SPICE MODEL of SSM5H05TU (Professional+BDP+SBDP Model) in SPICE PARK
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SPICE MODEL of SSM5H05TU (Professional+BDP+SBDP Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
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SPICE MODEL of SSM5H05TU (Professional+BDP+SBDP Model) in SPICE PARK
- 1. Device Modeling Report COMPONENTS: Power MOSFET (Professional) / Schottky Rectifier (Professional) PART NUMBER: SSM5H05TU MANUFACTURER: TOSHIBA Body Diode (Professional) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 2. MOSFET MODEL Pspice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 3. Transconductance Characteristic Circuit Simulation Result Comparison table Gfs ID(A) Error (%) Measurement Simulation 0.500 2.220 2.190 -1.351 1.000 3.100 3.064 -1.161 2.000 4.260 4.266 0.141 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 4. Vgs-Id Characteristic Circuit Simulation result Evaluation circuit V2 0Vdc Open Open RS 100MEG Vds U6 SSM5H05TU 3Vdc 0 Vgs open 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 5. Comparison Graph Circuit Simulation Result Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation 0.010 0.930 0.931 0.107 0.020 0.950 0.957 0.736 0.050 1.000 1.010 1.000 0.100 1.050 1.070 1.904 0.200 1.150 1.159 0.782 0.500 1.320 1.327 0.530 1.000 1.510 1.520 0.662 2.000 1.800 1.800 0.000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 6. Id-Rds(on) Characteristic Circuit Simulation result Evaluation circuit U2 OPEN OPEN OPEN V1 R1 100MEG 0Vdc SSM5H05TU 0 VG VD 2.5Vdc 10Vdc 0 Simulation Result ID=0.75A, VGS=2.5V Measurement Simulation Error (%) R DS (on) 154.00 m 154.00 m 0.00 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 7. Id-Rds(on) Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 8. Gate Charge Characteristic Circuit Simulation result Evaluation circuit Open Dbreak Open PER = 1000u D1 PW = 600u U5 I2 RS TF = 10n W1 SSM5H05TU 1.5Adc TR = 10n 100MEG + TD = 0 - open I2 = 1m I1 W I1 = 0 IOFF = 1mA V1 0 ION = 0uA 10Vdc 0 Simulation Result VDD=10V,ID=1.5A Measurement Simulation Error (%) Qgs 0.250 nC 0.245 nC -2.000 Qgd 0.565 nC 0.560 nC -0.885 Qg 3.100 nC 3.080 nC -0.645 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 9. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.10 109.00 109.80 0.73 0.20 104.00 104.70 0.67 0.50 94.00 93.62 -0.40 1.00 80.00 80.23 0.29 2.00 63.00 64.13 1.79 5.00 43.00 43.04 0.09 10.00 30.00 30.11 0.37 20.00 20.00 20.25 1.25 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 10. Switching Time Characteristic Circuit Simulation result 12V VDD = 10V Vg = 0/2.5V 8V 4V 0V 4.97us 4.99us 5.01us 5.03us 5.05us 5.07us 5.09us V(2)*4 V(3) Time Evaluation circuit L2 R2 Open 30nH 13.35 RG L1 Open 30nH 10Vdc 4.7 U5 V1 = 0 SSM5H05TU V1 RS V2 = 5 V2 TD = 2u R1 100MEG open TR = 5n 4.7 TF = 5n PW = 10u 0 PER = 30u 0 Simulation Result ID=0.75A, VDD=10V Measurement Simulation Error(%) VGS=2.5V ton 15.5 ns 15.55 ns 0.322 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 11. Output Characteristic Circuit Simulation result 5.0A 2.4V 4.5A 4.0A 3.5A 2.2V 3.0A 2.5A 2.0V 2.0A VGS=1.8V 1.5A 1.0A 0.5A 0A 0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V 1.6V 1.8V I(V3) V_V2 Evaluation circuit V2 Open 0Vdc Open R1 100MEG Vds U5 0 SSM5H05TU 0Vdc Vgs open 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 12. Output Characteristic Reference 2.4V 2.2V 2V VGS=1.8V All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 13. Forward Current Characteristic Circuit Simulation Result Evaluation Circuit R1 0.01m Open Open SSM5H05TU VD U6 0Vdc RS 100MEG open 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 14. Comparison Graph Circuit Simulation Result Simulation Result Vfwd(V) Vfwd(V) Ifwd(A) Measurement Simulation %Error 0.010 0.590 0.591 0.169 0.020 0.600 0.603 0.500 0.050 0.620 0.622 0.323 0.100 0.640 0.639 -0.156 0.200 0.660 0.659 -0.152 0.500 0.690 0.689 -0.145 1.000 0.710 0.713 0.423 2.000 0.740 0.738 -0.270 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 15. Forward Current Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 16. Reverse Recovery Characteristic Circuit Simulation Result Evaluation circuit R1 50 Open Open SSM5H05TU V1 = -9.4v V1 U6 V2 = 10.6v RS TD = 0 TR = 10ns 100MEG TF = 10ns PW = 1us PER = 100us open 0 0 Compare Measurement vs. Simulation Measurement Simulation Error(%) trj 6.40 ns 6.44 ns 0.63 trb 9.60 ns 9.62 ns 0.21 trr 16.00 ns 16.06 ns 0.37 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 17. Reverse Recovery Characteristic Reference Measurement trj=6.4(ns) trb=9.6(ns) Conditions:Ifwd=Irev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 18. Zener Voltage Characteristic Circuit Simulation Result Evaluation Circuit R1 Open 0.01m Open SSM5H05TU V1 U5 0Vdc RS 100MEG open 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 19. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 20. Forward Current Characteristic Circuit Simulation Result Evaluation Circuit R1 0.01m open open open V1 SSM5H05TU 0Vdc U2 RS 100MEG open 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 21. Comparison Graph Circuit Simulation Result Simulation Result Vfwd (V) Ifwd (A) Measurement Simulation %Error 0.001 0.120 0.120 0.000 0.002 0.138 0.138 0.364 0.006 0.170 0.166 -2.353 0.010 0.188 0.182 -3.298 0.022 0.214 0.207 -3.185 0.052 0.240 0.238 -0.668 0.099 0.261 0.269 2.874 0.200 0.300 0.310 3.333 0.500 0.437 0.429 -1.739 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 22. Forward Current Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 23. Junction Capacitance Characteristic Circuit Simulation Result Evaluation Circuit V2 open 0Vdc open RS V2 = 5 V1 100MEG V1 = 0 TD = 0 TR = 1us U2 TF = 10ns SSM5H05TU 0 PW = 50us open open PER = 10us 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 24. Comparison Graph Circuit Simulation Result Simulation Result Cj(pF) Vrev(V) Measurement Simulation %Error 0.000 83.209 83.209 0.000 0.100 81.209 82.242 1.272 0.200 79.273 80.200 1.169 0.500 72.172 73.355 1.639 1.000 60.129 62.007 3.123 2.000 44.904 46.502 3.559 5.000 23.041 23.742 3.042 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 25. Reverse Characteristic Circuit Simulation Result Evaluation Circuit RL 0.1m open open open 0Vdc V1 SSM5H05TU U2 RS 100MEG open 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 26. Comparison Graph Circuit Simulation Result Simulation Result Irev (uA) Vrev(V) %Error Measurement Simulation 4.00 11.60 11.89 2.50 6.00 13.70 13.25 -3.28 8.00 15.80 15.41 -2.47 10.00 17.90 18.00 0.56 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
- 27. Reverse Current Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2005