This document reports on a lab experiment using a scanning electron microscope (SEM) to examine how different SEM parameters affect image quality. Groups of students tested acceleration voltage, beam current, sample tilt, and working distance. For acceleration voltage, higher voltages produced brighter but less clear images due to charging effects. Medium voltages of 5-10kV provided the best balance of brightness and contrast. Higher beam currents created smoother but lower resolution images. Tilting the sample resulted in non-uniform illumination. Variations in working distance revealed trade-offs between resolution and depth of field. The lab helped students learn SEM operation and parameter optimization to obtain high-quality images.
Preparing a metal specimen for microscopic examination Saif al-din ali
1.Name of Experiment:
Preparing a Metal Specimen for Microscopic Examination.
2.The objective of the Experiment
a. The determination of the size and shape of the grains.
b. To specify what forms are present.
c. To find if the specimen has undergone plastic or elastic deformation.
d. To search for impurities.
e. To find if it has inferior any phase changes
Dynamic Mechanical Analysis (DMA) is a technique that is widely used to characterize a material’s properties as a function of temperature, time, frequency, stress, atmosphere or a combination of these parameters.
Preparing a metal specimen for microscopic examination Saif al-din ali
1.Name of Experiment:
Preparing a Metal Specimen for Microscopic Examination.
2.The objective of the Experiment
a. The determination of the size and shape of the grains.
b. To specify what forms are present.
c. To find if the specimen has undergone plastic or elastic deformation.
d. To search for impurities.
e. To find if it has inferior any phase changes
Dynamic Mechanical Analysis (DMA) is a technique that is widely used to characterize a material’s properties as a function of temperature, time, frequency, stress, atmosphere or a combination of these parameters.
Thermal testing, thermo mechanical and dynamic mechanical analysis & chem...Dr.S.Thirumalvalavan
Unit-V: THERMAL TESTING, THERMO-MECHANICAL AND DYNAMIC MECHANICAL ANALYSIS & CHEMICAL TESTING [OTHER TESTING].
Subject Name: OML751 Testing of Materials
Topics: Thermal Testing: Differential scanning calorimetry, Differential thermal analysis. Thermo-mechanical and Dynamic mechanical analysis: Principles, Advantages, Applications. Chemical Testing: X-Ray Fluorescence, Elemental Analysis by Inductively Coupled Plasma-Optical Emission Spectroscopy and Plasma-Mass Spectrometry.
B.E. Mechanical Engineering
Final Year, VII Semester, Open Elective Subject
[As per Anna University R-2017]
Unit-II Mechanical Testing
Subject Name: OML751 Testing of Materials
Topics: Various Mechanical Tests [Hardness, Tensile, Impact, Bend, Shear, Creep & Fatigue]
B.E. Mechanical Engineering
Final Year, VII Semester, Open Elective Subject
[As per Anna University R-2017]
Intro
Principle
How it works
Types of dynamic Experiments
Instrumentation
Construction
Preparation of samples
Types of analysers
DMA of glass transition of polymers
Advantages
Applications
Limitations
Latest Research
References
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.
FellowBuddy.com is an innovative platform that brings students together to share notes, exam papers, study guides, project reports and presentation for upcoming exams.
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# Students can catch up on notes they missed because of an absence.
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Transmission electron microscope, high resolution tem and selected area elect...Nano Encryption
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
Thermal testing, thermo mechanical and dynamic mechanical analysis & chem...Dr.S.Thirumalvalavan
Unit-V: THERMAL TESTING, THERMO-MECHANICAL AND DYNAMIC MECHANICAL ANALYSIS & CHEMICAL TESTING [OTHER TESTING].
Subject Name: OML751 Testing of Materials
Topics: Thermal Testing: Differential scanning calorimetry, Differential thermal analysis. Thermo-mechanical and Dynamic mechanical analysis: Principles, Advantages, Applications. Chemical Testing: X-Ray Fluorescence, Elemental Analysis by Inductively Coupled Plasma-Optical Emission Spectroscopy and Plasma-Mass Spectrometry.
B.E. Mechanical Engineering
Final Year, VII Semester, Open Elective Subject
[As per Anna University R-2017]
Unit-II Mechanical Testing
Subject Name: OML751 Testing of Materials
Topics: Various Mechanical Tests [Hardness, Tensile, Impact, Bend, Shear, Creep & Fatigue]
B.E. Mechanical Engineering
Final Year, VII Semester, Open Elective Subject
[As per Anna University R-2017]
Intro
Principle
How it works
Types of dynamic Experiments
Instrumentation
Construction
Preparation of samples
Types of analysers
DMA of glass transition of polymers
Advantages
Applications
Limitations
Latest Research
References
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.
FellowBuddy.com is an innovative platform that brings students together to share notes, exam papers, study guides, project reports and presentation for upcoming exams.
We connect Students who have an understanding of course material with Students who need help.
Benefits:-
# Students can catch up on notes they missed because of an absence.
# Underachievers can find peer developed notes that break down lecture and study material in a way that they can understand
# Students can earn better grades, save time and study effectively
Our Vision & Mission – Simplifying Students Life
Our Belief – “The great breakthrough in your life comes when you realize it, that you can learn anything you need to learn; to accomplish any goal that you have set for yourself. This means there are no limits on what you can be, have or do.”
Like Us - https://www.facebook.com/FellowBuddycom
Transmission electron microscope, high resolution tem and selected area elect...Nano Encryption
The transmission electron microscope is a very powerful tool for material science. A high energy beam of electrons is shone through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. Chemical analysis can also be performed. TEM can be used to study the growth of layers, their composition and defects in semiconductors. High resolution can be used to analyze the quality, shape, size and density of quantum wells, wires and dots.
Solar power is a very important source of renewable energy for many low power systems. Matching the power consumption level with the supply level can make a great difference in the efficiency of power utilization. MoSe2, crystals (photo-electrodes) have been grown via a direct vapour transport technique. This paper presents results of Photo Voltage (VPh) Vs. Photo current (IPh)curves measured for MoSe2 crystals of different Intensity levels between 10, 20,'¦100W/cm2 in Polychromatic as well as Monochromatic light. We finding the Open circuit Voltage (VOC), Short circuit current(ISC), fill factor and photo conversion efficiency (?) of Mose2 crystals. The Photo conversion efficiency of this MoSe2 crystals are less than 0.1% in Polychromatic light but nearly 1% in Monochromatic light H. S. Patel | S. P. Shukla | Hitesh Parmar"Optical Response of MoSe2 Crystals" Published in International Journal of Trend in Scientific Research and Development (ijtsrd), ISSN: 2456-6470, Volume-1 | Issue-3 , April 2017, URL: http://www.ijtsrd.com/papers/ijtsrd66.pdf http://www.ijtsrd.com/other-scientific-research-area/physics/66/optical-response-of-mose2-crystals/h-s-patel
Lightning Characteristics and Impulse Voltage.Milton Sarker
Lightning characteristics and standard impulse
waveform are related to each other. But the lack
of realization about the relation between them
would make the solution to produce better
protection against lightning surge becomes
harder. Natural lightning surge waveform has
been compared to standard impulse waveform as
evidence that there have similarity between
them. The standard impulse waveform could be
used to test the strength of electrical equipment
against the lightning. Therefore designing and
simulating the impulse generator are the purpose
of this project beside to get better understanding
about lightning characteristics. This project aims
to develop an impulse generator circuit. The
main objectives of this work are two folds: the
first is the characterization of impulse voltages
and the second is the designing of an impulse
voltage generator. Our working purpose is to
give a concept about Impulse voltages and
impulse generator to the students and
researchers.
A Study on Liquid Dielectric Breakdown in Micro-EDM Discharge - Cognitio paperSantosh Verma
The research work carried out in this paper, aims at
understanding the breakdown phenomenon of liquid dielectric by the low energy ultra-short pulsed electric discharge produced between tiny electrodes (~ 100µm diameter electrode) through experimental studies In literature not many studies are reported on liquid dielectric breakdown mechanism, and in micro-EDM no published literature discusses about this. Therefore, a detailed study on literature has been performed and preliminary
experiments have conducted on micro-EDM to understand the glow discharge and its breakdown phenomenon better, towards validation of scientific analogies for micro-EDM process conditions.
Introduction of quantum efficiency
Original link:https://enlitechnology.com/blog/qe/quantum-efficiency-01/
*About Enlitech
Enlitech was founded in March 2009.
The core technologies include artificial light source and spectrum analyzing technique.Enlitech’s four main product markets include image sensor testing solutions, advanced photoelectric detector testing systems, quantum efficiency test solutions, and various light simulators.
Our popular products are QER and SS-X solar simulator. If you are interested, please visit the official website to understand more!
https://enlitechnology.com/
SIMULATION OF THE SOLAR CELLS WITH PC1D, APPLICATION TO CELLS BASED ON SILICONAEIJjournal2
A way of exploiting the solar energy is to use cells photovoltaic which convert the energy conveyed by the
incidental radiation in a continuous electric current. This conversation is based on the photovoltaic effect
engendered by the absorption of photons. A part of the absorbed photons generates pairs electron-hole in
which an electric field created in the zone of load of space of a junction p–n.
Thus, the junction p-n, its characteristics, its components and its dimensions are the parameters
responsible of the efficiency and the performances of a solar cell. To study this, we are going to use a very
known software in the mode of the simulation of solar cells, the PC1D, and we are going, at the end, to
draw a conclusion around the ideal parameters that a good solar cell has to have.
STUDY OF THE EQUIVALENT CIRCUIT OF A DYESENSITIZED SOLAR CELLSAEIJjournal2
The dye-sensitized solar cells (DSSC) have gained the last decades an important place among photovoltaic
technologies due to their low-cost of implementation and their performance, which becomes more efficient.
The experimental data for this type of cells are enriched and accumulated quickly, given the enthusiasm for
this new technology. The present work treats the equivalent circuit of a dye-sensitized solar cell (DSSC) for
a model in an exponential, and by using the results of some works, we shall make a simulation by the
software Scilab to obtain the characteristics (I-V), then we will study the influence of every parameter on
the curve.
SCANNING ELECTRON MICROSCOPE
Introduction to electron Microscope
Principle of SEM
Characteristics that can be viewed on SEM
Comparison OM V/S SEM
Components of SEM
SEM Sample preparation
Working SEM
Applications
Limitations
References
Similar to Scanning Electron Microscope Lab Report (20)
Report paper on Graphene Field Effect Transistor, for the Nanoelectronics course, in the Nanotechnology MSc program at the Information and Telecommunication (ICT) school KTH.
Report presentation on project work involving the fabrication and characterization of a MEMS Bi/Multi-Stable Optical In-plane Switch, for the Micro-Elcectro Mechanical Systems (MEMS) course, in the Nanotechnology MSc program at the Information and Telecommunication (ICT) school KTH.
A presentation about the article "Simulation Study of a 3-D Device IntegratingFinFET and UTBFET" by Hossain M. Fahad and Chenming Hu, published in IEEE Transactions on Electron Devices.
TOP 10 B TECH COLLEGES IN JAIPUR 2024.pptxnikitacareer3
Looking for the best engineering colleges in Jaipur for 2024?
Check out our list of the top 10 B.Tech colleges to help you make the right choice for your future career!
1) MNIT
2) MANIPAL UNIV
3) LNMIIT
4) NIMS UNIV
5) JECRC
6) VIVEKANANDA GLOBAL UNIV
7) BIT JAIPUR
8) APEX UNIV
9) AMITY UNIV.
10) JNU
TO KNOW MORE ABOUT COLLEGES, FEES AND PLACEMENT, WATCH THE FULL VIDEO GIVEN BELOW ON "TOP 10 B TECH COLLEGES IN JAIPUR"
https://www.youtube.com/watch?v=vSNje0MBh7g
VISIT CAREER MANTRA PORTAL TO KNOW MORE ABOUT COLLEGES/UNIVERSITITES in Jaipur:
https://careermantra.net/colleges/3378/Jaipur/b-tech
Get all the information you need to plan your next steps in your medical career with Career Mantra!
https://careermantra.net/
Online aptitude test management system project report.pdfKamal Acharya
The purpose of on-line aptitude test system is to take online test in an efficient manner and no time wasting for checking the paper. The main objective of on-line aptitude test system is to efficiently evaluate the candidate thoroughly through a fully automated system that not only saves lot of time but also gives fast results. For students they give papers according to their convenience and time and there is no need of using extra thing like paper, pen etc. This can be used in educational institutions as well as in corporate world. Can be used anywhere any time as it is a web based application (user Location doesn’t matter). No restriction that examiner has to be present when the candidate takes the test.
Every time when lecturers/professors need to conduct examinations they have to sit down think about the questions and then create a whole new set of questions for each and every exam. In some cases the professor may want to give an open book online exam that is the student can take the exam any time anywhere, but the student might have to answer the questions in a limited time period. The professor may want to change the sequence of questions for every student. The problem that a student has is whenever a date for the exam is declared the student has to take it and there is no way he can take it at some other time. This project will create an interface for the examiner to create and store questions in a repository. It will also create an interface for the student to take examinations at his convenience and the questions and/or exams may be timed. Thereby creating an application which can be used by examiners and examinee’s simultaneously.
Examination System is very useful for Teachers/Professors. As in the teaching profession, you are responsible for writing question papers. In the conventional method, you write the question paper on paper, keep question papers separate from answers and all this information you have to keep in a locker to avoid unauthorized access. Using the Examination System you can create a question paper and everything will be written to a single exam file in encrypted format. You can set the General and Administrator password to avoid unauthorized access to your question paper. Every time you start the examination, the program shuffles all the questions and selects them randomly from the database, which reduces the chances of memorizing the questions.
Water billing management system project report.pdfKamal Acharya
Our project entitled “Water Billing Management System” aims is to generate Water bill with all the charges and penalty. Manual system that is employed is extremely laborious and quite inadequate. It only makes the process more difficult and hard.
The aim of our project is to develop a system that is meant to partially computerize the work performed in the Water Board like generating monthly Water bill, record of consuming unit of water, store record of the customer and previous unpaid record.
We used HTML/PHP as front end and MYSQL as back end for developing our project. HTML is primarily a visual design environment. We can create a android application by designing the form and that make up the user interface. Adding android application code to the form and the objects such as buttons and text boxes on them and adding any required support code in additional modular.
MySQL is free open source database that facilitates the effective management of the databases by connecting them to the software. It is a stable ,reliable and the powerful solution with the advanced features and advantages which are as follows: Data Security.MySQL is free open source database that facilitates the effective management of the databases by connecting them to the software.
6th International Conference on Machine Learning & Applications (CMLA 2024)ClaraZara1
6th International Conference on Machine Learning & Applications (CMLA 2024) will provide an excellent international forum for sharing knowledge and results in theory, methodology and applications of on Machine Learning & Applications.
NUMERICAL SIMULATIONS OF HEAT AND MASS TRANSFER IN CONDENSING HEAT EXCHANGERS...ssuser7dcef0
Power plants release a large amount of water vapor into the
atmosphere through the stack. The flue gas can be a potential
source for obtaining much needed cooling water for a power
plant. If a power plant could recover and reuse a portion of this
moisture, it could reduce its total cooling water intake
requirement. One of the most practical way to recover water
from flue gas is to use a condensing heat exchanger. The power
plant could also recover latent heat due to condensation as well
as sensible heat due to lowering the flue gas exit temperature.
Additionally, harmful acids released from the stack can be
reduced in a condensing heat exchanger by acid condensation. reduced in a condensing heat exchanger by acid condensation.
Condensation of vapors in flue gas is a complicated
phenomenon since heat and mass transfer of water vapor and
various acids simultaneously occur in the presence of noncondensable
gases such as nitrogen and oxygen. Design of a
condenser depends on the knowledge and understanding of the
heat and mass transfer processes. A computer program for
numerical simulations of water (H2O) and sulfuric acid (H2SO4)
condensation in a flue gas condensing heat exchanger was
developed using MATLAB. Governing equations based on
mass and energy balances for the system were derived to
predict variables such as flue gas exit temperature, cooling
water outlet temperature, mole fraction and condensation rates
of water and sulfuric acid vapors. The equations were solved
using an iterative solution technique with calculations of heat
and mass transfer coefficients and physical properties.
NUMERICAL SIMULATIONS OF HEAT AND MASS TRANSFER IN CONDENSING HEAT EXCHANGERS...
Scanning Electron Microscope Lab Report
1. IH2652 Methods and Instruments of Analysis
Scanning Electron Microscope
Lab Report
December 2, 2014
Group members: Sumit Mohanty
Mohamed Atwa
Ahmed AlAskalany
1
3. 1 Introduction
Scanning Electrons Microscope (SEM) is a powerful characterization tool for materials of various sizes and
shapes, and is extremely important in the study of nano-scale structures. The electron beam from an electron
gun is directed towards the specimen and steered using an arrangement of apertures and magnetic lenses.
The steered electron beam is focused on specific positions on the surface of the specimen, where different
beam-sample interactions can take place, the electrons resulting from such interactions are collected by spe-
cific detectors and converted to an image on a screen. There are two important types of electrons resulting
from beam-sample interaction. The first is the Back-scattered Electrons (BSE), which result from elastically
scattered of incident beam electrons by atoms in the sample, BSEs are used to generate images with contrast
varying with the atomic number of different sample constituent elements. The second are Secondary Elec-
trons (SE), resulting form inelastic scattering process, these are useful in obtaining topographical images
of the sample’s surface, since their reflected intensity is proportional to the volume of interaction that is
affected by the angle between the beam and the point where it hits the sample.
Various parameters affect SEM images, accelerating voltage, beam current, beam diameter, working distance
are all parameters that should be taken care of in order to obtain a high quality SEM image. SEM images
always seem to be illuminated from a certain direction, which is actually the detector direction.
SEM samples should either be conductive or coated by a conductive layer, which can be done by different
techniques. This is to eliminate any accumulation of electrons on the sample’s surface (surface charging)
degrading image quality. In case of biological samples, it is required that water is replaced by appropriate
gas, to avoid water bursting under the influence of electron bombardment.
In the lab, different SEM images were obtained, examining the different effects of chaning accelerating
voltage, probe current, tilt angle, and working distance on the SEM image. In this report, the different SEM
images are presented and accompanied by comments on the differences based on the theory of operation of
SEM.
2 Results and discussions
In this section of the report the different experiments conducted in the lab will be discussed, and will be
commented on based on the theory of operation of SEM and the possible interpretations of the effect of
change in its different operating parameters on the obtained scans of the specimen.
2.1 Acceleration Voltage and Charging Effect
The effect of varying acceleration voltage was studied at a constant magnification of x5k. It could be clearly
seen that the image obtained at highest value of acceleration voltage (Fig. 1d)of 20kV is the brightest. Its
reasonable to argue to that this primarily owes to the highly energetic electrons bombarding the sample
thereby and producing a more illuminated image. Hence this overtly illuminated image might lead to the
charging effect of the specimen which may damage our sample. These electrons have a lower wavelength
thereby a higher energy which leads to higher electron beam brightness and ultimately a higher resolution.
Similarly, it can be seen that as we go down the values of acceleration voltage the image, we lose this bright-
ness and henceforth at the value of acceleration voltage as low as 1kV, it is difficult to obtain a clear image
even by manually enhancing the brightness on the screen. The image obtained as a result was distorted as
shown in Fig 1(a). Hence, a higher acceleration voltage reveals more surface details on a specimen due to
higher resolution.
On the contrary, a brighter image doesn’t necessarily imply more clarity because although a more brighter
image is obtained upon increasing the acceleration voltage, the contrast between the features isn’t satis-
factory. Increasing the acceleration leads to an increase in the interaction between the electron probe and
specimen in the lateral direction which leads to a decrease in resolution. There lies a trade off between using
the highly energetic electrons for illumination and stark contrast between the intricate structures apparent
from the figures. Looking at Fig 1b and 1c, it can be observed that the miniatured hole like features on
3
4. (a) SE image 1kV x5k (b) SE image 5kV x5k
(c) SE image 10kV x5k (d) SE image 20kV x5k
Figure 1: Multiple SE images corresponding to different acceleration voltages
the electrode fingers have much more clarity compared to the two extreme values and therefor these two
represent a more optimal case of tuning between the brightness and contrast and ultimately the resolution.
Therefore a right balance between brightness and contrast could only be obtained at a value roughly between
between the two extrema for the perfect resolution.
The effect of varying the accelerating voltage on SE images can be summarized as follows. Increasing the
accelerating voltage causes a considerable increase in image resolution, on the expense of the clarity of surface
structures, also it leads to more charge-up, and increased probability of sample damage. While decreasing
accelerating voltage lowers the image resolution, however it allows us to see surface structures more clearly,
and reduces other effects associated with higher voltage, like charge-up and damage to the sample.
2.2 Current Effects
(a) 20mA (b) 40mA (c) 60mA
Figure 2: SE images at 20kV and different beam currents, to study how current intensity affects image.
In conclusion, increasing probe current generates a smoother image with deteriorated resolution, and may
cause damage to the sample. While a higher resolution image with less probability of damage can be obtained
using lower probe currents, but the image will be grainy due to the decrease in the signal-to-noise ratio.
4
5. 2.3 Tilt Effects
(a) 0 degree tilt (b) 45 degree tilt
Figure 3: The effect of changing the tilt of the sample on the SEM image
In order to look at the tilting effect of sample, the working distance was increased to roughly 27mm to
accommodate the angular displacement of 45o
, this increased the working distance from the perspective
view and hence the image obtained are shown in Fig 3. Fig 3b makes it apparent that the sample is
disproportionately illuminated. This is because of the non uniformity of the electron beam irradiation on
the specimen and the relatively more lit up area corresponds to the direction in which the detector perceives
it. Therefore, increasing the tilt apart from obvious perspective scaling of dimensions, also results into
disproportional irradiation of the specimen resulting into variable resolution along the sample. This is
analogous of having different working distances at different points of the sample.
2.4 Working Distance
Figure 4: Working distance changed from 7mm to 33mm
A variation of working distance (WD) was carried out from 7mm to roughly 33mm as shown in Fig 4.a-4.c.
It could be observed that moving to closer WDs gives a higher resolution of images as apparent from the
image 4c. Though there again lies a trade off between the resolution and depth of field. Looking at image 4a,
it could be seen that the depth of field is improved but at expense of poor resolution. Furthermore, it greater
WDs implies imparts a certain fringing effect to the image which even worsens the resolution. This fringing
effect owes partly to the improper spherical aberration and also to the inconsistency in the rate of electron
scanning. There is a possibility that at higher WDs, the rate at which electron beam scans the sample has a
certain lag (owing to the distance) compared to the data acquisition rate. The variation of this lag could be
responsible for the fringing effect (Fig 4a) which looks like an interference pattern on the electrodes in the
image. On a conclusive note, the optimum balance of the working distance could be obtained, depending
upon the requirements of depth of field and resolution, somewhere in the intermediate values of WDs chosen.
5
6. 3 Conclusion
During the lab, different experiments were conducted. In the first experiment, different SEM scans were
obtained for the specimen, at different acceleration voltages (1kV, 2kV, and 5kV) to study the charging
effect of the specimen on the SEM image, and how this can affect the image’s resolution. In the experiment
that followed, the effect of varying SEM beam current on the image was examined through setting the
beam to a low (20mA) and high (40mA) values. The effect of different beam currents was discussed, in
terms of image resolution, grainy image, signal to noise ration, and the possibility of sample damage due
to charging effect. Afterwards, the sample was scanned before and after a tilt of 45 degrees, with same
operating conditions. This was discussed in terms of the disproportional reflection of the irradiated parts
of the specimen, depending on their perspective with respect to the detector. Finally, the working distance
of the sample was increased, and the effect of this on the image’s resolution and the depth of field was
explained.
The most important part of this lab, besides learning about the effect of the change in different operating
parameters, was getting an important hands-on experience and having to learn how to operate an SEM and
to tune its different variables in order to obtain a clear image that is essential for the study of different
materials and components.
6