SLM project presentation

Advisor Co-supervisor Candidate
Professor Luana Bottini Professor Alberto Boschetto Hesham Ibrahim
Surface roughness of AlSi10Mg parts
manufactured by Selective laser melting
Faculty of Civil and Industrial Engineering
Department of Mechanical and Aerospace Engineering

25/01/2020Titolo Presentazione Pagina 2
Selective Laser Melting

Surface roughness problems

AIM
Improvement of the surface roughness through
process parameters tuning

Process
parameters
powder
• Powder size disturbtion and
shape
• Powder flowability
• Laser powder interaction
laser
• Laser power
• Types of laser
• Laser spot
• Laser mode
• Energy desity
• Volumetric energy
density
Process
• Scan spacing
• Scan speed
•Layer thickness
•Scan strategy
•Building strategy
• Part orientation
•Atmospheric control

Definitions
3- Hatch distance
2- contour offset
1- Upskin

Design of Experiment
DOE
Taguchi Full Factorial
Contour
4 Factors
4 Levels
1 Factor
2 levels
Upskin
3 Factors
4 Levels
1 Factor
2 levels
Upskin
3 Factors
3 Levels
Contour
3 Factors
3 Levels
All combinations are available
Reduce the number of runs

Taguchi method
Number of levels
Designs 2 4
L8 (2**4 4**1) 1-4 1
L16 (2**12 4**1) 2-12 1
L16 (2**9 4**2) 1-9 2
L16 (2**6 4**3) 1-6 3
L16 (2**3 4**4) 1-3 4
L32 (2**1 4**9) 1 2-9
Commonly used orthogonal arrays

experiments
Taguchi
Full
Factorial
Taguchi chosen process parameters
# Factors levels # Factors Levels
The contour
1
-
The contour
offset in mm
0.00 and
0.02
For the first contour For the second contour
2
-
the laser power
in watt
80, 150,
250 and
350
4
-
the laser power
in watt
80,150,250
and 350
3
-
scan speed for
the first
exposure in
mm/s
400, 700,
1000 and
1300
5
-
the scan speed for
the second
exposure in mm/s
400,700,100
0 and 1300
The UPSKIN
6
-
Number of
layers
1 and 3
7
-
Laser power In
watt
180,240,3
00 and
360
8
-
Scan speed In
mm/s
600,800,1
000 and
1200
9
-
Hatch distance 0.18 0.21
0.24 0.27
FF chosen process parameters
# Factors Levels
Upskin
1 Laser power 240,300 and 360
2 Scan speed 400,800 and
1200
3 Hatch distance 0.18,0.21 and
0.24
Contour
4 Laser power 150,250 and 350
5 Scan speed 400,800 and
1200
6 Contour offset 0,0.02 and 0.04

experiments
Taguchi table
Number
of runs
Contour
offset for
first and
second
contour
(C0)
Laser
power
for first
contour
(Pc1)
Scan
speed for
first
contour
(Vc1)
Laser
power
for
second
contour
(Pc2)
Scan
speed for
second
contour
(Vc2)
Number
of layers
for
upskin
thickness
(nL)
Laser
power
for
upskin
(Pu)
Scan
speed for
upskin
(Vu)
Hatch
distance
for
upskin
(Hd)
BeB 01 0 80 400 80 400 1 180 600 0.18
BeB 02 0 80 700 150 700 1 180 800 0.21
BeB 03 0 80 1000 250 1000 1 180 1000 0.24
BeB 04 0 80 1300 350 1300 1 180 1200 0.27
BeB 05 0 150 400 80 700 1 240 600 0.18
BeB 06 0 150 700 150 400 1 240 800 0.21
BeB 07 0 150 1000 250 1300 1 240 1000 0.24
BeB 08 0 150 1300 350 1000 1 240 1200 0.27
BeB 09 0 250 400 150 1000 1 300 600 0.21
BeB 10 0 250 700 80 1300 1 300 800 0.18
BeB 11 0 250 1000 350 400 1 300 1000 0.27
BeB 12 0 250 1300 250 700 1 300 1200 0.24
BeB 13 0 350 400 150 1300 1 360 600 0.21
BeB 14 0 350 700 80 1000 1 360 800 0.18
BeB 15 0 350 1000 350 700 1 360 1000 0.27
BeB 16 0 350 1300 250 400 1 360 1200 0.24
BeB 17 0.02 80 400 350 400 3 180 600 0.27
BeB 18 0.02 80 700 250 700 3 180 800 0.24
BeB 19 0.02 80 1000 150 1000 3 180 1000 0.21
BeB 20 0.02 80 1300 80 1300 3 180 1200 0.18
BeB 21 0.02 150 400 350 700 3 240 600 0.27
BeB 22 0.02 150 700 250 400 3 240 800 0.24
BeB 23 0.02 150 1000 150 1300 3 240 1000 0.21
BeB 24 0.02 150 1300 80 1000 3 240 1200 0.18
BeB 25 0.02 250 400 250 1000 3 300 600 0.24
BeB 26 0.02 250 700 350 1300 3 300 800 0.27
BeB 27 0.02 250 1000 80 400 3 300 1000 0.18
BeB 28 0.02 250 1300 150 700 3 300 1200 0.21
BeB 29 0.02 350 400 250 1300 3 360 600 0.24
BeB 30 0.02 350 700 350 1000 3 360 800 0.27
BeB 31 0.02 350 1000 80 700 3 360 1000 0.18
BeB 32 0.02 350 1300 150 400 3 360 1200 0.21
Full Factorial Table
Number of
runs
Laser
power for
upskin
(Pu) W
Scan
speed for
upskin
(Vu)
Hatch
distance
for upskin
(Hd)
Laser
power for
contour
(Pc)
Scan
speed for
contour
(Vc)
Contour
offset for
contour
(Co)
AL 01 240 400 0.18 150 400 0
AL 02 240 400 0.21 150 400 0.02
AL 03 240 400 0.24 150 400 0.04
AL 04 240 800 0.18 150 800 0
AL 05 240 800 0.21 150 800 0.02
AL 06 240 800 0.24 150 800 0.04
AL 07 240 1200 0.18 150 1200 0
AL 08 240 1200 0.21 150 1200 0.02
AL 09 240 1200 0.24 150 1200 0.04
AL 10 300 400 0.18 250 400 0
AL 11 300 400 0.21 250 400 0.02
AL 12 300 400 0.24 250 400 0.04
AL 13 300 800 0.18 250 800 0
AL 14 300 800 0.21 250 800 0.02
AL 15 300 800 0.24 250 800 0.04
AL 16 300 1200 0.18 250 1200 0
AL 17 300 1200 0.21 250 1200 0.02
AL 18 300 1200 0.24 250 1200 0.04
AL 19 360 400 0.18 350 400 0
AL 20 360 400 0.21 350 400 0.02
AL 21 360 400 0.24 350 400 0.04
AL 22 360 800 0.18 350 800 0
AL 23 360 800 0.21 350 800 0.02
AL 24 360 800 0.24 350 800 0.04
AL 25 360 1200 0.18 350 1200 0
AL 26 360 1200 0.21 350 1200 0.02
AL 27 360 1200 0.24 350 1200 0.04

EOS M 290

Specimen

• Mitutoyo SJ-410 profilometer
• SPLINE PROFILE FILTER.
• ISO 16610-22, 2015
Measure

Data analysis for the measured surface
roughness

Source DF Adj SS Adj MS F-Value P-Value
Model 7 71.488 10.213 4.91 0.004
Linear 3 20.432 6.811 3.27 0.049
Pu 1 14.575 14.575 7.00 0.018
Vu 1 1.229 1.229 0.59 0.453
Hd 1 4.628 4.628 2.22 0.155
2-Way
Interactions
3 37.707 12.569 6.04 0.006
Pu*Vu 1 20.871 20.871 10.03 0.006
Pu*Hd 1 3.057 3.057 1.47 0.243
Vu*Hd 1 13.779 13.779 6.62 0.020
3-Way
Interactions
1 13.349 13.349 6.42 0.022
Pu*Vu*Hd 1 13.349 13.349 6.42 0.022
Error 16 33.291 2.081
Total 23 104.779
Roughness =
-58.7 + 0.2597 Pu + 0.0631 Vu + 243 Hd - 0.000256 Pu*Vu - 1.027 Pu*Hd
- 0.248 Vu*Hd + 0.001036 Pu*Vu*Hd
Full Factorial
upskin
FF Taguchi
3.5μm 4.06μm

Titolo Presentazione Pagina 17
Hd 0.18
Hold Values
052
300
4
6
8
052 005
3 05
100
750
2 051
00
8
01
ssenhguoR
uV
uP
urface Plot of RS o ghness vs Vu, Puu
Hd 0.21
Hold Values
2 05
03 0
4
5
6
2 05 500
053
100
075
1250
00
6
7
ssenhguoR
uV
uP
Hd 0.24
Hold Values
052
003
0.4
8.4
052 005
053
2 051
1000
7 05
8.4
6.5
ssenhguoR
uV
uP
The Lowest
Ra
Laser
power
Scan
speed
VED Spe. Mean Ra
At Hd 0.18,
0.21 and 0.24
mm
240
Watt
400
mm/s
111 J/mm^3
95.2 J/mm^3
83.3 J/mm^3
AL1,
AL2,
AL3
3.73 µm
3.52 µm
3.54 µm
Another Low
Ra point
Laser
power
Scan
speed
VED Spe. Mean Ra
Only using Hd
0.18 mm
360
Watt
1200
mm/s
55.5 J/mm^3
Al
25
4.2 µm
Hd 0.18
Hold Values
Pu
Vu
350325300275250
1200
1100
1000
900
800
700
600
500
400
>
–
–
–
< 5
5 6
6 7
7 8
8
Roughness
Contour Plot of Roughness vs Vu, Pu
In upskin and 90 degree
Increasing
energy
Decrease
roughness

Taguchi Upskin
Term Coef SE Coef T P
Constant 12.5953 0.2124 59.300 0.000
nL 1 1.0024 0.2124 4.720 0.000
Pu(Watt) 180 8.6256 0.3679 23.446 0.000
Pu(Watt) 240 -0.4361 0.3679 -1.186 0.251
Pu(Watt) 300 -3.4839 0.3679 -9.470 0.000
Vu(mm/s) 600 -3.9655 0.3679 -10.779 0.000
Vu(mm/s) 800 -1.9324 0.3679 -5.253 0.000
Vu(mm/s) 1000 1.3242 0.3679 3.600 0.002
Hd(mm) 0.18 -3.5308 0.3679 -9.597 0.000
Hd(mm) 0.21 -0.0807 0.3679 -0.219 0.829
Hd(mm) 0.24 1.6199 0.3679 4.403 0.000
nL*Pu(Watt) 1 180 -1.5965 0.3679 -4.340 0.000
nL*Pu(Watt) 1 240 0.3171 0.3679 0.862 0.400
nL*Pu(Watt) 1 300 0.8971 0.3679 2.438 0.025
S R-Sq R-Sq(adj)
1.2015 98.20% 96.91%
Source DF Seq SS Adj SS Adj MS F P
nL 1 32.16 32.16 32.156 22.27 0.000
Pu(Watt) 3 870.98 870.98
290.32
6
201.1
0
0.000
Vu(mm/s) 3 337.05 337.05
112.35
1
77.82 0.000
Hd(mm) 3 152.51 152.51 50.837 35.21 0.000
nL*Pu(Watt) 3 28.80 28.80 9.601 6.65 0.003
Residual Error 18 25.99 25.99 1.444
Total 31 1447.48

Spe. name Ra range VED
Range of
variation
BeB29
BeB4
3.383 μm
till
31.982 μm
Lowest
surface
roughness
BeB29 3.383 μm
to
4.422 μm
Mean Ra 83.3
J/mm^3
4.063 μm
Highest
roughness
limit &
longest
variation
BeB4 21.464 μm
to
31.982
μm,
Mean Ra 18.5
J/mm^3
26.83 μm

Full Factorial
For 90 degree
Model 7 2798.62 399.80 132.13 0.000
Linear 3 1439.72 479.91 158.60 0.000
Pc 1 1378.62 1378.62 455.61 0.000
Vc 1 2.23 2.23 0.74 0.403
Co 1 58.86 58.86 19.45 0.000
2-Way
Interactions
3 1353.58 451.19 149.11 0.000
Pc*Vc 1 966.85 966.85 319.53 0.000
Pc*Co 1 252.66 252.66 83.50 0.000
Vc*Co 1 134.08 134.08 44.31 0.000
3-Way
Interactions
1 5.31 5.31 1.76 0.204
Pc*Vc*Co 1 5.31 5.31 1.76 0.204
Error 16 48.41 3.03
Total 23 2847.03
S R-sq R-sq(adj) R-sq(pred)
1.73950 98.30% 97.56% 96.17%
Ra(90) = 85.19 - 0.2446 Pc - 0.04776 Vc - 838 Co + 0.000170 Pc*Vc
+ 2.093 Pc*Co + 0.443 Vc*Co - 0.000588 Pc*Vc*Co
In 90 the laser power and the scan speed vary in
opposite way of the upskin but the same result
FF Taguchi
3.9 μm 4.3 μm

Co 0
Hold Values
081
240
300
01
20
03
081 500
0
360
01 0
750
2501
00
03
40
09
cV
cP
cP,cVsv09fotolPecafruS
Co 0.02
Hold Values
0
10
20
81 0
024
300
005
0
63 0
1 00
750
1250
00
03
09
cV
cP
Co 0.04
Hold Values
6
21
81
081
240
003
500
0
063
001
057
2501
00
81
42
09
cV
cP
Lowest
surface
roughness
Laser
powe
r
Scan
speed
Instant
energy
Spe. Mean Ra
At contour
offset 0.00
0.02 0.04
350
Watt
400 mm/s 0.875 Al19
Al20
Al21
4.34 µm
4.30 µm
3.90 µm
Low surface
roughness
Laser
powe
r
Scan
speed
Instant
energy
Spe. Mean Ra
Only at
contour offset
0.00
350
Watt
1200
mm/s
0.29 Al25 13.857
µm
Co 0
Hold Values
Pc
Vc
350300250200150
1200
1100
1000
900
800
700
600
500
400
>
–
–
–
–
–
–
< 5
5 10
10 15
15 20
20 25
25 30
30 35
35
90
Contour Plot of 90 vs Vc, Pc

Constant 15.5383 0.9442 16.457 0.000
C0 0.00 -0.2335 0.9442 -0.247 0.809
Pc1 80 2.2923 1.6353 1.402 0.186
Pc1 150 2.9428 1.6353 1.800 0.097
Pc1 250 -0.4255 1.6353 -0.260 0.799
Vc1 400 -3.9457 1.6353 -2.413 0.033
Vc1 700 0.7384 1.6353 0.452 0.660
Vc1 1000 1.0447 1.6353 0.639 0.535
Pc2 80 2.9595 1.6353 1.810 0.095
Pc2 150 7.1668 1.6353 4.382 0.001
Pc2 250 -2.1430 1.6353 -1.310 0.215
Vc2 400 2.8047 1.6353 1.715 0.112
Vc2 700 3.0039 1.6353 1.837 0.091
Vc2 1000 -2.9273 1.6353 -1.790 0.099
C0*Pc1 0.00 80 2.4929 1.6353 1.524 0.153
C0*Pc1 0.00 150 5.8357 1.6353 3.569 0.004
C0*Pc1 0.00 250 -3.6247 1.6353 -2.216 0.047
C0*Vc2 0.00 400 0.2400 1.6353 0.147 0.886
C0*Vc2 0.00 700 1.1963 1.6353 0.732 0.478
C0*Vc2 0.00 1000 -1.1620 1.6353 -0.711 0.491
C0 1 1.74 1.74 1.745 0.06 0.809
Pc1 3 297.84 297.84 99.278 3.48 0.050
Vc1 3 175.05 175.05 58.350 2.05 0.161
Pc2 3 1027.56 1027.56 342.521 12.01 0.001
Vc2 3 270.09 270.09 90.030 3.16 0.064
C0*Pc1 3 604.29 604.29 201.429 7.06 0.005
C0*Vc2 3 23.31 23.31 7.771 0.27 0.844
Residual
Error
12 342.32 342.32 28.526
Total 31 2742.20
Taguchi
on 90 degree

Spe.
Name
Ra range Instant energy T.E
Range
of
variatio
n
BeB17
BeB6
3.924 μm
40.689
μm
Lowest BeB17
from
3.924 μm
till 4.674
μm
Mean Ra 0.875 on 1st
contour
0.2 on 2nd
contour
1.075 j/mm^3
4.312 μm
Highest BeB6
31.352
μm
to
40.6 μm
Mean Ra 0.21 on 1st
contour
0.375 on 2nd
contour
0.585 J/m^3
34.45 μm

Full Factorial
on 45 degree
Model 7 43.696 6.2423 1.66 0.189
Linear 3 25.165 8.3883 2.24 0.124
Pc 1 18.739 18.7390 4.99 0.040
Vc 1 2.010 2.0097 0.54 0.475
Co 1 4.416 4.4161 1.18 0.294
2-Way
Interactions
3 14.265 4.7550 1.27 0.319
Pc*Vc 1 8.154 8.1538 2.17 0.160
Pc*Co 1 6.059 6.0591 1.61 0.222
Vc*Co 1 0.052 0.0520 0.01 0.908
3-Way
Interactions
1 4.266 4.2664 1.14 0.302
Pc*Vc*Co 1 4.266 4.2664 1.14 0.302
Error 16 60.045 3.7528
Total 23 103.741
Ra(45)=
15.67 + 0.0171 Pc + 0.00185 Vc - 33 Co - 0.000004 Pc*Vc
+ 0.341 Pc*Co + 0.252 Vc*Co - 0.001054 Pc*Vc*Co
FF Taguchi
18.7μm 18.48μm

Co 0
Hold Values
180
240
300
91
20
21
180
0521
0001
750
005
0
360
21
22
54
cV
cP
Co 0.01
Hold Values
81 0
042
003
91
02
21
81 0
52 01
01 00
057
05 0
0
063
22
54
cV
cP
Co 0.02
Hold Values
018
240
300
20
21
22
018 500
0
360
1 025
0001
057
22
32
54
cV
cP
The lowest
surface
roughness
Laser
power
Scan
Speed
Instant
energy
Spe Mean Ra
At Co 0.0,
0.01 and
0.02
150 Watt 400
mm/s
0.375
J/mm
Al1
Al2
18.7 µm
19.8 µm
low surface
roughness
Laser
power
Scan
Speed
Instant
energy
Spe Mean Ra
Only
At
Co
0.02
350 Watt 1200
mm/s
0.29
J/mm
Al26 21.087
µm
Co
0.00
150 W 1200 0.125 Al7 19.721µm
250 W 400 0.625 Al10 19.396µm
250 W 1200 0.208 Al16 19.814µm
Co 0.02
Hold Values
Pc
Vc
350300250200150
1200
1100
1000
900
800
700
600
500
400
>
–
–
–
–
–
< 20.0
20.0 20.5
20.5 21.0
21.0 21.5
21.5 22.0
22.0 22.5
22.5
45

Constant 23.0783 0.6852 33.679 0.000
C0 0.00 -0.2457 0.6852 -0.359 0.726
Pc1 80 1.0956 1.1869 0.923 0.374
Pc1 150 0.4204 1.1869 0.354 0.729
Pc1 250 -1.9099 1.1869 -1.609 0.134
Vc1 400 -1.9398 1.1869 -1.634 0.128
Vc1 700 0.7120 1.1869 0.600 0.560
Vc1 1000 -0.4529 1.1869 -0.382 0.709
Pc2 80 0.6696 1.1869 0.564 0.583
Pc2 150 -1.3300 1.1869 -1.121 0.284
Pc2 250 -0.4888 1.1869 -0.412 0.688
Vc2 400 1.2398 1.1869 1.045 0.317
Vc2 700 0.3399 1.1869 0.286 0.779
Vc2 1000 -1.5001 1.1869 -1.264 0.230
C0*Pc1 0.00 80 -0.5326 1.1869 -0.449 0.662
C0*Pc1 0.00 150 -0.2631 1.1869 -0.222 0.828
C0*Pc1 0.00 250 -0.8824 1.1869 -0.743 0.472
C0*Vc2 0.00 400 -0.3468 1.1869 -0.292 0.775
C0*Vc2 0.00 700 1.0840 1.1869 0.913 0.379
C0*Vc2 0.00 1000 -1.0940 1.1869 -0.922 0.375
C0 1 1.932 1.932 1.932 0.13 0.726
Pc1 3 41.441 41.441 13.814 0.92 0.461
Vc1 3 58.397 58.397 19.466 1.30 0.321
Pc2 3 30.213 30.213 10.071 0.67 0.586
Vc2 3 31.274 31.274 10.425 0.69 0.573
C0*Pc1 3 31.582 31.582 10.527 0.70 0.570
C0*Vc2 3 20.955 20.955 6.985 0.46 0.712
Residual
Error
12 180.306 180.306 15.025
Total 31 396.099
Taguchi
on 45 degree

Spe.
name
Ra Range Instant energy
Variation
Range
BeB7
BeB12.
17.352 μm
till
29.249 μm
Lowest
Ra
BeB7
17.352 μm
to
19.127 μm
Mean Ra 0.15 on 1st
contour
0.19 on 2nd
contour
0.34 J/mm^3
18.48 μm
Highest
Ra &
Long
variation
BeB12
20.701 μm
to
29.249 μm
Mean Ra 0.19 on 1st
contour
0.357 on 2nd
contour
0.4111
J/mm^325.465 μm

Full Factorial
135 degree
Model 7 328.549 46.936 2.05 0.111
Linear 3 174.712 58.237 2.55 0.092
Pc 1 143.879 143.879 6.30 0.023
Vc 1 0.031 0.031 0.00 0.971
Co 1 30.802 30.802 1.35 0.263
2-Way
Interactions
3 151.036 50.345 2.20 0.127
Pc*Vc 1 88.639 88.639 3.88 0.066
Pc*Co 1 1.332 1.332 0.06 0.812
Vc*Co 1 61.066 61.066 2.67 0.122
3-Way
Interactions
1 2.801 2.801 0.12 0.731
Pc*Vc*Co 1 2.801 2.801 0.12 0.731
Error 16 365.635 22.852
Total 23 694.184
Ra135 = 22.8 + 0.0415 Pc + 0.0305 Vc + 662 Co - 0.000074 Pc*Vc - 0.92 Pc*Co -
0.612 Vc*Co + 0.00085 Pc*Vc*Co
37.6 μm 41 μm

Co 0
Hold Values
081
240
003
48.0
49.5
.15 0
081 5 00
0
063
010
750
21 05
00
.15 0
.52 5
531
cV
cP
Co 0.01
Hold Values
081
240
300
45.0
5.74
0.05
081 500
0
063
01 0
057
5021
00
0.05
52.5
531
cV
cP
Co 0.02
Hold Values
018
240
003
24
54
48
018 500
0
360
001
750
1250
00
48
51
531
cV
cP
Lowest
surface
roughness
Laser
power
Scan
speed
Instant
energy
Spe. Mean
Ra
At Co 0.01
and 0.02
350
Watt
1200
mm/s
0.29 Al26
Al27
42.28µm
41.57µm
Low surface
roughness
Laser
power
Scan
speed
Instant
energy
Spe. Mean
Ra
0.02 150 400 0.375 Al2 43.44µm
0.02 250 400 0.625 Al11 47.39µm
0.02 350 400 0.875 Al20 43.54µm
Co 0.02
Hold Values
Pc
Vc
350300250200150
1200
1100
1000
900
800
700
600
500
400
>
–
–
–
< 44
44 46
46 48
48 50
50
135

Constant 46.5644 0.4268 109.098 0.000
C0 0.00 -2.8867 0.4268 -6.763 0.000
Pc1 80 -0.2502 0.7393 -0.338 0.741
Pc1 150 0.0250 0.7393 0.034 0.974
Pc1 250 2.3331 0.7393 3.156 0.008
Vc1 400 0.1316 0.7393 0.178 0.862
Vc1 700 0.5873 0.7393 0.794 0.442
Vc1 1000 1.1132 0.7393 1.506 0.158
Pc2 80 0.8801 0.7393 1.190 0.257
Pc2 150 -0.8304 0.7393 -1.123 0.283
Pc2 250 0.7340 0.7393 0.993 0.340
Vc2 400 0.4696 0.7393 0.635 0.537
Vc2 700 1.3096 0.7393 1.771 0.102
Vc2 1000 -0.8318 0.7393 -1.125 0.283
C0*Pc1 0.00
80
-0.1339 0.7393 -0.181 0.859
C0*Pc1 0.00
150
-0.0069 0.7393 -0.009 0.993
C0*Pc1 0.00
250
-0.8784 0.7393 -1.188 0.258
C0*Vc2 0.00
400
-0.3444 0.7393 -0.466 0.650
C0*Vc2 0.00
700
0.6572 0.7393 0.889 0.392
C0*Vc2 0.00
1000
0.0291 0.7393 0.039 0.969
C0 1 266.657 266.657 266.657 45.74 0.000
Pc1 3 79.595 79.595 26.532 4.55 0.024
Vc1 3 39.662 39.662 13.221 2.27 0.133
Pc2 3 20.937 20.937 6.979 1.20 0.352
Vc2 3 28.200 28.200 9.400 1.61 0.238
C0*Pc1 3 14.626 14.626 4.875 0.84 0.499
C0*Vc2 3 5.346 5.346 1.782 0.31 0.821
Residual
Error
12 69.954 69.954 5.829
Total 31 524.976
Taguchi
on 135 degree

Spe.
name
Ra Range Instant energy
Variation
Range
BeB4
BeB24
34.778 μm
60.994 μm
Lowest Ra BeB4
From
34.778 μm
to
39.576 μm
Mean Ra 0.06 on 1st
contour
0.27 on 2nd
contour
0.213
37.617
Highest Ra &
Long variation
BeB24
from
43.015 μm
to
60.994 μm
Mean Ra 0.12 on 1st
contour
0.08 on 2nd
contour
0.20
50.9

Conclusion
• In this thesis I planned and executed an experimental campaign aiming
to improve the surface roughness of AlSi10Mg SLM parts
• Two different design of experiments have been employed: Taguchi
method and full factorial
• The Taguchi method, which reduces the number of tests, provided
results limited to only Main effects analysis
• The full factorial method allowed to measure the significance of the test
factors and provided some models for the prediction of the outcomes
• The best improvements were reached at horizontal and vertical surfaces
with a reduction of more than 50% and 80% respectively
• The roughness reduction on the inclined surfaces is limited
• Further developments will regard: new experimentations focusing on a
small region around the found best conditions and the under-skin
damages and porosity investigations.

Thanks For Attention

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