This document discusses low-energy electron diffraction (LEED), a technique used to determine the surface structure of single-crystalline materials. LEED works by bombarding a sample's surface with a low-energy electron beam and observing the diffraction pattern of scattered electrons on a fluorescent screen. The key components of a LEED system are an electron gun, sample holder, and detector. LEED provides structural information about a sample's surface and has the advantages of being relatively simple and highly surface sensitive, but requires an ultra-high vacuum environment and thin sample specimens.

2. LOW-ENERGY ELECTRON
DIFFRACTION (LEED)

3. CONTENTS
•LEED
•Modes
•History
•Principle
•Electron diffraction
•Experimental setup
Sample preparation
Electron gun
Detector system
•Advantages & Drawbacks

4. LOW-ENERGY ELECTRON
DIFFRACTION (LEED)
It is a technique for the determination of
the surface structure of single-crystalline
material by bombardment with a
collimated beam of low energy electrons
(20-200 eV) and observation of diffracted
electrons as spots on a fluorescent
screen.

5. LEED MAY BE USED IN
ONE OF TWO WAYS:
•Qualitative, where the diffraction pattern
is recoded and analysis of the spot
position gives information on the
symmetry of the surface structure.
•Quantitatively, where the intensities of
diffracted beam are recoded as a
function of incident electron beam
energy to generate the so-called I-V
curves.

6. DAVISSON AND GERMER'S
DISCOVERY OF ELECTRON
DIFFRACTION

7. PRINCIPLE
The basic principle of standard
LEED experiment is very simple: a
collimated mono energetic beam of
electrons is directed towards a
single crystal surface and the
diffraction pattern of the elastically
back scattered electrons is
recoded using a sensitive detector.

8. ELECTRON DIFFRACTION
Low-energy electron diffraction (LEED)
is based on the diffraction of electrons by
the Bragg planes of a single-crystalline
sample

9. EXPERIMENTAL
SETUP
In order to keep the studied
sample clean and free from
unwanted adsorbents, LEED
experiments are performed in an
ultra-high-vacuum environment
(10−9 mbar).
The most important elements in a
LEED experiment are:
A sample holder with the
prepared sample
An electron gun
A display system, usually a
hemispherical fluorescent screen
on which the diffraction pattern
can be observed directly
A sputtering gun for cleaning the
surface.

11. SAMPLE PREPARATION
The sample is usually prepared outside the
vacuum chamber by cutting a slice of
around 1 mm in thickness and 1 cm in
diameter along the desired crystallographic
axis. After being mounted in the UHV
chamber the sample is chemically cleaned
and flattened. Unwanted surface
contaminants are removed by ion sputtering
or by chemical processes such as oxidation
and reduction cycles.

12. ELECTRON GUN
•In the electron gun, electrons are emitted
by a cathode filament which is at a negative
potential, typically 10-600 V, with respect to
the sample.
• The electrons are accelerated and focused
into a beam, typically about 0.1 to 0.5 mm
wide, by a series of electrodes serving as
electron lenses. Some of the electrons
incident on the sample surface are
backscattered elastically, and diffraction can
be detected if sufficient order exists on the
surface.

13. DETECTOR SYSTEM
A LEED detector usually contains three or four
hemispherical concentric grids and
a phosphor screen or other position-sensitive
detector.
The grids are used for screening out the
inelastically scattered electrons.
•The LEED contains a retarding field analyzer to
block inelastically scattered electrons.
•The first grid screens separates the space above
the sample from the retarding field. The next grid is
at a potential to block low energy electrons.

14. ADVANTAGES
•Structural information available.
•Relatively simple and cheap
experiment setup.
•High surface sensitivity.
•Easy information on symmetry
and shape of surface unit cell.
•Atomic structure can be retrieved
with high accuracy.

15. DRAWBACKS
•LEED can not detect the surface
properties during the process of film
growing on the sample surface.
•Very thin specimen needed.
•UHV essential