Engineering Skills
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Isaac E. Chao received a B.S. in Materials Science and Engineering from Rutgers University in 2006. He has work experience in undergraduate research at Rutgers University and the University of South Carolina, as well as a position as a laboratory technician at OFS Optics. His skills include materials processing, characterization techniques, design software, and laboratory equipment operation.
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- 1. Isaac E. Chao B.S. Materials Science and Engineering [email_address]
- 17. Silver Deposition Setup reducing solution pump clamp pipette tip pipette tip waveguide Tygon tubing silvering solution waste
- 20. Lower wt% vs. high Property Lower wt% Higher wt% Adhesion √ Smoothness/ Uniformity √ Transmittance √ Thickness √
- 21. Absorption Spectrum for PS coated sample (2 wt%) Polystyrene absorption peak 6th 5th 4th 3 rd order interference peak
- 23. Film thickness Film Thickness can be determined from Absorption Data: Lambda: primary absorption wavelength n: refractive index of material n= 1.57 for polystyrene The thickness of our film was determined to be 1.53 micrometers
- 32. PZT Sensor Sample Diagram
- 33. Optical Microscopy of Sample The optical microscopy images produced no blemishes of significance. The ones seen on this slide are attributed to dust on the sample (and/or lens).
- 34. Scanning Electron Microscopy (SEM) The SEM produced an image which shows small blemishes on the surface of the PZT thin-film. These could be attributed to damage to the PZT during handling, but could possibly represent imperfections on the sputtered surface on a scale of 10^(-6) meters.
- 36. Atomic Force Microscopy of the Sample
- 37. Atomic Force Microscopy of the Sample AFM shows that surface deflection remains at the nano scale (10^-9), which is insignificant compared to the thickness of the layer (10^-6).