The document defines various time categories used to calculate utilization metrics for semiconductor manufacturing operations. It includes productive time, non-scheduled time like idle or engineering time, scheduled downtime, and standby time. Overall utilization is calculated as the actual output divided by the ideal cycle time, total time is the sum of all time categories, and utilization percentages provide insights into operations, planning, and tester equipment efficiency.

1. Utilization Definition Overview Semi E10

2. Utilization Definition Overview Semi E10

3. Non-Scheduled Time
Idle (No-Load)
Engineering Time
PRODUCTIVE TIME
Tester
Downtime
Manufacturing
Time
Operations
Time
Total Time
Unscheduled Downtime
Scheduled Downtime
Standby time
Utilization Definition Overview Semi E10+

4. Actual
Output
x
Ideal CT
Total
Time
x
# Testers
Overall
Tester
Utilization
Operations
Utilization
Planning
Utilization
Unscheduled
Downtime
Scheduled
Downtime
Standby
Time
Engineering
time
Non-Scheduled
Time
Idle (No-Load)
Time
Operations
Time
Total
Time
Productive
Time
KGP
Time
Actual
Output
x
Ideal CT
- Yield loss
- Retest Time
- Holidays
- Power-cut
- No orders
- R&M
- PM
- SW Q
- Process Q
- Equipment Q
- Waiting Time
Utilization Definition Overview
Data Categories
Installed
Capacity

5. Actual
Output
x
Ideal CT
Total
Time
x
# Testers
Overall
Tester
Utilization
Operations
Utilization
Planning
Utilization
Unscheduled
Downtime
Scheduled
Downtime
Standby
Time
Engineering
time
Non-Scheduled
Time
Idle (No-Load)
Time
Operations
Time
Total
Time
Productive
Time
KGP
Time
Actual
Output
x
Ideal CT
- Yield loss
- Retest Time
- Holidays
- Power-cuts
- No orders
- R&M Time
- PM Time
- CO Time
- SW Q
- Process Q
- Equipment Q
- Waiting Time
- Small stops
Operations Time
Total Time
KGP Time
Operations Time
Planning Operations
Utilization Utilization
x
Actual Output x CT
Total Time x # Testers
Utilization Definition Overview
Data Categories
Installed
Capacity