SPICE MODEL of 2SK3938 (Professional+BDP Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS: MOSFET (Professional Model)
PART NUMBER: 2SK3938
MANUFACTURER: Panasonic
Body Diode (Professional) / ESD Protection Diode
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

2. Circuit Configuration
2SK3938
Equivalent Circuit
D
S1
- -
+ +
R2
S
R1 10MEG DGD
10M CGD
S2
+ +
- -
Q1
S
G
S
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

3. MOSFET MODEL
PSpice model
Model description
parameter
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

4. Transconductance Characteristic
Circuit Simulation Result
Comparison table
gfs (ms)
Id(mA) Error(%)
Measurement Simulation
5.000 38.462 38.462 0.000
10.000 55.556 54.348 -2.174
20.000 76.923 77.220 0.386
40.000 108.110 108.992 0.817
80.000 148.150 154.143 4.046
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

5. Vgs-Id Characteristic
Circuit Simulation result
140mA
120mA
80mA
40mA
0A
0V 1.0V 2.0V 3.0V 4.0V 5.0V
I(V3)
V_V1
Evaluation circuit
V3
0V dc
U4
2SK3938 V2
3V dc
V1
4V dc
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

6. Comparison Graph
Circuit Simulation Result
Simulation Result
VGS(V)
ID(mA) Error (%)
Measurement Simulation
5.000 1.900 1.924 1.263
10.000 2.020 2.034 0.693
20.000 2.180 2.190 0.459
50.000 2.500 2.499 -0.040
100.000 2.900 2.847 -1.828
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

7. Rds(on) Characteristic
Circuit Simulation result
10mA
0A
0V 200mV
I(V3)
V_V2
Evaluation circuit
V3
0Vdc
U4 V2
2SK3938 3Vdc
V1
4Vdc
0
Simulation Result
ID=10mA, VGS=4.0V Measurement Simulation Error (%)
R DS (on) 5.000  5.000  0.000
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

8. Gate Charge Characteristic
Circuit Simulation result
5.0V
4.0V
3.0V
2.0V
1.0V
0V
0s 0.4ns 1.2ns 2.0ns 2.8ns 3.6ns
V(W1:2)
Time*1m
Evaluation circuit
V2
0V dc
D1
Dbreak I2
PER = 1000u U1
PW = 6 00u 2SK3938
TF = 10n W1
TR = 10n +
TD = 0
-
I2 = 1m V1
I1 W 24V dc
I1 = 0 IOFF = 1m
ION = 0uA
0
Simulation Result
VDD=24V,ID=0.1A Measurement Simulation Error (%)
,VG=4V
Qgs 0.464 nC 0.465 nC 0.216
Qgd 1.936 nC 1.930 nC -0.310
Qg 3.270 nC 3.275 nC 0.153
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

9. Gate Charge Characteristic Reference
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

10. Capacitance Characteristic
Measurement
Simulation
Simulation Result
Cbd(pF)
VDS(V) Error(%)
Measurement Simulation
0.100 10.500 10.580 0.762
0.200 9.900 9.830 -0.707
0.500 8.500 8.400 -1.176
1.000 7.000 7.100 1.429
2.000 5.700 5.790 1.579
5.000 4.300 4.280 -0.465
10.000 3.400 3.360 -1.176
20.000 2.600 2.630 1.154
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

11. Switching Time Characteristic
Circuit Simulation result
5.0V
4.0V
3.0V
2.0V
1.0V
0V
4.8us 5.0us 5.2us 5.4us 5.6us 5.8us 6.0us 6.2us 6.4us
V(2) V(3)
Time
Evaluation circuit
Vsense L2 RL
3
30nH 290
R1 L1
V1 = 0 2
C1
50 30nH
V2 = 6 U1 VD
2SK3938 100uF 3Vdc
TD = 1u V1 R2
TR = 10n 50
TF = 10n
PW = 5u
PER = 10u
0
Simulation Result
ID=10mA, VDD=3V
Measurement Simulation Error(%)
VGS=0V~3V
ton 350.000 ns 350.698 ns 0.199
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

12. Output Characteristic
Circuit Simulation result
120mA
VGS=2.8
V
80mA
2.6V
40mA 2.4V
2.2V
2.0V
0A
0V 4V 8V 12V
I(V3)
V_V2
Evaluation circuit
V3
0Vdc
U4 V2
2SK3938 3Vdc
V1
4Vdc
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

13. Forward Current Characteristic
Circuit Simulation Result
100mA
50mA
0A
0V -0.5V -1.0V
I(R1)
V_V1
Evaluation Circuit
R1
0.01m
V1
DC = 0 U1
AC = 2SK3938
TRAN =
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

14. Comparison Graph
Circuit Simulation Result
Simulation Result
VSD (mV)
IDR (mA) %Error
Measurement Simulation
1.000 610.000 611.680 0.275
2.000 637.000 637.360 0.057
5.000 671.000 671.307 0.046
10.000 700.000 696.989 -0.430
20.000 725.000 722.666 -0.322
50.000 756.000 756.613 0.081
100.000 780.000 782.293 0.294
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

15. Forward Current Characteristic Reference
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

16. Reverse Recovery Characteristic
Circuit Simulation Result
40mA
0A
-40mA
14.84us 14.92us 15.00us 15.08us 15.16us
I(R1)
Time
Evaluation Circuit
R1
50
V1 = -0.3V
V2 = 1.72V
TD = 0s V1
TR = 10n
TF = 10n U2
D3938_PRO
PW = 15us
PER = 100us
0
Compare Measurement vs. Simulation
Measurement Simulation Error (%)
trj 8.800 ns 8.861 ns 0.693
trb 20.800 ns 20.703 ns -0.466
trr 29.600 ns 29.564 ns -0.122
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

17. Reverse Recovery Characteristic Reference
Trj=8.8(ns)
Trb=20.8(ns)
Conditions:Ifwd=lrev=0.02(A),Rl=50
Example
Relation between trj and trb
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

18. Zener Voltage Characteristic
Circuit Simulation Result
10mA
9mA
8mA
7mA
6mA
5mA
4mA
3mA
2mA
1mA
0A
0V 5V 10V 20V 30V 40V 50V
I(R1)
V_V1
Evaluation Circuit
OPEN
OPEN
R2
R1 1G
0.01m 0
U1
2SK3938
V1
0Vdc
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

19. Zener Voltage Characteristic Reference
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006