1 using a compliance pattern. The target signal parameters are: - Voltage swing = 800mV - TX De-Emphasis = -1.0 +/- .1 dB, -3.1 +/- 1 dB, and -5.0 +/- .1 dB - Fixed Pre-shoot = 2.2 +/- .1 dB  Rj is calibrated to within 1.0 +0/-.1 ps RMS with a CP10 pattern without a reference equalizer  Sj is calibrated to 17.0 ps +0/-10% at 100 MHz with a CP9 sequence. This step is repeated for different frequencies of Sj from 50MHz to 500kHz at different amplitudes Figure showing connection for Rj and Sj calibration
  • 33. Eye height and width calibration 4/24/2017 33  The purpose of this calibration is to achieve a target Eye height of 70mV +5/-0 mV and target Eye width of 48 +2/-0 ps at the end of a lossy reference compliance channel defined as per the CTS  Measure eye height with CP9 at a BER E-6 using the calibrated Sj and Rj values previously determined using the reference equalizer with DFE and with the CTLE curve fixed to a DC gain of - 5 dB  There are three compliance load boards of lengths 5.6”, 7.1” and 8.1” available from USB-IF  The compliance standard mandates that the eye height is measured with each of these compliance load boards in the reference channel.  The load board which yields the eye height value closest to 70mV is chosen for the subsequent steps during calibration and for RX jitter tolerance testing  The de-emphasis on the pattern generator/BERT is adjusted to achieve the target eye width and signal amplitude is adjusted to achieve the target eye height. In both cases the reference equalizer is used
  • 34. Eye height and width calibration setup 4/24/2017 34 Connector Type Calibration Channel (Using breakout fixture to measure at end of channel) Test Channel Std-A BERT >> USB 3.1 Compliance Load Board >> 6 dB Cable >> USB 3.1 Host Fixture 1A >> USB 3.1 Mock Host 7.2” >> SCOPE BERT >> USB 3.1 Compliance Load Board >> 6 dB Cable >> USB 3.1 Host Fixture 1A >> Host Under Test Micro-B BERT >> USB 3.1 Compliance Load Board >> 6 dB Cable >> USB 3.1 Device Fixture 1A >> USB 3.1 Mock Device 7.2” >> SCOPE BERT >> USB 3.1 Compliance Load Board >> 6 dB Cable >> USB 3.1 Device Fixture 1A >> Device Under Test Micro-AB (Host Only) BERT >> USB 3.1 Compliance Load Board >> 6 dB Cable >> USB 3.1 Device Fixture 1A >> USB 3.1 Mock Device 7.2” >> SCOPE BERT >> USB 3.1 Compliance Load Board >> 6 dB Cable >> USB 3.1 Device Fixture 1A >> Device Under Test Micro-AB (DRD) BERT >> USB 3.1 Compliance Load Board >> 6 dB Cable >> USB 3.1 Device Fixture 1A >> USB 3.1 Mock Device 7.2” >> SCOPE BERT >> USB 3.1 Compliance Load Board >> 6 dB Cable >> USB 3.1 Device Fixture 1A >> Device Under Test
  • 35. RX Jitter tolerance testing 4/24/2017 35  Connect the DUT as shown in the setup diagram below. Use the De-Emphasis and signal amplitude found during the eye calibration sequence and Sj of 100MHz  Place the DUT in loopback using the protocol state machine specified in the standard  Transmit a “modified” CP9 sequence from the signal source for a total of 2 minutes. The modified CP9 pattern starts with a SYNC ordered set. Then data blocks are added and scrambled with the USB10G specific PRBS-23 scrambler polynomial. A single SKP ordered set with 20SKP symbols (192 bits) must be inserted in the sequence every 40 blocks. At least 65536 data blocks must be sent before the pattern is repeated  The test is considered a failure if more than 1 bit error is encountered over 10^12 bits  The BERT instrument must be capable of removing the SKP sequences from the incoming data stream  This test is repeated for different frequencies of Sj
  • 36. Jitter tolerance test setup 4/24/2017 36 Table showing different Sj frequencies and the amplitudes Test setup for short channel JTOL testing. All calibrations have to be repeated for this channel
  • 37. QPHY USB 3.1 Automated compliance test software 4/24/2017 37  QPHY-USB3.1-Tx-Rx offers fully automated transmitter and receiver testing  Support for both Gen1 (5 Gb/s) and Gen2 (10 Gb/s) DUTs  Automatically change DUT compliance patterns using the PeRT3 - QPHY-USB3.1-Tx-Rx can control the PeRT3 communication with the DUT on the protocol layer by sending a specific number of Ping.LFPS commands in order to stimulate it to output the required CP for each test  QPHY-USB3-Tx-Rx provides full reporting capability including Pass/Fail indications and screenshots from pertinent test  Eye Doctor™ II Advanced Signal Integrity Tools enable channel emulation and CTLE/DFE equalization  SDAIII-CompleteLinQ enables simultaneous analysis of multiple points in the USB 3.1 channel
  • 38. The PERT3 - Phoenix 4/24/2017 38  PERT3 – Protocol Enabled Receiver Transmitter Tolerance Tester. It is a Bit Error Rate tester with protocol aware capabilities  True protocol handshake support in PeRT3 for loopback initialization and TSEQ training during receiver compliance testing  Jitter Tolerance Testing for characterization  Built in 3 tap de-emphasis generator  User defined test scripting functions for jitter tolerance, equalization optimization search, and multi-parameter sweep testing  In-built Rj, Sj, CM and DM sources to provide single box calibration and testing solution for multiple serial protocols  PeRT3 Phoenix System also offers true SKP symbol injections and SKP filtering during BER testing, as well as 128b/132b pattern generation and detection
  • 39. USB 3.1 - Required Test Equipment for PHY testing  Oscilloscope  16 GHz with 80 GS/s  WaveMaster 816Zi-B or WaveMaster 816Zi-A with WM8Zi-2x80GS  Software  QPHY-USB3.1-Tx-Rx, SDAIII, and EyeDrII  Upgrade option (RK-USB3-USB3.1) for existing QPHY-USB3-Tx-RX customers  Receiver Tester  PeRT3 Phoenix Platform,10G option for PeRT3 Phoenix, Receiver Tolerance Test Suite, USB 3.0 Receiver Tolerance Test Suite and USB 3.1 Receiver Tolerance Test Suite  Test Fixtures  Can be ordered from USB-IF (Custom fixtures for FYI testing) 4/24/2017 39
  • 40. 4/24/2017 40 The Type-C connector Image courtesy of laptopmag.com. All rights reserved Image courtesy laptopmag.com, All rights reserved
  • 41. Type-C connector  USB Type-C, commonly known as USB-C, is a 24-pin fully reversible plug connector system allowing transport of data and energy  A device that implements USB-C may not necessarily support USB 3.1 or USB Power delivery  Unique cable architecture having same connector on both sides to plug in to either host or device  The connector provides four power/ground pairs, two differential pairs for non-SuperSpeed data (though only one pair is populated in a USB-C cable) and four pairs for SuperSpeed data  Devices with Type-C ports may be hosts or devices depending on what is detected at the other end. These types of ports are called Dual-Role-Data (DRD)  Dual role devices supporting power delivery may swap data and power roles, for example, a data host might act as a power sink 4/24/2017 41
  • 42. USB-C connector pin-out 4/24/2017 42 Pin Name Description Pin Name Description A1 GND Ground return B12 GND Ground return A2 SSTXp1 SuperSpeed differential pair #1, TX, positive B11 SSRXp1 SuperSpeed differential pair #2, RX, positive A3 SSTXn1 SuperSpeed differential pair #1, TX, negative B10 SSRXn1 SuperSpeed differential pair #2, RX, negative A4 VBUS Bus power B9 VBUS Bus power A5 CC1 Configuration channel B8 SBU2 Sideband use (SBU) A6 Dp1 Non-SuperSpeed differential pair, position 1, positive B7 Dn2 Non-SuperSpeed differential pair, position 2, negative A7 Dn1 Non-SuperSpeed differential pair, position 1, negative B6 Dp2 Non-SuperSpeed differential pair, position 2, positive A8 SBU1 Sideband use (SBU) B5 CC2 Configuration channel A9 VBUS Bus power B4 VBUS Bus power A10 SSRXn2 SuperSpeed differential pair #4, RX, negative B3 SSTXn2 SuperSpeed differential pair #3, TX, negative A11 SSRXp2 SuperSpeed differential pair #4, RX, positive B2 SSTXp2 SuperSpeed differential pair #3, TX, positive A12 GND Ground return B1 GND Ground return USB-C receptacle USB-C plug
  • 43. Modes of operation  Audio Adapter Accessory mode - USB-C plug supports analog headsets through an audio adapter accessory with a 3.5 mm socket providing four standard analog audio signals (Left, Right, Mic, and GND). The presence of the audio accessory is signalled through the configuration channel and VCONN  Alternate mode - An Alternate Mode dedicates some of the physical wires in a USB-C 3.1 cable for direct device-to-host transmission of alternate data protocols - The four high-speed lanes, two side-band pins, and (for dock, detachable device and permanent cable applications only) two non-SuperSpeed data pins and one configuration pin can be used for alternate mode transmission - The modes are configured using vendor-defined messages (VDM) through the configuration channel  The available Alt modes are: • Display Port Alternate mode • MHL Alternate mode • Thunderbird Alternate mode • HDMI Alternate mode  Other protocols such as PCIe and Base-T internet are being discussed 4/24/2017 43
  • 44. DP 1.3 over USB Type-C – A case study 4/24/2017 44
  • 45. Some USB-C interfaces 4/24/2017 45 Image courtesy of Choetech Copyright ©2017 CHOETECH TECHNOLOGY All Rights Reserved Image courtesy of Satechi ©Satechi 2014 All Rights Reserved Image courtesy of Apple Inc. Copyright © 2017 Apple Inc. All rights reserved.
  • 46. USB - PD  The GRL-USB-PD software is a compliance package developed by Granite River Labs which is now compatible with Teledyne LeCroy oscilloscopes  The GRL-USB-PD-C1 Type-C hardware test controller is used to automate the test process  Performs testing as per chapters 5,6 and 7 of the compliance spec  Supports USB Power Delivery Protocol, Compliance, Decode, and Debug along with Electrical Measurements  The Voyager M310C is Teledyne LeCroy’s USB protocol verification system designed for the latest evolution of universal serial bus, USB Type-C, and includes support for USB Power Delivery 4/24/2017 46