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Application Report
SPRABJ7–June 2011
PCB Design Requirements for VDD_MPU_IVA Power
Distribution Network for TI OMAP3630, AM37xx, and
DM37xx Microprocessors
The Sitara™ ARM® MPU Applications Team ........................................................................................
ABSTRACT
The purpose of a power distribution network (PDN) is to provide clean and reliable power to active devices
in the system. The printed circuit board (PCB) is a critical component of the system-level PDN. Therefore,
the PCB design is of utmost importance for high-performance low-power microprocessors. This application
report provides design requirements and details a step-by-step methodology on how to design the
VDD_MPU_IVA PDN on the PCB to comply with the requirements of the TI OMAP3630,AM37xx, and
DM37xx microprocessors.
Contents
1 Introduction .................................................................................................................. 2
2 PCB PDN Design Methodology ........................................................................................... 2
3 Step 1: Requirements and Guidelines for PCB Stack-up .............................................................. 2
4 Step 2: Physical Layout Optimization of the PDN ...................................................................... 4
5 Step 3: Static IR Drop PDN Optimization ................................................................................ 7
6 Step 4: AC Analysis of PCB PDN ....................................................................................... 12
7 Step 5: Checklist of Requirements/Guidelines/Specifications ....................................................... 15
8 Acronyms ................................................................................................................... 17
List of Figures
1 Minimize Loop Inductance by Proper Layer Assignment in the PCB ................................................ 3
2 An Example PCB Layer Assignment That Uses High-Density Interconnect (HDI) Vias........................... 3
3 Another 8-Layer PCB Design That Uses Plated Through Hole (PTH) Vias......................................... 3
4 Poor Via Assignment for PDN ............................................................................................ 4
5 Improved Via Assignment for PDN ....................................................................................... 4
6 An Example Showing Via Starvation ..................................................................................... 5
7 Improved Layout With More Transitional Vias .......................................................................... 5
8 Example of Co-Planar Shielding of Power Net Using Ground Guard-Band......................................... 5
9 Characteristics of a Real Capacitor With ESL and ESR............................................................... 6
10 Typical Impedance Profile of a Capacitor................................................................................ 6
11 Capacitor Placement Geometry for Improved Mounting Inductance................................................. 7
12 Depiction of Sheet Resistivity and Resistance.......................................................................... 7
13 Static IR Drop Budget for PCB Only...................................................................................... 8
14 Pin-Grouping Concept: Lumped and Distributed Methodologies ..................................................... 8
15 PCB Only Lumped R Extraction Flow .................................................................................... 9
16 PCB Only Distributed IR Drop Flow..................................................................................... 10
17 Example Showing IR Drop Improvement Using Distributed IR Drop Flow......................................... 11
18 Components of a Typical Power Distribution Network (PDN) ....................................................... 12
19 Decoupling Frequency Range of the Components of PCB PDN.................................................... 12
OMAP is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
1SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI
OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback
Copyright © 2011, Texas Instruments Incorporated
Introduction www.ti.com
20 Modeling and Extraction Flow for Extracting Loop Inductance From s-Parameter ............................... 14
21 An Example of Decoupling Placement for VDD_MPU_IVA.......................................................... 15
List of Tables
1 Acronyms ................................................................................................................... 17
1 Introduction
This application report provides detail design guidelines and specific recommendations for designing a
PCB power delivery network (PDN) for the high performance/low power TI OMAP3630, AM37xx, and
DM37xx microprocessors. The approach used here is: outline what the PCB PDN design target
requirements are, discuss the fundamental rational behind these requirements and, whenever appropriate,
provide suggestions/means that the PCB designers can adopt to validate that the PDN requirements are
met.
2 PCB PDN Design Methodology
• Step1: Requirements and guidelines for PCB Stack-up
• Step 2: Physical layout optimization of the PDN
• Step 3: Static IR drop optimization of PDN
– Minimize resistance, avoid neck-down, and reduce current density
• Step 4: ac resonance Check
– Target impedance, resonance and anti-resonance peaks, and decoupling optimization scheme
(type, placement, and value)
• Step 5: Checklist for PDN requirements/specifications
3 Step 1: Requirements and Guidelines for PCB Stack-up
The PCB stack-up (layer assignment) is an important factor in determining the optimal performance of the
power distribution system. An optimized PCB stack-up for higher power integrity performance can be
achieved by following these requirements:
• Power and ground plane pairs/islands should be closely coupled together. The capacitance formed
between the planes can be used to decouple the power supply at high frequencies. Whenever
possible, the power and ground planes should be solid to provide a continuous return path for return
current.
• Use a thin dielectric thickness between the power and ground plane pair. Capacitance is inversely
proportional to the separation of the plane pair. Minimizing the separation distance (i.e., the dielectric
thickness) maximizes the capacitance.
• Keep the power and ground plane pair as close to the TOP and BOTTOM surfaces as possible (see
Figure 1). This will help in minimizing the decoupling capacitors mounting, via, and the power/ground
plane pair spreading loop inductance.
2 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011
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OMAP Package
OMAP DIE
Power/Ground
Ground/Power
Trace
Capacitor
Via
Note: Loop Inductance
1
2
3
1. BGA via pair loop inductance
2. Power/Ground by proper layer assignment in the PCB
3. Capacitor trace inductance
TOP/SIGNAL1
GROUND
POWER
SIGNAL2
SIGNAL3
POWER
GROUND
BOTTOM/SIGNAL4
TOP/SIGNAL1
POWER
GROUND
SIGNAL2
POWER
GROUND
BOTTOM/SIGNAL4
SIGNAL3
www.ti.com Step 1: Requirements and Guidelines for PCB Stack-up
Figure 1. Minimize Loop Inductance by Proper Layer Assignment in the PCB
The placement of power and ground planes in the PCB stack-up (determined by layer assignment) has a
significant impact on the parasitic inductances of power current path as shown in Figure 1. For this
reason, it is recommended to consider layer order in the early stages of the PCB PDN design cycle,
putting high priority supplies in the top half of the stack-up and low-priority supplies in the bottom half of
the stack-up as shown in the following figures.
Figure 2 and Figure 3 show examples of typical PCB stack-up designed with power integrity in mind.
Figure 2. An Example PCB Layer Assignment That Uses High-Density Interconnect (HDI) Vias
Figure 3. Another 8-Layer PCB Design That Uses Plated Through Hole (PTH) Vias
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Step 2: Physical Layout Optimization of the PDN www.ti.com
4 Step 2: Physical Layout Optimization of the PDN
A critical step in designing an optimized PDN is that proper care should be taken to make sure that the
initial layout is done with good power integrity design guidelines in mind. What follows are some important
requirements that need to be implemented in the PCB PDN design.
• External trace routing between components should be as wide as possible. Wider traces lower the
impedance, which reduces the static IR drop and improves high frequency performance of the PDN.
• Whenever possible, use a minimum trace width to solder pad ratio of 1:1 or greater for passive
component (e.g., capacitors and resistors) pins and vias. Do not share vias among multiple capacitors.
• Placement of the vias should be as close to the solder pad as possible.
Figure 4 depicts an example of acceptable width for power net routing but with poor via placement.
Figure 5 shows an improved power net routing with appropriate via assignment and placement,
respectively.
Figure 4. Poor Via Assignment for PDN
Figure 5. Improved Via Assignment for PDN
• To avoid any ampacity issue – maximum current-carrying capacity of each transitional via should be
evaluated to determine the appropriate number of vias required to connect components. Figure 6 and
Figure 7 are examples of via starvation on a power net transitioning from the TOP routing layer to
internal layers and the improved layout, respectively.
• It is also a good practice to perform static IR drop (discussed in Section 5). This analysis can be used
to assess the appropriate number of vias and geometrical trace width dimensions required to meet the
expected IR drop requirement.
4 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011
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One via for 5 capacitor pads is NOT good practice
Added vias
VDD_Core
VDD_MPU_IVA
VSS as “co-planar” shield
www.ti.com Step 2: Physical Layout Optimization of the PDN
Figure 6. An Example Showing Via Starvation
Figure 7. Improved Layout With More Transitional Vias
• Whenever possible for the internal layers (routing and plane), wide traces and copper area fills are
preferred for PDN layout. As discussed in earlier sections, routing power nets in plane provide for more
inter-plane capacitance and improve high frequency performance of the PDN.
• Try to avoid different power nets (e.g., VDD_MPU_IVA with VDD_CORE) coupling on the PCB by
using co-planar shielding whenever appropriate. Figure 8 depicts an example of co-planar shielding for
power nets.
Figure 8. Example of Co-Planar Shielding of Power Net Using Ground Guard-Band
5SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI
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C ESL ESR
2
2 1
Z ESR ESL
C
ω
ω
 
= + −  
Where
2 fω π=
Resonant Frequency (55 MHz)
(minimum impedance)
1/CX Cw= LX Lw=
Step 2: Physical Layout Optimization of the PDN www.ti.com
• Decoupling capacitors should be mounted with minimum impact to inductance. A capacitor has
characteristics not only of capacitance but also inductance and resistance. Figure 9 shows the parasitic
model of a real capacitor. A real capacitor should be treated as an RLC circuit with effective series
resistance (ESR) and effective series inductance (ESL).
Figure 9. Characteristics of a Real Capacitor With ESL and ESR
The magnitude of the impedance of this series model is given as:
(1)
Figure 10 shows the resonant frequency response of a typical capacitor with self-resonant frequency of 55
MHz. The impedance of the capacitor is a combination of its series resistance, reactive capacitance, and
inductance as shown in Equation 1.
Figure 10. Typical Impedance Profile of a Capacitor
• Since the capacitors have series inductance and resistance that will impact its effectiveness, it is
important that the following recommendations are adopted in placing them on the power distribution
network. Whenever possible, make sure to mount the capacitor with the geometry that minimizes the
mounting inductance and resistance as shown earlier in Figure 1. The capacitor mounting inductance
and resistance here includes the inductance and resistance of the pads, trace, and vias.
• The length of trace used to connect a capacitor has a big impact on parasitic inductance and
resistance of the mounting. This trace should be as short and wide as possible. Wherever possible,
minimize the trace length by locating vias near the solder pads. Further improvements can be made by
placing vias to the side of capacitor solder pads or doubling the number of vias as shown in Figure 11.
If the PCB manufacturing processes allow, and if cost-effective, via-in-pad (VIP) geometries are
strongly recommended.
6 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011
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Copyright © 2011, Texas Instruments Incorporated
trace
pad
via
Mounting Geometry for Reduced Inductance
Via-in-pad
The resistance Rs of a plane conductor
for a unit length and unit width is called
the surface resistivity ( s per square).Ω
W
L
t
1
Rs
t t
l
R Rs
w
ρ
σ
= =
⋅
= ⋅
www.ti.com Step 3: Static IR Drop PDN Optimization
In addition to mounting inductance and resistance associated with placing a capacitor on the PCB, the
effectiveness of a decoupling capacitor also depends on the spreading inductance and resistance that the
capacitor sees with respect to the load. The spreading inductance and resistance is strongly dependent on
the layer assignment in the PCB stack-up (as shown in Figure 1).
Figure 11. Capacitor Placement Geometry for Improved Mounting Inductance
5 Step 3: Static IR Drop PDN Optimization
Delivering reliable power to circuits is always of critical importance because IR drops can occur on
multiple components of the PDN. Power distribution cables, connectors, PCBs, semiconductor packaging,
and semiconductors are all example components of the PDN that may contribute to the system level IR
drop. Components that are distant from their associated power source are particularly susceptible to IR
drop, and designs that rely on battery power must minimize voltage drop to avoid unacceptable power
loss. Early DC assessments help determine power distribution basics such as the best available entry
point for power, layer stack-up choices, and estimates for the amount of copper needed to carry the
current.
Figure 12. Depiction of Sheet Resistivity and Resistance
Ohm’s Law (V=IR) relates conduction current to voltage drop, and at dc, the relation coefficient is a
constant representing the resistance of the conductor. Conductors also dissipate power due to their
resistance. Both voltage drop and power dissipation are proportional to the resistance of the conductor.
Systems with on-board power sources have three primary components that may contribute IR drop;
semiconductor, semiconductor package and main PCB. Static IR or dc analysis/design methodology
consists of designing the PDN such that the voltage available (under dc operating conditions) to the power
and ground pads of the applications processor transistors is within a specified value of the nominal
voltage, for proper functionality of the device. The PCB-contribution to the static IR drop budget is defined
as the dc voltage drop between the solder pads of the power management integrated circuit (PMIC) or
voltage regulator module (VRM) and the BGA solder pads of the applications processor (as shown in
Figure 13).
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Copyright © 2011, Texas Instruments Incorporated
PMIC
/VRM
OMAP3630,
AM37xx, or
DM37xx
PCB
Static IR Drop Budget of
< 30 mV (Worst-case)
BGA Pad on PCB
Sources
Sinks
Sources
Sinks
Multi-port
Net
Branch
Port/Pin
OMAP end
Grouped Power/Ground
pins to create 1 equivalent
resistive branch
Step 3: Static IR Drop PDN Optimization www.ti.com
Figure 13. Static IR Drop Budget for PCB Only
Given the total system-level margin allowed for proper device functionality, allowable voltage variation at
the power terminals of the applications processor is specified at 2.5% of the nominal voltage. For a 1.2 V
supply, this should be ≤30 mV. This is ONLY permitted under the assumption that the power source
feedback or sense is connected to a point very close to the applications processor, such the DC IR drop is
compensated by the power source. If the power source feedback or sense is not connected to a point
close to the applications processor, the static IR drop must be controlled to 0.5-1.0% for proper device
functionality.
• It is highly recommended the power source feedback or sense line on the PCB is connected as close
as physically possible to the applications processor.
To check if the static IR drop is within specification, the PCB designer needs to perform the appropriate
analysis and compare the results to the power supply tolerance specification of ± 0.5%/2.5% (based on
PMIC/VRM sense design topologies discussed above). To accurately analyze PCB static IR drop, the
actual geometry of the PDN must often be properly modeled and simulated to accurately characterize long
distribution paths, low weight copper, electro-migration violations of current-carrying vias, and
swiss-cheese effects.
It is recommended to perform the following analyses:
• Lumped resistance/IR drop analysis
• Distributed resistance/IR drop analysis
The requirements are to perform both analyses and to show compliance. In the next sections, each
methodology is described in detail and examples are provided of analyses flow that can be used by the
PCB designer to validate compliance to the requirements on their PCB PDN design.
5.1 Lumped and Distributed Resistance/IR Drop Analysis Methodology
Lumped methodology consists of grouping all of the power/ground pins of the PMIC and the processor
device; this is followed by extracting the lumped resistance or dc voltage drop of the equivalent path by
applying a voltage source at the PMIC end and a current sink at the device end. The pin-grouping concept
is depicted in Figure 14.
Figure 14. Pin-Grouping Concept: Lumped and Distributed Methodologies
8 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011
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Copyright © 2011, Texas Instruments Incorporated
Board layout (.brd) in
Cadence Allegro
PCB layout import in
static IR drop tool
?
?
Edit technology stackup
Add/edit metal conductivity
?
?
Pin grouping
Current source assignment
Resistance extraction in
Static IR drop tool
Lumped path R O/P
Meet
spec?
DC IR Signoff
Yes
No
PCB
layout
iterations
in Cadence
www.ti.com Step 3: Static IR Drop PDN Optimization
The lumped methodology consists of importing the PCB layout database (from Cadence Allegro or other
PCB layout tool) into the static IR drop modeling and simulation tool of preference for the PCB designer.
This is followed by applying the correct PCB stack-up information (thickness, material properties) of the
PCB dielectric and metallization layers. The material properties of dielectric consist of permittivity (Dk) and
loss tangent (Df). For the conductor layers, the correct conductivity needs to be programmed into the
simulation tool. This is followed by pin-grouping of the power and ground nets, and applying appropriate
voltage/current sources. The current and voltage information can be obtained from the power and voltage
specifications of the device under different operating conditions/use-modes. After running the simulation,
the lumped resistance and lumped IR drop can be examined as shown in Figure 15.
Figure 15. PCB Only Lumped R Extraction Flow
9SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI
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Copyright © 2011, Texas Instruments Incorporated
Board Layout (.brd) in
Cadence Allegro
PCB Layout import in
Static IR Drop Tool
?
?
Edit Technology stackup
Add/Edit metal conductivity
Pin selection,
Current Source Assignment
Average Static IR drop O/P profile
Meet
spec?
DC IR Signoff
Yes
No
PCB
Layout
Iterations
in Cadence
Design
Rules/LL/Best
Practices
Average current (l) per Device pin
Resistance Extraction in Static IR
Drop Tool
Step 3: Static IR Drop PDN Optimization www.ti.com
A more accurate analysis is to use average current per-pin assumption and then create a distributed IR
drop profile of the PCB. In this analysis, the power and ground pins are left unique instead of lumping
them together. If the average-current based analysis is performed, the average per-pin current information
is extracted from the device-specification data sheet and the pin count for the specific supply rail. This
average current information is then included for analysis as shown in Figure 16.
Figure 16. PCB Only Distributed IR Drop Flow
10 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011
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Copyright © 2011, Texas Instruments Incorporated
Original Unoptimized Design
Max. drop: 80.5 mV
Improved Design
Max. drop: 26.7 mV
www.ti.com Step 3: Static IR Drop PDN Optimization
Based on the design guidelines followed by post-layout IR drop analysis, significant improvements in
designs can be characterized by the above flow. An example of design improvement has been depicted in
Figure 17.
The Static IR drop flow/methodologies in this document have been demonstrated using the TI internal
flow. The basic steps can be repeated with other EDA tools. It consists of:
• Translate the post-layout design into the tool
• Define the sources (PMIC/VRM, connectors etc.)
• Define the current sinks for loads, spec it as lumped, distributed based on design requirements
• Ensure that the stack-up, layer thickness, and copper technology properties (thickness, conductivity) is
correct
• Set up of appropriate limits for simulation
• Analyses of IR drop simulation data to locate hotspots, neckdowns, electromigration (EM) violations,
etc.
Figure 17. Example Showing IR Drop Improvement Using Distributed IR Drop Flow
11SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI
OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback
Copyright © 2011, Texas Instruments Incorporated
Rr
p
Lr
p
Rb
p
Lb
p
Rp
p
Lp
p
Rc
p
Lc
p
out
Iload
Voltage
Regulator PCB IC Package Chip Module
Rr
g
Lr
g
Rb
g
Lb
g
Rp
g
Lp
g
Rc
g
Lc
g
1MHz1-5KHz
PMIC/VRM Electrolytic
Bulk
Capacitors
Mid -
Frequency
Ceramic
Capacitors
Power/Ground
Inter-plane
Capacitance
50-100MHz
Frequency
Mag. of Z FMAX
ZTARGET
|Z |EFF
Step 4: AC Analysis of PCB PDN www.ti.com
6 Step 4: AC Analysis of PCB PDN
The typical elements of the PDN are shown in Figure 18. They include the chip-level power distribution
with thin-oxide decoupling capacitors, the package-level power distribution with planes and mid-frequency
decoupling capacitors, and the board-level (i.e., PCB) power distribution with planes, low-frequency
ceramic and bulk decoupling capacitors, and the PMIC/VRM.
Figure 18. Components of a Typical Power Distribution Network (PDN)
The frequency ranges covered by these elements are shown in Figure 19. The primary focus here is on
optimizing the PCB PDN for high performance; the methodology is developed around the areas that the
PCB designer has control and can influence early in the design phase.
The typical PCB PDN network contains the following components:
• Power management integrated circuit (PMIC) or voltage regulator module (VRM)
• Bulk and mid-frequency decoupling capacitors
• Parasitics from power/ground plane spreading, BGA vias, and SMT
• Inter-plane capacitance
In the following sections, the purpose of each of the components of the PDN network are reviewed and
the requirements for each are stated with examples, whenever appropriate.
Figure 19. Decoupling Frequency Range of the Components of PCB PDN
12 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011
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Copyright © 2011, Texas Instruments Incorporated
RIPPLE TRANSIENT PDNV I Z= ∗
%
0.5
TARGET
MAX
VoltageRail Ripple
Z
I
∗
=
∗
96.4TARGETZ m= Ω
www.ti.com Step 4: AC Analysis of PCB PDN
The PMIC/VRM or simply voltage regulator device is the first major component of the PDN. It observes its
output voltage and adjusts the amount of current being supplied to keep the voltage constant. Most
common voltage regulators make this adjustment on the order of milliseconds to microseconds. They are
effective at maintaining output voltage for events at all frequencies from dc to a few kilohertz (depending
on the regulator dynamic response time). For all transient events that occur at frequencies above this
range, there is a time lag before the voltage regulator can respond to the new level of demand. During this
time lag the rail suffers from voltage droop. A power delivery network has an impedance (ZPDN) associated
with the path from the PMIC/VRM to the applications processor. The magnitude of noise (voltage ripple)
seen on a given power rail is proportional to the impedance (ZPDN) and the transient current (ITRANSIENT)
draw associated with that rail. Figure 20 shows an example of the current transient profile under a
switching set-up condition.
Based on Ohm’s Law,
(2)
Typically the transient current is application specific and is determined by the switching scenario. As a
board designer, you have the ability to minimize the voltage ripple by reducing ZPDN either by reducing the
inductance or by maximizing the capacitance. To ensure that the voltage ripple noise is within the
applications processor specification, the ZPDN must be designed to meet a certain impedance, called the
target impedance (ZTARGET). Using the frequency domain target impedance method (FDTIM) to describe
the behavior of a power delivery system has been widely accepted.
The key concept of the FDTIM is the determination of the target impedance ZTARGET (see Equation 3) for
the power rail under consideration. For reliable operation of a power delivery system, its impedance
spectrum needs to be maintained below the target value at the frequencies from dc to FMAX (as shown in
Figure 19). FMAX is the point in frequency after which adding a reasonable number of decoupling capacitors
does not bring down the power rail impedance |ZEFF| below the target impedance (ZTARGET) due to the
dominance of the parasitic planar spreading inductance and package inductances.
(3)
For the OMAP3630, AM37xx, and DM37xx devices, the ZTARGET for VDD_MPU_IVA is specified at 96.4
mΩ. This was computed using the Equation 3 and with the following assumptions: the voltage rail
(VDD_MPU_IVA) is 1.35 V (max voltage at OPP1G), % ripple allowed is 5% of the maximum voltage, and
IMAX is the maximum transient current.
(4)
6.1 Selecting Decoupling Capacitors to Meet ZTARGET
To maintain power integrity throughout the entire frequency range of interest, the power distribution
network relies on the voltage regulator module (PMIC/VRM), the on-board discrete bulk electrolytic and
ceramic decoupling capacitors, and the inter-plane capacitance (capacitance from the power-ground
sandwich in the board stack-up).
For a first-order analysis, the PMIC/VRM can be modeled as a series-connected resistor and inductor.
The PMIC/VRM, at low frequencies (up to about 1 MHz), has a low output impedance and is capable of
responding to the instantaneous requirements of the applications processor. The ESR and ESL values for
the PMIC/VRM are very low in the lower frequency range. Beyond lower frequencies, the PMIC/VRM
impedance is primarily inductive, making it incapable of meeting the transient current requirement of the
device.
The bulk and ceramic discrete decoupling capacitors must provide the required low impedance power
source above the frequency where the PMIC/VRM becomes inductive. The effectiveness of the bulk and
mid-frequency decoupling capacitors (1 MHz-70 MHz – depending on the capacitors ESL and ESR) is
limited by its placement (loop inductance), value, and type.
The bulk capacitors should be located near the entry point of the power supply to the PCB. These
decoupling capacitors maintain the PDN impedance at the required value beyond the frequency where the
PMIC/VRM becomes inductive and up to the frequency at which mid-frequency capacitors become useful.
The mid-frequency SMT capacitors are useful in the 10 to 150 MHz range and higher. These capacitors
are primarily ceramic capacitors that come in several dielectric types (NPO, X7R, X5R, and Y5V) and
several sizes (1206, 0805, 0603, 0402, etc).
13SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI
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( ( , ))
2
eff
imaginary Z power gnd pads of decap
L
frequencyπ
=
∗ ∗
Board Layout (.brd) in
Cadence Allegro
Import Power and Ground Nets
in EM Tool
?
?
Edit Technology stackup
RGA Pin-Grouping for power and ground net
Meet design
guidelines?
Signoff
Yes No
PCB
Layout
Iterations
in Cadence
?
?
?
Short Power and ground BGA pin-groups
Port creation at all decap locations
associated with PDN
Frequency Setup
EMTool extraction
Loop_L(cap_n)=imag(Znn)/2*pi*freq
Board Schematic for Decap
list PDN, VRM connectivity
Step 4: AC Analysis of PCB PDN www.ti.com
The mid-frequency capacitors are much smaller than the bulk capacitors and therefore can be placed
closer to the transistor circuit. Since the ceramic capacitors are smaller, they have lower ESR and ESL
and lower capacitance than bulk capacitors, leading to a higher resonance frequency with smaller
impedance at resonance. Therefore, ceramic capacitors can be used at higher frequencies. Typical
mid-frequency capacitors have capacitance in the range of 1-100nF, ESR in the range of 10-100 mΩ, and
ESL in the range of 0.5-1nH.
The concept of loop inductance is a useful metric for quantifying the effectiveness of the decoupling
capacitors of a power distribution network. Use Equation 5 to calculate the loop inductance associated
with the decoupling capacitor placement. Once the s-parameter model has been extracted of the power
distribution network. Figure 20 shows a typical flow for loop inductance extraction.
(5)
Where Leff is the effective loop inductance, represents the Z-parameters of the port defined across the
power and ground pads of the corresponding decap, the frequency should be chosen in the flat region of
the z-parameter response, typically in the 50-70 MHz range.
Figure 20. Modeling and Extraction Flow for Extracting Loop Inductance From s-Parameter
6.2 PDN Decoupling Capacitors Requirements
Based on extensive resonance analysis, the decoupling requirements (type, value, and location) and
guidelines to properly decouple VDD_MPU_IVA so that the effective impedance remains below ZTARGET
within the entire frequency range of interest from DC up to 60-70 MHz are:
• Bulk capacitors: 22 µF[x2] (location as shown in Figure 21)
• If needed (depending on the PCB design performance), 44 µF may be needed for bulk
• Mid-frequency decaps: 100 nF[x8], 47 nF[x2], and 10 nF[x2]
• Total capacitors = 14
14 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011
OMAP3630, AM37xx and DM37xx Microprocessors Submit Documentation Feedback
Copyright © 2011, Texas Instruments Incorporated
PMIC/VRM
OMAP3630,
AM37xx, or
DM37xx
Sense Line
22 µF 22 Fµ
VDD1_MPU_IVA Net
2 x 22 Fµ8 x 100 nF
2 x 47 nF
2 x 10 nF
Bulk Capacitors
Mid-Frequency Capacitors
www.ti.com Step 5: Checklist of Requirements/Guidelines/Specifications
Number of Mounting Inductance
Cap Value Units Footprint ESR (Ω) ESL (nH) Total Inductance
Caps (nH)
22000 nF 0603 2 0.2 0.2 0.2-0.3 0.4-0.5
100 nF 0402 8 0.2 0.2 0.2-0.3 0.4-0.5
47 nF 0402 2 0.2 0.2 0.2-0.3 0.4-0.5
10 nF 0402 2 0.2 0.2 0.2-0.3 0.4-0.5
Total 14
Locations of the decoupling capacitors are very important to reducing loop inductance. Figure 21 shows
an example of VDD_MPU_IVA rail with optimal location of decaps that minimize loop inductance.
Figure 21. An Example of Decoupling Placement for VDD_MPU_IVA
7 Step 5: Checklist of Requirements/Guidelines/Specifications
• Specifications/Requirements:
– Static IR drop should not exceed more than 30 mV worst case ONLY under optimal sense point
location.
– Target impedance should not exceed 96.4 mΩ from dc up to 60-70 MHz on PCB.
– The total loop inductance from any decoupling capacitor to applications processor should be less
than 1.5 nH. This includes the capacitor ESL, the via and mounting inductance, and the spreading
inductance of the PDN rail.
– Use the decoupling scheme and placement as per Figure 21.
• Stack-up and Layout Recommendations/Guidelines for Optimal PDN Design:
– Placement of the power and ground planes close to the surface where the capacitors are placed is
advantageous to reduce the vias inductance. Additionally, use of thinner dielectric between power
and ground planes is recommended to increase inter-plane capacitance and reduced via
inductance/resistance.
– Use of multiple via pairs for capacitor mounting is helpful to reduce equivalent
inductance/resistance.
– Placement of decoupling capacitors as close to the OMAP™ device as possibly is preferred. Use
the loop inductance requirements above to guide your placement.
– Use of multiple via pairs for capacitor mounting is helpful to reduce equivalent
inductance/resistance.
– Sharing of vias of adjacent capacitors should be avoided.
– Use of short and wide surface traces to connect capacitor pads to the vias connected to the planes
below is preferred.
15SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI
OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback
Copyright © 2011, Texas Instruments Incorporated
Step 5: Checklist of Requirements/Guidelines/Specifications www.ti.com
– Opposite current vias should be placed in proximity while same current vias should be distantly
placed to account for subtractive versus additive effects of mutual inductance.
– Use of large diameter vias is preferred for reduced inductance/resistance.
– Place the capacitors on the PCB surface (TOP and BOTTOM) closest to their corresponding power
and ground planes. This minimizes the via length.
• Capacitors and Analyses Recommendations:
– Perform static IR drop analysis on rail to determine optimal location of sense line. Correct
positioning of the PMIC/VRM feedback can cause the PMIC/VRM to increase the voltage to
compensate for the IR drop of the PDN. Placing the sense location on the 22 µF bulk capacitor
power pad closest to the applications processor will help offset the IR drop of the rail and is the
recommended location.
– Static IR drop can be reduced by maximizing area and/or length of the net.
– Maximize the area of the power and ground plane/island pair; this helps increase the inter-plane
capacitance. The amount of capacitance seen by the power and ground pair sandwich is directly
proportional to the relative permittivity of the material (i.e., dielectric constant), the dielectric width,
and the length and width of the plane. Use the thinnest dielectric material between the power and
ground plane pair.
– Choose capacitors with small footprint to minimize ESL.
– When selecting capacitors, choose capacitors with multiple values rather than a large number of
capacitors of the same value to meet your target impedance. The impedance peaks in Z-profile are
formed by resonance behavior within the power delivery network. High ESR at resonance
frequency helps in damping the resonance, thereby reducing the magnitude of the impedance
peak. Using a large number of capacitors of the same value significantly reduces the ESR near a
self resonant frequency (SRF) and results in a higher magnitude of nearby impedance peaks.
16 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011
OMAP3630, AM37xx and DM37xx Microprocessors Submit Documentation Feedback
Copyright © 2011, Texas Instruments Incorporated
www.ti.com Acronyms
8 Acronyms
Table 1. Acronyms
ac Alternate current
BGA Ball grid array
dc Direct current (static)
Df :oss tangent
Dk Dielectric constant
EDA Electronic design automation
EM Electromigration
ESL Effective series inductance
ESR Effective series resistance
FDTIM Frequency domain target impedance method
HDI High density interconnect (e.g., buried/blind via)
I Electrical current
IR Product of current (I) x resistance ®)
L Inductance
NPO EIA temperature coefficient for capacitors, ± 30 PPM/°C, -55 to +125°C
PCB Printed circuit board
PDN Power distribution network
PMIC Power management integrated circuit
PTH Plated through hole
R Resistance
RLC Resistance, inductance, and capacitance
SMT Surface mount technology
SRF Self resonant frequency
TI Texas Instruments Incorporated and its subsidiaries
V Electrical potential difference
VIP Via in pad
VRM Voltage regulator module
X5R EIA temperature coefficient for capacitors, ± 15%, -55 to +85°C
X7R EIA temperature coefficient for capacitors, ± 15%, -55 to +125°C
Y5V EIA temperature coefficient for capacitors, -82 to +22%, -30 to +85°C
Z Impedance
17SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI
OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback
Copyright © 2011, Texas Instruments Incorporated
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements,
and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should
obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are
sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment.
TI warrants performance of its hardware products to the specifications applicable at the time of sale in accordance with TI’s standard
warranty. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. Except where
mandated by government requirements, testing of all parameters of each product is not necessarily performed.
TI assumes no liability for applications assistance or customer product design. Customers are responsible for their products and
applications using TI components. To minimize the risks associated with customer products and applications, customers should provide
adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any TI patent right, copyright, mask work right,
or other TI intellectual property right relating to any combination, machine, or process in which TI products or services are used. Information
published by TI regarding third-party products or services does not constitute a license from TI to use such products or services or a
warranty or endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual
property of the third party, or a license from TI under the patents or other intellectual property of TI.
Reproduction of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied
by all associated warranties, conditions, limitations, and notices. Reproduction of this information with alteration is an unfair and deceptive
business practice. TI is not responsible or liable for such altered documentation. Information of third parties may be subject to additional
restrictions.
Resale of TI products or services with statements different from or beyond the parameters stated by TI for that product or service voids all
express and any implied warranties for the associated TI product or service and is an unfair and deceptive business practice. TI is not
responsible or liable for any such statements.
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Automotive
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Copyright © 2011, Texas Instruments Incorporated

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Sprabj7

  • 1. Application Report SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI OMAP3630, AM37xx, and DM37xx Microprocessors The Sitara™ ARM® MPU Applications Team ........................................................................................ ABSTRACT The purpose of a power distribution network (PDN) is to provide clean and reliable power to active devices in the system. The printed circuit board (PCB) is a critical component of the system-level PDN. Therefore, the PCB design is of utmost importance for high-performance low-power microprocessors. This application report provides design requirements and details a step-by-step methodology on how to design the VDD_MPU_IVA PDN on the PCB to comply with the requirements of the TI OMAP3630,AM37xx, and DM37xx microprocessors. Contents 1 Introduction .................................................................................................................. 2 2 PCB PDN Design Methodology ........................................................................................... 2 3 Step 1: Requirements and Guidelines for PCB Stack-up .............................................................. 2 4 Step 2: Physical Layout Optimization of the PDN ...................................................................... 4 5 Step 3: Static IR Drop PDN Optimization ................................................................................ 7 6 Step 4: AC Analysis of PCB PDN ....................................................................................... 12 7 Step 5: Checklist of Requirements/Guidelines/Specifications ....................................................... 15 8 Acronyms ................................................................................................................... 17 List of Figures 1 Minimize Loop Inductance by Proper Layer Assignment in the PCB ................................................ 3 2 An Example PCB Layer Assignment That Uses High-Density Interconnect (HDI) Vias........................... 3 3 Another 8-Layer PCB Design That Uses Plated Through Hole (PTH) Vias......................................... 3 4 Poor Via Assignment for PDN ............................................................................................ 4 5 Improved Via Assignment for PDN ....................................................................................... 4 6 An Example Showing Via Starvation ..................................................................................... 5 7 Improved Layout With More Transitional Vias .......................................................................... 5 8 Example of Co-Planar Shielding of Power Net Using Ground Guard-Band......................................... 5 9 Characteristics of a Real Capacitor With ESL and ESR............................................................... 6 10 Typical Impedance Profile of a Capacitor................................................................................ 6 11 Capacitor Placement Geometry for Improved Mounting Inductance................................................. 7 12 Depiction of Sheet Resistivity and Resistance.......................................................................... 7 13 Static IR Drop Budget for PCB Only...................................................................................... 8 14 Pin-Grouping Concept: Lumped and Distributed Methodologies ..................................................... 8 15 PCB Only Lumped R Extraction Flow .................................................................................... 9 16 PCB Only Distributed IR Drop Flow..................................................................................... 10 17 Example Showing IR Drop Improvement Using Distributed IR Drop Flow......................................... 11 18 Components of a Typical Power Distribution Network (PDN) ....................................................... 12 19 Decoupling Frequency Range of the Components of PCB PDN.................................................... 12 OMAP is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 1SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 2. Introduction www.ti.com 20 Modeling and Extraction Flow for Extracting Loop Inductance From s-Parameter ............................... 14 21 An Example of Decoupling Placement for VDD_MPU_IVA.......................................................... 15 List of Tables 1 Acronyms ................................................................................................................... 17 1 Introduction This application report provides detail design guidelines and specific recommendations for designing a PCB power delivery network (PDN) for the high performance/low power TI OMAP3630, AM37xx, and DM37xx microprocessors. The approach used here is: outline what the PCB PDN design target requirements are, discuss the fundamental rational behind these requirements and, whenever appropriate, provide suggestions/means that the PCB designers can adopt to validate that the PDN requirements are met. 2 PCB PDN Design Methodology • Step1: Requirements and guidelines for PCB Stack-up • Step 2: Physical layout optimization of the PDN • Step 3: Static IR drop optimization of PDN – Minimize resistance, avoid neck-down, and reduce current density • Step 4: ac resonance Check – Target impedance, resonance and anti-resonance peaks, and decoupling optimization scheme (type, placement, and value) • Step 5: Checklist for PDN requirements/specifications 3 Step 1: Requirements and Guidelines for PCB Stack-up The PCB stack-up (layer assignment) is an important factor in determining the optimal performance of the power distribution system. An optimized PCB stack-up for higher power integrity performance can be achieved by following these requirements: • Power and ground plane pairs/islands should be closely coupled together. The capacitance formed between the planes can be used to decouple the power supply at high frequencies. Whenever possible, the power and ground planes should be solid to provide a continuous return path for return current. • Use a thin dielectric thickness between the power and ground plane pair. Capacitance is inversely proportional to the separation of the plane pair. Minimizing the separation distance (i.e., the dielectric thickness) maximizes the capacitance. • Keep the power and ground plane pair as close to the TOP and BOTTOM surfaces as possible (see Figure 1). This will help in minimizing the decoupling capacitors mounting, via, and the power/ground plane pair spreading loop inductance. 2 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011 OMAP3630, AM37xx and DM37xx Microprocessors Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 3. OMAP Package OMAP DIE Power/Ground Ground/Power Trace Capacitor Via Note: Loop Inductance 1 2 3 1. BGA via pair loop inductance 2. Power/Ground by proper layer assignment in the PCB 3. Capacitor trace inductance TOP/SIGNAL1 GROUND POWER SIGNAL2 SIGNAL3 POWER GROUND BOTTOM/SIGNAL4 TOP/SIGNAL1 POWER GROUND SIGNAL2 POWER GROUND BOTTOM/SIGNAL4 SIGNAL3 www.ti.com Step 1: Requirements and Guidelines for PCB Stack-up Figure 1. Minimize Loop Inductance by Proper Layer Assignment in the PCB The placement of power and ground planes in the PCB stack-up (determined by layer assignment) has a significant impact on the parasitic inductances of power current path as shown in Figure 1. For this reason, it is recommended to consider layer order in the early stages of the PCB PDN design cycle, putting high priority supplies in the top half of the stack-up and low-priority supplies in the bottom half of the stack-up as shown in the following figures. Figure 2 and Figure 3 show examples of typical PCB stack-up designed with power integrity in mind. Figure 2. An Example PCB Layer Assignment That Uses High-Density Interconnect (HDI) Vias Figure 3. Another 8-Layer PCB Design That Uses Plated Through Hole (PTH) Vias 3SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 4. Step 2: Physical Layout Optimization of the PDN www.ti.com 4 Step 2: Physical Layout Optimization of the PDN A critical step in designing an optimized PDN is that proper care should be taken to make sure that the initial layout is done with good power integrity design guidelines in mind. What follows are some important requirements that need to be implemented in the PCB PDN design. • External trace routing between components should be as wide as possible. Wider traces lower the impedance, which reduces the static IR drop and improves high frequency performance of the PDN. • Whenever possible, use a minimum trace width to solder pad ratio of 1:1 or greater for passive component (e.g., capacitors and resistors) pins and vias. Do not share vias among multiple capacitors. • Placement of the vias should be as close to the solder pad as possible. Figure 4 depicts an example of acceptable width for power net routing but with poor via placement. Figure 5 shows an improved power net routing with appropriate via assignment and placement, respectively. Figure 4. Poor Via Assignment for PDN Figure 5. Improved Via Assignment for PDN • To avoid any ampacity issue – maximum current-carrying capacity of each transitional via should be evaluated to determine the appropriate number of vias required to connect components. Figure 6 and Figure 7 are examples of via starvation on a power net transitioning from the TOP routing layer to internal layers and the improved layout, respectively. • It is also a good practice to perform static IR drop (discussed in Section 5). This analysis can be used to assess the appropriate number of vias and geometrical trace width dimensions required to meet the expected IR drop requirement. 4 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011 OMAP3630, AM37xx and DM37xx Microprocessors Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 5. One via for 5 capacitor pads is NOT good practice Added vias VDD_Core VDD_MPU_IVA VSS as “co-planar” shield www.ti.com Step 2: Physical Layout Optimization of the PDN Figure 6. An Example Showing Via Starvation Figure 7. Improved Layout With More Transitional Vias • Whenever possible for the internal layers (routing and plane), wide traces and copper area fills are preferred for PDN layout. As discussed in earlier sections, routing power nets in plane provide for more inter-plane capacitance and improve high frequency performance of the PDN. • Try to avoid different power nets (e.g., VDD_MPU_IVA with VDD_CORE) coupling on the PCB by using co-planar shielding whenever appropriate. Figure 8 depicts an example of co-planar shielding for power nets. Figure 8. Example of Co-Planar Shielding of Power Net Using Ground Guard-Band 5SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 6. C ESL ESR 2 2 1 Z ESR ESL C ω ω   = + −   Where 2 fω π= Resonant Frequency (55 MHz) (minimum impedance) 1/CX Cw= LX Lw= Step 2: Physical Layout Optimization of the PDN www.ti.com • Decoupling capacitors should be mounted with minimum impact to inductance. A capacitor has characteristics not only of capacitance but also inductance and resistance. Figure 9 shows the parasitic model of a real capacitor. A real capacitor should be treated as an RLC circuit with effective series resistance (ESR) and effective series inductance (ESL). Figure 9. Characteristics of a Real Capacitor With ESL and ESR The magnitude of the impedance of this series model is given as: (1) Figure 10 shows the resonant frequency response of a typical capacitor with self-resonant frequency of 55 MHz. The impedance of the capacitor is a combination of its series resistance, reactive capacitance, and inductance as shown in Equation 1. Figure 10. Typical Impedance Profile of a Capacitor • Since the capacitors have series inductance and resistance that will impact its effectiveness, it is important that the following recommendations are adopted in placing them on the power distribution network. Whenever possible, make sure to mount the capacitor with the geometry that minimizes the mounting inductance and resistance as shown earlier in Figure 1. The capacitor mounting inductance and resistance here includes the inductance and resistance of the pads, trace, and vias. • The length of trace used to connect a capacitor has a big impact on parasitic inductance and resistance of the mounting. This trace should be as short and wide as possible. Wherever possible, minimize the trace length by locating vias near the solder pads. Further improvements can be made by placing vias to the side of capacitor solder pads or doubling the number of vias as shown in Figure 11. If the PCB manufacturing processes allow, and if cost-effective, via-in-pad (VIP) geometries are strongly recommended. 6 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011 OMAP3630, AM37xx and DM37xx Microprocessors Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 7. trace pad via Mounting Geometry for Reduced Inductance Via-in-pad The resistance Rs of a plane conductor for a unit length and unit width is called the surface resistivity ( s per square).Ω W L t 1 Rs t t l R Rs w ρ σ = = ⋅ = ⋅ www.ti.com Step 3: Static IR Drop PDN Optimization In addition to mounting inductance and resistance associated with placing a capacitor on the PCB, the effectiveness of a decoupling capacitor also depends on the spreading inductance and resistance that the capacitor sees with respect to the load. The spreading inductance and resistance is strongly dependent on the layer assignment in the PCB stack-up (as shown in Figure 1). Figure 11. Capacitor Placement Geometry for Improved Mounting Inductance 5 Step 3: Static IR Drop PDN Optimization Delivering reliable power to circuits is always of critical importance because IR drops can occur on multiple components of the PDN. Power distribution cables, connectors, PCBs, semiconductor packaging, and semiconductors are all example components of the PDN that may contribute to the system level IR drop. Components that are distant from their associated power source are particularly susceptible to IR drop, and designs that rely on battery power must minimize voltage drop to avoid unacceptable power loss. Early DC assessments help determine power distribution basics such as the best available entry point for power, layer stack-up choices, and estimates for the amount of copper needed to carry the current. Figure 12. Depiction of Sheet Resistivity and Resistance Ohm’s Law (V=IR) relates conduction current to voltage drop, and at dc, the relation coefficient is a constant representing the resistance of the conductor. Conductors also dissipate power due to their resistance. Both voltage drop and power dissipation are proportional to the resistance of the conductor. Systems with on-board power sources have three primary components that may contribute IR drop; semiconductor, semiconductor package and main PCB. Static IR or dc analysis/design methodology consists of designing the PDN such that the voltage available (under dc operating conditions) to the power and ground pads of the applications processor transistors is within a specified value of the nominal voltage, for proper functionality of the device. The PCB-contribution to the static IR drop budget is defined as the dc voltage drop between the solder pads of the power management integrated circuit (PMIC) or voltage regulator module (VRM) and the BGA solder pads of the applications processor (as shown in Figure 13). 7SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 8. PMIC /VRM OMAP3630, AM37xx, or DM37xx PCB Static IR Drop Budget of < 30 mV (Worst-case) BGA Pad on PCB Sources Sinks Sources Sinks Multi-port Net Branch Port/Pin OMAP end Grouped Power/Ground pins to create 1 equivalent resistive branch Step 3: Static IR Drop PDN Optimization www.ti.com Figure 13. Static IR Drop Budget for PCB Only Given the total system-level margin allowed for proper device functionality, allowable voltage variation at the power terminals of the applications processor is specified at 2.5% of the nominal voltage. For a 1.2 V supply, this should be ≤30 mV. This is ONLY permitted under the assumption that the power source feedback or sense is connected to a point very close to the applications processor, such the DC IR drop is compensated by the power source. If the power source feedback or sense is not connected to a point close to the applications processor, the static IR drop must be controlled to 0.5-1.0% for proper device functionality. • It is highly recommended the power source feedback or sense line on the PCB is connected as close as physically possible to the applications processor. To check if the static IR drop is within specification, the PCB designer needs to perform the appropriate analysis and compare the results to the power supply tolerance specification of ± 0.5%/2.5% (based on PMIC/VRM sense design topologies discussed above). To accurately analyze PCB static IR drop, the actual geometry of the PDN must often be properly modeled and simulated to accurately characterize long distribution paths, low weight copper, electro-migration violations of current-carrying vias, and swiss-cheese effects. It is recommended to perform the following analyses: • Lumped resistance/IR drop analysis • Distributed resistance/IR drop analysis The requirements are to perform both analyses and to show compliance. In the next sections, each methodology is described in detail and examples are provided of analyses flow that can be used by the PCB designer to validate compliance to the requirements on their PCB PDN design. 5.1 Lumped and Distributed Resistance/IR Drop Analysis Methodology Lumped methodology consists of grouping all of the power/ground pins of the PMIC and the processor device; this is followed by extracting the lumped resistance or dc voltage drop of the equivalent path by applying a voltage source at the PMIC end and a current sink at the device end. The pin-grouping concept is depicted in Figure 14. Figure 14. Pin-Grouping Concept: Lumped and Distributed Methodologies 8 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011 OMAP3630, AM37xx and DM37xx Microprocessors Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 9. Board layout (.brd) in Cadence Allegro PCB layout import in static IR drop tool ? ? Edit technology stackup Add/edit metal conductivity ? ? Pin grouping Current source assignment Resistance extraction in Static IR drop tool Lumped path R O/P Meet spec? DC IR Signoff Yes No PCB layout iterations in Cadence www.ti.com Step 3: Static IR Drop PDN Optimization The lumped methodology consists of importing the PCB layout database (from Cadence Allegro or other PCB layout tool) into the static IR drop modeling and simulation tool of preference for the PCB designer. This is followed by applying the correct PCB stack-up information (thickness, material properties) of the PCB dielectric and metallization layers. The material properties of dielectric consist of permittivity (Dk) and loss tangent (Df). For the conductor layers, the correct conductivity needs to be programmed into the simulation tool. This is followed by pin-grouping of the power and ground nets, and applying appropriate voltage/current sources. The current and voltage information can be obtained from the power and voltage specifications of the device under different operating conditions/use-modes. After running the simulation, the lumped resistance and lumped IR drop can be examined as shown in Figure 15. Figure 15. PCB Only Lumped R Extraction Flow 9SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 10. Board Layout (.brd) in Cadence Allegro PCB Layout import in Static IR Drop Tool ? ? Edit Technology stackup Add/Edit metal conductivity Pin selection, Current Source Assignment Average Static IR drop O/P profile Meet spec? DC IR Signoff Yes No PCB Layout Iterations in Cadence Design Rules/LL/Best Practices Average current (l) per Device pin Resistance Extraction in Static IR Drop Tool Step 3: Static IR Drop PDN Optimization www.ti.com A more accurate analysis is to use average current per-pin assumption and then create a distributed IR drop profile of the PCB. In this analysis, the power and ground pins are left unique instead of lumping them together. If the average-current based analysis is performed, the average per-pin current information is extracted from the device-specification data sheet and the pin count for the specific supply rail. This average current information is then included for analysis as shown in Figure 16. Figure 16. PCB Only Distributed IR Drop Flow 10 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011 OMAP3630, AM37xx and DM37xx Microprocessors Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 11. Original Unoptimized Design Max. drop: 80.5 mV Improved Design Max. drop: 26.7 mV www.ti.com Step 3: Static IR Drop PDN Optimization Based on the design guidelines followed by post-layout IR drop analysis, significant improvements in designs can be characterized by the above flow. An example of design improvement has been depicted in Figure 17. The Static IR drop flow/methodologies in this document have been demonstrated using the TI internal flow. The basic steps can be repeated with other EDA tools. It consists of: • Translate the post-layout design into the tool • Define the sources (PMIC/VRM, connectors etc.) • Define the current sinks for loads, spec it as lumped, distributed based on design requirements • Ensure that the stack-up, layer thickness, and copper technology properties (thickness, conductivity) is correct • Set up of appropriate limits for simulation • Analyses of IR drop simulation data to locate hotspots, neckdowns, electromigration (EM) violations, etc. Figure 17. Example Showing IR Drop Improvement Using Distributed IR Drop Flow 11SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 12. Rr p Lr p Rb p Lb p Rp p Lp p Rc p Lc p out Iload Voltage Regulator PCB IC Package Chip Module Rr g Lr g Rb g Lb g Rp g Lp g Rc g Lc g 1MHz1-5KHz PMIC/VRM Electrolytic Bulk Capacitors Mid - Frequency Ceramic Capacitors Power/Ground Inter-plane Capacitance 50-100MHz Frequency Mag. of Z FMAX ZTARGET |Z |EFF Step 4: AC Analysis of PCB PDN www.ti.com 6 Step 4: AC Analysis of PCB PDN The typical elements of the PDN are shown in Figure 18. They include the chip-level power distribution with thin-oxide decoupling capacitors, the package-level power distribution with planes and mid-frequency decoupling capacitors, and the board-level (i.e., PCB) power distribution with planes, low-frequency ceramic and bulk decoupling capacitors, and the PMIC/VRM. Figure 18. Components of a Typical Power Distribution Network (PDN) The frequency ranges covered by these elements are shown in Figure 19. The primary focus here is on optimizing the PCB PDN for high performance; the methodology is developed around the areas that the PCB designer has control and can influence early in the design phase. The typical PCB PDN network contains the following components: • Power management integrated circuit (PMIC) or voltage regulator module (VRM) • Bulk and mid-frequency decoupling capacitors • Parasitics from power/ground plane spreading, BGA vias, and SMT • Inter-plane capacitance In the following sections, the purpose of each of the components of the PDN network are reviewed and the requirements for each are stated with examples, whenever appropriate. Figure 19. Decoupling Frequency Range of the Components of PCB PDN 12 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011 OMAP3630, AM37xx and DM37xx Microprocessors Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 13. RIPPLE TRANSIENT PDNV I Z= ∗ % 0.5 TARGET MAX VoltageRail Ripple Z I ∗ = ∗ 96.4TARGETZ m= Ω www.ti.com Step 4: AC Analysis of PCB PDN The PMIC/VRM or simply voltage regulator device is the first major component of the PDN. It observes its output voltage and adjusts the amount of current being supplied to keep the voltage constant. Most common voltage regulators make this adjustment on the order of milliseconds to microseconds. They are effective at maintaining output voltage for events at all frequencies from dc to a few kilohertz (depending on the regulator dynamic response time). For all transient events that occur at frequencies above this range, there is a time lag before the voltage regulator can respond to the new level of demand. During this time lag the rail suffers from voltage droop. A power delivery network has an impedance (ZPDN) associated with the path from the PMIC/VRM to the applications processor. The magnitude of noise (voltage ripple) seen on a given power rail is proportional to the impedance (ZPDN) and the transient current (ITRANSIENT) draw associated with that rail. Figure 20 shows an example of the current transient profile under a switching set-up condition. Based on Ohm’s Law, (2) Typically the transient current is application specific and is determined by the switching scenario. As a board designer, you have the ability to minimize the voltage ripple by reducing ZPDN either by reducing the inductance or by maximizing the capacitance. To ensure that the voltage ripple noise is within the applications processor specification, the ZPDN must be designed to meet a certain impedance, called the target impedance (ZTARGET). Using the frequency domain target impedance method (FDTIM) to describe the behavior of a power delivery system has been widely accepted. The key concept of the FDTIM is the determination of the target impedance ZTARGET (see Equation 3) for the power rail under consideration. For reliable operation of a power delivery system, its impedance spectrum needs to be maintained below the target value at the frequencies from dc to FMAX (as shown in Figure 19). FMAX is the point in frequency after which adding a reasonable number of decoupling capacitors does not bring down the power rail impedance |ZEFF| below the target impedance (ZTARGET) due to the dominance of the parasitic planar spreading inductance and package inductances. (3) For the OMAP3630, AM37xx, and DM37xx devices, the ZTARGET for VDD_MPU_IVA is specified at 96.4 mΩ. This was computed using the Equation 3 and with the following assumptions: the voltage rail (VDD_MPU_IVA) is 1.35 V (max voltage at OPP1G), % ripple allowed is 5% of the maximum voltage, and IMAX is the maximum transient current. (4) 6.1 Selecting Decoupling Capacitors to Meet ZTARGET To maintain power integrity throughout the entire frequency range of interest, the power distribution network relies on the voltage regulator module (PMIC/VRM), the on-board discrete bulk electrolytic and ceramic decoupling capacitors, and the inter-plane capacitance (capacitance from the power-ground sandwich in the board stack-up). For a first-order analysis, the PMIC/VRM can be modeled as a series-connected resistor and inductor. The PMIC/VRM, at low frequencies (up to about 1 MHz), has a low output impedance and is capable of responding to the instantaneous requirements of the applications processor. The ESR and ESL values for the PMIC/VRM are very low in the lower frequency range. Beyond lower frequencies, the PMIC/VRM impedance is primarily inductive, making it incapable of meeting the transient current requirement of the device. The bulk and ceramic discrete decoupling capacitors must provide the required low impedance power source above the frequency where the PMIC/VRM becomes inductive. The effectiveness of the bulk and mid-frequency decoupling capacitors (1 MHz-70 MHz – depending on the capacitors ESL and ESR) is limited by its placement (loop inductance), value, and type. The bulk capacitors should be located near the entry point of the power supply to the PCB. These decoupling capacitors maintain the PDN impedance at the required value beyond the frequency where the PMIC/VRM becomes inductive and up to the frequency at which mid-frequency capacitors become useful. The mid-frequency SMT capacitors are useful in the 10 to 150 MHz range and higher. These capacitors are primarily ceramic capacitors that come in several dielectric types (NPO, X7R, X5R, and Y5V) and several sizes (1206, 0805, 0603, 0402, etc). 13SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 14. ( ( , )) 2 eff imaginary Z power gnd pads of decap L frequencyπ = ∗ ∗ Board Layout (.brd) in Cadence Allegro Import Power and Ground Nets in EM Tool ? ? Edit Technology stackup RGA Pin-Grouping for power and ground net Meet design guidelines? Signoff Yes No PCB Layout Iterations in Cadence ? ? ? Short Power and ground BGA pin-groups Port creation at all decap locations associated with PDN Frequency Setup EMTool extraction Loop_L(cap_n)=imag(Znn)/2*pi*freq Board Schematic for Decap list PDN, VRM connectivity Step 4: AC Analysis of PCB PDN www.ti.com The mid-frequency capacitors are much smaller than the bulk capacitors and therefore can be placed closer to the transistor circuit. Since the ceramic capacitors are smaller, they have lower ESR and ESL and lower capacitance than bulk capacitors, leading to a higher resonance frequency with smaller impedance at resonance. Therefore, ceramic capacitors can be used at higher frequencies. Typical mid-frequency capacitors have capacitance in the range of 1-100nF, ESR in the range of 10-100 mΩ, and ESL in the range of 0.5-1nH. The concept of loop inductance is a useful metric for quantifying the effectiveness of the decoupling capacitors of a power distribution network. Use Equation 5 to calculate the loop inductance associated with the decoupling capacitor placement. Once the s-parameter model has been extracted of the power distribution network. Figure 20 shows a typical flow for loop inductance extraction. (5) Where Leff is the effective loop inductance, represents the Z-parameters of the port defined across the power and ground pads of the corresponding decap, the frequency should be chosen in the flat region of the z-parameter response, typically in the 50-70 MHz range. Figure 20. Modeling and Extraction Flow for Extracting Loop Inductance From s-Parameter 6.2 PDN Decoupling Capacitors Requirements Based on extensive resonance analysis, the decoupling requirements (type, value, and location) and guidelines to properly decouple VDD_MPU_IVA so that the effective impedance remains below ZTARGET within the entire frequency range of interest from DC up to 60-70 MHz are: • Bulk capacitors: 22 µF[x2] (location as shown in Figure 21) • If needed (depending on the PCB design performance), 44 µF may be needed for bulk • Mid-frequency decaps: 100 nF[x8], 47 nF[x2], and 10 nF[x2] • Total capacitors = 14 14 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011 OMAP3630, AM37xx and DM37xx Microprocessors Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 15. PMIC/VRM OMAP3630, AM37xx, or DM37xx Sense Line 22 µF 22 Fµ VDD1_MPU_IVA Net 2 x 22 Fµ8 x 100 nF 2 x 47 nF 2 x 10 nF Bulk Capacitors Mid-Frequency Capacitors www.ti.com Step 5: Checklist of Requirements/Guidelines/Specifications Number of Mounting Inductance Cap Value Units Footprint ESR (Ω) ESL (nH) Total Inductance Caps (nH) 22000 nF 0603 2 0.2 0.2 0.2-0.3 0.4-0.5 100 nF 0402 8 0.2 0.2 0.2-0.3 0.4-0.5 47 nF 0402 2 0.2 0.2 0.2-0.3 0.4-0.5 10 nF 0402 2 0.2 0.2 0.2-0.3 0.4-0.5 Total 14 Locations of the decoupling capacitors are very important to reducing loop inductance. Figure 21 shows an example of VDD_MPU_IVA rail with optimal location of decaps that minimize loop inductance. Figure 21. An Example of Decoupling Placement for VDD_MPU_IVA 7 Step 5: Checklist of Requirements/Guidelines/Specifications • Specifications/Requirements: – Static IR drop should not exceed more than 30 mV worst case ONLY under optimal sense point location. – Target impedance should not exceed 96.4 mΩ from dc up to 60-70 MHz on PCB. – The total loop inductance from any decoupling capacitor to applications processor should be less than 1.5 nH. This includes the capacitor ESL, the via and mounting inductance, and the spreading inductance of the PDN rail. – Use the decoupling scheme and placement as per Figure 21. • Stack-up and Layout Recommendations/Guidelines for Optimal PDN Design: – Placement of the power and ground planes close to the surface where the capacitors are placed is advantageous to reduce the vias inductance. Additionally, use of thinner dielectric between power and ground planes is recommended to increase inter-plane capacitance and reduced via inductance/resistance. – Use of multiple via pairs for capacitor mounting is helpful to reduce equivalent inductance/resistance. – Placement of decoupling capacitors as close to the OMAP™ device as possibly is preferred. Use the loop inductance requirements above to guide your placement. – Use of multiple via pairs for capacitor mounting is helpful to reduce equivalent inductance/resistance. – Sharing of vias of adjacent capacitors should be avoided. – Use of short and wide surface traces to connect capacitor pads to the vias connected to the planes below is preferred. 15SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 16. Step 5: Checklist of Requirements/Guidelines/Specifications www.ti.com – Opposite current vias should be placed in proximity while same current vias should be distantly placed to account for subtractive versus additive effects of mutual inductance. – Use of large diameter vias is preferred for reduced inductance/resistance. – Place the capacitors on the PCB surface (TOP and BOTTOM) closest to their corresponding power and ground planes. This minimizes the via length. • Capacitors and Analyses Recommendations: – Perform static IR drop analysis on rail to determine optimal location of sense line. Correct positioning of the PMIC/VRM feedback can cause the PMIC/VRM to increase the voltage to compensate for the IR drop of the PDN. Placing the sense location on the 22 µF bulk capacitor power pad closest to the applications processor will help offset the IR drop of the rail and is the recommended location. – Static IR drop can be reduced by maximizing area and/or length of the net. – Maximize the area of the power and ground plane/island pair; this helps increase the inter-plane capacitance. The amount of capacitance seen by the power and ground pair sandwich is directly proportional to the relative permittivity of the material (i.e., dielectric constant), the dielectric width, and the length and width of the plane. Use the thinnest dielectric material between the power and ground plane pair. – Choose capacitors with small footprint to minimize ESL. – When selecting capacitors, choose capacitors with multiple values rather than a large number of capacitors of the same value to meet your target impedance. The impedance peaks in Z-profile are formed by resonance behavior within the power delivery network. High ESR at resonance frequency helps in damping the resonance, thereby reducing the magnitude of the impedance peak. Using a large number of capacitors of the same value significantly reduces the ESR near a self resonant frequency (SRF) and results in a higher magnitude of nearby impedance peaks. 16 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI SPRABJ7–June 2011 OMAP3630, AM37xx and DM37xx Microprocessors Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
  • 17. www.ti.com Acronyms 8 Acronyms Table 1. Acronyms ac Alternate current BGA Ball grid array dc Direct current (static) Df :oss tangent Dk Dielectric constant EDA Electronic design automation EM Electromigration ESL Effective series inductance ESR Effective series resistance FDTIM Frequency domain target impedance method HDI High density interconnect (e.g., buried/blind via) I Electrical current IR Product of current (I) x resistance ®) L Inductance NPO EIA temperature coefficient for capacitors, ± 30 PPM/°C, -55 to +125°C PCB Printed circuit board PDN Power distribution network PMIC Power management integrated circuit PTH Plated through hole R Resistance RLC Resistance, inductance, and capacitance SMT Surface mount technology SRF Self resonant frequency TI Texas Instruments Incorporated and its subsidiaries V Electrical potential difference VIP Via in pad VRM Voltage regulator module X5R EIA temperature coefficient for capacitors, ± 15%, -55 to +85°C X7R EIA temperature coefficient for capacitors, ± 15%, -55 to +125°C Y5V EIA temperature coefficient for capacitors, -82 to +22%, -30 to +85°C Z Impedance 17SPRABJ7–June 2011 PCB Design Requirements for VDD_MPU_IVA Power Distribution Network for TI OMAP3630, AM37xx and DM37xx MicroprocessorsSubmit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated
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