In this paper we introduced an approach to model manufacture process of a multiemitter heterotransistor.
The approach gives us also possibility to optimize manufacture process. p-n-junctions, which include into
the multiemitter heterotransistor, have higher sharpness and higher homogeneity of dopants distributions in enriched by the dopant area.
Using inhomogeneity of heterostructure and optimization of annealing to decre...ijcsa
Framework this paper we discussed an approach to manufacture a multiemitter heterotransistor. The introduced
approach is a branch of recently introduced approach and based on doping by diffusion or by ion
implantation of required part of heterostructure and optimization of dopant and/or radiation defects. The
heterostructure should has special configuration.
ON MODIFICATION OF PROPERTIES OF P-N-JUNCTIONS DURING OVERGROWTHZac Darcy
In this paper we consider influence of overgrowth of doped by diffusion and ion implantation areas of heterostructures
on distributions of concentrations of dopants. Several conditions to increase sharpness of p-njunctions
(single and framework bipolar transistors), which were manufactured during considered technological
process, have been determined. At the same time we analyzed influence of speed of overgrowth of
doped areas and mechanical stress in the considered heterostructure on distribution of concentrations of
dopants in the structure.
ON OPTIMIZATION OF MANUFACTURING OF MULTICHANNEL HETEROTRANSISTORS TO INCREAS...ijrap
In this paper we consider an approach to increase integration rate of field-effect heterotransistors. Framework
the approach we consider a heterostructure with specific configuration. After manufacturing the
heterostructure we consider doping of required areas of the heterostructure by diffusion or ion implantation.
The doping finished by optimized annealing of dopant and/or radiation defects. Framework this paper
we consider a possibility to manufacture with several channels. Manufacturing multi-channel transistors
gives us a possibility the to increase integration rate of transistors and to increase electrical current
through the transistor.
An approach to decrease dimentions of logicalijcsa
In this paper we consider manufacturing logical elements with function AND-NOT based on bipolar transistors.Based on recently considered approach to decrease dimensions of solid state electronic devices with the same time increasing of their performance we introduce an approach to decrease dimensions of transistors and p-n-junctions, which became a part of the logical element. Framework the approach a heterostructure
with required configuration should be manufactured. After the manufacture required areas of the heterostructures should be doped by diffusion or ion implantation. The doping should be finished by optimized annealing of dopant and/or radiation defects.
ON APPROACH TO DECREASE DIMENSIONS OF FIELD-EFFECT TRANSISTORS FRAMEWORK ELEM...ijfcstjournal
In this paper we consider manufacturing of elements SRAM with increased density of field-effect transistors
consisting these elements. The approach based on manufacturing of the elements in heterostructure with
specific configuration. We consider doping of several required areas of the heterostructure by diffusion or
by ion implantation. After that dopant and radiation defects have been annealed framework optimized
scheme.
Dependence of Charge Carriers Mobility in the P-N-Heterojunctions on Composit...msejjournal
In this paper we consider manufacturing a p-n-junctions by dopant diffusion or ion implantation into a multilayer structure. We introduce an approach to increase sharpness of these p-n-junctions and at the same time to increase homogeneity of distributions of dopants in enriched by these dopants areas. We consider influence of the above changing of distribution of dopant on charge carrier mobility. We also consider an approach to decrease value of mismatch-induced stress in the considered multilayer structure by using a buffer layer. The decreasing gives a possibility to increase value of charge carrier mobility.
Optimization of Manufacturing of Circuits XOR to Decrease Their Dimensionsijrap
We analyzed possibility to increase density of elements of integrated circuits. We illustrate the possibility
by example of manufacturing of a circuit XOR. Framework the paper we consider a heterostructure which
includes into itself a substrate and an epitaxial layer with specific configuration. Several required areas of
the heterostructure have been doped by diffusion and/or ion implantation. After that we consider optimized
annealing of dopant and/or radiation defects.
Optimization of technological process to decrease dimensions of circuits xor ...ijfcstjournal
The paper describes an approach of increasing of integration rate of elements of integrated circuits. The
approach has been illustrated by example of manufacturing of a circuit XOR. Framework the approach one
should manufacture a heterostructure with specific configuration. After that several special areas of the
heterostructure should be doped by diffusion and/or ion implantation and optimization of annealing of dopant
and/or radiation defects. We analyzed redistribution of dopant with account redistribution of radiation
defects to formulate recommendations to decrease dimensions of integrated circuits by using analytical
approaches of modeling of technological process.
Using inhomogeneity of heterostructure and optimization of annealing to decre...ijcsa
Framework this paper we discussed an approach to manufacture a multiemitter heterotransistor. The introduced
approach is a branch of recently introduced approach and based on doping by diffusion or by ion
implantation of required part of heterostructure and optimization of dopant and/or radiation defects. The
heterostructure should has special configuration.
ON MODIFICATION OF PROPERTIES OF P-N-JUNCTIONS DURING OVERGROWTHZac Darcy
In this paper we consider influence of overgrowth of doped by diffusion and ion implantation areas of heterostructures
on distributions of concentrations of dopants. Several conditions to increase sharpness of p-njunctions
(single and framework bipolar transistors), which were manufactured during considered technological
process, have been determined. At the same time we analyzed influence of speed of overgrowth of
doped areas and mechanical stress in the considered heterostructure on distribution of concentrations of
dopants in the structure.
ON OPTIMIZATION OF MANUFACTURING OF MULTICHANNEL HETEROTRANSISTORS TO INCREAS...ijrap
In this paper we consider an approach to increase integration rate of field-effect heterotransistors. Framework
the approach we consider a heterostructure with specific configuration. After manufacturing the
heterostructure we consider doping of required areas of the heterostructure by diffusion or ion implantation.
The doping finished by optimized annealing of dopant and/or radiation defects. Framework this paper
we consider a possibility to manufacture with several channels. Manufacturing multi-channel transistors
gives us a possibility the to increase integration rate of transistors and to increase electrical current
through the transistor.
An approach to decrease dimentions of logicalijcsa
In this paper we consider manufacturing logical elements with function AND-NOT based on bipolar transistors.Based on recently considered approach to decrease dimensions of solid state electronic devices with the same time increasing of their performance we introduce an approach to decrease dimensions of transistors and p-n-junctions, which became a part of the logical element. Framework the approach a heterostructure
with required configuration should be manufactured. After the manufacture required areas of the heterostructures should be doped by diffusion or ion implantation. The doping should be finished by optimized annealing of dopant and/or radiation defects.
ON APPROACH TO DECREASE DIMENSIONS OF FIELD-EFFECT TRANSISTORS FRAMEWORK ELEM...ijfcstjournal
In this paper we consider manufacturing of elements SRAM with increased density of field-effect transistors
consisting these elements. The approach based on manufacturing of the elements in heterostructure with
specific configuration. We consider doping of several required areas of the heterostructure by diffusion or
by ion implantation. After that dopant and radiation defects have been annealed framework optimized
scheme.
Dependence of Charge Carriers Mobility in the P-N-Heterojunctions on Composit...msejjournal
In this paper we consider manufacturing a p-n-junctions by dopant diffusion or ion implantation into a multilayer structure. We introduce an approach to increase sharpness of these p-n-junctions and at the same time to increase homogeneity of distributions of dopants in enriched by these dopants areas. We consider influence of the above changing of distribution of dopant on charge carrier mobility. We also consider an approach to decrease value of mismatch-induced stress in the considered multilayer structure by using a buffer layer. The decreasing gives a possibility to increase value of charge carrier mobility.
Optimization of Manufacturing of Circuits XOR to Decrease Their Dimensionsijrap
We analyzed possibility to increase density of elements of integrated circuits. We illustrate the possibility
by example of manufacturing of a circuit XOR. Framework the paper we consider a heterostructure which
includes into itself a substrate and an epitaxial layer with specific configuration. Several required areas of
the heterostructure have been doped by diffusion and/or ion implantation. After that we consider optimized
annealing of dopant and/or radiation defects.
Optimization of technological process to decrease dimensions of circuits xor ...ijfcstjournal
The paper describes an approach of increasing of integration rate of elements of integrated circuits. The
approach has been illustrated by example of manufacturing of a circuit XOR. Framework the approach one
should manufacture a heterostructure with specific configuration. After that several special areas of the
heterostructure should be doped by diffusion and/or ion implantation and optimization of annealing of dopant
and/or radiation defects. We analyzed redistribution of dopant with account redistribution of radiation
defects to formulate recommendations to decrease dimensions of integrated circuits by using analytical
approaches of modeling of technological process.
ON APPROACH TO INCREASE DENSITY OF FIELD- EFFECT TRANSISTORS IN AN INVERTER C...antjjournal
In this paper we consider an approach to decrease dimensions of field-effect transistors framework invertors with increasing of their density. Framework the approach it is necessary to manufacture a
heterostructure, which consist of two layers. One of them includes into itself several sections. After manufacturing of the heterostructure these sections should be doped by diffusion or by ion implantation with future optimized annealing of dopant and/or radiation defects. To prognosis the technological process we consider an analytical approach, which gives a possibility to take into account variation of physical parameters in space and time. At the same time the approach gives a possibility to take into
account nonlinearity of mass and heat transport and to analyze the above transport without crosslinking solutions on interfaces between materials of heterostructure.
On optimization ofON OPTIMIZATION OF DOPING OF A HETEROSTRUCTURE DURING MANUF...ijcsitcejournal
We introduce an approach of manufacturing of a p-i-n-heterodiodes. The approach based on using a δ-
doped heterostructure, doping by diffusion or ion implantation of several areas of the heterostructure. After
the doping the dopant and/or radiation defects have been annealed. We introduce an approach to optimize
annealing of the dopant and/or radiation defects. We determine several conditions to manufacture more
compact p-i-n-heterodiodes
Decreasing of quantity of radiation de fects inijcsa
Recently we introduced an approach to increase sharpness of diffusion-junction and implanted-junction
heterorectifiers. The heterorectifiers could by single and as a part of heterobipolar transistors. However
manufacturing p-n-junctions by ion implantation leads to generation of radiation defects in materials of
heterostructure. In this paper we introduce an approach to use an overlayer and optimization of annealing
of radiation defects to decrease quantity of radiation defects.
Modeling of manufacturing of a field effect transistor to determine condition...ijcsa
In this paper we introduce an approach to model technological process of manufacture of a field-effect
heterotransistor. The modeling gives us possibility to optimize the technological process to decrease length
of channel by using mechanical stress. As accompanying results of the decreasing one can find decreasing
of thickness of the heterotransistors and increasing of their density, which were comprised in integrated
circuits.
ON DECREASING OF DIMENSIONS OF FIELDEFFECT TRANSISTORS WITH SEVERAL SOURCESmsejjournal
We analyzed mass and heat transport during manufacturing field-effect heterotransistors with several sources to decrease their dimensions. Framework the result of manufacturing it is necessary to manufacture heterostructure with specific configuration. After that it is necessary to dope required areas of the heterostructure by diffusion or ion implantation to manufacture the required type of conductivity (p or n). After
the doping it is necessary to do optimize annealing. We introduce an analytical approach to prognosis mass
and heat transport during technological processes. Using the approach leads to take into account nonlinearity of mass and heat transport and variation in space and time (at one time) physical parameters of these processes
ON APPROACH OF OPTIMIZATION OF FORMATION OF INHOMOGENOUS DISTRIBUTIONS OF DOP...ijcsa
We introduce an approach of manufacturing of a field-effect heterotransistor with inhomogenous doping of channel. The inhomogenous distribution of concentration of dopant gives a possibility to change speed of transport of charge carriers and to decrease length of channel.
OPTIMIZATION OF MANUFACTURING OF LOGICAL ELEMENTS "AND" MANUFACTURED BY USING...ijcsitcejournal
In this paper we introduce an approach to decrease dimensions of logical elements "AND" based on fieldeffect
heterotransistors. Framework the approach one shall consider a heterostructure with specific structure.
Several specific areas of the het
ANALYSIS OF MANUFACTURING OF VOLTAGE RESTORE TO INCREASE DENSITY OF ELEMENTS ...ijoejournal
We introduce an approach for increasing density of voltage restore elements. The approach based on
manufacturing of a heterostructure, which consist of a substrate and an epitaxial layer with special configuration.
Several required sections of the layer should be doped by diffusion or ion implantation. After
that dopants and/or radiation defects should be annealed.
AN APPROACH TO OPTIMIZE MANUFACTURE OF AN ACTIVE QUADRATURE SIGNAL GENERATOR ...antjjournal
In this paper we introduce an approach to increase density of field-effect transistors framework an active
quadrature signal generator. Framework the approach we consider manufacturing the generator in heterostructure
with specific configuration. Several required areas of the heterostructure should be doped by diffusion
or ion implantation. After that dopant and radiation defects should by annealed framework optimized
scheme. We also consider an approach to decrease value of mismatch-induced stress in the considered
heterostructure. We introduce an analytical approach to analyze mass and heat transport in heterostructures
during manufacturing of integrated circuits with account mismatch-induced stress.
MODELING OF MANUFACTURING OF A FIELDEFFECT TRANSISTOR TO DETERMINE CONDITIONS...antjjournal
In this paper we introduce an approach to model technological process of manufacture of a field-effect
heterotransistor. The modeling gives us possibility to optimize the technological process to decrease length
of channel by using mechanical stress. As accompanying results of the decreasing one can find decreasing
of thickness of the heterotransistors and increasing of their density, which were comprised in integrated
circuits.
MODIFICATION OF DOPANT CONCENTRATION PROFILE IN A FIELD-EFFECT HETEROTRANSIST...msejjournal
In this paper we consider an approach of manufacturing more compact field-effect heterotransistors. The
approach based on manufacturing a heterostructure, which consist of a substrate and an epitaxial layer
with specific configuration. After that several areas of the epitaxial layer have been doped by diffusion or
ion implantation with optimized annealing of dopant and /or radiation defects. At the same time we introduce
an approach of modification of energy band diagram by additional doping of channel of the transistors.
We also consider an analytical approach to model and optimize technological process.
In this paper we introduce an approach to increase vertical integration of elements of transistor-transistor logic with function AND-NOT. Framework the approach we consider a heterostructure with special configuration. Several specific areas of the heterostructure should be doped by diffusion or ion implantation. Annealing of dopant and/or radiation defects should be optimized.
On Modification of Properties of P-N-Junctions During OvergrowthZac Darcy
In this paper we consider influence of overgrowth of doped by diffusion and ion implantation areas of heterostructures on distributions of concentrations of dopants. Several conditions to increase sharpness of p-njunctions (single and framework bipolar transistors), which were manufactured during considered technological process, have been determined. At the same time we analyzed influence of speed of overgrowth of
doped areas and mechanical stress in the considered heterostructure on distribution of concentrations of
dopants in the structure.
On Modification of Properties of P-N-Junctions During OvergrowthZac Darcy
In this paper we consider influence of overgrowth of doped by diffusion and ion implantation areas of heterostructures on distributions of concentrations of dopants. Several conditions to increase sharpness of p-njunctions (single and framework bipolar transistors), which were manufactured during considered technological process, have been determined. At the same time we analyzed influence of speed of overgrowth of
doped areas and mechanical stress in the considered heterostructure on distribution of concentrations of
dopants in the structure.
Optimization of Manufacture of Field-Effect Heterotransistors without P-N-Jun...ijrap
It has been recently shown, that manufacturing p-n-junctions, field-effect and bipolar transistors, thyristors in a multilayer structure by diffusion or ion implantation under condition of optimization of dopant and/or
radiation defects leads to increasing of sharpness of p-n-junctions (both single p-n-junctions and p-njunctions, which include into their system). In this situation one can also obtain increasing of homogeneity of dopant in doped area. In this paper we consider manufacturing a field-effect heterotransistor without pn-junction. Optimization of technological process with using inhomogeneity of heterostructure give us possibility to manufacture the transistors as more compact.
Optimization of Manufacture of Field-Effect Heterotransistors without P-N-Jun...ijrap
It has been recently shown, that manufacturing p-n-junctions, field-effect and bipolar transistors, thyristors in a multilayer structure by diffusion or ion implantation under condition of optimization of dopant and/or radiation defects leads to increasing of sharpness of p-n-junctions (both single p-n-junctions and p-njunctions, which include into their system). In this situation one can also obtain increasing of homogeneity of dopant in doped area. In this paper we consider manufacturing a field-effect heterotransistor without pn-junction. Optimization of technological process with using inhomogeneity of heterostructure give us possibility to manufacture the transistors as more compact.
ON OPTIMIZATION OF MANUFACTURING OF FIELD-EFFECT HETEROTRANSISTORS FRAMEWORK ...ijoejournal
In this paper we introduce an approach to increase density of field-effect transistors framework a voltage reference. Framework the approach we consider manufacturing the inverter in heterostructure with specific configuration. Several required areas of the heterostructure should be doped by diffusion or ion implantation. After that dopant and radiation defects should by annealed framework optimized scheme. We also consider an approach to decrease value of mismatch-induced stress in the considered heterostructure. We introduce an analytical approach to analyze mass and heat transport in heterostructures during manufacturing of integrated circuits with account mismatch-induced stress.
On Decreasing of Dimensions of Field-Effect Transistors with Several Sourcesmsejjournal
We analyzed mass and heat transport during manufacturing field-effect heterotransistors with several
sources to decrease their dimensions. Framework the result of manufacturing it is necessary to manufacture
heterostructure with specific configuration. After that it is necessary to dope required areas of the heterostructure by diffusion or ion implantation to manufacture the required type of conductivity (p or n). After
the doping it is necessary to do optimize annealing. We introduce an analytical approach to prognosis mass
and heat transport during technological processes. Using the approach leads to take into account nonlinearity of mass and heat transport and variation in space and time (at one time) physical parameters of these
processes
OPTIMIZATION OF MANUFACTURE OF FIELDEFFECT HETEROTRANSISTORS WITHOUT P-NJUNCT...ijrap
It has been recently shown, that manufacturing p-n-junctions, field-effect and bipolar transistors, thyristors
in a multilayer structure by diffusion or ion implantation under condition of optimization of dopant and/or
radiation defects leads to increasing of sharpness of p-n-junctions (both single p-n-junctions and p-njunctions,
which include into their system). In this situation one can also obtain increasing of homogeneity
of dopant in doped area. In this paper we consider manufacturing a field-effect heterotransistor without pn-
junction. Optimization of technological process with using inhomogeneity of heterostructure give us
possibility to manufacture the transistors as more compact.
AN APPROACH TO OPTIMIZE OF MANUFACTURING OF A VOLTAGE REFERENCE BASED ON HETE...JaresJournal
In this paper we introduce an approach to increase density of field-effect transistors framework a voltage
reference. Framework the approach we consider manufacturing the inverter in heterostructure with specific configuration. Several required areas of the heterostructure should be doped by diffusion or ion implantation. After that dopant and radiation defects should by annealed framework optimized scheme. We also
consider an approach to decrease value of mismatch-induced stress in the considered heterostructure. We
introduce an analytical approach to analyze mass and heat transport in heterostructures during manufacturing of integrated circuits with account mismatch-induced stress.
On Optimization of Manufacturing of Field-Effect Heterotransistors Frame-work...antjjournal
We consider an approach for increasing density of field-effect heterotransistors in a single-stage multi-path
operational amplifier. At the same time one can obtain decreasing of dimensions of the above transistors.
Dimensions of the elements could be decreased by manufacturing of these elements in a heterostructure
with specific structure. The manufacturing is doing by doping of required areas of the heterostructure by
diffusion or ion implantation with future optimization of annealing of dopant and/or radiation defects.
ON APPROACH TO INCREASE DENSITY OF FIELD- EFFECT TRANSISTORS IN AN INVERTER C...antjjournal
In this paper we consider an approach to decrease dimensions of field-effect transistors framework invertors with increasing of their density. Framework the approach it is necessary to manufacture a
heterostructure, which consist of two layers. One of them includes into itself several sections. After manufacturing of the heterostructure these sections should be doped by diffusion or by ion implantation with future optimized annealing of dopant and/or radiation defects. To prognosis the technological process we consider an analytical approach, which gives a possibility to take into account variation of physical parameters in space and time. At the same time the approach gives a possibility to take into
account nonlinearity of mass and heat transport and to analyze the above transport without crosslinking solutions on interfaces between materials of heterostructure.
On optimization ofON OPTIMIZATION OF DOPING OF A HETEROSTRUCTURE DURING MANUF...ijcsitcejournal
We introduce an approach of manufacturing of a p-i-n-heterodiodes. The approach based on using a δ-
doped heterostructure, doping by diffusion or ion implantation of several areas of the heterostructure. After
the doping the dopant and/or radiation defects have been annealed. We introduce an approach to optimize
annealing of the dopant and/or radiation defects. We determine several conditions to manufacture more
compact p-i-n-heterodiodes
Decreasing of quantity of radiation de fects inijcsa
Recently we introduced an approach to increase sharpness of diffusion-junction and implanted-junction
heterorectifiers. The heterorectifiers could by single and as a part of heterobipolar transistors. However
manufacturing p-n-junctions by ion implantation leads to generation of radiation defects in materials of
heterostructure. In this paper we introduce an approach to use an overlayer and optimization of annealing
of radiation defects to decrease quantity of radiation defects.
Modeling of manufacturing of a field effect transistor to determine condition...ijcsa
In this paper we introduce an approach to model technological process of manufacture of a field-effect
heterotransistor. The modeling gives us possibility to optimize the technological process to decrease length
of channel by using mechanical stress. As accompanying results of the decreasing one can find decreasing
of thickness of the heterotransistors and increasing of their density, which were comprised in integrated
circuits.
ON DECREASING OF DIMENSIONS OF FIELDEFFECT TRANSISTORS WITH SEVERAL SOURCESmsejjournal
We analyzed mass and heat transport during manufacturing field-effect heterotransistors with several sources to decrease their dimensions. Framework the result of manufacturing it is necessary to manufacture heterostructure with specific configuration. After that it is necessary to dope required areas of the heterostructure by diffusion or ion implantation to manufacture the required type of conductivity (p or n). After
the doping it is necessary to do optimize annealing. We introduce an analytical approach to prognosis mass
and heat transport during technological processes. Using the approach leads to take into account nonlinearity of mass and heat transport and variation in space and time (at one time) physical parameters of these processes
ON APPROACH OF OPTIMIZATION OF FORMATION OF INHOMOGENOUS DISTRIBUTIONS OF DOP...ijcsa
We introduce an approach of manufacturing of a field-effect heterotransistor with inhomogenous doping of channel. The inhomogenous distribution of concentration of dopant gives a possibility to change speed of transport of charge carriers and to decrease length of channel.
OPTIMIZATION OF MANUFACTURING OF LOGICAL ELEMENTS "AND" MANUFACTURED BY USING...ijcsitcejournal
In this paper we introduce an approach to decrease dimensions of logical elements "AND" based on fieldeffect
heterotransistors. Framework the approach one shall consider a heterostructure with specific structure.
Several specific areas of the het
ANALYSIS OF MANUFACTURING OF VOLTAGE RESTORE TO INCREASE DENSITY OF ELEMENTS ...ijoejournal
We introduce an approach for increasing density of voltage restore elements. The approach based on
manufacturing of a heterostructure, which consist of a substrate and an epitaxial layer with special configuration.
Several required sections of the layer should be doped by diffusion or ion implantation. After
that dopants and/or radiation defects should be annealed.
AN APPROACH TO OPTIMIZE MANUFACTURE OF AN ACTIVE QUADRATURE SIGNAL GENERATOR ...antjjournal
In this paper we introduce an approach to increase density of field-effect transistors framework an active
quadrature signal generator. Framework the approach we consider manufacturing the generator in heterostructure
with specific configuration. Several required areas of the heterostructure should be doped by diffusion
or ion implantation. After that dopant and radiation defects should by annealed framework optimized
scheme. We also consider an approach to decrease value of mismatch-induced stress in the considered
heterostructure. We introduce an analytical approach to analyze mass and heat transport in heterostructures
during manufacturing of integrated circuits with account mismatch-induced stress.
MODELING OF MANUFACTURING OF A FIELDEFFECT TRANSISTOR TO DETERMINE CONDITIONS...antjjournal
In this paper we introduce an approach to model technological process of manufacture of a field-effect
heterotransistor. The modeling gives us possibility to optimize the technological process to decrease length
of channel by using mechanical stress. As accompanying results of the decreasing one can find decreasing
of thickness of the heterotransistors and increasing of their density, which were comprised in integrated
circuits.
MODIFICATION OF DOPANT CONCENTRATION PROFILE IN A FIELD-EFFECT HETEROTRANSIST...msejjournal
In this paper we consider an approach of manufacturing more compact field-effect heterotransistors. The
approach based on manufacturing a heterostructure, which consist of a substrate and an epitaxial layer
with specific configuration. After that several areas of the epitaxial layer have been doped by diffusion or
ion implantation with optimized annealing of dopant and /or radiation defects. At the same time we introduce
an approach of modification of energy band diagram by additional doping of channel of the transistors.
We also consider an analytical approach to model and optimize technological process.
In this paper we introduce an approach to increase vertical integration of elements of transistor-transistor logic with function AND-NOT. Framework the approach we consider a heterostructure with special configuration. Several specific areas of the heterostructure should be doped by diffusion or ion implantation. Annealing of dopant and/or radiation defects should be optimized.
On Modification of Properties of P-N-Junctions During OvergrowthZac Darcy
In this paper we consider influence of overgrowth of doped by diffusion and ion implantation areas of heterostructures on distributions of concentrations of dopants. Several conditions to increase sharpness of p-njunctions (single and framework bipolar transistors), which were manufactured during considered technological process, have been determined. At the same time we analyzed influence of speed of overgrowth of
doped areas and mechanical stress in the considered heterostructure on distribution of concentrations of
dopants in the structure.
On Modification of Properties of P-N-Junctions During OvergrowthZac Darcy
In this paper we consider influence of overgrowth of doped by diffusion and ion implantation areas of heterostructures on distributions of concentrations of dopants. Several conditions to increase sharpness of p-njunctions (single and framework bipolar transistors), which were manufactured during considered technological process, have been determined. At the same time we analyzed influence of speed of overgrowth of
doped areas and mechanical stress in the considered heterostructure on distribution of concentrations of
dopants in the structure.
Optimization of Manufacture of Field-Effect Heterotransistors without P-N-Jun...ijrap
It has been recently shown, that manufacturing p-n-junctions, field-effect and bipolar transistors, thyristors in a multilayer structure by diffusion or ion implantation under condition of optimization of dopant and/or
radiation defects leads to increasing of sharpness of p-n-junctions (both single p-n-junctions and p-njunctions, which include into their system). In this situation one can also obtain increasing of homogeneity of dopant in doped area. In this paper we consider manufacturing a field-effect heterotransistor without pn-junction. Optimization of technological process with using inhomogeneity of heterostructure give us possibility to manufacture the transistors as more compact.
Optimization of Manufacture of Field-Effect Heterotransistors without P-N-Jun...ijrap
It has been recently shown, that manufacturing p-n-junctions, field-effect and bipolar transistors, thyristors in a multilayer structure by diffusion or ion implantation under condition of optimization of dopant and/or radiation defects leads to increasing of sharpness of p-n-junctions (both single p-n-junctions and p-njunctions, which include into their system). In this situation one can also obtain increasing of homogeneity of dopant in doped area. In this paper we consider manufacturing a field-effect heterotransistor without pn-junction. Optimization of technological process with using inhomogeneity of heterostructure give us possibility to manufacture the transistors as more compact.
ON OPTIMIZATION OF MANUFACTURING OF FIELD-EFFECT HETEROTRANSISTORS FRAMEWORK ...ijoejournal
In this paper we introduce an approach to increase density of field-effect transistors framework a voltage reference. Framework the approach we consider manufacturing the inverter in heterostructure with specific configuration. Several required areas of the heterostructure should be doped by diffusion or ion implantation. After that dopant and radiation defects should by annealed framework optimized scheme. We also consider an approach to decrease value of mismatch-induced stress in the considered heterostructure. We introduce an analytical approach to analyze mass and heat transport in heterostructures during manufacturing of integrated circuits with account mismatch-induced stress.
On Decreasing of Dimensions of Field-Effect Transistors with Several Sourcesmsejjournal
We analyzed mass and heat transport during manufacturing field-effect heterotransistors with several
sources to decrease their dimensions. Framework the result of manufacturing it is necessary to manufacture
heterostructure with specific configuration. After that it is necessary to dope required areas of the heterostructure by diffusion or ion implantation to manufacture the required type of conductivity (p or n). After
the doping it is necessary to do optimize annealing. We introduce an analytical approach to prognosis mass
and heat transport during technological processes. Using the approach leads to take into account nonlinearity of mass and heat transport and variation in space and time (at one time) physical parameters of these
processes
OPTIMIZATION OF MANUFACTURE OF FIELDEFFECT HETEROTRANSISTORS WITHOUT P-NJUNCT...ijrap
It has been recently shown, that manufacturing p-n-junctions, field-effect and bipolar transistors, thyristors
in a multilayer structure by diffusion or ion implantation under condition of optimization of dopant and/or
radiation defects leads to increasing of sharpness of p-n-junctions (both single p-n-junctions and p-njunctions,
which include into their system). In this situation one can also obtain increasing of homogeneity
of dopant in doped area. In this paper we consider manufacturing a field-effect heterotransistor without pn-
junction. Optimization of technological process with using inhomogeneity of heterostructure give us
possibility to manufacture the transistors as more compact.
AN APPROACH TO OPTIMIZE OF MANUFACTURING OF A VOLTAGE REFERENCE BASED ON HETE...JaresJournal
In this paper we introduce an approach to increase density of field-effect transistors framework a voltage
reference. Framework the approach we consider manufacturing the inverter in heterostructure with specific configuration. Several required areas of the heterostructure should be doped by diffusion or ion implantation. After that dopant and radiation defects should by annealed framework optimized scheme. We also
consider an approach to decrease value of mismatch-induced stress in the considered heterostructure. We
introduce an analytical approach to analyze mass and heat transport in heterostructures during manufacturing of integrated circuits with account mismatch-induced stress.
On Optimization of Manufacturing of Field-Effect Heterotransistors Frame-work...antjjournal
We consider an approach for increasing density of field-effect heterotransistors in a single-stage multi-path
operational amplifier. At the same time one can obtain decreasing of dimensions of the above transistors.
Dimensions of the elements could be decreased by manufacturing of these elements in a heterostructure
with specific structure. The manufacturing is doing by doping of required areas of the heterostructure by
diffusion or ion implantation with future optimization of annealing of dopant and/or radiation defects.
ON OPTIMIZATION OF MANUFACTURING OF FIELD EFFECT HETEROTRANSISTORS FRAMEWORK ...antjjournal
We consider an approach for increasing density of field-effect heterotransistors in a single-stage multi-path
operational amplifier. At the same time one can obtain decreasing of dimensions of the above transistors.
Dimensions of the elements could be decreased by manufacturing of these elements in a heterostructure
with specific structure. The manufacturing is doing by doping of required areas of the heterostructure by
diffusion or ion implantation with future optimization of annealing of dopant and/or radiation defects.
On Optimization of Manufacturing of Field-Effect Heterotransistors Frame-work...antjjournal
We consider an approach for increasing density of field-effect heterotransistors in a single-stage multi-path operational amplifier. At the same time one can obtain decreasing of dimensions of the above transistors.
Dimensions of the elements could be decreased by manufacturing of these elements in a heterostructure with specific structure. The manufacturing is doing by doping of required areas of the heterostructure by
diffusion or ion implantation with future optimization of annealing of dopant and/or radiation defects.
ON DECREASING OF DIMENSIONS OF FIELDEFFECT TRANSISTORS WITH SEVERAL SOURCESmsejjournal
We analyzed mass and heat transport during manufacturing field-effect heterotransistors with several
sources to decrease their dimensions. Framework the result of manufacturing it is necessary to manufacture
heterostructure with specific configuration. After that it is necessary to dope required areas of the heterostructure by diffusion or ion implantation to manufacture the required type of conductivity (p or n). After
the doping it is necessary to do optimize annealing. We introduce an analytical approach to prognosis mass
and heat transport during technological processes. Using the approach leads to take into account nonlinearity of mass and heat transport and variation in space and time (at one time) physical parameters of these
processes
DEPENDENCE OF CHARGE CARRIERS MOBILITY IN THE P-N-HETEROJUNCTIONS ON COMPOSIT...msejjournal
In this paper we consider manufacturing a p-n-junctions by dopant diffusion or ion implantation into a
multilayer structure. We introduce an approach to increase sharpness of these p-n-junctions and at the
same time to increase homogeneity of distributions of dopants in enriched by these dopants areas. We consider influence of the above changing of distribution of dopant on charge carrier mobility. We also consider an approach to decrease value of mismatch-induced stress in the considered multilayer structure by using a buffer layer. The decreasing gives a possibility to increase value of charge carrier mobility.
ON MODEL OF MANUFACTURING OF A BAND-PASS FILTER TO INCREASE INTEGRATION RATE ...antjjournal
In this paper we introduce an approach to increase integration rate of field-effect heterotransistors in the
framework of band-pass filter. In the framework of the approach we consider a heterostructure with special configuration. Several specific areas of the heterostructure should be doped by diffusion or ion implantation. Annealing of dopant and/or radiation defects should be optimized.
ON INCREASING OF DENSITY OF ELEMENTS IN A MULTIVIBRATOR ON BIPOLAR TRANSISTORSijcsitcejournal
In this paper we consider an approach to increase density of elements of a multivibrator on bipolar transistors.
The considered approach based on manufacturing a heterostructure with necessity configuration,
doping by diffusion or ion implantation of required areas to manufacture the required type of conductivity
(p or n) in the areas and optimization of annealing of dopant and/or radiation defects to manufacture more
compact distributions of concentrations of dopants. We also introduce an analytical approach to prognosis
technological process.
Influence of Overlayers on Depth of Implanted-Heterojunction RectifiersZac Darcy
In this paper we compare distributions of concentrations of dopants in an implanted-junction rectifiers in a
heterostructures with an overlayer and without the overlayer. Conditions for decreasing of depth of the
considered p-n-junction have been formulated.
INFLUENCE OF OVERLAYERS ON DEPTH OF IMPLANTED-HETEROJUNCTION RECTIFIERSZac Darcy
In this paper we compare distributions of concentrations of dopants in an implanted-junction rectifiers in a
heterostructures with an overlayer and without the overlayer. Conditions for decreasing of depth of the
considered p-n-junction have been formulated.
An Approach to Optimize Regimes of Manufacturing of Complementary Horizontal ...ijrap
In this paper we consider nonlinear model to describe manufacturing complementary horizontal field-effect heterotransistor. Based on analytical solution of the considered boundary problems some recommendations have been formulated to optimize technological processes.
An Approach to Optimize Regimes of Manufacturing of Complementary Horizontal ...ijrap
In this paper we consider nonlinear model to describe manufacturing complementary horizontal field-effect
heterotransistor. Based on analytical solution of the considered boundary problems some recommendations
have been formulated to optimize technological processes.
Similar to AN APPROACH FOR OPTIMIZATION OF MANUFACTURE MULTIEMITTER HETEROTRANSISTORS (20)
A MODEL OF MANUFACTURING OF A MOSFETFILTER WITH ACCOUNT MISMATCH-INDUCED STRE...antjjournal
In the present time several actual problems of the solid state electronics (such as increasing of
performance, reliability and density of elements of integrated circuits: diodes, field-effect and bipolar
transistors) are intensively solving. To increase the performance of these devices it is attracted an interest
determination of materials with higher values of charge carriers mobility. One way to decrease dimensions
of elements of integrated circuits is manufacturing them in thin film heterostructures. In this paper we
introduce an approach to increase density of field-effect transistors in the framework of a metal-oxidesemiconductor field-effect transistor filter. In the framework of the approach we consider manufacturing of
the above filter in a heterostructure with specific configuration. Several appropriate areas of the
considered heterostructure should be doped by diffusion or by ion implantation. After the doping the
considered dopant and radiation defects should be annealed in the framework oh the recently considered
optimized scheme. We also consider an approach to decrease value of mismatch-induced stress in the
considered heterostructure. The decreasing of the mismatch-induced stress could be decreased by
radiation processing of appropriate areas of heterostructure. We introduce an analytical approach to
analyze mass and heat transport in heterostructures during manufacturing of integrated circuits with
account mismatch-induced stress.
On Optimization of Manufacturing of Field-Effect Heterotransistors Frame-work...antjjournal
We consider an approach for increasing density of field-effect heterotransistors in a single-stage multi-path operational amplifier. At the same time one can obtain decreasing of dimensions of the above transistors. Dimensions of the elements could be decreased by manufacturing of these elements in a heterostructure with specific structure. The manufacturing is doing by doping of required areas of the heterostructure by diffusion or ion implantation with future optimization of annealing of dopant and/or radiation defects.
Performance Enhancement of Single Slope Solar Still Using Nano-Particles Mixe...antjjournal
ABSTRACT
The present paper reports on an experiment to improve the productivity of solar still using nano-particles. Solar distillation is a relatively simple treatment of brackish or impure water. In this solar energy is used to evaporate water then this vapour is condensed as pure water. This process removes salts and other impurities. Latest trend to improve the efficiency of the solar still is use of nano-particles like metal oxides. These particles increase surface area of absorption to solar radiation. In this work the Al2O3 nanoparticles mixed black paint is used to enhance the productivity of solar still. The solar radiations are transmitted through the glass cover and captured by a black painted inner bottom surface of the solar still. Water absorbs the heat and is converted into vapour within the chamber of the solar still.Single slop solar still is used from past decades but in this study effect of nano-particles on productivity of solar still is analyzed. Experimental work is performed for the single slope solar still (SS-SS) under climatic conditions of Jaipur. The use of the nano-particles mixed with black paint increases the temperature of the solar still basin. The productivity and efficiency of solar still at water depth 0.01 m with nano-particles are 3.48 litre and 38.65% respectively which are maximum values compared to water depths 0.02 m and 0.03 m. Results of the study gives 38.09% increment in productivity and 12.18% increment in thermal efficiency when nano-particles of size 50 nm to 100 nm mixed black paint used at water depth .01 m. To check the significance of difference in productivity of solar still with and without nano-particle mixed black paint, a paired t-Test is performed which is conforms that the productivity enhancement due to nano-particle mixed black paint is significant at 95% confidence interval.
KEYWORDS
Solar still, Distillation, Nano-particles, Productivity, TDS, P
Synthesis, Evaluation, Modeling and Simulation of Nano-Pore NAA Zeolite Membr...antjjournal
ABSTRACT
Zeolite membranes have uniform and molecular-sized pores that separate molecules based on the differences in the molecules’ adsorption and diffusion properties. Strong electrostatic interaction between ionic sites and water molecules (due to its highly polar nature) makes the zeolite NaA membrane very hydrophilic. Zeolite NaA membranes are thus well suited for the separation of liquid-phase mixtures by
pervaporation. In this study, experiments were conducted with various Ethanol–water mixtures (1–20 wt. %) at 25 °C. Total flux for Ethanol–water mixtures was found to vary from 0.331 to 0.229 kg/m2 .h with increasing Ethanol concentration from 1 to 20 wt.%. Ionic sites of the NaA zeolite matrix play a very important role in water transport through the membrane. These sites act both as water sorption and transport sites. Surface diffusion of water occurs in an activated fashion through these sites. The precise Nano-porous structure of the zeolite cage helps in a partial molecular sieving of the large solvent
molecules leading to high separation factors. A comparison between experimental flux and calculated flux using Stephan Maxwell (S.M.) correlation was made and a linear trend was found to exist for water flux through the membrane with Ethanol concentration. A comprehensive model also was proposed for the Ethanol/water pervaporation (PV) by Finite Element Method (FEM). The 2D model was masterfully capable of predicting water concentration distribution within both the membrane and the feed side of the pervaporation membrane module.
KEYWORDS
Nano pores; Pervaporation; Ethanol separation; Zeolite NaA membrane; FEM simulation
REVIEW OF NANO TECHNOLOGY DEVELOPMENT IN TEXTILE INDUSTRY AND THE ROLE OF R &...antjjournal
The development of technology in the world, especially nanotechnology has also penetrated into the textile
sector. The application of nanotechnology to textiles has given its own advantages compared to
conventional textile technology. Nano technology has provided several advantages, such as: textiles with
multiple functions, better quality, cheaper and environmentally friendly. Through the application of
nanotechnology, types of textiles can be produced for many different uses, ranging from textiles to
aerospace, aeronautic, automotive, sportwear, fire fighting, to defense and security such as parachutes,
bulletproof clothes, and others. Thus for the Indonesian textile industry, in order to be able to compete with
the textile industry from outside, it is also necessary to adjust to the development of global technology. The
role of R&D institutions and universities is very strategic to develop nanotechnology where the industry is
unable to do so given the shortage of human resources and research facilities.
REVIEW OF NANO TECHNOLOGY DEVELOPMENT IN TEXTILE INDUSTRY AND THE ROLE OF R &...antjjournal
The development of technology in the world, especially nanotechnology has also penetrated into the textile
sector. The application of nanotechnology to textiles has given its own advantages compared to
conventional textile technology. Nano technology has provided several advantages, such as: textiles with
multiple functions, better quality, cheaper and environmentally friendly. Through the application of
nanotechnology, types of textiles can be produced for many different uses, ranging from textiles to
aerospace, aeronautic, automotive, sportwear, fire fighting, to defense and security such as parachutes,
bulletproof clothes, and others. Thus for the Indonesian textile industry, in order to be able to compete with
the textile industry from outside, it is also necessary to adjust to the development of global technology. The
role of R&D institutions and universities is very strategic to develop nanotechnology where the industry is
unable to do so given the shortage of human resources and research facilities.
A NOVEL PRECURSOR IN PREPARATION AND CHARACTERIZATION OF NICKEL OXIDE (NIO) A...antjjournal
Synthesis of Nickel Oxide (NiO) nanoparticles and cobalt oxide (CO3O4) materials synthesis by aqueous chemical growth (ACG) Techniques. Oxide based material having a wide band gap, and suitable for optical devices,Optoelectronic devices, UV photodetector, and Light emitting diode LEDs. The analysis
and characterizationof Nickel Oxide (NiO) and cobalt oxide (CO3O4) nanoparticles by(1) X-ray diffraction (XRD), (2) Scanning electron microscopy (SEM), and (3) Ultraviolet–visible (UV–Vis) spectroscopy.
WORK FUNCTION ESTIMATION OF BISMUTH DOPED ZNO THIN FILMantjjournal
In this paper we report bismuth (Bi) doped ZnO based heterojunction devices. The p-type Bi doped ZnO thin films have been deposited on n and p type silicon substrate using sol-gel spin coating method. The ptype nature of the deposited Bi doped ZnO thin films have been analyzed by hot point probe method. The electrical properties of the fabricated devices have been obtained from I-V characteristic measured using
semiconductor parameter analyzer. Finally, the work function of Bi doped ZnO has been estimated from the electrical parameter obtained from I-V calculations.
ON OPTIMIZATION OF MANUFACTURING OF FIELD EFFECT HETEROTRANSISTORS FRAMEWORK ...antjjournal
We consider an approach for increasing density of field-effect heterotransistors in a single-stage multi-path operational amplifier. At the same time one can obtain decreasing of
dimensions of the above transistors.Dimensions of the elements could be decreased by manufacturing of these elements in a heterostructure with specific structure. The manufacturing is doing by doping of required areas of the heterostructure by diffusion or ion implantation with future optimization of annealing of dopant and/or radiation defects.
SYNTHESIS, EVALUATION, MODELING AND SIMULATION OF NANO-PORE NAA ZEOLITE MEMBR...antjjournal
Zeolite membranes have uniform and molecular-sized pores that separate molecules based on the
differences in the molecules’ adsorption and diffusion properties. Strong electrostatic interaction between
ionic sites and water molecules (due to its highly polar nature) makes the zeolite NaA membrane very
hydrophilic. Zeolite NaA membranes are thus well suited for the separation of liquid-phase mixtures by
pervaporation. In this study, experiments were conducted with various Ethanol–water mixtures (1–20 wt.
%) at 25 °C. Total flux for Ethanol–water mixtures was found to vary from 0.331 to 0.229 kg/m2
.h with
increasing Ethanol concentration from 1 to 20 wt.%. Ionic sites of the NaA zeolite matrix play a very
important role in water transport through the membrane. These sites act both as water sorption and
transport sites. Surface diffusion of water occurs in an activated fashion through these sites. The precise
Nano-porous structure of the zeolite cage helps in a partial molecular sieving of the large solvent
molecules leading to high separation factors. A comparison between experimental flux and calculated flux
using Stephan Maxwell (S.M.) correlation was made and a linear trend was found to exist for water flux
through the membrane with Ethanol concentration. A comprehensive model also was proposed for the
Ethanol/water pervaporation (PV) by Finite Element Method (FEM). The 2D model was masterfully
capable of predicting water concentration distribution within both the membrane and the feed side of the
pervaporation membrane module.
Advanced Nanoscience and Technology: An International Journal (ANTJ) antjjournal
Advanced Nanoscience and Technology: An International Journal (ANTJ) is a peer-reviewed, open access journal, addresses the impacts and challenges of Nanoscience and Technology. The journal documents practical and theoretical results which make a fundamental contribution for the development of Nanoscience and Technology.
Advanced Nanoscience and Technology: An International Journal (ANTJ) antjjournal
Advanced Nanoscience and Technology: An International Journal (ANTJ) is a peer-reviewed, open access journal, addresses
the impacts and challenges of Nanoscience and Technology. The journal documents practical and theoretical results which make
a fundamental contribution for the development of Nanoscience and Technology.
Advanced Nanoscience and Technology: An International Journal (ANTJ) antjjournal
Advanced Nanoscience and Technology: An International Journal (ANTJ) is a peer-reviewed, open access journal, addresses the impacts and challenges of Nanoscience and Technology. The journal documents practical and theoretical results which make a fundamental contribution for the development of Nanoscience and Technology
In the present work micromachining of PMMA was carried out using KrF excimer laser. Excimer laser pulse with a wavelength of 248 nm was generated with a coherent COMPexPro 110 excimer laser system.
A micro-hole of Ø150 μm was machined on PMMA substrate during the experimentation. The PMMA substrate was mounted on the translation stage. The PMMA substrates were ex-posed to different number of pulses (1, 2, 5, 10, 20, 50 and 100) at repetition rate of 2, 5 and 10 Hz respectively by keeping the pulse energy unchanged at 200 mJ. In the present experimentation, the effect of pulse repetition rate and
number of pulses on ablation depth has been investigated. The experimental results for micromachining
demonstrate ablation process as a photo-chemical mechanism. The results of the experimentation have
revealed that, ablation depth is directly proportional to pulse number & pulse repetition rate has no significant effects on the ablation depth.
ENHANCED ACTIVITY OF ANTIBIOTICS BY LIPOSOMAL DRUG DELIVERYantjjournal
Liposome are the most widely used and the most extensively marketed nano-formulation that is being manufactured by pharmaceutical industries. Liposome can be modified in different size and structure. Conjugation of ligend with liposome surface increase the target specificity and changes the pharmacokinetic distribution of encapsulated drug. Different methods of preparation can
produce different types of liposomes. Many marketed formulations are available as liposome and
has proved to be more useful than the conventional formulations. Antibiotics of different classes such as quinolones, aminoglycosides, beta-lactams, cephalosporins, retroviral, macrolides and polypeptides are associated with the shortcomings of drug toxicities, lower bioavailability as well
as bacterial resistance. A proper drug delivery system can circumvent these drawbacks. The liposome can prove to be a big stride towards abolishment of these drawbacks. The disadvantage associated with this novel delivery system should also be understood and prevented by means of proper scientific methods for a betterment of human health and society.
PERFORMANCE ENHANCEMENT OF SINGLE SLOPE SOLAR STILL USING NANOPARTICLES MIXED...antjjournal
The present paper reports on an experiment to improve the productivity of solar still using nano-particles.Solar distillation is a relatively simple treatment of brackish or impure water. In this solar energy is used to evaporate water then this vapour is condensed as pure water. This process removes salts and other impurities. Latest trend to improve the efficiency of the solar still is use of nano-particles like metal oxides. These particles increase surface area of absorption to solar radiation. In this work the Al2O3 nanoparticles
mixed black paint is used to enhance the productivity of solar still. The solar radiations are transmitted through the glass cover and captured by a black painted inner bottom surface of the solar still. Water absorbs the heat and is converted into vapour within the chamber of the solar still.Single slop solar
still is used from past decades but in this study effect of nano-particles on productivity of solar still is
analyzed. Experimental work is performed for the single slope solar still (SS-SS) under climatic conditions
of Jaipur. The use of the nano-particles mixed with black paint increases the temperature of the solar still
basin. The productivity and efficiency of solar still at water depth 0.01 m with nano-particles are 3.48 litre
and 38.65% respectively which are maximum values compared to water depths 0.02 m and 0.03 m. Results
of the study gives 38.09% increment in productivity and 12.18% increment in thermal efficiency when
nano-particles of size 50 nm to 100 nm mixed black paint used at water depth .01 m. To check the
significance of difference in productivity of solar still with and without nano-particle mixed black paint, a
paired t-Test is performed which is conforms that the productivity enhancement due to nano-particle mixed
black paint is significant at 95% confidence interval.
OPTICAL BEHAVIOUR OF SYNTHESIZED ZNO NANOTABLETS AND ITS TRANSFORMED NANORODS...antjjournal
We are reporting the preparation of ZnO nanotablets at relatively low temperature (1500C) using zinc acetate [Zn(Ac)2], NaOH, cetyltrimethylammonium bromide (CTAB) by solvothermal method. By adjusting
the molar ratio of the reactants we obtained nanorods and we also obtained the variation of the dimension
of the nanorods using hydrazine hydrate as capping reagent. The prepared samples were morphologically
recognized as well crystallized. The average diameter of the ZnO nanotablets were ranging from 500 to 600 nm and the average thickness of the nanotablets were ranging from 85 to 90 nm. The length of ZnO nanorods were ranging from 300 to several micrometers and breadth of the ZnO nanorods were ranging from 80 to 160 nm. The optical properties of the prepared materials have also been studied with the exhibition of its interesting behavior.
Forklift Classes Overview by Intella PartsIntella Parts
Discover the different forklift classes and their specific applications. Learn how to choose the right forklift for your needs to ensure safety, efficiency, and compliance in your operations.
For more technical information, visit our website https://intellaparts.com
KuberTENes Birthday Bash Guadalajara - K8sGPT first impressionsVictor Morales
K8sGPT is a tool that analyzes and diagnoses Kubernetes clusters. This presentation was used to share the requirements and dependencies to deploy K8sGPT in a local environment.
Water billing management system project report.pdfKamal Acharya
Our project entitled “Water Billing Management System” aims is to generate Water bill with all the charges and penalty. Manual system that is employed is extremely laborious and quite inadequate. It only makes the process more difficult and hard.
The aim of our project is to develop a system that is meant to partially computerize the work performed in the Water Board like generating monthly Water bill, record of consuming unit of water, store record of the customer and previous unpaid record.
We used HTML/PHP as front end and MYSQL as back end for developing our project. HTML is primarily a visual design environment. We can create a android application by designing the form and that make up the user interface. Adding android application code to the form and the objects such as buttons and text boxes on them and adding any required support code in additional modular.
MySQL is free open source database that facilitates the effective management of the databases by connecting them to the software. It is a stable ,reliable and the powerful solution with the advanced features and advantages which are as follows: Data Security.MySQL is free open source database that facilitates the effective management of the databases by connecting them to the software.
Online aptitude test management system project report.pdfKamal Acharya
The purpose of on-line aptitude test system is to take online test in an efficient manner and no time wasting for checking the paper. The main objective of on-line aptitude test system is to efficiently evaluate the candidate thoroughly through a fully automated system that not only saves lot of time but also gives fast results. For students they give papers according to their convenience and time and there is no need of using extra thing like paper, pen etc. This can be used in educational institutions as well as in corporate world. Can be used anywhere any time as it is a web based application (user Location doesn’t matter). No restriction that examiner has to be present when the candidate takes the test.
Every time when lecturers/professors need to conduct examinations they have to sit down think about the questions and then create a whole new set of questions for each and every exam. In some cases the professor may want to give an open book online exam that is the student can take the exam any time anywhere, but the student might have to answer the questions in a limited time period. The professor may want to change the sequence of questions for every student. The problem that a student has is whenever a date for the exam is declared the student has to take it and there is no way he can take it at some other time. This project will create an interface for the examiner to create and store questions in a repository. It will also create an interface for the student to take examinations at his convenience and the questions and/or exams may be timed. Thereby creating an application which can be used by examiners and examinee’s simultaneously.
Examination System is very useful for Teachers/Professors. As in the teaching profession, you are responsible for writing question papers. In the conventional method, you write the question paper on paper, keep question papers separate from answers and all this information you have to keep in a locker to avoid unauthorized access. Using the Examination System you can create a question paper and everything will be written to a single exam file in encrypted format. You can set the General and Administrator password to avoid unauthorized access to your question paper. Every time you start the examination, the program shuffles all the questions and selects them randomly from the database, which reduces the chances of memorizing the questions.
Welcome to WIPAC Monthly the magazine brought to you by the LinkedIn Group Water Industry Process Automation & Control.
In this month's edition, along with this month's industry news to celebrate the 13 years since the group was created we have articles including
A case study of the used of Advanced Process Control at the Wastewater Treatment works at Lleida in Spain
A look back on an article on smart wastewater networks in order to see how the industry has measured up in the interim around the adoption of Digital Transformation in the Water Industry.
Cosmetic shop management system project report.pdfKamal Acharya
Buying new cosmetic products is difficult. It can even be scary for those who have sensitive skin and are prone to skin trouble. The information needed to alleviate this problem is on the back of each product, but it's thought to interpret those ingredient lists unless you have a background in chemistry.
Instead of buying and hoping for the best, we can use data science to help us predict which products may be good fits for us. It includes various function programs to do the above mentioned tasks.
Data file handling has been effectively used in the program.
The automated cosmetic shop management system should deal with the automation of general workflow and administration process of the shop. The main processes of the system focus on customer's request where the system is able to search the most appropriate products and deliver it to the customers. It should help the employees to quickly identify the list of cosmetic product that have reached the minimum quantity and also keep a track of expired date for each cosmetic product. It should help the employees to find the rack number in which the product is placed.It is also Faster and more efficient way.
NO1 Uk best vashikaran specialist in delhi vashikaran baba near me online vas...Amil Baba Dawood bangali
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6th International Conference on Machine Learning & Applications (CMLA 2024)ClaraZara1
6th International Conference on Machine Learning & Applications (CMLA 2024) will provide an excellent international forum for sharing knowledge and results in theory, methodology and applications of on Machine Learning & Applications.
NUMERICAL SIMULATIONS OF HEAT AND MASS TRANSFER IN CONDENSING HEAT EXCHANGERS...ssuser7dcef0
Power plants release a large amount of water vapor into the
atmosphere through the stack. The flue gas can be a potential
source for obtaining much needed cooling water for a power
plant. If a power plant could recover and reuse a portion of this
moisture, it could reduce its total cooling water intake
requirement. One of the most practical way to recover water
from flue gas is to use a condensing heat exchanger. The power
plant could also recover latent heat due to condensation as well
as sensible heat due to lowering the flue gas exit temperature.
Additionally, harmful acids released from the stack can be
reduced in a condensing heat exchanger by acid condensation. reduced in a condensing heat exchanger by acid condensation.
Condensation of vapors in flue gas is a complicated
phenomenon since heat and mass transfer of water vapor and
various acids simultaneously occur in the presence of noncondensable
gases such as nitrogen and oxygen. Design of a
condenser depends on the knowledge and understanding of the
heat and mass transfer processes. A computer program for
numerical simulations of water (H2O) and sulfuric acid (H2SO4)
condensation in a flue gas condensing heat exchanger was
developed using MATLAB. Governing equations based on
mass and energy balances for the system were derived to
predict variables such as flue gas exit temperature, cooling
water outlet temperature, mole fraction and condensation rates
of water and sulfuric acid vapors. The equations were solved
using an iterative solution technique with calculations of heat
and mass transfer coefficients and physical properties.
We have compiled the most important slides from each speaker's presentation. This year’s compilation, available for free, captures the key insights and contributions shared during the DfMAy 2024 conference.
Understanding Inductive Bias in Machine LearningSUTEJAS
This presentation explores the concept of inductive bias in machine learning. It explains how algorithms come with built-in assumptions and preferences that guide the learning process. You'll learn about the different types of inductive bias and how they can impact the performance and generalizability of machine learning models.
The presentation also covers the positive and negative aspects of inductive bias, along with strategies for mitigating potential drawbacks. We'll explore examples of how bias manifests in algorithms like neural networks and decision trees.
By understanding inductive bias, you can gain valuable insights into how machine learning models work and make informed decisions when building and deploying them.
AN APPROACH FOR OPTIMIZATION OF MANUFACTURE MULTIEMITTER HETEROTRANSISTORS
1. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
1
AN APPROACH FOR OPTIMIZATION OF
MANUFACTURE MULTIEMITTER
HETEROTRANSISTORS
E.L. Pankratov1
and E.A. Bulaeva2
1
Nizhny Novgorod State University, 23 Gagarin avenue, Nizhny Novgorod, 603950,
Russia
2
Nizhny Novgorod State University of Architecture and Civil Engineering, 65 Il'insky
street, Nizhny Novgorod, 603950, Russia
ABSTRACT
In this paper we introduced an approach to model manufacture process of a multiemitter heterotransistor.
The approach gives us also possibility to optimize manufacture process. p-n-junctions, which include into
the multiemitter heterotransistor, have higher sharpness and higher homogeneity of dopants distributions
in enriched by the dopant area.
KEYWORDS
Multiemitter heterotransistor, Approach to optimize technological processes.
1. INTRODUCTION
Logical elements often include into itself multiemitter transistors [1-4]. To manufacture bipolar
transistors it could be used dopant diffusion, ion doping or epitaxial layer [1-8]. It is attracted an
interest increasing of sharpness of p-n-junctions, which include into bipolar transistors and
decreasing of dimensions of the transistors, which include into integrated circuits [1-4].
Dimensions of transistors will be decreased by using inhomogenous distribution of temperature
during laser or microwave types of annealing [9,10], using defects of materials (for example,
defects could be generated during radiation processing of materials) [11-14], native
inhomogeneity (multilayer property) of heterostructure [12-14].
Framework this paper we consider a heterostructure, which consist of a substrate and three
epitaxial layers (see Fig. 1). Some dopants are infused in the epitaxial layers to manufacture p and
n types of conductivities during manufacture a multiemitter transistor. Let us consider two cases:
infusion of dopant by diffusion or ion implantation. Farther in the first case we consider annealing
of dopant so long, that after the annealing the dopants should achieve interfaces between epitaxial
layers. In this case one can obtain increasing of sharpness of p-n-junctions [12-14]. The
increasing of sharpness could be obtained under conditions, when values of dopant diffusion
coefficients in last epitaxial layers is larger, than values of dopant diffusion coefficient in average
epitaxial layer. At the same time homogeneity of dopant distributions in doped areas increases. It
is attracted an interest higher doping of last epitaxial layers, than doping of average epitaxial
layer, because the higher doping gives us possibility to increase sharpness of p-n-junctions. It is
2. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
2
also practicably to choose materials of epitaxial layers and substrate so; those values of dopant
diffusion coefficients in the substrate should be smaller, than in the epitaxial layer. In this
situation one can obtain thinner transistor. In the case of ion doping of heterostructure it should be
done annealing of radiation defects. It is practicably to choose so regimes of annealing of
radiation defects, that dopant should achieves interface between epitaxial layers. At the same time
the dopant could not diffuse into another epitaxial layer. If dopant did not achieves interface
between epitaxial layers during annealing of radiation defects, additional annealing of dopant
required.
Main aims of the present paper are analysis of dynamics of redistribution of dopants in considered
heterostructure (Figs. 1) and optimization of annealing times of dopants. In some recent papers
analogous analysis have been done [4,10,12-14]. However we can not find in literature any
similar heterostructures as we consider in the paper.
Substrate
Epitaxial
layer 1
Epitaxial
layer 2
Epitaxial
layer 3
n-type dopant p-type dopant n-type dopant
Fig. 1a. Heterostructure, which consist of a substrate and three epitaxial layers. View from above
Epitaxial layer 1 Epitaxial layer 2 Epitaxial layer 3
n-type dopantp-type dopant
n-type dopant 1
n-type dopant 2
n-type dopant 3
n-type dopant 4
Fig. 1b. Heterostructure, which consist of a substrate and three epitaxial layers. View from one side
3. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
3
2. Method of Analysis
Redistribution of dopant in the considered heterostructure has been described by the second
Fick’s low [1-4]
( ) ( ) ( ) ( )
+
+
=
z
tzyxC
D
zy
tzyxC
D
yx
tzyxC
D
xt
tzyxC
CCC
∂
∂
∂
∂
∂
∂
∂
∂
∂
∂
∂
∂
∂
∂ ,,,,,,,,,,,,
(1)
with boundary and initial conditions
( ) 0
,,,
0
=
∂
∂
=x
x
tzyxC
,
( ) 0
,,,
=
∂
∂
= xLx
x
tzyxC
,
( ) 0
,,,
0
=
∂
∂
=y
y
tzyxC
,
( ) 0
,,,
=
∂
∂
= yLy
y
tzyxC
,
( ) 0
,,,
0
=
∂
∂
=z
z
tzyxC
,
( ) 0
,,,
=
∂
∂
= zLz
z
tzyxC
, C (x,y,z,0)=fC (x,y,z). (2)
Here C(x,y,z,t) is the spatio-temporal distribution of concentration of dopant; x, y, z and t are
current coordinates and times; DС is the dopant diffusion coefficient. Value of dopant diffusion
coefficient depends on properties of materials in layers of heterostructure, speed of heating and
cooling of heterostructure (with account Arrhenius low), spatio-temporal distributions of
concentrations of dopants and radiation defects. Two last dependences of dopant diffusion
coefficient could be approximated by the following relation [15,16]
( ) ( )
( )
( ) ( )
( )
++
+= 2*
2
2*1
,,,,,,
1
,,,
,,,
1,,,
V
tzyxV
V
tzyxV
TzyxP
tzyxC
TzyxDD LC
ςςξ γ
γ
. (3)
Here DL (x,y,z,T) is the spatial (due to inhomogeneity (многослойности) of heterostructure) and
temperature (due to Arrhenius low) dependences of dopant diffusion coefficient; P (x,y,z,T) is the
limit of solubility of dopant; parameter γ depends of properties of materials and could be integer
in the interval γ ∈[1,3] [15]; V (x,y,z,t) is the spatio-temporal distribution of concentration of
radiation vacancies; V*
is the equilibrium distribution of vacancies. Concentrational dependence
of dopant diffusion coefficient has been discussed in details in [15]. It should be noted, that
radiation damage absents in the case of diffusion doping of haterostructure. In this situation ζ1=
ζ2= 0. Spatio-temporal distributions of concentrations of point radiation defects could be
determine by solution of the following system of equations [17-19]
( ) ( ) ( ) ( ) ( ) ( )×−
∂
∂
∂
∂
+
∂
∂
∂
∂
=
∂
∂
tzyxI
y
tzyxI
TzyxD
yx
tzyxI
TzyxD
xt
tzyxI
II
,,,
,,,
,,,
,,,
,,,
,,, 2
( ) ( ) ( ) ( ) ( ) ( )tzyxVtzyxITzyxk
z
tzyxI
TzyxD
z
Tzyxk VIIII
,,,,,,,,,
,,,
,,,,,, ,,
−
∂
∂
∂
∂
+× (4)
( ) ( ) ( ) ( ) ( ) ( )×−
∂
∂
∂
∂
+
∂
∂
∂
∂
=
∂
∂
tzyxV
y
tzyxV
TzyxD
yx
tzyxV
TzyxD
xt
tzyxV
VV
,,,
,,,
,,,
,,,
,,,
,,, 2
( ) ( ) ( ) ( ) ( ) ( )tzyxVtzyxITzyxk
z
tzyxV
TzyxD
z
Tzyxk VIVVV
,,,,,,,,,
,,,
,,,,,, ,,
−
∂
∂
∂
∂
+×
4. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
4
with initial
ρ(x,y,z,0)=fρ (x,y,z) (5a)
and boundary conditions
( ) 0
,,,
=
∂
∂
= yLy
y
tzyxρ
,
( ) 0
,,,
0
=
∂
∂
=z
z
tzyxρ
,
( ) 0
,,,
=
∂
∂
= zLz
z
tzyxρ
. (5b)
Here ρ =I,V; I (x,y,z,t) is the spatio-temporal distribution of concentration of interstitials; Dρ(x,y,
z,T) are diffusion coefficients of interstitials and vacancies; terms V2
(x,y, z,t) and I2
(x,y,z,t)
correspond to generation of divacancies and analogous complexes of interstitials; kI,V(x,y,z,T),
kI,I(x,y,z,T) and kV,V(x,y,z,T) parameters of recombination of point radiation defects and generation
of complexes.
Spatio-temporal distributions of concentrations of divacancies ΦV(x,y,z,t) and analogous
complexes of interstitials ΦI(x,y,z,t) will be determined by solving the following systems of
equations [17-19]
( )
( )
( )
( )
( )
+
Φ
+
Φ
=
Φ
ΦΦ
y
tzyx
TzyxD
yx
tzyx
TzyxD
xt
tzyx I
I
I
I
I
∂
∂
∂
∂
∂
∂
∂
∂
∂
∂ ,,,
,,,
,,,
,,,
,,,
( )
( )
( ) ( ) ( ) ( )tzyxITzyxktzyxITzyxk
z
tzyx
TzyxD
z
III
I
I
,,,,,,,,,,,,
,,,
,,, 2
,
−+
Φ
+ Φ
∂
∂
∂
∂
(6)
( )
( )
( )
( )
( )
+
Φ
+
Φ
=
Φ
ΦΦ
y
tzyx
TzyxD
yx
tzyx
TzyxD
xt
tzyx V
V
V
V
V
∂
∂
∂
∂
∂
∂
∂
∂
∂
∂ ,,,
,,,
,,,
,,,
,,,
( )
( )
( ) ( ) ( ) ( )tzyxVTzyxktzyxVTzyxk
z
tzyx
TzyxD
z
VVV
V
V
,,,,,,,,,,,,
,,,
,,, 2
,
−+
Φ
+ Φ
∂
∂
∂
∂
with boundary and initial conditions
( )
0
,,,
0
=
∂
Φ∂
=x
x
tzyxρ
,
( )
0
,,,
=
∂
Φ∂
= xLx
x
tzyxρ
,
( )
0
,,,
0
=
∂
Φ∂
=y
y
tzyxρ
,
( )
0
,,,
=
∂
Φ∂
= yLy
y
tzyxρ
,
( )
0
,,,
0
=
∂
Φ∂
=z
z
tzyxρ
,
( )
0
,,,
=
∂
Φ∂
= zLz
z
tzyxρ
, ΦI(x,y,z,0)=fΦI(x,y,z), ΦV(x,y,z,0)=fΦV (x,y,z). (7)
Here DΦI(x,y,z,T) and DΦV(x,y,z,T) are diffusion coefficients of complexes of point radiation
defects; kI(x,y,z,T) and kV(x,y,z,T) are parameters of decay of the complexes.
To determine spatio-temporal distributions of concentrations of complexes of radiation defects we
used considered in Refs. [14,19] approach. Framework the approach we transform approxi-
mations of diffusion coefficients of complexes of point radiation defects to the following form:
Dρ (x,y,z,T) = D0ρ [1+ερ gρ (x,y,z,T)] and kI,V (x,y,z,T)=k0I,V[1+ζ h(x,y,z,T)], where D0ρ and k0I,V are
the average values of appropriate parameters, 0≤ερV <1, 0≤ζ<1, | gρ(x,y,z,T)|≤1, |h(x,y,z,T)|≤1. Let
us introduced the following dimensionless variables: ( ) ( )
*
,,,
,,,~
ρ
ρ
ρ
tzyx
tzyx = , χ=x/Lx, η= y/Ly,
ψ = z/Lz,
++= 22200
111
zyx
VVVI
LLL
DDtϑ , ( )
VI
zyxVI
DD
VI
LLLk
00
**
222
,0
++=ω , 2
2
2
2
1
z
x
y
x
x
L
L
L
L
b ++= ,
5. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
5
2
2
2
2
1
z
y
x
y
y
L
L
L
L
b ++= , 2
2
2
2
1
y
z
x
z
z
L
L
L
L
b ++= . Using the above variables leads to transformation Eqs. (4) to
the following form
( ) ( )[ ] ( ) ×+
+=
V
I
y
II
V
I
x
D
D
b
I
Tg
D
D
b
I
0
0
0
0 1,,,
~
,,,1
1,,,
~
χ∂
ϑψηχ∂
ψηχε
χ∂
∂
ϑ∂
ϑψηχ∂
( )[ ] ( ) ( )[ ] ( ) ×
++
+×
ψ∂
ϑψηχ∂
ψηχε
ψ∂
∂
η∂
ϑψηχ∂
ψηχε
η∂
∂ ,,,
~
,,,1
1,,,
~
,,,1
I
Tg
b
I
Tg II
z
II
( )[ ] ( ) ( )ϑψηχϑψηχψηχςω ,,,
~
,,,
~
,,,1*
*
0
0
VITh
I
V
D
D
V
I
+−× (8)
( ) ( )[ ] ( ) ×+
+=
I
V
y
VV
I
V
x
D
D
b
V
Tg
D
D
b
V
0
0
0
0 1,,,
~
,,,1
1,,,
~
χ∂
ϑψηχ∂
ψηχε
χ∂
∂
ϑ∂
ϑψηχ∂
( )[ ] ( ) ( )[ ] ( ) ×
++
+×
ψ∂
ϑψηχ∂
ψηχε
ψ∂
∂
η∂
ϑψηχ∂
ψηχε
η∂
∂ ,,,
~
,,,1
,,,
~
,,,1
V
Tg
V
Tg VVVV
( )[ ] ( ) ( )ϑψηχϑψηχψηχςω ,,,
~
,,,
~
,,,1
1
*
*
0
0
VITh
V
I
D
D
b I
V
z
+−× .
We will determine solution of Eqs. (8) as the following power series
( ) ( )∑ ∑ ∑=
∞
=
∞
=
∞
=0 0 0
~ ,,,~,,,~
i j k
ijk
kji
ϑψηχρςωεϑψηχρ ρ
. (9)
Substitution of the series into Eqs. (8) gives us possibility to obtain system of equations for
initial-order approximations of concentrations of defects ( )ϑψηχρ ,,,~
000 and corrections for them
( )ϑψηχρ ,,,~
ijk
(i≥1, j≥1, k≥1). The equations are presented in Appendix.
Substitution of the series (9) into appropriate boundary and initial conditions gives us possibility
to obtain boundary and initial conditions for the functions ( )ϑψηχρ ,,,~
ijk . The conditions dard
approaches [21,22], are presented in Appendix. and solutions for the functions ( )ϑψηχρ ,,,~
ijk
(i≥0, j≥0, k≥0), which have been obtained by stan
Farther we determine spatio-temporal distributions of concentrations of point radiation defects.
To calculate the distributions we transform approximations of diffusion coefficients to the
following form: DΦI(x,y,z,T)=D0ΦI[1+εΦIgΦI(x,y,z,T)], DΦV(x,y,z,T)= D0ΦV[1+εΦVgΦV (x,y,z,T)]. In
this situation Eqs. (6) will be transform to the following form
( )
( )[ ] ( )
( )[ ]
×++
Φ
+=
Φ
ΦΦΦΦ
Tzyxg
yx
tzyx
Tzyxg
xt
tzyx
II
I
II
I
,,,1
,,,
,,,1
,,,
ε
∂
∂
∂
∂
ε
∂
∂
∂
∂
( )
( ) ( ) ( ) ( )tzyxITzyxktzyxITzyxkD
y
tzyx
IIII
I
,,,,,,,,,,,,
,,, 2
,0
+−
Φ
× Φ
∂
∂
6. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
6
( )
( )[ ] ( )
( )[ ]
×++
Φ
+=
Φ
ΦΦΦΦ
Tzyxg
yx
tzyx
Tzyxg
xt
tzyx
VV
V
VV
V
,,,1
,,,
,,,1
,,,
ε
∂
∂
∂
∂
ε
∂
∂
∂
∂
( )
( ) ( ) ( ) ( )tzyxVTzyxktzyxVTzyxkD
y
tzyx
VVVV
V
,,,,,,,,,,,,
,,, 2
,0
+−
Φ
× Φ
∂
∂
.
We determine solutions of these equations as the following power series
( ) ( )∑ Φ=Φ
∞
=
Φ
0
,,,,,,
i
i
i
tzyxtzyx ρρρ
ε , (10)
where ρ =I,V. Substitution of the series (10) into Eqs. (6) and appropriate boundary and initial
conditions gives us possibility to obtain equations for initial-order approximations of
concentrations of complexes of point radiation defects, corrections for them, boundary and initial
conditions for all above functions. The equations, conditions and solutions, which have been
obtained by standard approaches [21,22], are presented in the Appendix.
Analysis of spatio-temporal distributions of concentrations of radiation defects has been done by
using the second-order approximations on parameters, which used in appropriate series, and have
been defined more precisely by using numerical simulation.
Farther we determine solution of the Eq.(1). To calculate the solution we used the approach,
which has been considered in [13,18]. Framework the approach we transform approximation of
dopant diffusion coefficient DL(x,y,z,T) into following form: DL(x,y,z,T) =D0L[1+ε L gL(x,y,z,T)].
We determine solution of the Eq.(1) as the following power series
( ) ( )∑ ∑=
∞
=
∞
=0 0
,,
i j
ij
ji
L
txCtxC ξε . (11)
Substitution of the series into Eq. (1) gives us possibility to obtain system of equations for initial-
order approximation of dopant concentration C00(x,y,z,t) and corrections for them Cij(x,y,z,t) (i≥1,
j≥1). Substitution of the series (11) into appropriate boundary and initial conditions for the
functions Cij(x,y,z,t) (i≥0, j≥0)
( )
0
,,,
0
=
=x
ij
x
tzyxC
∂
∂
;
( )
0
,,,
=
= xLx
ij
x
tzyxC
∂
∂
;
( )
0
,,,
0
=
=y
ij
y
tzyxC
∂
∂
;
( )
0
,,,
=
= yLy
ij
y
tzyxC
∂
∂
;
( )
0
,,,
0
=
=z
ij
z
tzyxC
∂
∂
;
( )
0
,,,
=
= zLz
ij
z
tzyxC
∂
∂
; C00(x,y,z,0)=fC (x,y,z); Cij(x,y,z,0)=0, i≥0, j≥0.
Solutions of equations for the functions Cij(x,y,z,t) (i≥0, j≥0), which has been calculated by
standard approaches [21,22], are presented in the Appendix.
Analysis of spatio-temporal distribution of dopant concentration has been done analytically by
using the second-order approximation on parameters, which has been used in appropriate series
and have been defined more precisely by using numerical simulation.
7. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
7
3. Discussion
In this section we analyzed dynamics of redistribution of dopant with account relaxation of
distributions of concentrations of radiation defects (in the case of ion doping of heterostructure).
The Figs. 2 show distributions of concentrations of infused and implanted dopants in one of last
epitaxial layers in direction, which is perpendicular to interfaces between epitaxial layers, after
annealing of dopant and/or radiation defects, respectively. In this case values of dopant diffusion
coefficient in last epitaxial layers is larger, than value of dopant diffusion coefficient in average
epitaxial layer. The figures show, that interfaces between epitaxial layers under the above
conditions give us possibility to increase sharpness of p-n-junctions and at the same time to
increase homogeneity of distributions of concentrations of dopants in enriched by the dopants
areas.
The Figs. 3 show distributions of concentrations of infused and implanted dopants in one of last
epitaxial layers in direction, which is perpendicular to interfaces between epitaxial layers, after
annealing of dopant and/or radiation defects, respectively. In this case values of dopant diffusion
coefficient in last epitaxial layers is smaller, than value of dopant diffusion coefficient in average
epitaxial layer. The figures show, that presents of last epitaxial layers leads to increasing of
homogeneity of dopant in the average epitaxial layers. However sharpness of p-n-junctions
decreases in comparison with p-n-junctions for Figs. 2. In this case one can obtain accelerated
diffusion in last epitaxial layers. The decreasing of sharpness of p-n-junctions is a reason to use
higher level of doping of last epitaxial layer to use nonlinearity of dopant diffusion. In this case
one obtain n+
-p-n+
and/or p+
-n-p+
structures.
x
0.0
0.5
1.0
1.5
C(x,Θ)
1
2
3
4
5
6
0 L/4 L/2 3L/4 L
Interface
Epitaxial
layer2
Epitaxial
layer1
Fig. 2a. Distributions of concentrations of infused dopant in heterostructure from Fig. 1. Increasing of
number of curves corresponds to increasing of difference between values of dopant diffusion coefficient
8. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
8
x
0.0
0.5
1.0
1.5
2.0
C(x,Θ)
1
2
3
4
0 L/4 L/2 3L/4 L
Interface
Epitaxial
layer2
Epitaxial
layer1
Fig. 2b. Distributions of concentrations of implanted dopant in heterostructure from Fig. 1. Increasing of
number of curves corresponds to increasing of difference between values of dopant diffusion coefficient
x
0.0
0.5
1.0
1.5
C(x,Θ)
0 a=2L/3 L-a1 =-L/3
1
3
2
Fig. 3a. Distributions of concentration of infused in average epitaxial layer dopant in the heterostructure in
Fig. 1 without another epitaxial layers (curve 1) and with them for the case, when dopant diffusion
coefficient in the average epitaxial layer is smaller in comparison with dopant diffusion coefficients in
another layers (curves 2 and 3). Increasing of number of curves corresponds to increasing of difference
between values of dopant diffusion coefficients epitaxial layers of heterostructure
x
0.00001
0.00010
0.00100
0.01000
0.10000
1.00000
C(x,Θ)
fC(x)
L/40 L/2 3L/4 Lx0
1
2
9. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
9
Fig. 3b. Distributions of concentration of implanted in average epitaxial layer dopant in the heterostructure
in Fig. 1 without another epitaxial layers (curve 1) and with them for the case, when dopant diffusion
coefficient in the average epitaxial layer is smaller in comparison with dopant diffusion coefficients in
another layers (curves 2 and 3). Increasing of number of curves corresponds to increasing of difference
between values of dopant diffusion coefficients epitaxial layers of heterostructure
Optimal value of annealing time we determine framework recently introduced criterion [12-14].
Framework the criterion we approximate real distributions of dopant by step-wise function and
minimize the following mean-squared error
( ) ( )[ ]∫ −Θ=
L
xdxxC
L
U
0
2
,
1
ψ (12)
at annealing time Θ. Dependences of the optimal value of annealing time from different
parameters are presented on Figs. 4.
0.0 0.1 0.2 0.3 0.4 0.5
a/L, ξ, ε, γ
0.0
0.1
0.2
0.3
0.4
0.5
ΘD0L
-2
3
2
4
1
Fig. 4a. Dependences of dimensionless optimal value of annealing time of infused dopant, which has been
calculated by minimization the mean-squared error (12), on different parameters of heterostructure. Curve 1
is the dependence of annealing time on relation a/L, ξ=γ=0 and equal to each other values of dopant
diffusion coefficient in epitaxial layers. Curve 2 is the dependence of annealing time on parameter ε for
a/L=1/2 and ξ=γ=0. Curve 3 is the dependence of annealing time on parameter ξ for a/L=1/2 and ε=γ=0.
Curve 4 is the dependence of annealing time on parameter γ for a/L=1/2 and ε = ξ = 0
0.0 0.1 0.2 0.3 0.4 0.5
a/L, ξ, ε, γ
0.00
0.04
0.08
0.12
ΘD0L
-2
3
2
4
1
10. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
10
Fig. 4b. Dependences of dimensionless optimal value time of additional annealing of implanted dopant,
which has been calculated by minimization the mean-squared error (12), on different parameters of
heterostructure. Curve 1 is the dependence of annealing time on relation a/L, ξ=γ =0 and equal to each
other values of dopant diffusion coefficient in epitaxial layers. Curve 2 is the dependence of annealing time
on parameter ε for a/L=1/2 and ξ=γ=0. Curve 3 is the dependence of annealing time on parameter ξ for
a/L=1/2 and ε=γ=0. Curve 4 is the dependence of annealing time on parameter γ for a/L=1/2 and ε=ξ=0
The figures show, that optimal values of annealing time after ion implantation are smaller, than
optimal values of annealing time after infusion of dopant. Reason of the difference is necessity to
use annealing of radiation defects after ion implantation. After that (if necessary) it could be used
additional annealing of dopant. One can obtain spreading of distribution of concentration during
annealing of radiation defects. Increasing of annealing time with increasing of thickness of
epitaxial layer is the consequence of necessity of higher time for dopant to achieve interfaces
between epitaxial layers of heterostructure. Decreasing of annealing time with increasing of
values of parameters ε and ξ is the consequence of increasing of values of dopant diffusion
coefficient in the area, where main part of dopant has been diffused. Increasing of annealing time
with increasing of the parameter γ is the consequence of decreasing of the term [C (x,y,z,t)/ P
(x,y,z,T)]γ
in approximation of dopant diffusion coefficient (3) with increasing of the parameter γ,
because dopant concentration did not usually achieved value of limit of solubility of dopant and
parameter γ is not smaller, than 1.
4. Conclusion
In this paper we introduce an approach of manufacturing multiemitter heterotransistors.
Framework the approach the considered transistors became more compact and will include into
itself p-n-junctions with higher sharpness.
ACKNOWLEDGEMENTS
This work is supported by the contract 11.G34.31.0066 of the Russian Federation Government,
grant of Scientific School of Russia and educational fellowship for scientific research.
APPENDIX
Equations and conditions for functions ( )ϑψηχρ ,,,~
ijk (i≥0, j≥0, k≥0) could be written as
( ) ( ) ( ) ( )
++= 2
000
2
2
000
2
2
000
2
0
0000
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ I
b
I
b
I
bD
DI
zyxV
I
;
( ) ( ) ( ) ( )
++= 2
000
2
2
000
2
2
000
2
0
0000
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ V
b
V
b
V
bD
DV
zyxI
V
;
( ) ( ) ( ) ( )
+
++= 2
00
2
2
00
2
2
00
2
0
000
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ i
z
i
y
i
xV
Ii
I
b
I
b
I
bD
DI
( )
( )
( )
( )
+
+
+ −−
η∂
ϑψηχ∂
ψηχ
η∂
∂
χ∂
ϑψηχ∂
ψηχ
χ∂
∂ ,,,
~
,,,
1,,,
~
,,,
1 100100
0
0 i
I
y
i
I
xV
I
I
Tg
b
I
Tg
bD
D
11. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
11
( )
( )
+ −
ψ∂
ϑψηχ∂
ψηχ
ψ∂
∂ ,,,
~
,,,
1 100i
I
z
I
Tg
b
, i≥1;
( ) ( ) ( ) ( )
+
++= 2
00
2
2
00
2
2
00
2
0
000
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ i
z
i
y
i
xI
Vi
V
b
V
b
V
bD
DV
( )
( )
( )
( )
+
+
+ −−
η∂
ϑψηχ∂
ψηχ
η∂
∂
χ∂
ϑψηχ∂
ψηχ
χ∂
∂ ,,,
~
,,,
1,,,
~
,,,
1 100100
0
0 i
V
y
i
V
xI
V
V
Tg
b
V
Tg
bD
D
( ) ( )
+ −
ψ∂
ϑψηχ∂
ψηχ
ψ∂
∂ ,,,
~
,,,
1 100i
V
z
V
Tg
b
, i≥1;
( ) ( ) ( ) ( )
−
++= 2
010
2
2
010
2
2
010
2
0
0010
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ I
b
I
b
I
bD
DI
zyxV
I
( ) ( )ϑψηχϑψηχ ,,,
~
,,,
~
000000*
*
VI
I
V
− ;
( ) ( ) ( ) ( )
−
++= 2
010
2
2
010
2
2
010
2
0
0010
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ V
b
V
b
V
bD
DV
zyxI
V
( ) ( )ϑψηχϑψηχ ,,,
~
,,,
~
000000*
*
VI
I
V
− ;
( ) ( ) ( ) ( )
−
++= 2
020
2
2
020
2
2
020
2
0
0020
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ I
b
I
b
I
bD
DI
zyxV
I
( ) ( ) ( ) ( )ϑψηχϑψηχϑψηχϑψηχ ,,,
~
,,,
~
,,,
~
,,,
~
010000*
*
000010*
*
VI
I
V
VI
I
V
−−
( ) ( ) ( ) ( )
−
++= 2
020
2
2
020
2
2
020
2
0
0020
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ V
b
V
b
V
bD
DV
zyxI
V
( ) ( ) ( ) ( )ϑψηχϑψηχϑψηχϑψηχ ,,,
~
,,,
~
,,,
~
,,,
~
010000*
*
000010*
*
VI
V
I
VI
V
I
−− ;
( ) ( ) ( ) ( )
+
++= 2
110
2
2
110
2
2
110
2
0
0110
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ I
b
I
b
I
bD
DI
zyxV
I
( )
( )
( )
( )
+
+
+
η∂
ϑψηχ∂
ψηχ
η∂
∂
χ∂
ϑψηχ∂
ψηχ
χ∂
∂ ,,,
~
,,,
1,,,
~
,,,
1 010010
0
0
I
Tg
b
I
Tg
bD
D
I
y
I
xV
I
( )
( )
( ) ( ) ×−−
+ *
*
000100*
*
010
,,,
~
,,,
~,,,
~
,,,
1
I
V
VI
I
VI
Tg
b
I
z
ϑψηχϑψηχ
ψ∂
ϑψηχ∂
ψηχ
ψ∂
∂
( ) ( )ϑψηχϑψηχ ,,,
~
,,,
~
100000
VI× ;
( ) ( ) ( ) ( )
+
++= 2
110
2
2
110
2
2
110
2
0
0110
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ V
b
V
b
V
bD
DV
zyxI
V
( )
( )
( )
( )
+
+
+
η∂
ϑψηχ∂
ψηχ
η∂
∂
χ∂
ϑψηχ∂
ψηχ
χ∂
∂ ,,,
~
,,,
1,,,
~
,,,
1 010010
0
0
V
Tg
b
V
Tg
bD
D
V
y
V
xI
V
12. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
12
( )
( )
( ) ( ) ×−−
+ *
*
000100*
*
010
,,,
~
,,,
~,,,
~
,,,
1
I
I
VI
I
IV
Tg
b
V
z
ϑψηχϑψηχ
ψ∂
ϑψηχ∂
ψηχ
ψ∂
∂
( ) ( )ϑψηχϑψηχ ,,,
~
,,,
~
100000
VI× ;
( ) ( ) ( ) ( )
++= 2
00
2
2
00
2
2
00
2
0
000
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ k
z
k
y
k
xV
Ik
I
b
I
b
I
bD
DI
( ) ( ) ( ) ( )
++= 2
00
2
2
00
2
2
00
2
0
000
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ k
z
k
y
k
xI
Vk
I
b
I
b
I
bD
DV
;
( ) ( ) ( ) ( ) +
++= 2
101
2
2
101
2
2
101
2
0
0101
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ I
b
I
b
I
bD
DI
zyxV
I
( )
( )
( )
( )
+
+
+
η∂
ϑψηχ∂
ψηχ
η∂
∂
χ∂
ϑψηχ∂
ψηχ
χ∂
∂ ,,,
~
,,,
1,,,
~
,,,
1 001001
0
0
I
Tg
b
I
Tg
bD
D
I
y
I
xV
I
( )
( )
+
ψ∂
ϑψηχ∂
ψηχ
ψ∂
∂ ,,,
~
,,,
1 001
I
Tg
b
I
z
;
( ) ( ) ( ) ( )
+
++= 2
101
2
2
101
2
2
101
2
0
0101
,,,
~
1,,,
~
1,,,
~
1,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑχ∂ V
b
V
b
V
bD
DV
zyxI
V
( )
( )
( )
( )
+
+
+
η∂
ϑψηχ∂
ψηχ
η∂
∂
χ∂
ϑψηχ∂
ψηχ
χ∂
∂ ,,,
~
,,,
1,,,
~
,,,
1 001001
0
0
I
Tg
b
I
Tg
bD
D
V
y
V
xI
V
( )
( )
+
ψ∂
ϑψηχ∂
ψηχ
ψ∂
∂ ,,,
~
,,,
1 001
I
Tg
b
V
z
;
( ) ( ) ( ) ( )
+
++= 2
011
2
2
011
2
2
011
2
0
0011
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ I
b
I
b
I
bD
DI
zyxV
I
( ) ( ) ( ) ( ) ( )[ −−− ϑψηχϑψηχψηχϑψηχϑψηχ ,,,
~
,,,
~
,,,,,,
~
,,,
~
000000000001*
*
VIThVI
I
V
( ) ( )]ϑψηχϑψηχ ,,,
~
,,,
~
001000
VI−
( ) ( ) ( ) ( )
−
++= 2
011
2
2
011
2
2
011
2
0
0011
,,,
~
1,,,
~
1,,,
~
1,,,
~
ψ∂
ϑψηχ∂
η∂
ϑψηχ∂
χ∂
ϑψηχ∂
ϑ∂
ϑψηχ∂ V
b
V
b
V
bD
DV
zyxI
V
( ) ( ) ( ) ( ) ( )[ −−− ϑψηχϑψηχψηχϑψηχϑψηχ ,,,
~
,,,
~
,,,,,,
~
,,,
~
000000000001*
*
VIThVI
I
V
( ) ( )]ϑψηχϑψηχ ,,,
~
,,,
~
001000
VI− .
( )
0
,,,~
0
=
=χ
χ∂
ϑψηχρ∂ ijk
;
( )
0
,,,~
1
=
=χ
χ∂
ϑψηχρ∂ ijk
;
( )
0
,,,~
0
=
=η
η∂
ϑψηχρ∂ ijk
;
( )
0
,,,~
1
=
=η
η∂
ϑψηχρ∂ ijk
;
( )
0
,,,~
0
=
=ψ
ψ∂
ϑψηχρ∂ ijk
;
( )
0
,,,~
1
=
=ψ
ψ∂
ϑψηχρ∂ ijk
, i≥1, j≥1, k≥1; ( )
( )
*
,,
0,,,~
000
ρ
ψηχ
ψηχρ ρ
f
= ;
( ) 00,,,~ =ψηχρijk
, i≥1, j≥1, k≥1.
Solutions of equations for the functions ( )ϑψηχρ ,,,~
ijk
(i≥0, j≥0, k≥0) could be written as
19. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
19
REFERENCES
[1] I.P. Stepanenko. Basis of Microelectronics, Soviet Radio, Moscow, 1980.
[2] A.G. Alexenko, I.I. Shagurin. Microcircuitry Radio and Communication, Moscow, 1990.
[3] V.G. Gusev, Yu.M. Gusev. Electronics, Moscow: Vysshaya shkola, 1991, in Russian.
[4] V.I. Lachin, N.S. Savelov. Electronics,Phoenix, Rostov-na-Donu, 2001.
[5] Jung-Hui Tsai, Shao-Yen Chiu, Wen-Shiung Lour, Der-Feng Guo. High-performance InGaP/GaAs
pnp delta-doped heterojunction bipolar transistor, Semiconductors. Vol. 43 (7). P. 971-974 (2009).
[6] T. Y. Peng, S. Y. Chen, L. C. Hsieh, C. K. Lo, Y. W. Huang, W. C. Chien, Y. D. Yao. Impedance
behavior of spin-valve transistor, J. Appl. Phys. Vol. 99 (8). P. 08H710-08H712 (2006).
[7] S. Maximenko, S. Soloviev, D. Cherednichenko, T. Sudarshan. Observation of dislocations in
diffused 4H–SiC p-i-n diodes by electron-beam induced current, J. Appl. Phys. Vol. 97 (1). P.
013533-013538 (2005).
[8] I.E. Tyschenko, V.A. Volodin. Quantum confinement effect in silicon-on-insulator films implanted
with high dose hydrogen ions, Semiconductors. Vol.46 (10). P.1309-1313 (2012).
[9] K.K. Ong, K.L. Pey, P.S. Lee, A.T.S. Wee, X.C. Wang, Y.F. Chong. Dopant distribution in the
recrystallization transient at the maximum melt depth induced by laser annealing, Appl. Phys. Lett.
Vol. 89 (17). P. 172111 (2006).
[10] Yu.V. Bykov, A.G. Yeremeev, N.A. Zharova, I.V. Plotnikov, K.I. Rybakov, M.N. Drozdov, Yu.N.
Drozdov, V.D. Skupov. Diffusion processes in semiconductor structures during microwave annealing,
Radiophysics and Quantum Electronics. Vol. 43 (3). P. 836-843 (2003).
[11] V.V. Kozlivsky. Modification of semiconductors by proton beams, Sant-Peterburg, Nauka, 2003,
in Russian.
[12] E.L. Pankratov. Application of porous layers and optimization of annealing of dopant and radiation
defects to increase sharpness of p-n-junctions in a bipolar heterotransistors, J. Optoel. Nanoel. Vol. 6
(2). P. 188 (2011).
[13] E.L. Pankratov. Increasing of homogeneity of dopant distribution in a p-n-junction by using an
overlayers, J. Comp. Theor. Nanoscience. Vol. 8 (2). P. 207 (2011).
[14] E.L. Pankratov, E.A. Bulaeva. Increasing of sharpness of diffusion-junction heterorectifier by using
radiation pro-cessing, Int. J. Nanoscience. Vol. 11 (5). P. 1250028 (2012).
[15] Z.Yu. Gotra. Technology of microelectronic devices (Radio and communication, Moscow, 1991).
[16] E.I. Zorin, P.V. Pavlov and D.I. Tetelbaum. Ion doping of semiconductors, Energy, Moscow, 1975.
[17] P.M. Fahey, P.B. Griffin, J.D. Plummer. Point defects and dopant diffusion in silicon, Rev. Mod.
Phys. 1989. V. 61. № 2. P. 289-388.
[18] V.L. Vinetskiy, G.A. Kholodar', Radiative physics of semiconductors. (Naukova Dumka, Kiev, 1979,
in Russian).
[19] E.L. Pankratov. Analysis of redistribution of radiation defects with account diffusion and several
secondary processes, Mod. Phys. Lett. B. 2008. Vol. 22 (28). P. 2779-2791.
[20] K.V. Shalimova. Physics of semiconductors, Moscow: Energoatomizdat, 1985, in Russian.
[21] A.N. Tikhonov, A.A. Samarskii. The mathematical physics equations, Moscow, Nauka 1972) (in
Russian.
[22] H.S. Carslaw, J.C. Jaeger. Conduction of heat in solids, Oxford University Press, 1964.
Author
Pankratov Evgeny Leonidovich was born at 1977. From 1985 to 1995 he was educated in a secondary
school in Nizhny Novgorod. From 1995 to 2004 he was educated in Nizhny Novgorod State University:
from 1995 to 1999 it was bachelor course in Radiophysics, from 1999 to 2001 it was master course in
Radiophysics with specialization in Statistical Radiophysics, from 2001 to 2004 it was PhD course in
Radiophysics. From 2004 to 2008 E.L. Pankratov was a leading technologist in Institute for Physics of
Microstructures. From 2008 to 2012 E.L. Pankratov was a senior lecture/Associate Professor of Nizhny
Novgorod State University of Architecture and Civil Engineering. Now E.L. Pankratov is in his Full Doctor
course in Radiophysical Department of Nizhny Novgorod State University. He has 96 published papers in
area of his researches.
20. Advanced Nanoscience and Technology: An International Journal (ANTJ), Vol. 1, No. 1, June 2015
20
Bulaeva Elena Alexeevna was born at 1991. From 1997 to 2007 she was educated in secondary school of
village Kochunovo of Nizhny Novgorod region. From 2007 to 2009 she was educated in boarding school
“Center for gifted children”. From 2009 she is a student of Nizhny Novgorod State University of
Architecture and Civil Engineering (spatiality “Assessment and management of real estate”). At the same
time she is a student of courses “Translator in the field of professional communication” and “Design
(interior art)” in the University. E.A. Bulaeva was a contributor of grant of President of Russia (grant №
MK-548.2010.2). She has 29 published papers in area of her researches.